{"id":"https://openalex.org/W3164382946","doi":"https://doi.org/10.1109/access.2021.3082858","title":"A Review of Knowledge-Based Defect Identification via PRPD Patterns in High Voltage Apparatus","display_name":"A Review of Knowledge-Based Defect Identification via PRPD Patterns in High Voltage Apparatus","publication_year":2021,"publication_date":"2021-01-01","ids":{"openalex":"https://openalex.org/W3164382946","doi":"https://doi.org/10.1109/access.2021.3082858","mag":"3164382946"},"language":"en","primary_location":{"id":"doi:10.1109/access.2021.3082858","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2021.3082858","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/9312710/09438640.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/9312710/09438640.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5053569282","display_name":"Tohid Shahsavarian","orcid":"https://orcid.org/0000-0001-6433-9204"},"institutions":[{"id":"https://openalex.org/I140172145","display_name":"University of Connecticut","ror":"https://ror.org/02der9h97","country_code":"US","type":"education","lineage":["https://openalex.org/I140172145"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Tohid Shahsavarian","raw_affiliation_strings":["Electrical Insulation Research Center, Institute of Materials Science, University of Connecticut, Storrs, CT, USA","University of Connecticut, Storrs, CT, USA"],"raw_orcid":"https://orcid.org/0000-0001-6433-9204","affiliations":[{"raw_affiliation_string":"Electrical Insulation Research Center, Institute of Materials Science, University of Connecticut, Storrs, CT, USA","institution_ids":["https://openalex.org/I140172145"]},{"raw_affiliation_string":"University of Connecticut, Storrs, CT, USA","institution_ids":["https://openalex.org/I140172145"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5067890765","display_name":"Yue Pan","orcid":"https://orcid.org/0000-0002-0521-250X"},"institutions":[{"id":"https://openalex.org/I23632641","display_name":"Shanghai University of Electric Power","ror":"https://ror.org/02w4tny03","country_code":"CN","type":"education","lineage":["https://openalex.org/I23632641"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yue Pan","raw_affiliation_strings":["School of Electrical Engineering, Shanghai University of Electric Power, Shanghai, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Shanghai University of Electric Power, Shanghai, China","institution_ids":["https://openalex.org/I23632641"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017362676","display_name":"Zhousheng Zhang","orcid":"https://orcid.org/0000-0002-0891-7695"},"institutions":[{"id":"https://openalex.org/I23632641","display_name":"Shanghai University of Electric Power","ror":"https://ror.org/02w4tny03","country_code":"CN","type":"education","lineage":["https://openalex.org/I23632641"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhousheng Zhang","raw_affiliation_strings":["School of Electrical Engineering, Shanghai University of Electric Power, Shanghai, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Shanghai University of Electric Power, Shanghai, China","institution_ids":["https://openalex.org/I23632641"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080564197","display_name":"Cheng Pan","orcid":"https://orcid.org/0000-0003-4735-5047"},"institutions":[{"id":"https://openalex.org/I37461747","display_name":"Wuhan University","ror":"https://ror.org/033vjfk17","country_code":"CN","type":"education","lineage":["https://openalex.org/I37461747"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Cheng Pan","raw_affiliation_strings":["School of Electrical Engineering, Wuhan University, Wuhan, China"],"raw_orcid":"https://orcid.org/0000-0003-4735-5047","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Wuhan University, Wuhan, China","institution_ids":["https://openalex.org/I37461747"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5067041549","display_name":"Hadi Naderiallaf","orcid":"https://orcid.org/0000-0002-8241-4631"},"institutions":[{"id":"https://openalex.org/I9360294","display_name":"University of Bologna","ror":"https://ror.org/01111rn36","country_code":"IT","type":"education","lineage":["https://openalex.org/I9360294"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Hadi Naderiallaf","raw_affiliation_strings":["University of Bologna, Bologna, Italy"],"raw_orcid":"https://orcid.org/0000-0002-8241-4631","affiliations":[{"raw_affiliation_string":"University of Bologna, Bologna, Italy","institution_ids":["https://openalex.org/I9360294"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070466650","display_name":"Jim Guo","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Jim Guo","raw_affiliation_strings":["Altanova, TECHIMP U.S. Corporation, Alpharetta, GA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Altanova, TECHIMP U.S. Corporation, Alpharetta, GA, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102013586","display_name":"Chuanyang Li","orcid":"https://orcid.org/0000-0002-3702-2647"},"institutions":[{"id":"https://openalex.org/I140172145","display_name":"University of Connecticut","ror":"https://ror.org/02der9h97","country_code":"US","type":"education","lineage":["https://openalex.org/I140172145"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Chuanyang Li","raw_affiliation_strings":["Electrical Insulation Research Center, Institute of Materials Science, University of Connecticut, Storrs, CT, USA","University of Connecticut, Storrs, CT, USA"],"raw_orcid":"https://orcid.org/0000-0002-3702-2647","affiliations":[{"raw_affiliation_string":"Electrical Insulation Research Center, Institute of Materials Science, University of Connecticut, Storrs, CT, USA","institution_ids":["https://openalex.org/I140172145"]},{"raw_affiliation_string":"University of Connecticut, Storrs, CT, USA","institution_ids":["https://openalex.org/I140172145"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5017796934","display_name":"Yang Cao","orcid":"https://orcid.org/0000-0001-7034-2792"},"institutions":[{"id":"https://openalex.org/I140172145","display_name":"University of Connecticut","ror":"https://ror.org/02der9h97","country_code":"US","type":"education","lineage":["https://openalex.org/I140172145"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yang Cao","raw_affiliation_strings":["Electrical Insulation Research Center, Institute of Materials Science, University of Connecticut, Storrs, CT, USA","University of Connecticut, Storrs, CT, USA"],"raw_orcid":"https://orcid.org/0000-0001-7034-2792","affiliations":[{"raw_affiliation_string":"Electrical Insulation Research Center, Institute of Materials Science, University of Connecticut, Storrs, CT, USA","institution_ids":["https://openalex.org/I140172145"]},{"raw_affiliation_string":"University of Connecticut, Storrs, CT, USA","institution_ids":["https://openalex.org/I140172145"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":2.8913,"has_fulltext":true,"cited_by_count":65,"citation_normalized_percentile":{"value":0.92085043,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":100},"biblio":{"volume":"9","issue":null,"first_page":"77705","last_page":"77728"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11343","display_name":"Power Transformer Diagnostics and Insulation","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11609","display_name":"Geophysical Methods and Applications","score":0.9900000095367432,"subfield":{"id":"https://openalex.org/subfields/2212","display_name":"Ocean Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/partial-discharge","display_name":"Partial discharge","score":0.8110856413841248},{"id":"https://openalex.org/keywords/transformer","display_name":"Transformer","score":0.6282421350479126},{"id":"https://openalex.org/keywords/high-voltage","display_name":"High voltage","score":0.5881091952323914},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5802844762802124},{"id":"https://openalex.org/keywords/electrical-equipment","display_name":"Electrical equipment","score":0.5497943162918091},{"id":"https://openalex.org/keywords/identification","display_name":"Identification (biology)","score":0.517934262752533},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4992642402648926},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4635540544986725},{"id":"https://openalex.org/keywords/switchgear","display_name":"Switchgear","score":0.46279215812683105},{"id":"https://openalex.org/keywords/insulation-system","display_name":"Insulation system","score":0.4579642415046692},{"id":"https://openalex.org/keywords/key","display_name":"Key (lock)","score":0.4492453932762146},{"id":"https://openalex.org/keywords/electric-power-system","display_name":"Electric power system","score":0.44363337755203247},{"id":"https://openalex.org/keywords/power-grid","display_name":"Power grid","score":0.4129270613193512},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3880161643028259},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.35181567072868347},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.31959113478660583},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21398800611495972},{"id":"https://openalex.org/keywords/computer-security","display_name":"Computer security","score":0.10275766253471375}],"concepts":[{"id":"https://openalex.org/C130143024","wikidata":"https://www.wikidata.org/wiki/Q1929972","display_name":"Partial discharge","level":3,"score":0.8110856413841248},{"id":"https://openalex.org/C66322947","wikidata":"https://www.wikidata.org/wiki/Q11658","display_name":"Transformer","level":3,"score":0.6282421350479126},{"id":"https://openalex.org/C88182573","wikidata":"https://www.wikidata.org/wiki/Q1139740","display_name":"High voltage","level":3,"score":0.5881091952323914},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5802844762802124},{"id":"https://openalex.org/C162175671","wikidata":"https://www.wikidata.org/wiki/Q3749263","display_name":"Electrical equipment","level":2,"score":0.5497943162918091},{"id":"https://openalex.org/C116834253","wikidata":"https://www.wikidata.org/wiki/Q2039217","display_name":"Identification (biology)","level":2,"score":0.517934262752533},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4992642402648926},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4635540544986725},{"id":"https://openalex.org/C93893174","wikidata":"https://www.wikidata.org/wiki/Q1273786","display_name":"Switchgear","level":2,"score":0.46279215812683105},{"id":"https://openalex.org/C2776152135","wikidata":"https://www.wikidata.org/wiki/Q467898","display_name":"Insulation system","level":2,"score":0.4579642415046692},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.4492453932762146},{"id":"https://openalex.org/C89227174","wikidata":"https://www.wikidata.org/wiki/Q2388981","display_name":"Electric power system","level":3,"score":0.44363337755203247},{"id":"https://openalex.org/C2983254600","wikidata":"https://www.wikidata.org/wiki/Q1096907","display_name":"Power grid","level":3,"score":0.4129270613193512},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3880161643028259},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.35181567072868347},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.31959113478660583},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21398800611495972},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.10275766253471375},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C59822182","wikidata":"https://www.wikidata.org/wiki/Q441","display_name":"Botany","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/access.2021.3082858","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2021.3082858","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/9312710/09438640.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:193fae2f005849debf4b8322301cd11c","is_oa":true,"landing_page_url":"https://doaj.org/article/193fae2f005849debf4b8322301cd11c","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 9, Pp 77705-77728 (2021)","raw_type":"article"},{"id":"pmh:oai:zenodo.org:139713","is_oa":true,"landing_page_url":"https://www.openaccessrepository.it/record/139713","pdf_url":null,"source":{"id":"https://openalex.org/S4306402478","display_name":"INFM-OAR (INFN Catania)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I4210116497","host_organization_name":"Istituto Nazionale di Fisica Nucleare, Sezione di Catania","host_organization_lineage":["https://openalex.org/I4210116497"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":{"id":"doi:10.1109/access.2021.3082858","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2021.3082858","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/9312710/09438640.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W3164382946.pdf","grobid_xml":"https://content.openalex.org/works/W3164382946.grobid-xml"},"referenced_works_count":145,"referenced_works":["https://openalex.org/W307217633","https://openalex.org/W1524112957","https://openalex.org/W1535655141","https://openalex.org/W1543079349","https://openalex.org/W1590892709","https://openalex.org/W1638688353","https://openalex.org/W1854711852","https://openalex.org/W1888312768","https://openalex.org/W1911892631","https://openalex.org/W1938478029","https://openalex.org/W1958673841","https://openalex.org/W1961756951","https://openalex.org/W1962943187","https://openalex.org/W1966061260","https://openalex.org/W1970682922","https://openalex.org/W1980324578","https://openalex.org/W1982058934","https://openalex.org/W1985988963","https://openalex.org/W1995529805","https://openalex.org/W1997155888","https://openalex.org/W1999603859","https://openalex.org/W2001812107","https://openalex.org/W2009408074","https://openalex.org/W2009674087","https://openalex.org/W2026947446","https://openalex.org/W2033968706","https://openalex.org/W2035557334","https://openalex.org/W2039452645","https://openalex.org/W2040827709","https://openalex.org/W2042588246","https://openalex.org/W2045382169","https://openalex.org/W2059436504","https://openalex.org/W2061073098","https://openalex.org/W2062887610","https://openalex.org/W2078901643","https://openalex.org/W2079844350","https://openalex.org/W2082001509","https://openalex.org/W2082931885","https://openalex.org/W2083257804","https://openalex.org/W2096056820","https://openalex.org/W2097305436","https://openalex.org/W2097393916","https://openalex.org/W2098557600","https://openalex.org/W2099093603","https://openalex.org/W2100028863","https://openalex.org/W2100223978","https://openalex.org/W2102099568","https://openalex.org/W2103885207","https://openalex.org/W2104721401","https://openalex.org/W2107001311","https://openalex.org/W2108500657","https://openalex.org/W2109180372","https://openalex.org/W2113085830","https://openalex.org/W2115826883","https://openalex.org/W2116045409","https://openalex.org/W2116253764","https://openalex.org/W2119567756","https://openalex.org/W2119772112","https://openalex.org/W2120134628","https://openalex.org/W2120743928","https://openalex.org/W2123516216","https://openalex.org/W2126049032","https://openalex.org/W2126940918","https://openalex.org/W2126962258","https://openalex.org/W2127804164","https://openalex.org/W2129624644","https://openalex.org/W2132945360","https://openalex.org/W2132959474","https://openalex.org/W2135293599","https://openalex.org/W2136757284","https://openalex.org/W2137363963","https://openalex.org/W2139298988","https://openalex.org/W2142227836","https://openalex.org/W2142258021","https://openalex.org/W2142342623","https://openalex.org/W2142592645","https://openalex.org/W2142621345","https://openalex.org/W2145547753","https://openalex.org/W2146487654","https://openalex.org/W2151064381","https://openalex.org/W2152751317","https://openalex.org/W2153876905","https://openalex.org/W2154219161","https://openalex.org/W2155502922","https://openalex.org/W2159044466","https://openalex.org/W2159569822","https://openalex.org/W2166843196","https://openalex.org/W2166903221","https://openalex.org/W2167967623","https://openalex.org/W2171132436","https://openalex.org/W2176092132","https://openalex.org/W2265943583","https://openalex.org/W2291086031","https://openalex.org/W2294834651","https://openalex.org/W2328117025","https://openalex.org/W2469113795","https://openalex.org/W2478564372","https://openalex.org/W2509811535","https://openalex.org/W2510237566","https://openalex.org/W2514194732","https://openalex.org/W2542492732","https://openalex.org/W2560499269","https://openalex.org/W2561831184","https://openalex.org/W2563344931","https://openalex.org/W2563517738","https://openalex.org/W2564213242","https://openalex.org/W2571552894","https://openalex.org/W2575596603","https://openalex.org/W2585461214","https://openalex.org/W2738233520","https://openalex.org/W2742311918","https://openalex.org/W2743141873","https://openalex.org/W2760670754","https://openalex.org/W2762941404","https://openalex.org/W2775249703","https://openalex.org/W2789418768","https://openalex.org/W2801946776","https://openalex.org/W2805914786","https://openalex.org/W2887625650","https://openalex.org/W2896673944","https://openalex.org/W2920214992","https://openalex.org/W2945116752","https://openalex.org/W2948140810","https://openalex.org/W2948247560","https://openalex.org/W2948618717","https://openalex.org/W2952563576","https://openalex.org/W2980919918","https://openalex.org/W3004427137","https://openalex.org/W3011026293","https://openalex.org/W3013068798","https://openalex.org/W3013758958","https://openalex.org/W3111630877","https://openalex.org/W4249619477","https://openalex.org/W6610813341","https://openalex.org/W6631300679","https://openalex.org/W6641016864","https://openalex.org/W6649483663","https://openalex.org/W6659491261","https://openalex.org/W6668291747","https://openalex.org/W6675039481","https://openalex.org/W6677437190","https://openalex.org/W6684420179","https://openalex.org/W6725434545","https://openalex.org/W6730704693","https://openalex.org/W6731622668"],"related_works":["https://openalex.org/W2907218275","https://openalex.org/W2893668454","https://openalex.org/W2110874379","https://openalex.org/W2533213929","https://openalex.org/W2808957303","https://openalex.org/W4200454289","https://openalex.org/W1938434038","https://openalex.org/W2513708364","https://openalex.org/W2360722331","https://openalex.org/W3036504194"],"abstract_inverted_index":{"Partial":[0],"discharge":[1,129],"(PD)":[2],"as":[3,107,109],"one":[4],"of":[5,8,14,26,46,50,78,100,103,128,139,144,154,184,200],"well-known":[6],"signatures":[7],"defects":[9,106,141],"in":[10,43,69,80,149],"the":[11,47,55,70,75,98],"insulation":[12,44],"system":[13,45,52],"high":[15,81,201],"voltage":[16,82,202],"equipment":[17,145],"has":[18],"been":[19],"studied":[20],"over":[21],"eight":[22],"decades.":[23],"It":[24,169],"is":[25,170],"a":[27,177],"great":[28],"interest":[29],"to":[30,36,59,64,96],"power":[31,51],"grid":[32],"operators":[33],"and":[34,38,86,90,121,130,135,151,158,197],"owners":[35],"identify":[37],"distinguish":[39],"local":[40],"weak":[41],"spots":[42],"key":[48,110],"components":[49],"by":[53,147,189],"using":[54],"obtained":[56],"PD":[57,79,104,111,163,181,186,191],"information":[58,187],"make":[60],"timely":[61],"decision":[62],"thus":[63],"avoid":[65],"any":[66],"unexpected":[67],"failures":[68],"system.":[71],"This":[72],"article":[73],"reviews":[74],"research":[76],"progress":[77],"apparatus,":[83],"including":[84],"motors":[85],"generators,":[87],"cables,":[88],"transformers":[89],"gas":[91],"insulated":[92],"equipment,":[93],"with":[94],"attempts":[95],"assess":[97],"severity":[99],"different":[101],"types":[102],"initiating":[105],"well":[108],"features":[112],"that":[113,172],"can":[114,175],"be":[115],"selected":[116],"for":[117,125,180,194],"classifying":[118],"defects.":[119],"Experimental":[120],"on-site":[122],"test":[123],"results":[124],"each":[126],"type":[127],"defect":[131,155],"associated":[132],"are":[133,166],"summarized":[134],"discussed.":[136],"Also,":[137],"development":[138],"these":[140],"during":[142],"operation":[143],"caused":[146],"changes":[148],"physical":[150],"chemical":[152],"parameters":[153],"and/or":[156],"insulation,":[157],"its":[159],"impact":[160],"on":[161],"phase-resolved":[162],"pattern":[164],"variation":[165],"thoroughly":[167],"explained.":[168],"expected":[171],"this":[173],"paper":[174],"provide":[176],"comprehensive":[178],"guideline":[179],"data":[182],"analysis":[183],"available":[185],"extracted":[188],"conventional":[190],"acquisition":[192],"instruments":[193],"both":[195],"engineers":[196],"asset":[198],"managers":[199],"apparatus.":[203]},"counts_by_year":[{"year":2026,"cited_by_count":4},{"year":2025,"cited_by_count":21},{"year":2024,"cited_by_count":23},{"year":2023,"cited_by_count":10},{"year":2022,"cited_by_count":6},{"year":2021,"cited_by_count":1}],"updated_date":"2026-07-15T18:14:33.161393","created_date":"2021-06-07T00:00:00"}