{"id":"https://openalex.org/W3113788634","doi":"https://doi.org/10.1109/access.2020.3047491","title":"A Process-Aware Memory Compact-Device Model Using Long-Short Term Memory","display_name":"A Process-Aware Memory Compact-Device Model Using Long-Short Term Memory","publication_year":2020,"publication_date":"2020-12-25","ids":{"openalex":"https://openalex.org/W3113788634","doi":"https://doi.org/10.1109/access.2020.3047491","mag":"3113788634"},"language":"en","primary_location":{"id":"doi:10.1109/access.2020.3047491","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2020.3047491","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/9312710/09308977.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/9312710/09308977.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5024992159","display_name":"Albert Lin","orcid":"https://orcid.org/0000-0001-6104-3360"},"institutions":[{"id":"https://openalex.org/I148366613","display_name":"National Yang Ming Chiao Tung University","ror":"https://ror.org/00se2k293","country_code":"TW","type":"education","lineage":["https://openalex.org/I148366613"]}],"countries":["TW"],"is_corresponding":true,"raw_author_name":"Albert S. Lin","raw_affiliation_strings":["Department of Electronics Engineering, National Chiao Tung University, Hsinchu, Taiwan"],"raw_orcid":"https://orcid.org/0000-0001-6104-3360","affiliations":[{"raw_affiliation_string":"Department of Electronics Engineering, National Chiao Tung University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I148366613"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064507748","display_name":"Sparsh Pratik","orcid":"https://orcid.org/0000-0002-2927-7121"},"institutions":[{"id":"https://openalex.org/I148366613","display_name":"National Yang Ming Chiao Tung University","ror":"https://ror.org/00se2k293","country_code":"TW","type":"education","lineage":["https://openalex.org/I148366613"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Sparsh Pratik","raw_affiliation_strings":["Department of Electronics Engineering, National Chiao Tung University, Hsinchu, Taiwan"],"raw_orcid":"https://orcid.org/0000-0002-2927-7121","affiliations":[{"raw_affiliation_string":"Department of Electronics Engineering, National Chiao Tung University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I148366613"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102944602","display_name":"Jun Ota","orcid":"https://orcid.org/0000-0001-9860-1186"},"institutions":[{"id":"https://openalex.org/I148366613","display_name":"National Yang Ming Chiao Tung University","ror":"https://ror.org/00se2k293","country_code":"TW","type":"education","lineage":["https://openalex.org/I148366613"]},{"id":"https://openalex.org/I2800271857","display_name":"Sumco Corporation (Japan)","ror":"https://ror.org/01yp72g57","country_code":"JP","type":"company","lineage":["https://openalex.org/I2800271857"]}],"countries":["JP","TW"],"is_corresponding":false,"raw_author_name":"Jun Ota","raw_affiliation_strings":["Department of Electronics Engineering, National Chiao Tung University, Hsinchu, Taiwan","Technology Division, Imari Crystal Engineering Section, SUMCO Corporation, Saga, Japan"],"raw_orcid":"https://orcid.org/0000-0001-9860-1186","affiliations":[{"raw_affiliation_string":"Department of Electronics Engineering, National Chiao Tung University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I148366613"]},{"raw_affiliation_string":"Technology Division, Imari Crystal Engineering Section, SUMCO Corporation, Saga, Japan","institution_ids":["https://openalex.org/I2800271857"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040582519","display_name":"Tejender Singh Rawat","orcid":"https://orcid.org/0000-0001-7894-0463"},"institutions":[{"id":"https://openalex.org/I148366613","display_name":"National Yang Ming Chiao Tung University","ror":"https://ror.org/00se2k293","country_code":"TW","type":"education","lineage":["https://openalex.org/I148366613"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Tejender Singh Rawat","raw_affiliation_strings":["Department of Electronics Engineering, National Chiao Tung University, Hsinchu, Taiwan"],"raw_orcid":"https://orcid.org/0000-0001-7894-0463","affiliations":[{"raw_affiliation_string":"Department of Electronics Engineering, National Chiao Tung University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I148366613"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5063361454","display_name":"Tzu-Hsiang Huang","orcid":"https://orcid.org/0000-0002-3923-9524"},"institutions":[{"id":"https://openalex.org/I148366613","display_name":"National Yang Ming Chiao Tung University","ror":"https://ror.org/00se2k293","country_code":"TW","type":"education","lineage":["https://openalex.org/I148366613"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Tzu-Hsiang Huang","raw_affiliation_strings":["Department of Electronics Engineering, National Chiao Tung University, Hsinchu, Taiwan"],"raw_orcid":"https://orcid.org/0000-0002-3923-9524","affiliations":[{"raw_affiliation_string":"Department of Electronics Engineering, National Chiao Tung University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I148366613"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5062838276","display_name":"Chun-Ling Hsu","orcid":"https://orcid.org/0000-0003-2091-710X"},"institutions":[{"id":"https://openalex.org/I148366613","display_name":"National Yang Ming Chiao Tung University","ror":"https://ror.org/00se2k293","country_code":"TW","type":"education","lineage":["https://openalex.org/I148366613"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Chun-Ling Hsu","raw_affiliation_strings":["Department of Electronics Engineering, National Chiao Tung University, Hsinchu, Taiwan"],"raw_orcid":"https://orcid.org/0000-0003-2091-710X","affiliations":[{"raw_affiliation_string":"Department of Electronics Engineering, National Chiao Tung University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I148366613"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017490487","display_name":"Wei-Ming Su","orcid":"https://orcid.org/0000-0003-0560-1916"},"institutions":[{"id":"https://openalex.org/I148366613","display_name":"National Yang Ming Chiao Tung University","ror":"https://ror.org/00se2k293","country_code":"TW","type":"education","lineage":["https://openalex.org/I148366613"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Wei-Ming Su","raw_affiliation_strings":["Department of Electronics Engineering, National Chiao Tung University, Hsinchu, Taiwan"],"raw_orcid":"https://orcid.org/0000-0003-0560-1916","affiliations":[{"raw_affiliation_string":"Department of Electronics Engineering, National Chiao Tung University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I148366613"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5081838658","display_name":"Tseung\u2010Yuen Tseng","orcid":"https://orcid.org/0000-0003-1158-5289"},"institutions":[{"id":"https://openalex.org/I148366613","display_name":"National Yang Ming Chiao Tung University","ror":"https://ror.org/00se2k293","country_code":"TW","type":"education","lineage":["https://openalex.org/I148366613"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Tseung-Yuen Tseng","raw_affiliation_strings":["Department of Electronics Engineering, National Chiao Tung University, Hsinchu, Taiwan"],"raw_orcid":"https://orcid.org/0000-0003-1158-5289","affiliations":[{"raw_affiliation_string":"Department of Electronics Engineering, National Chiao Tung University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I148366613"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":8,"corresponding_author_ids":["https://openalex.org/A5024992159"],"corresponding_institution_ids":["https://openalex.org/I148366613"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":1.1442,"has_fulltext":true,"cited_by_count":23,"citation_normalized_percentile":{"value":0.7878455,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":95,"max":99},"biblio":{"volume":"9","issue":null,"first_page":"3126","last_page":"3139"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/resistive-random-access-memory","display_name":"Resistive random-access memory","score":0.9151067733764648},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6372347474098206},{"id":"https://openalex.org/keywords/memorization","display_name":"Memorization","score":0.5546391010284424},{"id":"https://openalex.org/keywords/mean-squared-error","display_name":"Mean squared error","score":0.43156641721725464},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.40765509009361267},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.35623428225517273},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3527137339115143},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2874975800514221},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.11361828446388245},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.0989881157875061}],"concepts":[{"id":"https://openalex.org/C182019814","wikidata":"https://www.wikidata.org/wiki/Q1143830","display_name":"Resistive random-access memory","level":3,"score":0.9151067733764648},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6372347474098206},{"id":"https://openalex.org/C30038468","wikidata":"https://www.wikidata.org/wiki/Q4354775","display_name":"Memorization","level":2,"score":0.5546391010284424},{"id":"https://openalex.org/C139945424","wikidata":"https://www.wikidata.org/wiki/Q1940696","display_name":"Mean squared error","level":2,"score":0.43156641721725464},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.40765509009361267},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.35623428225517273},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3527137339115143},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2874975800514221},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.11361828446388245},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0989881157875061},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C145420912","wikidata":"https://www.wikidata.org/wiki/Q853077","display_name":"Mathematics education","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2020.3047491","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2020.3047491","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/9312710/09308977.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:e1529a89857f43f3ad53da5da0aca59b","is_oa":true,"landing_page_url":"https://doaj.org/article/e1529a89857f43f3ad53da5da0aca59b","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 9, Pp 3126-3139 (2021)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2020.3047491","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2020.3047491","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/9312710/09308977.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G6185113679","display_name":null,"funder_award_id":"MOST 109-2221-E-009-060","funder_id":"https://openalex.org/F4320322795","funder_display_name":"Ministry of Science and Technology, Taiwan"}],"funders":[{"id":"https://openalex.org/F4320322795","display_name":"Ministry of Science and Technology, Taiwan","ror":"https://ror.org/02kv4zf79"}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W3113788634.pdf","grobid_xml":"https://content.openalex.org/works/W3113788634.grobid-xml"},"referenced_works_count":51,"referenced_works":["https://openalex.org/W913644631","https://openalex.org/W1571862906","https://openalex.org/W1728842521","https://openalex.org/W1911867996","https://openalex.org/W1940872118","https://openalex.org/W1965288361","https://openalex.org/W1984609064","https://openalex.org/W1996764478","https://openalex.org/W2002016471","https://openalex.org/W2010959282","https://openalex.org/W2012903341","https://openalex.org/W2028341480","https://openalex.org/W2036850929","https://openalex.org/W2064675550","https://openalex.org/W2089529530","https://openalex.org/W2106620460","https://openalex.org/W2112181056","https://openalex.org/W2115709314","https://openalex.org/W2116261113","https://openalex.org/W2118921812","https://openalex.org/W2136848157","https://openalex.org/W2139304324","https://openalex.org/W2162279286","https://openalex.org/W2162651880","https://openalex.org/W2167784970","https://openalex.org/W2271840356","https://openalex.org/W2289174982","https://openalex.org/W2323952275","https://openalex.org/W2560467685","https://openalex.org/W2610531156","https://openalex.org/W2762990865","https://openalex.org/W2766600690","https://openalex.org/W2767248126","https://openalex.org/W2767346351","https://openalex.org/W2783329168","https://openalex.org/W2792297949","https://openalex.org/W2892035503","https://openalex.org/W2895083706","https://openalex.org/W2905379876","https://openalex.org/W2939745333","https://openalex.org/W2955850047","https://openalex.org/W2966101498","https://openalex.org/W3010588986","https://openalex.org/W3039320313","https://openalex.org/W4285719527","https://openalex.org/W4301057369","https://openalex.org/W6637572315","https://openalex.org/W6640362995","https://openalex.org/W6677408996","https://openalex.org/W6694517276","https://openalex.org/W6754957482"],"related_works":["https://openalex.org/W3093895509","https://openalex.org/W2054635671","https://openalex.org/W2545245183","https://openalex.org/W3163481960","https://openalex.org/W2323394100","https://openalex.org/W280704926","https://openalex.org/W2017425642","https://openalex.org/W2476068070","https://openalex.org/W4323971310","https://openalex.org/W2350916061"],"abstract_inverted_index":{"With":[0],"the":[1,5,9,29,32,45,86,109,141,175,194,202,206,211,252],"immense":[2],"increase":[3],"in":[4,20,35,162,169,193,216,225,260,274],"processing":[6],"data":[7,25],"during":[8],"scaling":[10],"down":[11],"of":[12,31,117,218,232],"semiconductor":[13],"devices":[14,95,227],"by":[15],"Moore's":[16],"Law,":[17],"it":[18],"is":[19,60,105,138,160,199],"urgent":[21],"need":[22],"to":[23,27,107,185,208],"use":[24,179],"analytics":[26],"meet":[28],"state":[30,128,133],"art":[33],"performance":[34],"both":[36,124],"manufacturing":[37],"and":[38,48,85,130,167,228,238,245,265],"device":[39,52,214],"compact":[40,51,77,197,213],"modeling.":[41],"In":[42,174],"particular,":[43],"managing":[44],"fabrication":[46],"cost":[47],"promptly":[49],"providing":[50],"models,":[53,237],"especially":[54],"for":[55,80,92,243],"new":[56],"or":[57],"emerging":[58,226],"devices,":[59,233],"challenging.":[61],"To":[62],"ease":[63],"out":[64],"these":[65],"issues,":[66],"we":[67,178],"propose":[68,250],"a":[69,229],"unified,":[70],"general-purpose,":[71],"process-aware":[72,176,195,236],"machine":[73],"learning":[74],"(ML)":[75],"based":[76,139,254],"model":[78,104,121,198,241],"(CM)":[79],"resistive":[81],"random-access":[82],"memory":[83,94,101,255],"(RRAM),":[84],"same":[87],"methodology":[88],"can":[89,122,257],"be":[90,258],"used":[91,106],"any":[93],"with":[96,210,268],"hysteresis.":[97],"A":[98],"long":[99],"short-term":[100],"(LSTM)":[102],"ML":[103],"fit":[108,123],"RRAM":[110,125,143,196],"current-voltage":[111],"(I-V)":[112],"characteristics.":[113],"The":[114,135,156,187],"memorizing":[115],"capability":[116,224],"LSTM":[118,253],"ensures":[119],"one":[120,239],"low":[126],"resistance":[127,132],"(LRS)":[129],"high":[131],"(HRS).":[134],"fitted":[136],"dataset":[137,182],"on":[140],"fabricated":[142],"samples":[144],"using":[145],"TaN/HfO":[146],"<sub":[147,151],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[148,152],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</sub>":[149,153],"/Pt/Ti/SiO":[150],"/Si":[154],"structure.":[155],"resultant":[157],"fitting":[158,223],"error":[159,191],"0.0096":[161],"sinusoidal":[163],"wave":[164],"input":[165],"voltage":[166,172],"0.0148":[168],"random":[170],"walk":[171],"sequences.":[173],"demonstration,":[177],"post-oxide":[180],"annealing":[181],"from":[183],"300\u00b0C":[184],"500\u00b0C.":[186],"root":[188],"mean":[189],"squared":[190],"(RMSE)":[192],"0.0028.":[200],"Thus,":[201],"LSTM-based":[203],"CM":[204,256],"has":[205],"potential":[207],"compete":[209],"conventional":[212],"models":[215],"terms":[217],"shorter":[219],"developing":[220],"time,":[221],"better":[222],"large":[230],"number":[231],"easily":[234],"incorporated":[235],"unified":[240],"accounting":[242],"LRS":[244],"HRS":[246],"ensuring":[247],"differentiability.":[248],"We":[249],"that":[251],"useful":[259],"intelligent":[261],"manufacturing,":[262],"process":[263],"tuning,":[264],"simulation":[266],"program":[267],"integrated":[269],"circuit":[270,275],"emphasis":[271],"(SPICE)":[272],"modeling":[273],"simulation.":[276]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":10},{"year":2023,"cited_by_count":4},{"year":2022,"cited_by_count":7}],"updated_date":"2026-05-06T08:25:59.206177","created_date":"2025-10-10T00:00:00"}