{"id":"https://openalex.org/W3133215079","doi":"https://doi.org/10.1109/access.2021.3060950","title":"Improved Markov Model for Reliability Assessment of Isolated Multiple-Switch PWM DC-DC Converters","display_name":"Improved Markov Model for Reliability Assessment of Isolated Multiple-Switch PWM DC-DC Converters","publication_year":2021,"publication_date":"2021-01-01","ids":{"openalex":"https://openalex.org/W3133215079","doi":"https://doi.org/10.1109/access.2021.3060950","mag":"3133215079"},"language":"en","primary_location":{"id":"doi:10.1109/access.2021.3060950","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2021.3060950","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/9312710/09359774.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/9312710/09359774.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5011919966","display_name":"Hadi Tarzamni","orcid":"https://orcid.org/0000-0002-6963-9852"},"institutions":[{"id":"https://openalex.org/I133529467","display_name":"Sharif University of Technology","ror":"https://ror.org/024c2fq17","country_code":"IR","type":"education","lineage":["https://openalex.org/I133529467"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"Hadi Tarzamni","raw_affiliation_strings":["Sharif University of Technology, Tehran, Iran"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Sharif University of Technology, Tehran, Iran","institution_ids":["https://openalex.org/I133529467"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013697622","display_name":"Farzad Tahami","orcid":"https://orcid.org/0000-0002-9729-7263"},"institutions":[{"id":"https://openalex.org/I133529467","display_name":"Sharif University of Technology","ror":"https://ror.org/024c2fq17","country_code":"IR","type":"education","lineage":["https://openalex.org/I133529467"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"Farzad Tahami","raw_affiliation_strings":["Sharif University of Technology, Tehran, Iran"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Sharif University of Technology, Tehran, Iran","institution_ids":["https://openalex.org/I133529467"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5038158100","display_name":"Mahmud Fotuhi\u2010Firuzabad","orcid":"https://orcid.org/0000-0002-5507-9938"},"institutions":[{"id":"https://openalex.org/I133529467","display_name":"Sharif University of Technology","ror":"https://ror.org/024c2fq17","country_code":"IR","type":"education","lineage":["https://openalex.org/I133529467"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"Mahmud Fotuhi-Firuzabad","raw_affiliation_strings":["Sharif University of Technology, Tehran, Iran"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Sharif University of Technology, Tehran, Iran","institution_ids":["https://openalex.org/I133529467"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5039395705","display_name":"Frede Blaabjerg","orcid":"https://orcid.org/0000-0001-8311-7412"},"institutions":[{"id":"https://openalex.org/I891191580","display_name":"Aalborg University","ror":"https://ror.org/04m5j1k67","country_code":"DK","type":"education","lineage":["https://openalex.org/I891191580"]}],"countries":["DK"],"is_corresponding":false,"raw_author_name":"Frede Blaabjerg","raw_affiliation_strings":["Aalborg University, Aalborg, Denmark"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Aalborg University, Aalborg, Denmark","institution_ids":["https://openalex.org/I891191580"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":2.5426,"has_fulltext":true,"cited_by_count":33,"citation_normalized_percentile":{"value":0.89588291,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":"9","issue":null,"first_page":"33666","last_page":"33674"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10663","display_name":"Advanced Battery Technologies Research","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2203","display_name":"Automotive Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10175","display_name":"Advanced DC-DC Converters","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/converters","display_name":"Converters","score":0.8502808809280396},{"id":"https://openalex.org/keywords/pulse-width-modulation","display_name":"Pulse-width modulation","score":0.5819992423057556},{"id":"https://openalex.org/keywords/transformer","display_name":"Transformer","score":0.5687042474746704},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5226181149482727},{"id":"https://openalex.org/keywords/duty-cycle","display_name":"Duty cycle","score":0.5206512808799744},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.49287915229797363},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.4490078091621399},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4190913438796997},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.3458503484725952},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.33125177025794983},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.3267174959182739},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2951674163341522},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.22503656148910522},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.10064589977264404}],"concepts":[{"id":"https://openalex.org/C2778422915","wikidata":"https://www.wikidata.org/wiki/Q10302051","display_name":"Converters","level":3,"score":0.8502808809280396},{"id":"https://openalex.org/C92746544","wikidata":"https://www.wikidata.org/wiki/Q585184","display_name":"Pulse-width modulation","level":3,"score":0.5819992423057556},{"id":"https://openalex.org/C66322947","wikidata":"https://www.wikidata.org/wiki/Q11658","display_name":"Transformer","level":3,"score":0.5687042474746704},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5226181149482727},{"id":"https://openalex.org/C199822604","wikidata":"https://www.wikidata.org/wiki/Q557120","display_name":"Duty cycle","level":3,"score":0.5206512808799744},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.49287915229797363},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.4490078091621399},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4190913438796997},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.3458503484725952},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.33125177025794983},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.3267174959182739},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2951674163341522},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.22503656148910522},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.10064589977264404},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/access.2021.3060950","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2021.3060950","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/9312710/09359774.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:pure.atira.dk:publications/f3b6e219-670d-43c4-94af-b3bbdc15413a","is_oa":true,"landing_page_url":"https://vbn.aau.dk/da/publications/f3b6e219-670d-43c4-94af-b3bbdc15413a","pdf_url":null,"source":{"id":"https://openalex.org/S4306401731","display_name":"VBN Forskningsportal (Aalborg Universitet)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I891191580","host_organization_name":"Aalborg University","host_organization_lineage":["https://openalex.org/I891191580"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Tarzamni, H, Tahami, F, Fotuhi-Firuzabad, M & Blaabjerg, F 2021, 'Improved Markov Model for Reliability Assessment of Isolated Multiple-Switch PWM DC-DC Converters', IEEE Access, vol. 9, 9359774, pp. 33666-33674. https://doi.org/10.1109/ACCESS.2021.3060950","raw_type":"info:eu-repo/semantics/publishedVersion"},{"id":"pmh:oai:doaj.org/article:f7852ff3c01a456cb7cd1ce87865770c","is_oa":true,"landing_page_url":"https://doaj.org/article/f7852ff3c01a456cb7cd1ce87865770c","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 9, Pp 33666-33674 (2021)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2021.3060950","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2021.3060950","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/9312710/09359774.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"score":0.5299999713897705,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320310490","display_name":"Villum Fonden","ror":"https://ror.org/007ww2d15"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W3133215079.pdf","grobid_xml":"https://content.openalex.org/works/W3133215079.grobid-xml"},"referenced_works_count":33,"referenced_works":["https://openalex.org/W1495048553","https://openalex.org/W1543489919","https://openalex.org/W1550064664","https://openalex.org/W2007393355","https://openalex.org/W2023285254","https://openalex.org/W2024109778","https://openalex.org/W2049245504","https://openalex.org/W2054101951","https://openalex.org/W2070645909","https://openalex.org/W2078540822","https://openalex.org/W2148646113","https://openalex.org/W2168162606","https://openalex.org/W2276034344","https://openalex.org/W2333010560","https://openalex.org/W2397134580","https://openalex.org/W2482891568","https://openalex.org/W2539483467","https://openalex.org/W2550831094","https://openalex.org/W2580053122","https://openalex.org/W2591508179","https://openalex.org/W2769208791","https://openalex.org/W2889359316","https://openalex.org/W2907717037","https://openalex.org/W2911115496","https://openalex.org/W2917190209","https://openalex.org/W2918022326","https://openalex.org/W2941724634","https://openalex.org/W2978034729","https://openalex.org/W2987470051","https://openalex.org/W3017538622","https://openalex.org/W3091887651","https://openalex.org/W3117782746","https://openalex.org/W4206027559"],"related_works":["https://openalex.org/W631083485","https://openalex.org/W4313452936","https://openalex.org/W2097026685","https://openalex.org/W1918404916","https://openalex.org/W2943183667","https://openalex.org/W4301864333","https://openalex.org/W2392249189","https://openalex.org/W2036463713","https://openalex.org/W1598069005","https://openalex.org/W2913124952"],"abstract_inverted_index":{"This":[0],"paper":[1],"proposes":[2],"a":[3,40],"comprehensive":[4],"Markov":[5],"model":[6,32,128],"to":[7,34,116,131,153,164],"study":[8],"the":[9,13,44,57,62,79,86,91,99,103,114,127,133,147,166,169],"reliability":[10,149],"performance":[11],"of":[12,43,56,64,81,102,113,135,168],"conventional":[14],"isolated":[15],"multiple-switch":[16],"pulse":[17],"width":[18],"modulation":[19],"DC-DC":[20,28],"(IMSDC-DC)":[21],"converters":[22,104,115],"including":[23],"full-bridge,":[24],"half-bridge":[25],"and":[26,67,71,93,109,142,150],"push-pull":[27],"topologies.":[29],"The":[30],"suggested":[31],"helps":[33],"achieve":[35],"more":[36,118],"precise":[37],"outcomes":[38],"with":[39],"better":[41],"reflection":[42],"real-world":[45],"operation":[46],"characteristics":[47,101],"by":[48,160],"(i)":[49],"relying":[50],"on":[51,85,146],"self-embedded":[52],"fault":[53,107],"tolerant":[54],"capability":[55],"IMSDC-DC":[58],"converters,":[59],"(ii)":[60],"considering":[61],"probability":[63,84],"both":[65],"short":[66],"open":[68],"circuit":[69],"(SC":[70],"OC)":[72],"faults":[73],"in":[74,122],"each":[75,106],"component,":[76],"(iii)":[77],"assessing":[78],"effect":[80],"semiconductors'":[82],"SC/OC":[83],"converters'":[87],"reliability,":[88],"(iv)":[89],"analyzing":[90],"continuous":[92],"discontinuous":[94],"conduction":[95],"modes,":[96],"(v)":[97],"updating":[98],"operational":[100],"after":[105],"occurrence,":[108],"(vi)":[110],"evaluating":[111],"control":[112],"have":[117],"durable":[119],"power":[120],"transfer":[121],"some":[123,161],"post-fault":[124],"cases.":[125],"Then,":[126],"is":[129],"applied":[130],"assess":[132],"effects":[134],"duty":[136],"cycle,":[137],"output":[138],"power,":[139],"voltage":[140],"gain":[141],"transformer":[143],"turns":[144],"ratio":[145],"overall":[148],"mean":[151],"time":[152],"failure.":[154],"Practical":[155],"analytic":[156],"conclusions":[157],"are":[158],"followed":[159],"experimental":[162],"results":[163],"verify":[165],"accuracy":[167],"proposed":[170],"model.":[171]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":7},{"year":2024,"cited_by_count":6},{"year":2023,"cited_by_count":11},{"year":2022,"cited_by_count":6},{"year":2021,"cited_by_count":2}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}