{"id":"https://openalex.org/W3134774849","doi":"https://doi.org/10.1109/access.2021.3063157","title":"Control Design and Realization of a Fast Transient Response, High-Reliability DC-DC Converter With a Secondary- Side Control Circuit","display_name":"Control Design and Realization of a Fast Transient Response, High-Reliability DC-DC Converter With a Secondary- Side Control Circuit","publication_year":2021,"publication_date":"2021-01-01","ids":{"openalex":"https://openalex.org/W3134774849","doi":"https://doi.org/10.1109/access.2021.3063157","mag":"3134774849"},"language":"en","primary_location":{"id":"doi:10.1109/access.2021.3063157","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2021.3063157","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/9312710/09366880.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/9312710/09366880.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5052499241","display_name":"Cong Ma","orcid":"https://orcid.org/0000-0002-8838-2909"},"institutions":[{"id":"https://openalex.org/I4210089056","display_name":"Beijing Microelectronics Technology Institute","ror":"https://ror.org/007y7ej30","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210089056"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Cong Ma","raw_affiliation_strings":["Xi’an Microelectronic Technology Institute, Xi’an, China"],"raw_orcid":"https://orcid.org/0000-0002-8838-2909","affiliations":[{"raw_affiliation_string":"Xi’an Microelectronic Technology Institute, Xi’an, China","institution_ids":["https://openalex.org/I4210089056"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5012991757","display_name":"Kai Wang","orcid":"https://orcid.org/0000-0003-0148-1494"},"institutions":[{"id":"https://openalex.org/I4210089056","display_name":"Beijing Microelectronics Technology Institute","ror":"https://ror.org/007y7ej30","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210089056"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Kai Wang","raw_affiliation_strings":["Xi’an Microelectronic Technology Institute, Xi’an, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Xi’an Microelectronic Technology Institute, Xi’an, China","institution_ids":["https://openalex.org/I4210089056"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100377340","display_name":"Junfeng Wang","orcid":"https://orcid.org/0000-0003-0837-7577"},"institutions":[{"id":"https://openalex.org/I4210089056","display_name":"Beijing Microelectronics Technology Institute","ror":"https://ror.org/007y7ej30","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210089056"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jun-Feng Wang","raw_affiliation_strings":["Xi’an Microelectronic Technology Institute, Xi’an, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Xi’an Microelectronic Technology Institute, Xi’an, China","institution_ids":["https://openalex.org/I4210089056"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5052499241"],"corresponding_institution_ids":["https://openalex.org/I4210089056"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.61,"has_fulltext":true,"cited_by_count":7,"citation_normalized_percentile":{"value":0.66208563,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"9","issue":null,"first_page":"36976","last_page":"36985"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10175","display_name":"Advanced DC-DC Converters","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10175","display_name":"Advanced DC-DC Converters","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10663","display_name":"Advanced Battery Technologies Research","score":0.9977999925613403,"subfield":{"id":"https://openalex.org/subfields/2203","display_name":"Automotive Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.717207670211792},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.647111177444458},{"id":"https://openalex.org/keywords/waveform","display_name":"Waveform","score":0.5560271739959717},{"id":"https://openalex.org/keywords/transient-response","display_name":"Transient response","score":0.5360046029090881},{"id":"https://openalex.org/keywords/circuit-reliability","display_name":"Circuit reliability","score":0.4954627752304077},{"id":"https://openalex.org/keywords/converters","display_name":"Converters","score":0.4818755090236664},{"id":"https://openalex.org/keywords/mean-time-between-failures","display_name":"Mean time between failures","score":0.48130738735198975},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4392692744731903},{"id":"https://openalex.org/keywords/circuit-design","display_name":"Circuit design","score":0.4168325662612915},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3931836485862732},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.3565017879009247},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.3484309911727905},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.30698275566101074},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.27909648418426514},{"id":"https://openalex.org/keywords/failure-rate","display_name":"Failure rate","score":0.18220189213752747},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.17265263199806213},{"id":"https://openalex.org/keywords/control","display_name":"Control (management)","score":0.11890015006065369},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.09730857610702515},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.07957214117050171}],"concepts":[{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.717207670211792},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.647111177444458},{"id":"https://openalex.org/C197424946","wikidata":"https://www.wikidata.org/wiki/Q1165717","display_name":"Waveform","level":3,"score":0.5560271739959717},{"id":"https://openalex.org/C85761212","wikidata":"https://www.wikidata.org/wiki/Q1974593","display_name":"Transient response","level":2,"score":0.5360046029090881},{"id":"https://openalex.org/C2778309119","wikidata":"https://www.wikidata.org/wiki/Q5121614","display_name":"Circuit reliability","level":4,"score":0.4954627752304077},{"id":"https://openalex.org/C2778422915","wikidata":"https://www.wikidata.org/wiki/Q10302051","display_name":"Converters","level":3,"score":0.4818755090236664},{"id":"https://openalex.org/C44154001","wikidata":"https://www.wikidata.org/wiki/Q754940","display_name":"Mean time between failures","level":3,"score":0.48130738735198975},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4392692744731903},{"id":"https://openalex.org/C190560348","wikidata":"https://www.wikidata.org/wiki/Q3245116","display_name":"Circuit design","level":2,"score":0.4168325662612915},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3931836485862732},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.3565017879009247},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.3484309911727905},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.30698275566101074},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.27909648418426514},{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.18220189213752747},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.17265263199806213},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.11890015006065369},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.09730857610702515},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.07957214117050171},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2021.3063157","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2021.3063157","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/9312710/09366880.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:4d84567ea0224281b5c98283580c941a","is_oa":true,"landing_page_url":"https://doaj.org/article/4d84567ea0224281b5c98283580c941a","pdf_url":null,"source":{"id":"https://openalex.org/S112646816","display_name":"SHILAP Revista de lepidopterolog\u00eda","issn_l":"0300-5267","issn":["0300-5267","2340-4078"],"is_oa":true,"is_in_doaj":true,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 9, Pp 36976-36985 (2021)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2021.3063157","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2021.3063157","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/9312710/09366880.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.7599999904632568,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W3134774849.pdf","grobid_xml":"https://content.openalex.org/works/W3134774849.grobid-xml"},"referenced_works_count":24,"referenced_works":["https://openalex.org/W1925177484","https://openalex.org/W2050954114","https://openalex.org/W2075568009","https://openalex.org/W2089816332","https://openalex.org/W2099715030","https://openalex.org/W2113698356","https://openalex.org/W2117657076","https://openalex.org/W2123389755","https://openalex.org/W2126713340","https://openalex.org/W2127627041","https://openalex.org/W2131772666","https://openalex.org/W2142144099","https://openalex.org/W2142810380","https://openalex.org/W2145009714","https://openalex.org/W2145229319","https://openalex.org/W2146999447","https://openalex.org/W2168736983","https://openalex.org/W2508942849","https://openalex.org/W2560435022","https://openalex.org/W2582935227","https://openalex.org/W2770240868","https://openalex.org/W3184274129","https://openalex.org/W6730294413","https://openalex.org/W6798249846"],"related_works":["https://openalex.org/W2328269456","https://openalex.org/W3109198837","https://openalex.org/W2138234198","https://openalex.org/W2162592036","https://openalex.org/W2064908981","https://openalex.org/W2086376312","https://openalex.org/W3207781072","https://openalex.org/W1912293800","https://openalex.org/W2351660816","https://openalex.org/W2382335154"],"abstract_inverted_index":{"In":[0],"high-reliability":[1,59,118,148],"applications,":[2],"DC/DC":[3],"converters":[4],"should":[5],"realize":[6],"high-efficiency":[7],"and":[8,18,33,55,78,92,104,108,113,136,147],"fast-transient":[9,146],"in":[10,67],"harsh":[11],"environments.":[12],"Thus,":[13],"the":[14,19,38,51,58,68,125,130,137,145,151],"circuit":[15,28,62,76],"parameter":[16],"design":[17,21,53,77,91],"reliability":[20,90],"are":[22,97,111],"both":[23],"critical.":[24],"The":[25,89,120],"secondary-side":[26,60,74,152],"control":[27,40,61,75,153],"has":[29,43],"a":[30,34,73,84],"faster":[31],"transient":[32,109,132],"simpler":[35],"gate-drive":[36],"than":[37],"primary-side":[39],"circuit,":[41],"which":[42],"been":[44,65],"used":[45],"for":[46,94],"over":[47],"twenty":[48],"years.":[49],"However,":[50],"detailed":[52],"procedure":[54,82],"analysis":[56],"of":[57,150],"have":[63],"not":[64],"presented":[66],"literature.":[69],"This":[70],"article":[71],"introduces":[72],"its":[79,105],"small-signal":[80],"modeling":[81],"with":[83,116],"peak-current-mode-control":[85],"(PCMC)":[86],"forward":[87],"converter.":[88],"evaluation":[93],"thick-film":[95],"converter":[96],"demonstrated.":[98],"A":[99],"100-watt":[100],"prototype":[101],"is":[102,134,141],"manufactured,":[103],"steady-state":[106],"waveforms":[107,110],"tested":[112],"then":[114],"compared":[115],"other":[117],"products.":[119],"experimental":[121],"results":[122],"show":[123],"that":[124],"peak":[126],"efficiency":[127],"reaches":[128],"90.6%;":[129],"load":[131],"response":[133],"330mV/560\u03bcs;":[135],"mean-time-between-failure":[138],"(MTBF)":[139],"value":[140],"481":[142],"kilo-hours,":[143],"proving":[144],"features":[149],"circuit.":[154]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}