{"id":"https://openalex.org/W3163108159","doi":"https://doi.org/10.1109/access.2021.3079274","title":"The Impact of Control Point Dispersion on Measurement Accuracy in a New Type of Light-Pen Coordinate Measuring System","display_name":"The Impact of Control Point Dispersion on Measurement Accuracy in a New Type of Light-Pen Coordinate Measuring System","publication_year":2021,"publication_date":"2021-01-01","ids":{"openalex":"https://openalex.org/W3163108159","doi":"https://doi.org/10.1109/access.2021.3079274","mag":"3163108159"},"language":"en","primary_location":{"id":"doi:10.1109/access.2021.3079274","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2021.3079274","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/9312710/09427468.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/9312710/09427468.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5024017992","display_name":"Dongri Shan","orcid":"https://orcid.org/0000-0003-2340-596X"},"institutions":[{"id":"https://openalex.org/I152269853","display_name":"Qilu University of Technology","ror":"https://ror.org/04hyzq608","country_code":"CN","type":"education","lineage":["https://openalex.org/I152269853"]},{"id":"https://openalex.org/I4210142748","display_name":"Shandong Academy of Sciences","ror":"https://ror.org/04y8d6y55","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210142748"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Dongri Shan","raw_affiliation_strings":["School of Electronic and Information Engineering, Qilu University of Technology (Shandong Academy of Sciences), Jinan, China"],"raw_orcid":"https://orcid.org/0000-0003-2340-596X","affiliations":[{"raw_affiliation_string":"School of Electronic and Information Engineering, Qilu University of Technology (Shandong Academy of Sciences), Jinan, China","institution_ids":["https://openalex.org/I152269853","https://openalex.org/I4210142748"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101743743","display_name":"Xiao-Dong Bi","orcid":null},"institutions":[{"id":"https://openalex.org/I152269853","display_name":"Qilu University of Technology","ror":"https://ror.org/04hyzq608","country_code":"CN","type":"education","lineage":["https://openalex.org/I152269853"]},{"id":"https://openalex.org/I4210142748","display_name":"Shandong Academy of Sciences","ror":"https://ror.org/04y8d6y55","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210142748"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaodong Bi","raw_affiliation_strings":["School of Mechanical and Automotive Engineering, Qilu University of Technology (Shandong Academy of Sciences), Jinan, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Mechanical and Automotive Engineering, Qilu University of Technology (Shandong Academy of Sciences), Jinan, China","institution_ids":["https://openalex.org/I152269853","https://openalex.org/I4210142748"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100431602","display_name":"Xiaofang Wang","orcid":"https://orcid.org/0000-0002-5603-6411"},"institutions":[{"id":"https://openalex.org/I152269853","display_name":"Qilu University of Technology","ror":"https://ror.org/04hyzq608","country_code":"CN","type":"education","lineage":["https://openalex.org/I152269853"]},{"id":"https://openalex.org/I4210142748","display_name":"Shandong Academy of Sciences","ror":"https://ror.org/04y8d6y55","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210142748"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaofang Wang","raw_affiliation_strings":["School of Electronic and Information Engineering, Qilu University of Technology (Shandong Academy of Sciences), Jinan, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronic and Information Engineering, Qilu University of Technology (Shandong Academy of Sciences), Jinan, China","institution_ids":["https://openalex.org/I152269853","https://openalex.org/I4210142748"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100364068","display_name":"Peng Zhang","orcid":"https://orcid.org/0000-0001-9690-7026"},"institutions":[{"id":"https://openalex.org/I152269853","display_name":"Qilu University of Technology","ror":"https://ror.org/04hyzq608","country_code":"CN","type":"education","lineage":["https://openalex.org/I152269853"]},{"id":"https://openalex.org/I4210142748","display_name":"Shandong Academy of Sciences","ror":"https://ror.org/04y8d6y55","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210142748"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Peng Zhang","raw_affiliation_strings":["School of Electronic and Information Engineering, Qilu University of Technology (Shandong Academy of Sciences), Jinan, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronic and Information Engineering, Qilu University of Technology (Shandong Academy of Sciences), Jinan, China","institution_ids":["https://openalex.org/I152269853","https://openalex.org/I4210142748"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109501848","display_name":"Zhoufang Xu","orcid":null},"institutions":[{"id":"https://openalex.org/I152269853","display_name":"Qilu University of Technology","ror":"https://ror.org/04hyzq608","country_code":"CN","type":"education","lineage":["https://openalex.org/I152269853"]},{"id":"https://openalex.org/I4210142748","display_name":"Shandong Academy of Sciences","ror":"https://ror.org/04y8d6y55","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210142748"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhoufang Xu","raw_affiliation_strings":["School of Electronic and Information Engineering, Qilu University of Technology (Shandong Academy of Sciences), Jinan, China"],"raw_orcid":"https://orcid.org/0000-0001-7660-1206","affiliations":[{"raw_affiliation_string":"School of Electronic and Information Engineering, Qilu University of Technology (Shandong Academy of Sciences), Jinan, China","institution_ids":["https://openalex.org/I152269853","https://openalex.org/I4210142748"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100673799","display_name":"Han Min","orcid":"https://orcid.org/0009-0009-7560-0522"},"institutions":[{"id":"https://openalex.org/I152269853","display_name":"Qilu University of Technology","ror":"https://ror.org/04hyzq608","country_code":"CN","type":"education","lineage":["https://openalex.org/I152269853"]},{"id":"https://openalex.org/I4210142748","display_name":"Shandong Academy of Sciences","ror":"https://ror.org/04y8d6y55","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210142748"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Min Han","raw_affiliation_strings":["School of Electronic and Information Engineering, Qilu University of Technology (Shandong Academy of Sciences), Jinan, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronic and Information Engineering, Qilu University of Technology (Shandong Academy of Sciences), Jinan, China","institution_ids":["https://openalex.org/I152269853","https://openalex.org/I4210142748"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100355927","display_name":"Yang Liu","orcid":"https://orcid.org/0000-0002-5543-9235"},"institutions":[{"id":"https://openalex.org/I194450716","display_name":"Jilin University","ror":"https://ror.org/00js3aw79","country_code":"CN","type":"education","lineage":["https://openalex.org/I194450716"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yang Liu","raw_affiliation_strings":["College of Instrumentation and Electrical Engineering, Jilin University, Changchun, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Instrumentation and Electrical Engineering, Jilin University, Changchun, China","institution_ids":["https://openalex.org/I194450716"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100395015","display_name":"Chenglong Zhang","orcid":"https://orcid.org/0009-0003-0002-5128"},"institutions":[{"id":"https://openalex.org/I152269853","display_name":"Qilu University of Technology","ror":"https://ror.org/04hyzq608","country_code":"CN","type":"education","lineage":["https://openalex.org/I152269853"]},{"id":"https://openalex.org/I4210142748","display_name":"Shandong Academy of Sciences","ror":"https://ror.org/04y8d6y55","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210142748"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chenglong Zhang","raw_affiliation_strings":["School of Mechanical and Automotive Engineering, Qilu University of Technology (Shandong Academy of Sciences), Jinan, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Mechanical and Automotive Engineering, Qilu University of Technology (Shandong Academy of Sciences), Jinan, China","institution_ids":["https://openalex.org/I152269853","https://openalex.org/I4210142748"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5091208853","display_name":"Yalu Xu","orcid":null},"institutions":[{"id":"https://openalex.org/I152269853","display_name":"Qilu University of Technology","ror":"https://ror.org/04hyzq608","country_code":"CN","type":"education","lineage":["https://openalex.org/I152269853"]},{"id":"https://openalex.org/I4210142748","display_name":"Shandong Academy of Sciences","ror":"https://ror.org/04y8d6y55","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210142748"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yalu Xu","raw_affiliation_strings":["School of Mechanical and Automotive Engineering, Qilu University of Technology (Shandong Academy of Sciences), Jinan, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Mechanical and Automotive Engineering, Qilu University of Technology (Shandong Academy of Sciences), Jinan, China","institution_ids":["https://openalex.org/I152269853","https://openalex.org/I4210142748"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.3615,"has_fulltext":true,"cited_by_count":6,"citation_normalized_percentile":{"value":0.55058116,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":97},"biblio":{"volume":"9","issue":null,"first_page":"76015","last_page":"76023"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14158","display_name":"Optical Systems and Laser Technology","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/repeatability","display_name":"Repeatability","score":0.8073567152023315},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.6388702392578125},{"id":"https://openalex.org/keywords/coordinate-measuring-machine","display_name":"Coordinate-measuring machine","score":0.6290151476860046},{"id":"https://openalex.org/keywords/system-of-measurement","display_name":"System of measurement","score":0.6176348924636841},{"id":"https://openalex.org/keywords/dispersion","display_name":"Dispersion (optics)","score":0.5745607614517212},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.5114761590957642},{"id":"https://openalex.org/keywords/point","display_name":"Point (geometry)","score":0.5012192726135254},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4791366755962372},{"id":"https://openalex.org/keywords/accuracy-and-precision","display_name":"Accuracy and precision","score":0.4390294551849365},{"id":"https://openalex.org/keywords/observational-error","display_name":"Observational error","score":0.4355641007423401},{"id":"https://openalex.org/keywords/software-portability","display_name":"Software portability","score":0.4314803183078766},{"id":"https://openalex.org/keywords/coordinate-system","display_name":"Coordinate system","score":0.4309063255786896},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.28443625569343567},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.28235095739364624},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.20062479376792908},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.083855539560318},{"id":"https://openalex.org/keywords/geometry","display_name":"Geometry","score":0.07199010252952576}],"concepts":[{"id":"https://openalex.org/C154020017","wikidata":"https://www.wikidata.org/wiki/Q520171","display_name":"Repeatability","level":2,"score":0.8073567152023315},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.6388702392578125},{"id":"https://openalex.org/C2777511293","wikidata":"https://www.wikidata.org/wiki/Q1426871","display_name":"Coordinate-measuring machine","level":2,"score":0.6290151476860046},{"id":"https://openalex.org/C37649242","wikidata":"https://www.wikidata.org/wiki/Q932268","display_name":"System of measurement","level":2,"score":0.6176348924636841},{"id":"https://openalex.org/C177562468","wikidata":"https://www.wikidata.org/wiki/Q182893","display_name":"Dispersion (optics)","level":2,"score":0.5745607614517212},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.5114761590957642},{"id":"https://openalex.org/C28719098","wikidata":"https://www.wikidata.org/wiki/Q44946","display_name":"Point (geometry)","level":2,"score":0.5012192726135254},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4791366755962372},{"id":"https://openalex.org/C202799725","wikidata":"https://www.wikidata.org/wiki/Q272035","display_name":"Accuracy and precision","level":2,"score":0.4390294551849365},{"id":"https://openalex.org/C19619285","wikidata":"https://www.wikidata.org/wiki/Q196372","display_name":"Observational error","level":2,"score":0.4355641007423401},{"id":"https://openalex.org/C63000827","wikidata":"https://www.wikidata.org/wiki/Q3080428","display_name":"Software portability","level":2,"score":0.4314803183078766},{"id":"https://openalex.org/C80551277","wikidata":"https://www.wikidata.org/wiki/Q11210","display_name":"Coordinate system","level":2,"score":0.4309063255786896},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.28443625569343567},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.28235095739364624},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.20062479376792908},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.083855539560318},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.07199010252952576},{"id":"https://openalex.org/C1276947","wikidata":"https://www.wikidata.org/wiki/Q333","display_name":"Astronomy","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2021.3079274","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2021.3079274","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/9312710/09427468.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:c28f56d302f042cd9830ec77177f65d3","is_oa":true,"landing_page_url":"https://doaj.org/article/c28f56d302f042cd9830ec77177f65d3","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 9, Pp 76015-76023 (2021)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2021.3079274","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2021.3079274","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/9312710/09427468.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G4602689998","display_name":null,"funder_award_id":"J18KA345","funder_id":"https://openalex.org/F4320329039","funder_display_name":"Project of Shandong Province Higher Educational Science and Technology Program"},{"id":"https://openalex.org/G7911751003","display_name":null,"funder_award_id":"ZR2020MF138","funder_id":"https://openalex.org/F4320324174","funder_display_name":"Natural Science Foundation of Shandong Province"}],"funders":[{"id":"https://openalex.org/F4320324174","display_name":"Natural Science Foundation of Shandong Province","ror":null},{"id":"https://openalex.org/F4320329039","display_name":"Project of Shandong Province Higher Educational Science and Technology Program","ror":null}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W3163108159.pdf","grobid_xml":"https://content.openalex.org/works/W3163108159.grobid-xml"},"referenced_works_count":15,"referenced_works":["https://openalex.org/W1992969044","https://openalex.org/W2024875370","https://openalex.org/W2030665317","https://openalex.org/W2035890486","https://openalex.org/W2044000854","https://openalex.org/W2046544025","https://openalex.org/W2057185870","https://openalex.org/W2080782567","https://openalex.org/W2086093720","https://openalex.org/W2087136449","https://openalex.org/W2146132885","https://openalex.org/W2326613171","https://openalex.org/W2329266853","https://openalex.org/W2578892009","https://openalex.org/W4238893685"],"related_works":["https://openalex.org/W2922366714","https://openalex.org/W784500383","https://openalex.org/W2078914717","https://openalex.org/W4322703778","https://openalex.org/W2364609529","https://openalex.org/W3112895143","https://openalex.org/W2037392885","https://openalex.org/W2907071475","https://openalex.org/W2043595074","https://openalex.org/W2383833818"],"abstract_inverted_index":{"Light-pen":[0],"coordinate":[1,39],"measuring":[2,40],"machines":[3],"are":[4,70],"widely":[5],"used":[6],"due":[7],"to":[8,77,129],"their":[9,82],"portability;":[10],"however,":[11],"the":[12,28,89,98,101,113,118,121,132],"measurement":[13,35,102,106,114],"accuracy":[14],"is":[15,42,57,75],"affected":[16],"by":[17],"camera":[18],"calibration,":[19,22],"light-pen":[20,38,91],"probe":[21],"control":[23,31,54,67,79,122,133],"points,":[24],"etc.":[25],"To":[26],"study":[27],"influence":[29],"of":[30,53,100,120],"point":[32,55,68,123,134],"dispersion":[33,124,135],"on":[34,60],"accuracy,":[36],"a":[37,50,137],"system":[41],"constructed":[43],"in":[44],"this":[45,48,61],"paper.":[46],"In":[47],"system,":[49],"new":[51],"type":[52],"distribution":[56],"designed.":[58],"Based":[59],"distribution,":[62],"five":[63,90,109],"light-pens":[64,110],"with":[65,81,117],"different":[66],"dispersions":[69],"created":[71],"and":[72],"an":[73],"algorithm":[74],"proposed":[76],"match":[78],"points":[80],"images.":[83],"The":[84,104],"experimental":[85,105],"repeatability":[86],"results":[87,107],"for":[88,108],"probes":[92],"indicate":[93],"satisfactory":[94],"repeatability,":[95],"which":[96],"ensures":[97],"effectiveness":[99],"results.":[103],"demonstrate":[111],"that":[112],"error":[115],"decreases":[116],"decline":[119],"at":[125],"first,":[126],"but":[127],"begins":[128],"increase":[130],"when":[131],"reaches":[136],"certain":[138],"value.":[139]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2022,"cited_by_count":3}],"updated_date":"2026-07-22T07:51:19.307946","created_date":"2025-10-10T00:00:00"}