{"id":"https://openalex.org/W3155499336","doi":"https://doi.org/10.1109/access.2021.3074464","title":"Comparative Analysis of Ultra-Low Current Measurement Topologies With Implementation in 130 nm Technology","display_name":"Comparative Analysis of Ultra-Low Current Measurement Topologies With Implementation in 130 nm Technology","publication_year":2021,"publication_date":"2021-01-01","ids":{"openalex":"https://openalex.org/W3155499336","doi":"https://doi.org/10.1109/access.2021.3074464","mag":"3155499336"},"language":"en","primary_location":{"id":"doi:10.1109/access.2021.3074464","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2021.3074464","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/9312710/09409046.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/9312710/09409046.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5001293093","display_name":"Sarath Kundumattathil Mohanan","orcid":"https://orcid.org/0000-0001-9053-1179"},"institutions":[{"id":"https://openalex.org/I167360494","display_name":"University of Wuppertal","ror":"https://ror.org/00613ak93","country_code":"DE","type":"education","lineage":["https://openalex.org/I167360494"]},{"id":"https://openalex.org/I67311998","display_name":"European Organization for Nuclear Research","ror":"https://ror.org/01ggx4157","country_code":"CH","type":"facility","lineage":["https://openalex.org/I67311998"]}],"countries":["CH","DE"],"is_corresponding":false,"raw_author_name":"Sarath Kundumattathil Mohanan","raw_affiliation_strings":["HSE-RP-IL, CERN, Geneva, Switzerland","IHCT, University of Wuppertal, Wuppertal, Germany"],"raw_orcid":"https://orcid.org/0000-0001-9053-1179","affiliations":[{"raw_affiliation_string":"HSE-RP-IL, CERN, Geneva, Switzerland","institution_ids":["https://openalex.org/I67311998"]},{"raw_affiliation_string":"IHCT, University of Wuppertal, Wuppertal, Germany","institution_ids":["https://openalex.org/I167360494"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075570602","display_name":"Hamza Boukabache","orcid":"https://orcid.org/0000-0001-6243-8401"},"institutions":[{"id":"https://openalex.org/I67311998","display_name":"European Organization for Nuclear Research","ror":"https://ror.org/01ggx4157","country_code":"CH","type":"facility","lineage":["https://openalex.org/I67311998"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Hamza Boukabache","raw_affiliation_strings":["HSE-RP-IL, CERN, Geneva, Switzerland"],"raw_orcid":"https://orcid.org/0000-0001-6243-8401","affiliations":[{"raw_affiliation_string":"HSE-RP-IL, CERN, Geneva, Switzerland","institution_ids":["https://openalex.org/I67311998"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048057991","display_name":"D. Perrin","orcid":"https://orcid.org/0000-0003-4340-8551"},"institutions":[{"id":"https://openalex.org/I67311998","display_name":"European Organization for Nuclear Research","ror":"https://ror.org/01ggx4157","country_code":"CH","type":"facility","lineage":["https://openalex.org/I67311998"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Daniel Perrin","raw_affiliation_strings":["HSE-RP-IL, CERN, Geneva, Switzerland"],"raw_orcid":"https://orcid.org/0000-0003-4340-8551","affiliations":[{"raw_affiliation_string":"HSE-RP-IL, CERN, Geneva, Switzerland","institution_ids":["https://openalex.org/I67311998"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5029037175","display_name":"Ullrich R. Pfeiffer","orcid":"https://orcid.org/0000-0002-6753-7879"},"institutions":[{"id":"https://openalex.org/I167360494","display_name":"University of Wuppertal","ror":"https://ror.org/00613ak93","country_code":"DE","type":"education","lineage":["https://openalex.org/I167360494"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Ullrich R. Pfeiffer","raw_affiliation_strings":["IHCT, University of Wuppertal, Wuppertal, Germany"],"raw_orcid":"https://orcid.org/0000-0002-6753-7879","affiliations":[{"raw_affiliation_string":"IHCT, University of Wuppertal, Wuppertal, Germany","institution_ids":["https://openalex.org/I167360494"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.562,"has_fulltext":true,"cited_by_count":10,"citation_normalized_percentile":{"value":0.61283883,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"9","issue":null,"first_page":"63855","last_page":"63864"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/dynamic-range","display_name":"Dynamic range","score":0.4930514991283417},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4839456379413605},{"id":"https://openalex.org/keywords/network-topology","display_name":"Network topology","score":0.48141810297966003},{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.4779622256755829},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.47086775302886963},{"id":"https://openalex.org/keywords/range","display_name":"Range (aeronautics)","score":0.4445967972278595},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.43739351630210876},{"id":"https://openalex.org/keywords/dram","display_name":"Dram","score":0.43127983808517456},{"id":"https://openalex.org/keywords/reset","display_name":"Reset (finance)","score":0.4182596802711487},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.41676002740859985},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.3220131993293762},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.20825126767158508},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.17383375763893127},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.16244840621948242},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.15603932738304138}],"concepts":[{"id":"https://openalex.org/C87133666","wikidata":"https://www.wikidata.org/wiki/Q1161699","display_name":"Dynamic range","level":2,"score":0.4930514991283417},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4839456379413605},{"id":"https://openalex.org/C199845137","wikidata":"https://www.wikidata.org/wiki/Q145490","display_name":"Network topology","level":2,"score":0.48141810297966003},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.4779622256755829},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.47086775302886963},{"id":"https://openalex.org/C204323151","wikidata":"https://www.wikidata.org/wiki/Q905424","display_name":"Range (aeronautics)","level":2,"score":0.4445967972278595},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.43739351630210876},{"id":"https://openalex.org/C7366592","wikidata":"https://www.wikidata.org/wiki/Q1255620","display_name":"Dram","level":2,"score":0.43127983808517456},{"id":"https://openalex.org/C2779795794","wikidata":"https://www.wikidata.org/wiki/Q7315343","display_name":"Reset (finance)","level":2,"score":0.4182596802711487},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.41676002740859985},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.3220131993293762},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.20825126767158508},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.17383375763893127},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.16244840621948242},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.15603932738304138},{"id":"https://openalex.org/C106159729","wikidata":"https://www.wikidata.org/wiki/Q2294553","display_name":"Financial economics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/access.2021.3074464","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2021.3074464","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/9312710/09409046.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:7b7ebc3aee2846858ee8db8cefb3cbcc","is_oa":true,"landing_page_url":"https://doaj.org/article/7b7ebc3aee2846858ee8db8cefb3cbcc","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 9, Pp 63855-63864 (2021)","raw_type":"article"},{"id":"pmh:oai:inspirehep.net:1866931","is_oa":true,"landing_page_url":"http://cds.cern.ch/record/2771858","pdf_url":null,"source":{"id":"https://openalex.org/S4306402195","display_name":"CERN Document Server (European Organization for Nuclear Research)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I67311998","host_organization_name":"European Organization for Nuclear Research","host_organization_lineage":["https://openalex.org/I67311998"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":null}],"best_oa_location":{"id":"doi:10.1109/access.2021.3074464","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2021.3074464","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/9312710/09409046.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W3155499336.pdf","grobid_xml":"https://content.openalex.org/works/W3155499336.grobid-xml"},"referenced_works_count":26,"referenced_works":["https://openalex.org/W1486126409","https://openalex.org/W1504593804","https://openalex.org/W1965609522","https://openalex.org/W1989057441","https://openalex.org/W1997315607","https://openalex.org/W2023590790","https://openalex.org/W2030671962","https://openalex.org/W2031920994","https://openalex.org/W2054376731","https://openalex.org/W2060323122","https://openalex.org/W2080024265","https://openalex.org/W2102786825","https://openalex.org/W2126497114","https://openalex.org/W2136562381","https://openalex.org/W2148217193","https://openalex.org/W2187153347","https://openalex.org/W2462819859","https://openalex.org/W2560275326","https://openalex.org/W2595097885","https://openalex.org/W2742038873","https://openalex.org/W2766316565","https://openalex.org/W3025582554","https://openalex.org/W3123629531","https://openalex.org/W6734162034","https://openalex.org/W6745444357","https://openalex.org/W6789116258"],"related_works":["https://openalex.org/W350273603","https://openalex.org/W2393495588","https://openalex.org/W96259911","https://openalex.org/W3120961607","https://openalex.org/W4385608460","https://openalex.org/W2168225754","https://openalex.org/W2370772865","https://openalex.org/W3148568549","https://openalex.org/W2140148117","https://openalex.org/W2319813110"],"abstract_inverted_index":{"Radiation":[0],"detectors":[1],"need":[2],"front-end":[3],"electronics":[4],"capable":[5],"of":[6,19,38,64,152,170],"measuring":[7],"currents":[8,166],"over":[9],"a":[10,101,200],"large":[11],"dynamic":[12,103,150],"range":[13,104,151],"with":[14,105,130,167,194],"femtoampere":[15],"sensitivity.":[16],"The":[17,43,93],"goal":[18],"this":[20,190],"work":[21],"is":[22,47,81,91],"to":[23,27,54,99,121,145,155,182,198],"find":[24],"an":[25,134,168],"alternative":[26],"the":[28,71,110,114,126,139,149,175,180,184,195],"legacy":[29],"systems":[30],"implemented":[31],"using":[32,183],"discrete":[33],"components":[34],"or":[35,41],"technology":[36,46,178,191],"nodes":[37],"350":[39],"nm":[40,45,177],"higher.":[42],"130":[44,176],"evaluated":[48],"on":[49],"its":[50,56],"leakage":[51],"current":[52,67,89,112,203],"performance":[53,86],"assess":[55],"employability":[57],"in":[58,87,109,174,192],"such":[59],"applications.":[60],"A":[61],"comparative":[62],"analysis":[63],"three":[65],"low":[66],"measurement":[68,79,117,204],"topologies,":[69],"namely":[70],"charge":[72,94,140],"balancing,":[73],"reset":[74],"counting,":[75],"and":[76,84,163],"direct":[77,115],"slope":[78,116],"methods,":[80],"carried":[82],"out":[83],"their":[85],"different":[88],"ranges":[90],"evaluated.":[92],"balancing":[95,141],"method":[96,118,142],"was":[97,119,143],"found":[98,120,144],"provide":[100],"better":[102],"greater":[106],"accuracy.":[107,132],"However,":[108],"lower":[111],"range,":[113],"give":[122],"faster":[123],"results":[124],"than":[125],"other":[127],"two":[128],"methods":[129],"comparable":[131],"Also,":[133],"application-specific":[135],"integrated":[136],"circuit":[137],"implementing":[138],"be":[146],"linear":[147],"throughout":[148],"\u22121":[153],"fA":[154],"<inline-formula":[156],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[157],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">":[158],"<tex-math":[159],"notation=\"LaTeX\">$-1\\,\\,\\mu":[160],"\\text{A}$":[161],"</tex-math></inline-formula>":[162],"could":[164],"measure":[165],"accuracy":[169],"\u00b17%.":[171],"This":[172],"achievement":[173],"opens":[179],"way":[181],"high-speed":[185,201],"digital":[186],"cells":[187],"offered":[188],"by":[189],"conjunction":[193],"low-leakage":[196],"transistors":[197],"design":[199],"accurate":[202],"system.":[205]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1}],"updated_date":"2026-07-21T08:15:58.654021","created_date":"2025-10-10T00:00:00"}