{"id":"https://openalex.org/W3123315239","doi":"https://doi.org/10.1109/access.2021.3052077","title":"Optimization of a Nanosecond Pre-Ionization Switch\u2019s Breakdown Jitter Characteristic Based on a Probability Distribution Model of Electron Avalanche\u2019s Initiation","display_name":"Optimization of a Nanosecond Pre-Ionization Switch\u2019s Breakdown Jitter Characteristic Based on a Probability Distribution Model of Electron Avalanche\u2019s Initiation","publication_year":2021,"publication_date":"2021-01-01","ids":{"openalex":"https://openalex.org/W3123315239","doi":"https://doi.org/10.1109/access.2021.3052077","mag":"3123315239"},"language":"en","primary_location":{"id":"doi:10.1109/access.2021.3052077","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2021.3052077","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/9312710/09326420.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/9312710/09326420.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101627817","display_name":"Tianchi Wang","orcid":"https://orcid.org/0000-0002-9022-3253"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Tianchi Wang","raw_affiliation_strings":["Key Laboratory of Particle & Radiation Imaging, Ministry of Education, Tsinghua University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Key Laboratory of Particle & Radiation Imaging, Ministry of Education, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100438271","display_name":"Haiyang Wang","orcid":"https://orcid.org/0000-0001-5282-3955"},"institutions":[{"id":"https://openalex.org/I4210151975","display_name":"Northwest Institute of Nuclear Technology","ror":"https://ror.org/04svrh266","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210151975"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Haiyang Wang","raw_affiliation_strings":["State Key Laboratory of Intense Pulsed Radiation Simulation and Effect, Northwest Institute of Nuclear Technology, Xi\u2019an, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Intense Pulsed Radiation Simulation and Effect, Northwest Institute of Nuclear Technology, Xi\u2019an, China","institution_ids":["https://openalex.org/I4210151975"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019971196","display_name":"Wei Chen","orcid":"https://orcid.org/0000-0003-3816-7941"},"institutions":[{"id":"https://openalex.org/I4210151975","display_name":"Northwest Institute of Nuclear Technology","ror":"https://ror.org/04svrh266","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210151975"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wei Chen","raw_affiliation_strings":["State Key Laboratory of Intense Pulsed Radiation Simulation and Effect, Northwest Institute of Nuclear Technology, Xi\u2019an, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Intense Pulsed Radiation Simulation and Effect, Northwest Institute of Nuclear Technology, Xi\u2019an, China","institution_ids":["https://openalex.org/I4210151975"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5088740647","display_name":"Tao Huang","orcid":"https://orcid.org/0000-0003-0351-1976"},"institutions":[{"id":"https://openalex.org/I4210151975","display_name":"Northwest Institute of Nuclear Technology","ror":"https://ror.org/04svrh266","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210151975"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Tao Huang","raw_affiliation_strings":["State Key Laboratory of Intense Pulsed Radiation Simulation and Effect, Northwest Institute of Nuclear Technology, Xi\u2019an, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Intense Pulsed Radiation Simulation and Effect, Northwest Institute of Nuclear Technology, Xi\u2019an, China","institution_ids":["https://openalex.org/I4210151975"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5101627817"],"corresponding_institution_ids":["https://openalex.org/I99065089"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.2747,"has_fulltext":true,"cited_by_count":2,"citation_normalized_percentile":{"value":0.5108793,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":93,"max":95},"biblio":{"volume":"9","issue":null,"first_page":"13513","last_page":"13523"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11920","display_name":"Pulsed Power Technology Applications","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11920","display_name":"Pulsed Power Technology Applications","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9950000047683716,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/jitter","display_name":"Jitter","score":0.9089800715446472},{"id":"https://openalex.org/keywords/electron-avalanche","display_name":"Electron avalanche","score":0.7745577096939087},{"id":"https://openalex.org/keywords/nanosecond","display_name":"Nanosecond","score":0.7350993156433105},{"id":"https://openalex.org/keywords/ionization","display_name":"Ionization","score":0.7000830173492432},{"id":"https://openalex.org/keywords/impact-ionization","display_name":"Impact ionization","score":0.6353269219398499},{"id":"https://openalex.org/keywords/avalanche-diode","display_name":"Avalanche diode","score":0.6062262058258057},{"id":"https://openalex.org/keywords/electron","display_name":"Electron","score":0.6041179299354553},{"id":"https://openalex.org/keywords/electric-field","display_name":"Electric field","score":0.5277702808380127},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.5246251225471497},{"id":"https://openalex.org/keywords/avalanche-breakdown","display_name":"Avalanche breakdown","score":0.4770642817020416},{"id":"https://openalex.org/keywords/breakdown-voltage","display_name":"Breakdown voltage","score":0.44838640093803406},{"id":"https://openalex.org/keywords/atomic-physics","display_name":"Atomic physics","score":0.3795344829559326},{"id":"https://openalex.org/keywords/computational-physics","display_name":"Computational physics","score":0.3679542541503906},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.33589503169059753},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.23068901896476746},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.1911916732788086},{"id":"https://openalex.org/keywords/laser","display_name":"Laser","score":0.1250540018081665},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.11290815472602844},{"id":"https://openalex.org/keywords/ion","display_name":"Ion","score":0.10214683413505554}],"concepts":[{"id":"https://openalex.org/C134652429","wikidata":"https://www.wikidata.org/wiki/Q1052698","display_name":"Jitter","level":2,"score":0.9089800715446472},{"id":"https://openalex.org/C207634928","wikidata":"https://www.wikidata.org/wiki/Q175921","display_name":"Electron avalanche","level":4,"score":0.7745577096939087},{"id":"https://openalex.org/C51141536","wikidata":"https://www.wikidata.org/wiki/Q838801","display_name":"Nanosecond","level":3,"score":0.7350993156433105},{"id":"https://openalex.org/C198291218","wikidata":"https://www.wikidata.org/wiki/Q190382","display_name":"Ionization","level":3,"score":0.7000830173492432},{"id":"https://openalex.org/C32921249","wikidata":"https://www.wikidata.org/wiki/Q2001256","display_name":"Impact ionization","level":4,"score":0.6353269219398499},{"id":"https://openalex.org/C95341827","wikidata":"https://www.wikidata.org/wiki/Q175898","display_name":"Avalanche diode","level":4,"score":0.6062262058258057},{"id":"https://openalex.org/C147120987","wikidata":"https://www.wikidata.org/wiki/Q2225","display_name":"Electron","level":2,"score":0.6041179299354553},{"id":"https://openalex.org/C60799052","wikidata":"https://www.wikidata.org/wiki/Q46221","display_name":"Electric field","level":2,"score":0.5277702808380127},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.5246251225471497},{"id":"https://openalex.org/C33652038","wikidata":"https://www.wikidata.org/wiki/Q175906","display_name":"Avalanche breakdown","level":4,"score":0.4770642817020416},{"id":"https://openalex.org/C119321828","wikidata":"https://www.wikidata.org/wiki/Q1267190","display_name":"Breakdown voltage","level":3,"score":0.44838640093803406},{"id":"https://openalex.org/C184779094","wikidata":"https://www.wikidata.org/wiki/Q26383","display_name":"Atomic physics","level":1,"score":0.3795344829559326},{"id":"https://openalex.org/C30475298","wikidata":"https://www.wikidata.org/wiki/Q909554","display_name":"Computational physics","level":1,"score":0.3679542541503906},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.33589503169059753},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.23068901896476746},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.1911916732788086},{"id":"https://openalex.org/C520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","level":2,"score":0.1250540018081665},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.11290815472602844},{"id":"https://openalex.org/C145148216","wikidata":"https://www.wikidata.org/wiki/Q36496","display_name":"Ion","level":2,"score":0.10214683413505554},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2021.3052077","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2021.3052077","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/9312710/09326420.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:a6e102bc9e624b01889df2e4b7c579e1","is_oa":true,"landing_page_url":"https://doaj.org/article/a6e102bc9e624b01889df2e4b7c579e1","pdf_url":null,"source":{"id":"https://openalex.org/S112646816","display_name":"SHILAP Revista de lepidopterolog\u00eda","issn_l":"0300-5267","issn":["0300-5267","2340-4078"],"is_oa":true,"is_in_doaj":true,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 9, Pp 13513-13523 (2021)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2021.3052077","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2021.3052077","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/9312710/09326420.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"score":0.9100000262260437,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W3123315239.pdf","grobid_xml":"https://content.openalex.org/works/W3123315239.grobid-xml"},"referenced_works_count":22,"referenced_works":["https://openalex.org/W634630802","https://openalex.org/W1501484565","https://openalex.org/W1503603808","https://openalex.org/W1895443880","https://openalex.org/W1994429864","https://openalex.org/W2028113109","https://openalex.org/W2047891809","https://openalex.org/W2059317213","https://openalex.org/W2059586946","https://openalex.org/W2072690443","https://openalex.org/W2080791117","https://openalex.org/W2103319132","https://openalex.org/W2122066489","https://openalex.org/W2136949218","https://openalex.org/W2515261012","https://openalex.org/W2599043117","https://openalex.org/W2785755216","https://openalex.org/W2956061518","https://openalex.org/W2972949576","https://openalex.org/W3111846678","https://openalex.org/W6734843927","https://openalex.org/W6787308882"],"related_works":["https://openalex.org/W2171642780","https://openalex.org/W2006509134","https://openalex.org/W2151805512","https://openalex.org/W2038160176","https://openalex.org/W2097151064","https://openalex.org/W2112149602","https://openalex.org/W4236725204","https://openalex.org/W2632144019","https://openalex.org/W2084871431","https://openalex.org/W2153102631"],"abstract_inverted_index":{"The":[0],"breakdown":[1,49,98,127,135],"jitter":[2,50,130,153],"characteristic":[3],"of":[4,17,30,58,68,100,112,120,140],"a":[5,73,117],"self-triggered":[6],"pre-ionization":[7,41],"switch":[8,55],"that":[9,64,95,146],"works":[10],"under":[11],"pulses":[12],"with":[13],"the":[14,26,48,54,59,65,77,81,97,101,106,109,113,126,134,141],"rising":[15],"time":[16,99,128,136],"about":[18,44,138],"one":[19],"hundred":[20],"nanoseconds":[21],"was":[22,83,137],"improved":[23],"based":[24],"on":[25,47],"probability":[27,60],"distribution":[28,61],"model":[29,62],"electron":[31,90],"avalanche's":[32],"initiation.":[33],"Contrary":[34],"to":[35,86,131],"what":[36],"we":[37],"might":[38],"imagine,":[39],"premature":[40],"nearly":[42],"brought":[43],"no":[45],"improvement":[46],"characteristic.":[51],"To":[52],"reduce":[53,125],"jitter,":[56],"analysis":[57],"indicated":[63],"generating":[66],"rate":[67],"initial":[69,121],"electrons":[70,107,122],"should":[71],"maintain":[72],"high":[74,84,147],"value":[75],"when":[76,133],"electric":[78],"field":[79],"in":[80,108],"gap":[82,103,115],"enough":[85],"initiate":[87],"an":[88],"effective":[89],"avalanche.":[91],"Experimental":[92],"results":[93],"proved":[94],"adjusting":[96],"trigger":[102,114],"or":[104],"letting":[105],"arc":[110],"channel":[111],"become":[116],"steady":[118],"source":[119],"could":[123],"both":[124],"delay":[129],"1ns-2ns":[132],"95%":[139],"peak":[142],"time,":[143],"this":[144],"means":[145],"energy":[148],"transfer":[149],"efficiency":[150],"and":[151],"low":[152],"were":[154],"realized":[155],"simultaneously.":[156]},"counts_by_year":[{"year":2021,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2021-02-01T00:00:00"}