{"id":"https://openalex.org/W3159163696","doi":"https://doi.org/10.1109/access.2021.3075974","title":"Reliability Modeling of Multistate Degraded Power Electronic Converters With Simultaneous Exposure to Dependent Competing Failure Processes","display_name":"Reliability Modeling of Multistate Degraded Power Electronic Converters With Simultaneous Exposure to Dependent Competing Failure Processes","publication_year":2021,"publication_date":"2021-01-01","ids":{"openalex":"https://openalex.org/W3159163696","doi":"https://doi.org/10.1109/access.2021.3075974","mag":"3159163696"},"language":"en","primary_location":{"id":"doi:10.1109/access.2021.3075974","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2021.3075974","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1109/access.2021.3075974","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5033179177","display_name":"Vahid Samavatian","orcid":"https://orcid.org/0000-0002-7365-3032"},"institutions":[{"id":"https://openalex.org/I133529467","display_name":"Sharif University of Technology","ror":"https://ror.org/024c2fq17","country_code":"IR","type":"education","lineage":["https://openalex.org/I133529467"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"Vahid Samavatian","raw_affiliation_strings":["School of Electrical Engineering, Sharif University of Technology, Tehran, Iran"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Sharif University of Technology, Tehran, Iran","institution_ids":["https://openalex.org/I133529467"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5038158100","display_name":"Mahmud Fotuhi\u2010Firuzabad","orcid":"https://orcid.org/0000-0002-5507-9938"},"institutions":[{"id":"https://openalex.org/I133529467","display_name":"Sharif University of Technology","ror":"https://ror.org/024c2fq17","country_code":"IR","type":"education","lineage":["https://openalex.org/I133529467"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"Mahmud Fotuhi-Firuzabad","raw_affiliation_strings":["School of Electrical Engineering, Sharif University of Technology, Tehran, Iran"],"raw_orcid":"https://orcid.org/0000-0002-5507-9938","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Sharif University of Technology, Tehran, Iran","institution_ids":["https://openalex.org/I133529467"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084130452","display_name":"Payman Dehghanian","orcid":"https://orcid.org/0000-0003-2237-4284"},"institutions":[{"id":"https://openalex.org/I193531525","display_name":"George Washington University","ror":"https://ror.org/00y4zzh67","country_code":"US","type":"education","lineage":["https://openalex.org/I193531525"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Payman Dehghanian","raw_affiliation_strings":["The George Washington University, Washington, DC, USA"],"raw_orcid":"https://orcid.org/0000-0003-2237-4284","affiliations":[{"raw_affiliation_string":"The George Washington University, Washington, DC, USA","institution_ids":["https://openalex.org/I193531525"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5039395705","display_name":"Frede Blaabjerg","orcid":"https://orcid.org/0000-0001-8311-7412"},"institutions":[{"id":"https://openalex.org/I891191580","display_name":"Aalborg University","ror":"https://ror.org/04m5j1k67","country_code":"DK","type":"education","lineage":["https://openalex.org/I891191580"]}],"countries":["DK"],"is_corresponding":false,"raw_author_name":"Frede Blaabjerg","raw_affiliation_strings":["Aalborg University, Aalborg, Denmark"],"raw_orcid":"https://orcid.org/0000-0001-8311-7412","affiliations":[{"raw_affiliation_string":"Aalborg University, Aalborg, Denmark","institution_ids":["https://openalex.org/I891191580"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":1.2785,"has_fulltext":false,"cited_by_count":14,"citation_normalized_percentile":{"value":0.79158424,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":98},"biblio":{"volume":"9","issue":null,"first_page":"67096","last_page":"67108"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10663","display_name":"Advanced Battery Technologies Research","score":0.9968000054359436,"subfield":{"id":"https://openalex.org/subfields/2203","display_name":"Automotive Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9925000071525574,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.8239184617996216},{"id":"https://openalex.org/keywords/converters","display_name":"Converters","score":0.7366652488708496},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.7296836376190186},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6766276359558105},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.6730456352233887},{"id":"https://openalex.org/keywords/monte-carlo-method","display_name":"Monte Carlo method","score":0.6211357116699219},{"id":"https://openalex.org/keywords/interdependence","display_name":"Interdependence","score":0.6007592082023621},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.5832263231277466},{"id":"https://openalex.org/keywords/catastrophic-failure","display_name":"Catastrophic failure","score":0.427661657333374},{"id":"https://openalex.org/keywords/vibration","display_name":"Vibration","score":0.4131240248680115},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1860775649547577},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.1105201244354248},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.0744946300983429}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.8239184617996216},{"id":"https://openalex.org/C2778422915","wikidata":"https://www.wikidata.org/wiki/Q10302051","display_name":"Converters","level":3,"score":0.7366652488708496},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.7296836376190186},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6766276359558105},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.6730456352233887},{"id":"https://openalex.org/C19499675","wikidata":"https://www.wikidata.org/wiki/Q232207","display_name":"Monte Carlo method","level":2,"score":0.6211357116699219},{"id":"https://openalex.org/C185874996","wikidata":"https://www.wikidata.org/wiki/Q269699","display_name":"Interdependence","level":2,"score":0.6007592082023621},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.5832263231277466},{"id":"https://openalex.org/C112987892","wikidata":"https://www.wikidata.org/wiki/Q5051574","display_name":"Catastrophic failure","level":2,"score":0.427661657333374},{"id":"https://openalex.org/C198394728","wikidata":"https://www.wikidata.org/wiki/Q3695508","display_name":"Vibration","level":2,"score":0.4131240248680115},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1860775649547577},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.1105201244354248},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0744946300983429},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C17744445","wikidata":"https://www.wikidata.org/wiki/Q36442","display_name":"Political science","level":0,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C199539241","wikidata":"https://www.wikidata.org/wiki/Q7748","display_name":"Law","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/access.2021.3075974","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2021.3075974","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:pure.atira.dk:openaire/90630d04-f8f7-41f1-8e75-4fd8f0a3a776","is_oa":true,"landing_page_url":"https://vbn.aau.dk/da/publications/90630d04-f8f7-41f1-8e75-4fd8f0a3a776","pdf_url":null,"source":{"id":"https://openalex.org/S4306401731","display_name":"VBN Forskningsportal (Aalborg Universitet)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I891191580","host_organization_name":"Aalborg University","host_organization_lineage":["https://openalex.org/I891191580"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Samavatian, V, Fotuhi-Firuzabad, M, Dehghanian, P & Blaabjerg, F 2021, 'Reliability Modeling of Multistate Degraded Power Electronic Converters With Simultaneous Exposure to Dependent Competing Failure Processes', IEEE Access, vol. 9, 9416647, pp. 67096 - 67108. https://doi.org/10.1109/ACCESS.2021.3075974","raw_type":"info:eu-repo/semantics/publishedVersion"},{"id":"pmh:oai:doaj.org/article:698e31d0f3a544309ec6ff920496967d","is_oa":true,"landing_page_url":"https://doaj.org/article/698e31d0f3a544309ec6ff920496967d","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 9, Pp 67096-67108 (2021)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2021.3075974","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2021.3075974","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320322243","display_name":"Iran National Science Foundation","ror":"https://ror.org/03sr1ma14"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":49,"referenced_works":["https://openalex.org/W1550064664","https://openalex.org/W1561528710","https://openalex.org/W1712905379","https://openalex.org/W1734021823","https://openalex.org/W1968904586","https://openalex.org/W1970244919","https://openalex.org/W1988264848","https://openalex.org/W2070645909","https://openalex.org/W2098917156","https://openalex.org/W2114087231","https://openalex.org/W2128452094","https://openalex.org/W2131698157","https://openalex.org/W2137244660","https://openalex.org/W2170542765","https://openalex.org/W2177739751","https://openalex.org/W2341945573","https://openalex.org/W2503613079","https://openalex.org/W2515348268","https://openalex.org/W2528015045","https://openalex.org/W2538479000","https://openalex.org/W2589081455","https://openalex.org/W2604697518","https://openalex.org/W2611848954","https://openalex.org/W2612683543","https://openalex.org/W2755161669","https://openalex.org/W2763838080","https://openalex.org/W2765240847","https://openalex.org/W2769824988","https://openalex.org/W2789514784","https://openalex.org/W2804537246","https://openalex.org/W2807135853","https://openalex.org/W2809821922","https://openalex.org/W2883006642","https://openalex.org/W2883606902","https://openalex.org/W2884957744","https://openalex.org/W2887207409","https://openalex.org/W2888528082","https://openalex.org/W2891645339","https://openalex.org/W2895494330","https://openalex.org/W2964837561","https://openalex.org/W2967599201","https://openalex.org/W2968402075","https://openalex.org/W2972587433","https://openalex.org/W2972829688","https://openalex.org/W2977856316","https://openalex.org/W2984394008","https://openalex.org/W3006077548","https://openalex.org/W6752986212","https://openalex.org/W6768319031"],"related_works":["https://openalex.org/W631083485","https://openalex.org/W2139079562","https://openalex.org/W2749324135","https://openalex.org/W4313452936","https://openalex.org/W2097026685","https://openalex.org/W2480068220","https://openalex.org/W2070883797","https://openalex.org/W4386859288","https://openalex.org/W2102542442","https://openalex.org/W2160537125"],"abstract_inverted_index":{"Depending":[0],"on":[1,26],"the":[2,16,55,66,128,132,137,154],"application":[3],"in":[4,33,100,131],"which":[5,145],"power":[6],"electronic":[7],"converters":[8],"(PECs)":[9],"are":[10,93],"deployed,":[11],"failure":[12,36,88,133,142],"processes":[13,51,134],"may":[14,52,146],"endanger":[15],"desirable":[17],"performance":[18,139],"of":[19,29,58,76,86,140],"PECs.":[20],"This":[21],"paper":[22],"offers":[23],"holistic":[24],"insights":[25],"reliability":[27,74,138],"modeling":[28],"PECs":[30,77],"considering":[31],"dependencies":[32],"two":[34],"simultaneous":[35,87],"processes,":[37],"namely":[38],"gradual":[39,49,108],"wearing-out":[40,109],"degradation":[41,50],"and":[42,48,110,153,157],"vibration":[43,111],"sudden":[44,47,112],"degradation.":[45],"While":[46],"individually":[53],"affect":[54],"useful":[56,150],"lifetime":[57,151],"PECs,":[59,141],"their":[60],"mutual":[61,84,129],"interdependencies":[62],"could":[63],"significantly":[64],"accelerate":[65],"aging":[67],"mechanisms.":[68],"A":[69],"new":[70],"analytical":[71],"model":[72],"for":[73],"assessment":[75],"is":[78,123],"proposed":[79,91],"that":[80],"can":[81],"capture":[82],"such":[83],"interdependence":[85,130],"processes.":[89],"The":[90],"analytics":[92],"applied":[94],"to":[95,106,124,143,148],"a":[96,101],"DC-DC":[97],"boost":[98],"converter":[99],"hybrid":[102],"electric":[103],"vehicle":[104],"exposed":[105],"both":[107],"degradations.":[113],"Monte":[114],"Carlo-aided":[115],"numerical":[116],"results":[117],"will":[118],"demonstrate":[119],"how":[120],"critical":[121],"it":[122],"take":[125],"into":[126],"account":[127],"when":[135],"assessing":[136],"do":[144],"lead":[147],"inaccurate":[149],"estimations":[152],"corresponding":[155],"maintenance":[156],"replacement":[158],"decisions.":[159]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":5},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}