{"id":"https://openalex.org/W3128622670","doi":"https://doi.org/10.1109/access.2021.3058149","title":"Research on Micro-CL Geometric Errors","display_name":"Research on Micro-CL Geometric Errors","publication_year":2021,"publication_date":"2021-02-10","ids":{"openalex":"https://openalex.org/W3128622670","doi":"https://doi.org/10.1109/access.2021.3058149","mag":"3128622670"},"language":"en","primary_location":{"id":"doi:10.1109/access.2021.3058149","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2021.3058149","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09350617.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09350617.pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100319572","display_name":"Jiajun Zhang","orcid":"https://orcid.org/0000-0001-5293-7434"},"institutions":[{"id":"https://openalex.org/I158842170","display_name":"Chongqing University","ror":"https://ror.org/023rhb549","country_code":"CN","type":"education","lineage":["https://openalex.org/I158842170"]},{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210123333","display_name":"Ministry of Education","ror":"https://ror.org/036nq5137","country_code":"TH","type":"government","lineage":["https://openalex.org/I4210123333"]},{"id":"https://openalex.org/I4210137180","display_name":"Institute of High Energy Physics","ror":"https://ror.org/03v8tnc06","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210137180"]},{"id":"https://openalex.org/I50632499","display_name":"Chongqing University of Technology","ror":"https://ror.org/04vgbd477","country_code":"CN","type":"education","lineage":["https://openalex.org/I50632499"]}],"countries":["CN","TH"],"is_corresponding":false,"raw_author_name":"Jiajun Zhang","raw_affiliation_strings":["The Key Laboratory of Opto-electronic Technology and Systems, Ministry of Education, Chongqing University, Chongqing, China","Key Laboratory of Opto-electronic Technology and Systems, Ministry of Education, Chongqing University, Chongqing 400044, China and Beijing Engineering Research Center of Radiographic Techniques and Equipment, Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049, China. (e-mail: zjj2575990663@163.com)","The Key Laboratory of Opto-electronic Technology and Systems, Ministry of Education, Chongqing University, Chongqing 400044, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"The Key Laboratory of Opto-electronic Technology and Systems, Ministry of Education, Chongqing University, Chongqing, China","institution_ids":["https://openalex.org/I50632499","https://openalex.org/I4210123333"]},{"raw_affiliation_string":"Key Laboratory of Opto-electronic Technology and Systems, Ministry of Education, Chongqing University, Chongqing 400044, China and Beijing Engineering Research Center of Radiographic Techniques and Equipment, Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049, China. (e-mail: zjj2575990663@163.com)","institution_ids":["https://openalex.org/I158842170","https://openalex.org/I19820366","https://openalex.org/I4210137180"]},{"raw_affiliation_string":"The Key Laboratory of Opto-electronic Technology and Systems, Ministry of Education, Chongqing University, Chongqing 400044, China","institution_ids":["https://openalex.org/I158842170"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101565650","display_name":"Liu Shi","orcid":"https://orcid.org/0000-0002-8552-2259"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210133524","display_name":"Key Laboratory of Nuclear Radiation and Nuclear Energy Technology","ror":"https://ror.org/03prcq065","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366","https://openalex.org/I19820366","https://openalex.org/I4210123885","https://openalex.org/I4210133524","https://openalex.org/I4210137180"]},{"id":"https://openalex.org/I4210137180","display_name":"Institute of High Energy Physics","ror":"https://ror.org/03v8tnc06","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210137180"]},{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Liu Shi","raw_affiliation_strings":["Beijing Engineering Research Center of Radiographic Techniques and Equipment, Institute of High Energy Physics, Chinese Academy of Sciences, Beijing, China","School of Nuclear Science and Technology,University of Chinese Academy of Sciences, Beijing 100049, China","Beijing Engineering Research Center of Radiographic Techniques and Equipment, Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049, China and School of Nuclear Science and Technology,University of Chinese Academy of Sciences, Beijing 100049, China"],"raw_orcid":"https://orcid.org/0000-0002-8552-2259","affiliations":[{"raw_affiliation_string":"Beijing Engineering Research Center of Radiographic Techniques and Equipment, Institute of High Energy Physics, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210137180"]},{"raw_affiliation_string":"School of Nuclear Science and Technology,University of Chinese Academy of Sciences, Beijing 100049, China","institution_ids":["https://openalex.org/I4210165038"]},{"raw_affiliation_string":"Beijing Engineering Research Center of Radiographic Techniques and Equipment, Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049, China and School of Nuclear Science and Technology,University of Chinese Academy of Sciences, Beijing 100049, China","institution_ids":["https://openalex.org/I4210133524","https://openalex.org/I4210137180"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071230176","display_name":"Cunfeng Wei","orcid":"https://orcid.org/0000-0001-7686-9587"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210133524","display_name":"Key Laboratory of Nuclear Radiation and Nuclear Energy Technology","ror":"https://ror.org/03prcq065","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366","https://openalex.org/I19820366","https://openalex.org/I4210123885","https://openalex.org/I4210133524","https://openalex.org/I4210137180"]},{"id":"https://openalex.org/I4210137180","display_name":"Institute of High Energy Physics","ror":"https://ror.org/03v8tnc06","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210137180"]},{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Cunfeng Wei","raw_affiliation_strings":["Beijing Engineering Research Center of Radiographic Techniques and Equipment, Institute of High Energy Physics, Chinese Academy of Sciences, Beijing, China","School of Nuclear Science and Technology,University of Chinese Academy of Sciences, Beijing 100049, China","Beijing Engineering Research Center of Radiographic Techniques and Equipment, Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049, China and School of Nuclear Science and Technology,University of Chinese Academy of Sciences, Beijing 100049, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Beijing Engineering Research Center of Radiographic Techniques and Equipment, Institute of High Energy Physics, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210137180"]},{"raw_affiliation_string":"School of Nuclear Science and Technology,University of Chinese Academy of Sciences, Beijing 100049, China","institution_ids":["https://openalex.org/I4210165038"]},{"raw_affiliation_string":"Beijing Engineering Research Center of Radiographic Techniques and Equipment, Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049, China and School of Nuclear Science and Technology,University of Chinese Academy of Sciences, Beijing 100049, China","institution_ids":["https://openalex.org/I4210133524","https://openalex.org/I4210137180"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004551670","display_name":"Baodong Liu","orcid":"https://orcid.org/0000-0003-4364-9478"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210133524","display_name":"Key Laboratory of Nuclear Radiation and Nuclear Energy Technology","ror":"https://ror.org/03prcq065","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366","https://openalex.org/I19820366","https://openalex.org/I4210123885","https://openalex.org/I4210133524","https://openalex.org/I4210137180"]},{"id":"https://openalex.org/I4210137180","display_name":"Institute of High Energy Physics","ror":"https://ror.org/03v8tnc06","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210137180"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Baodong Liu","raw_affiliation_strings":["Beijing Engineering Research Center of Radiographic Techniques and Equipment, Institute of High Energy Physics, Chinese Academy of Sciences, Beijing, China","Beijing Engineering Research Center of Radiographic Techniques and Equipment, Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049, China and School of Nuclear Science and Technology,University of Chinese Academy of Sciences, Beijing 100049, China"],"raw_orcid":"https://orcid.org/0000-0003-4364-9478","affiliations":[{"raw_affiliation_string":"Beijing Engineering Research Center of Radiographic Techniques and Equipment, Institute of High Energy Physics, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210137180"]},{"raw_affiliation_string":"Beijing Engineering Research Center of Radiographic Techniques and Equipment, Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049, China and School of Nuclear Science and Technology,University of Chinese Academy of Sciences, Beijing 100049, China","institution_ids":["https://openalex.org/I4210133524","https://openalex.org/I4210137180"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101971927","display_name":"Biao Wei","orcid":"https://orcid.org/0000-0002-3957-5405"},"institutions":[{"id":"https://openalex.org/I158842170","display_name":"Chongqing University","ror":"https://ror.org/023rhb549","country_code":"CN","type":"education","lineage":["https://openalex.org/I158842170"]},{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210123333","display_name":"Ministry of Education","ror":"https://ror.org/036nq5137","country_code":"TH","type":"government","lineage":["https://openalex.org/I4210123333"]},{"id":"https://openalex.org/I4210137180","display_name":"Institute of High Energy Physics","ror":"https://ror.org/03v8tnc06","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210137180"]},{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]},{"id":"https://openalex.org/I50632499","display_name":"Chongqing University of Technology","ror":"https://ror.org/04vgbd477","country_code":"CN","type":"education","lineage":["https://openalex.org/I50632499"]}],"countries":["CN","TH"],"is_corresponding":true,"raw_author_name":"Biao Wei","raw_affiliation_strings":["The Key Laboratory of Opto-electronic Technology and Systems, Ministry of Education, Chongqing University, Chongqing, China","The Key Laboratory of Opto-electronic Technology and Systems, Ministry of Education, Chongqing University, Chongqing 400044, China","Beijing Engineering Research Center of Radiographic Techniques and Equipment, Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049, China","School of Nuclear Science and Technology,University of Chinese Academy of Sciences, Beijing 100049, China"],"raw_orcid":"https://orcid.org/0000-0002-3957-5405","affiliations":[{"raw_affiliation_string":"The Key Laboratory of Opto-electronic Technology and Systems, Ministry of Education, Chongqing University, Chongqing, China","institution_ids":["https://openalex.org/I50632499","https://openalex.org/I4210123333"]},{"raw_affiliation_string":"The Key Laboratory of Opto-electronic Technology and Systems, Ministry of Education, Chongqing University, Chongqing 400044, China","institution_ids":["https://openalex.org/I158842170"]},{"raw_affiliation_string":"Beijing Engineering Research Center of Radiographic Techniques and Equipment, Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049, China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210137180"]},{"raw_affiliation_string":"School of Nuclear Science and Technology,University of Chinese Academy of Sciences, Beijing 100049, China","institution_ids":["https://openalex.org/I4210165038"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5101971927"],"corresponding_institution_ids":["https://openalex.org/I158842170","https://openalex.org/I19820366","https://openalex.org/I4210123333","https://openalex.org/I4210137180","https://openalex.org/I4210165038","https://openalex.org/I50632499"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.2549,"has_fulltext":true,"cited_by_count":4,"citation_normalized_percentile":{"value":0.48093785,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":"13","issue":null,"first_page":"124494","last_page":"124503"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11301","display_name":"Advanced Surface Polishing Techniques","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11301","display_name":"Advanced Surface Polishing Techniques","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.7778509259223938},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6829090118408203},{"id":"https://openalex.org/keywords/scanner","display_name":"Scanner","score":0.6519878506660461},{"id":"https://openalex.org/keywords/planar","display_name":"Planar","score":0.6292107701301575},{"id":"https://openalex.org/keywords/task","display_name":"Task (project management)","score":0.6079282164573669},{"id":"https://openalex.org/keywords/printed-circuit-board","display_name":"Printed circuit board","score":0.4870646297931671},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.3727007508277893},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.3273736238479614},{"id":"https://openalex.org/keywords/computer-graphics","display_name":"Computer graphics (images)","score":0.2151137888431549},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.16784802079200745},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.11687961220741272}],"concepts":[{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.7778509259223938},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6829090118408203},{"id":"https://openalex.org/C2779751349","wikidata":"https://www.wikidata.org/wiki/Q1474480","display_name":"Scanner","level":2,"score":0.6519878506660461},{"id":"https://openalex.org/C134786449","wikidata":"https://www.wikidata.org/wiki/Q3391255","display_name":"Planar","level":2,"score":0.6292107701301575},{"id":"https://openalex.org/C2780451532","wikidata":"https://www.wikidata.org/wiki/Q759676","display_name":"Task (project management)","level":2,"score":0.6079282164573669},{"id":"https://openalex.org/C120793396","wikidata":"https://www.wikidata.org/wiki/Q173350","display_name":"Printed circuit board","level":2,"score":0.4870646297931671},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3727007508277893},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.3273736238479614},{"id":"https://openalex.org/C121684516","wikidata":"https://www.wikidata.org/wiki/Q7600677","display_name":"Computer graphics (images)","level":1,"score":0.2151137888431549},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.16784802079200745},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.11687961220741272},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/access.2021.3058149","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2021.3058149","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09350617.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1109/access.2021.3058149","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2021.3058149","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09350617.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/16","display_name":"Peace, Justice and strong institutions","score":0.7400000095367432}],"awards":[{"id":"https://openalex.org/G1195764968","display_name":null,"funder_award_id":"JCTD-2019-02","funder_id":"https://openalex.org/F4320321133","funder_display_name":"Chinese Academy of Sciences"}],"funders":[{"id":"https://openalex.org/F4320321133","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35"},{"id":"https://openalex.org/F4320335641","display_name":"Institute of High Energy Physics","ror":null},{"id":"https://openalex.org/F4320337511","display_name":"High Energy Physics","ror":"https://ror.org/035m6g344"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W3128622670.pdf","grobid_xml":"https://content.openalex.org/works/W3128622670.grobid-xml"},"referenced_works_count":18,"referenced_works":["https://openalex.org/W319611471","https://openalex.org/W1964055326","https://openalex.org/W1968983912","https://openalex.org/W1976534251","https://openalex.org/W2011899617","https://openalex.org/W2013347423","https://openalex.org/W2027416197","https://openalex.org/W2053983375","https://openalex.org/W2063191389","https://openalex.org/W2073498690","https://openalex.org/W2085982348","https://openalex.org/W2286549565","https://openalex.org/W2294097917","https://openalex.org/W2533020866","https://openalex.org/W2608996180","https://openalex.org/W2767276864","https://openalex.org/W2909145683","https://openalex.org/W7055539437"],"related_works":["https://openalex.org/W1891287906","https://openalex.org/W2036807459","https://openalex.org/W2775347418","https://openalex.org/W1969923398","https://openalex.org/W2772917594","https://openalex.org/W2166024367","https://openalex.org/W2755342338","https://openalex.org/W3116076068","https://openalex.org/W2229312674","https://openalex.org/W2179301249"],"abstract_inverted_index":{"Computed":[0],"laminography":[1],"(CL)":[2],"is":[3,31],"a":[4,32,51,73],"nondestructive":[5],"testing":[6],"technique":[7],"for":[8,35],"planar":[9],"objects.":[10],"It":[11],"has":[12],"been":[13],"applied":[14],"in":[15],"applications":[16],"like":[17],"printed":[18],"circuit":[19],"board":[20],"inspection":[21],"and":[22,39,70],"paleontological":[23],"fossils":[24],"research.":[25],"However,":[26],"the":[27,46,68],"CL":[28,54],"system":[29],"calibration":[30,71],"challenging":[33],"task":[34],"complex":[36],"mechanical":[37],"structure":[38],"many":[40],"degrees":[41],"of":[42,48,59,72],"freedom.":[43],"To":[44],"evaluated":[45],"influence":[47],"geometric":[49,60],"errors,":[50],"new-type":[52],"microscopic":[53],"(micro-CL)":[55],"with":[56],"different":[57],"kinds":[58],"errors":[61],"was":[62],"simulated.":[63],"The":[64],"results":[65],"can":[66],"guide":[67],"installation":[69],"micro-CL":[74],"scanner.":[75]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":1}],"updated_date":"2026-01-17T23:10:49.606395","created_date":"2025-10-10T00:00:00"}