{"id":"https://openalex.org/W3159372937","doi":"https://doi.org/10.1109/access.2021.3075429","title":"AI-Powered Terahertz VLSI Testing Technology for Ensuring Hardware Security and Reliability","display_name":"AI-Powered Terahertz VLSI Testing Technology for Ensuring Hardware Security and Reliability","publication_year":2021,"publication_date":"2021-01-01","ids":{"openalex":"https://openalex.org/W3159372937","doi":"https://doi.org/10.1109/access.2021.3075429","mag":"3159372937"},"language":"en","primary_location":{"id":"doi:10.1109/access.2021.3075429","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2021.3075429","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/9312710/09415742.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/9312710/09415742.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5042210846","display_name":"Naznin Akter","orcid":"https://orcid.org/0000-0003-1094-5318"},"institutions":[{"id":"https://openalex.org/I19700959","display_name":"Florida International University","ror":"https://ror.org/02gz6gg07","country_code":"US","type":"education","lineage":["https://openalex.org/I19700959"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Naznin Akter","raw_affiliation_strings":["Florida International University, Miami, FL, USA"],"affiliations":[{"raw_affiliation_string":"Florida International University, Miami, FL, USA","institution_ids":["https://openalex.org/I19700959"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5090055013","display_name":"Masudur R. Siddiquee","orcid":"https://orcid.org/0000-0003-4149-6260"},"institutions":[{"id":"https://openalex.org/I19700959","display_name":"Florida International University","ror":"https://ror.org/02gz6gg07","country_code":"US","type":"education","lineage":["https://openalex.org/I19700959"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Masudur R. Siddiquee","raw_affiliation_strings":["Florida International University, Miami, FL, USA"],"affiliations":[{"raw_affiliation_string":"Florida International University, Miami, FL, USA","institution_ids":["https://openalex.org/I19700959"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070091935","display_name":"M. S. Shur","orcid":"https://orcid.org/0000-0003-0976-6232"},"institutions":[{"id":"https://openalex.org/I4210136895","display_name":"Institute for the Future","ror":"https://ror.org/049tcsg76","country_code":"US","type":"nonprofit","lineage":["https://openalex.org/I4210136895"]},{"id":"https://openalex.org/I165799507","display_name":"Rensselaer Polytechnic Institute","ror":"https://ror.org/01rtyzb94","country_code":"US","type":"education","lineage":["https://openalex.org/I165799507"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Michael Shur","raw_affiliation_strings":["Electronics of the Future, Inc., Vienna, VA, USA","Rensselaer Polytechnic Institute, Troy, NY, USA"],"affiliations":[{"raw_affiliation_string":"Electronics of the Future, Inc., Vienna, VA, USA","institution_ids":["https://openalex.org/I4210136895"]},{"raw_affiliation_string":"Rensselaer Polytechnic Institute, Troy, NY, USA","institution_ids":["https://openalex.org/I165799507"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5054557438","display_name":"Nezih Pala","orcid":"https://orcid.org/0000-0001-6136-9811"},"institutions":[{"id":"https://openalex.org/I19700959","display_name":"Florida International University","ror":"https://ror.org/02gz6gg07","country_code":"US","type":"education","lineage":["https://openalex.org/I19700959"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Nezih Pala","raw_affiliation_strings":["Florida International University, Miami, FL, USA"],"affiliations":[{"raw_affiliation_string":"Florida International University, Miami, FL, USA","institution_ids":["https://openalex.org/I19700959"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5042210846"],"corresponding_institution_ids":["https://openalex.org/I19700959"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.8022,"has_fulltext":true,"cited_by_count":13,"citation_normalized_percentile":{"value":0.71164394,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"9","issue":null,"first_page":"64499","last_page":"64509"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10752","display_name":"Terahertz technology and applications","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10752","display_name":"Terahertz technology and applications","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12357","display_name":"Digital Media Forensic Detection","score":0.9861000180244446,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7361602187156677},{"id":"https://openalex.org/keywords/terahertz-radiation","display_name":"Terahertz radiation","score":0.7289605140686035},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.641857385635376},{"id":"https://openalex.org/keywords/convolutional-neural-network","display_name":"Convolutional neural network","score":0.5946285128593445},{"id":"https://openalex.org/keywords/hardware-security-module","display_name":"Hardware security module","score":0.50672847032547},{"id":"https://openalex.org/keywords/counterfeit","display_name":"Counterfeit","score":0.5059460997581482},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.49913740158081055},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4911050796508789},{"id":"https://openalex.org/keywords/key","display_name":"Key (lock)","score":0.44977518916130066},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.3409661650657654},{"id":"https://openalex.org/keywords/computer-security","display_name":"Computer security","score":0.18920370936393738},{"id":"https://openalex.org/keywords/cryptography","display_name":"Cryptography","score":0.16521331667900085}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7361602187156677},{"id":"https://openalex.org/C107816215","wikidata":"https://www.wikidata.org/wiki/Q647887","display_name":"Terahertz radiation","level":2,"score":0.7289605140686035},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.641857385635376},{"id":"https://openalex.org/C81363708","wikidata":"https://www.wikidata.org/wiki/Q17084460","display_name":"Convolutional neural network","level":2,"score":0.5946285128593445},{"id":"https://openalex.org/C39217717","wikidata":"https://www.wikidata.org/wiki/Q1432354","display_name":"Hardware security module","level":3,"score":0.50672847032547},{"id":"https://openalex.org/C2779356469","wikidata":"https://www.wikidata.org/wiki/Q502918","display_name":"Counterfeit","level":2,"score":0.5059460997581482},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.49913740158081055},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4911050796508789},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.44977518916130066},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3409661650657654},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.18920370936393738},{"id":"https://openalex.org/C178489894","wikidata":"https://www.wikidata.org/wiki/Q8789","display_name":"Cryptography","level":2,"score":0.16521331667900085},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C17744445","wikidata":"https://www.wikidata.org/wiki/Q36442","display_name":"Political science","level":0,"score":0.0},{"id":"https://openalex.org/C199539241","wikidata":"https://www.wikidata.org/wiki/Q7748","display_name":"Law","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2021.3075429","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2021.3075429","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/9312710/09415742.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:b941f5e9bd66481f8f171ee68b77ef48","is_oa":true,"landing_page_url":"https://doaj.org/article/b941f5e9bd66481f8f171ee68b77ef48","pdf_url":null,"source":{"id":"https://openalex.org/S112646816","display_name":"SHILAP Revista de lepidopterolog\u00eda","issn_l":"0300-5267","issn":["0300-5267","2340-4078"],"is_oa":true,"is_in_doaj":true,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 9, Pp 64499-64509 (2021)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2021.3075429","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2021.3075429","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/9312710/09415742.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1472576877","display_name":null,"funder_award_id":"FA864919PA080","funder_id":"https://openalex.org/F4320338294","funder_display_name":"Air Force Research Laboratory"}],"funders":[{"id":"https://openalex.org/F4320315781","display_name":"Small Business Technology Transfer","ror":null},{"id":"https://openalex.org/F4320332467","display_name":"U.S. Air Force","ror":"https://ror.org/006gmme17"},{"id":"https://openalex.org/F4320338294","display_name":"Air Force Research Laboratory","ror":"https://ror.org/02e2egq70"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W3159372937.pdf","grobid_xml":"https://content.openalex.org/works/W3159372937.grobid-xml"},"referenced_works_count":79,"referenced_works":["https://openalex.org/W156667454","https://openalex.org/W284784117","https://openalex.org/W637779802","https://openalex.org/W1536283017","https://openalex.org/W1548432142","https://openalex.org/W1853602997","https://openalex.org/W1904882237","https://openalex.org/W1957344903","https://openalex.org/W1969236852","https://openalex.org/W1990745325","https://openalex.org/W2000295462","https://openalex.org/W2006612887","https://openalex.org/W2007071719","https://openalex.org/W2012405133","https://openalex.org/W2018498210","https://openalex.org/W2028827220","https://openalex.org/W2032481968","https://openalex.org/W2039496813","https://openalex.org/W2041726653","https://openalex.org/W2045517249","https://openalex.org/W2048801499","https://openalex.org/W2061682736","https://openalex.org/W2068268167","https://openalex.org/W2068608475","https://openalex.org/W2069679176","https://openalex.org/W2071842200","https://openalex.org/W2087492166","https://openalex.org/W2102662922","https://openalex.org/W2103147428","https://openalex.org/W2107180218","https://openalex.org/W2108190743","https://openalex.org/W2119412956","https://openalex.org/W2119468821","https://openalex.org/W2122111125","https://openalex.org/W2131363360","https://openalex.org/W2132893893","https://openalex.org/W2136446693","https://openalex.org/W2146364505","https://openalex.org/W2146968679","https://openalex.org/W2153218153","https://openalex.org/W2166847303","https://openalex.org/W2174700159","https://openalex.org/W2181228925","https://openalex.org/W2188666919","https://openalex.org/W2212550091","https://openalex.org/W2283577360","https://openalex.org/W2301317970","https://openalex.org/W2310015284","https://openalex.org/W2317275139","https://openalex.org/W2342159889","https://openalex.org/W2402807837","https://openalex.org/W2427149990","https://openalex.org/W2473662816","https://openalex.org/W2490215891","https://openalex.org/W2534779026","https://openalex.org/W2536799508","https://openalex.org/W2547045565","https://openalex.org/W2598144441","https://openalex.org/W2604761449","https://openalex.org/W2609680177","https://openalex.org/W2736258467","https://openalex.org/W2738803669","https://openalex.org/W2809078676","https://openalex.org/W2809344055","https://openalex.org/W2899484839","https://openalex.org/W2919332973","https://openalex.org/W2925813017","https://openalex.org/W2963995368","https://openalex.org/W2986006223","https://openalex.org/W3046421580","https://openalex.org/W3091390970","https://openalex.org/W3108659418","https://openalex.org/W6610331208","https://openalex.org/W6678487124","https://openalex.org/W6681750928","https://openalex.org/W6728810845","https://openalex.org/W6766526025","https://openalex.org/W6781454291","https://openalex.org/W6786273777"],"related_works":["https://openalex.org/W3191226418","https://openalex.org/W2357749344","https://openalex.org/W4323356230","https://openalex.org/W2362200800","https://openalex.org/W1539823648","https://openalex.org/W4290078996","https://openalex.org/W3113783116","https://openalex.org/W4372352523","https://openalex.org/W1579156572","https://openalex.org/W4233184255"],"abstract_inverted_index":{"Hardware":[0],"cybersecurity":[1],"has":[2],"become":[3],"a":[4,20,58,113,117,124,136,174],"key":[5],"issue,":[6],"especially":[7],"for":[8,63,102],"very":[9],"large":[10],"integrated":[11],"circuits.":[12],"If":[13],"counterfeit,":[14,69],"forged,":[15],"or":[16,72,156],"defective":[17,73],"ICs":[18,74,158],"present":[19],"significant":[21],"threat":[22],"to":[23,42,46,79,141],"system":[24],"reliability":[25,51],"and":[26,33,48,52,65,82,89],"security.":[27],"The":[28,167],"growing":[29],"complexity":[30],"of":[31,54,68,116],"digital":[32],"mixed-signal":[34],"systems":[35],"makes":[36],"it":[37],"increasingly":[38],"challenging":[39],"yet":[40],"vital":[41],"develop":[43],"robust":[44],"methods":[45],"assess":[47],"confirm":[49],"the":[50,86,91,110,130,143,163],"authenticity":[53],"ICs.":[55,103],"We":[56,104],"introduce":[57],"new":[59],"terahertz":[60,81,126],"testing":[61],"method":[62],"non-destructive":[64],"unobtrusive":[66],"identification":[67],"damaged,":[70],"forged":[71],"by":[75,108,123,161],"measuring":[76,109],"their":[77],"response":[78,92,111],"incident":[80],"sub-terahertz":[83],"radiation":[84],"at":[85],"circuit":[87],"pins":[88],"analyzing":[90],"using":[93],"artificial":[94],"intelligence":[95],"(AI).":[96],"These":[97],"responses":[98],"create":[99],"unique":[100],"signatures":[101],"generated":[105,160],"2D":[106],"images":[107],"on":[112],"selected":[114],"pin":[115],"radio":[118],"frequency":[119],"IC":[120],"(RFIC)":[121],"scanned":[122],"focused":[125],"radiation.":[127],"By":[128],"applying":[129],"data":[131,139,152],"augmentation":[132],"processes,":[133],"we":[134],"created":[135],"secure":[137,171],"image":[138,151,165],"set":[140,153],"train":[142],"convolutional":[144],"neural":[145],"network":[146],"(CNN)":[147],"model.":[148],"An":[149],"unsecured":[150],"representing":[154],"altered":[155],"damaged":[157],"was":[159],"modifying":[162],"original":[164],"data.":[166],"trained":[168],"models":[169],"identified":[170],"devices":[172],"with":[173],"~94%":[175],"accuracy.":[176]},"counts_by_year":[{"year":2025,"cited_by_count":5},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":4},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}