{"id":"https://openalex.org/W3114274294","doi":"https://doi.org/10.1109/access.2020.3046681","title":"Fault Diagnosis of Train Network Control Management System Based on Dynamic Fault Tree and Bayesian Network","display_name":"Fault Diagnosis of Train Network Control Management System Based on Dynamic Fault Tree and Bayesian Network","publication_year":2020,"publication_date":"2020-12-22","ids":{"openalex":"https://openalex.org/W3114274294","doi":"https://doi.org/10.1109/access.2020.3046681","mag":"3114274294"},"language":"en","primary_location":{"id":"doi:10.1109/access.2020.3046681","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2020.3046681","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/9312710/09302584.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/9312710/09302584.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100329433","display_name":"Chong Wang","orcid":"https://orcid.org/0000-0001-9515-8916"},"institutions":[{"id":"https://openalex.org/I21193070","display_name":"Beijing Jiaotong University","ror":"https://ror.org/01yj56c84","country_code":"CN","type":"education","lineage":["https://openalex.org/I21193070"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chong Wang","raw_affiliation_strings":["School of Electrical Engineering, Beijing Jiaotong University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0001-9515-8916","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Beijing Jiaotong University, Beijing, China","institution_ids":["https://openalex.org/I21193070"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071348006","display_name":"Lide Wang","orcid":"https://orcid.org/0000-0002-0230-5321"},"institutions":[{"id":"https://openalex.org/I21193070","display_name":"Beijing Jiaotong University","ror":"https://ror.org/01yj56c84","country_code":"CN","type":"education","lineage":["https://openalex.org/I21193070"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lide Wang","raw_affiliation_strings":["School of Electrical Engineering, Beijing Jiaotong University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-0230-5321","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Beijing Jiaotong University, Beijing, China","institution_ids":["https://openalex.org/I21193070"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5073858246","display_name":"Huang Chen","orcid":"https://orcid.org/0000-0001-9912-8925"},"institutions":[{"id":"https://openalex.org/I21193070","display_name":"Beijing Jiaotong University","ror":"https://ror.org/01yj56c84","country_code":"CN","type":"education","lineage":["https://openalex.org/I21193070"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Huang Chen","raw_affiliation_strings":["School of Electrical Engineering, Beijing Jiaotong University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0001-9912-8925","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Beijing Jiaotong University, Beijing, China","institution_ids":["https://openalex.org/I21193070"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002544328","display_name":"Yueyi Yang","orcid":"https://orcid.org/0000-0001-5966-8169"},"institutions":[{"id":"https://openalex.org/I21193070","display_name":"Beijing Jiaotong University","ror":"https://ror.org/01yj56c84","country_code":"CN","type":"education","lineage":["https://openalex.org/I21193070"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yueyi Yang","raw_affiliation_strings":["School of Electrical Engineering, Beijing Jiaotong University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0001-5966-8169","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Beijing Jiaotong University, Beijing, China","institution_ids":["https://openalex.org/I21193070"]}]},{"author_position":"last","author":{"id":null,"display_name":"Ye Li","orcid":"https://orcid.org/0000-0002-4392-7135"},"institutions":[{"id":"https://openalex.org/I21193070","display_name":"Beijing Jiaotong University","ror":"https://ror.org/01yj56c84","country_code":"CN","type":"education","lineage":["https://openalex.org/I21193070"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ye Li","raw_affiliation_strings":["School of Electrical Engineering, Beijing Jiaotong University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-4392-7135","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Beijing Jiaotong University, Beijing, China","institution_ids":["https://openalex.org/I21193070"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I21193070"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":4.0347,"has_fulltext":true,"cited_by_count":57,"citation_normalized_percentile":{"value":0.95318014,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":100},"biblio":{"volume":"9","issue":null,"first_page":"2618","last_page":"2632"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11357","display_name":"Risk and Safety Analysis","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},"topics":[{"id":"https://openalex.org/T11357","display_name":"Risk and Safety Analysis","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.984499990940094,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12127","display_name":"Software System Performance and Reliability","score":0.9722999930381775,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault-tree-analysis","display_name":"Fault tree analysis","score":0.8026795387268066},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7572336196899414},{"id":"https://openalex.org/keywords/bayesian-network","display_name":"Bayesian network","score":0.6979755163192749},{"id":"https://openalex.org/keywords/dynamic-bayesian-network","display_name":"Dynamic Bayesian network","score":0.6661674976348877},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6605815887451172},{"id":"https://openalex.org/keywords/fault-management","display_name":"Fault management","score":0.6451847553253174},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.6364089250564575},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5983201861381531},{"id":"https://openalex.org/keywords/field","display_name":"Field (mathematics)","score":0.4590455889701843},{"id":"https://openalex.org/keywords/fault-model","display_name":"Fault model","score":0.4377674162387848},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.3678087592124939},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.3642116189002991},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1483614146709442},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.13371849060058594}],"concepts":[{"id":"https://openalex.org/C107094494","wikidata":"https://www.wikidata.org/wiki/Q428453","display_name":"Fault tree analysis","level":2,"score":0.8026795387268066},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7572336196899414},{"id":"https://openalex.org/C33724603","wikidata":"https://www.wikidata.org/wiki/Q812540","display_name":"Bayesian network","level":2,"score":0.6979755163192749},{"id":"https://openalex.org/C82142266","wikidata":"https://www.wikidata.org/wiki/Q3456604","display_name":"Dynamic Bayesian network","level":3,"score":0.6661674976348877},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6605815887451172},{"id":"https://openalex.org/C108074857","wikidata":"https://www.wikidata.org/wiki/Q3067360","display_name":"Fault management","level":3,"score":0.6451847553253174},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6364089250564575},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5983201861381531},{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.4590455889701843},{"id":"https://openalex.org/C167391956","wikidata":"https://www.wikidata.org/wiki/Q1401211","display_name":"Fault model","level":3,"score":0.4377674162387848},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.3678087592124939},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.3642116189002991},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1483614146709442},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.13371849060058594},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C62611344","wikidata":"https://www.wikidata.org/wiki/Q1062658","display_name":"Node (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C202444582","wikidata":"https://www.wikidata.org/wiki/Q837863","display_name":"Pure mathematics","level":1,"score":0.0},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.0},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2020.3046681","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2020.3046681","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/9312710/09302584.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:1cb07d9c458f406a97e35eae0ce7a91f","is_oa":true,"landing_page_url":"https://doaj.org/article/1cb07d9c458f406a97e35eae0ce7a91f","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 9, Pp 2618-2632 (2021)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2020.3046681","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2020.3046681","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/9312710/09302584.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G43119211","display_name":null,"funder_award_id":"2018YSJ149","funder_id":"https://openalex.org/F4320335787","funder_display_name":"Fundamental Research Funds for the Central Universities"},{"id":"https://openalex.org/G6692000877","display_name":null,"funder_award_id":"SRI2019070","funder_id":"https://openalex.org/F4320323066","funder_display_name":"Beijing Jiaotong University"}],"funders":[{"id":"https://openalex.org/F4320316125","display_name":"China Railway","ror":"https://ror.org/044wv3489"},{"id":"https://openalex.org/F4320323066","display_name":"Beijing Jiaotong University","ror":"https://ror.org/01yj56c84"},{"id":"https://openalex.org/F4320332253","display_name":"Coastal Response Research Center, University of New Hampshire","ror":"https://ror.org/01rmh9n78"},{"id":"https://openalex.org/F4320335787","display_name":"Fundamental Research Funds for the Central Universities","ror":null}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W3114274294.pdf","grobid_xml":"https://content.openalex.org/works/W3114274294.grobid-xml"},"referenced_works_count":45,"referenced_works":["https://openalex.org/W121446020","https://openalex.org/W775357307","https://openalex.org/W1561828851","https://openalex.org/W1976102130","https://openalex.org/W2000317690","https://openalex.org/W2003109266","https://openalex.org/W2065135339","https://openalex.org/W2066195678","https://openalex.org/W2086668606","https://openalex.org/W2097663773","https://openalex.org/W2121337044","https://openalex.org/W2154884120","https://openalex.org/W2155093967","https://openalex.org/W2347027361","https://openalex.org/W2468457481","https://openalex.org/W2593553545","https://openalex.org/W2620928019","https://openalex.org/W2749337119","https://openalex.org/W2772986546","https://openalex.org/W2794149938","https://openalex.org/W2808901627","https://openalex.org/W2899875829","https://openalex.org/W2903200774","https://openalex.org/W2911890521","https://openalex.org/W2913541943","https://openalex.org/W2924488604","https://openalex.org/W2943441383","https://openalex.org/W2943972830","https://openalex.org/W2951297932","https://openalex.org/W2965147845","https://openalex.org/W2969990337","https://openalex.org/W2971998305","https://openalex.org/W2973189226","https://openalex.org/W2996907627","https://openalex.org/W3000534023","https://openalex.org/W3019448100","https://openalex.org/W3026374379","https://openalex.org/W3026737558","https://openalex.org/W3030616540","https://openalex.org/W3035421035","https://openalex.org/W3049636381","https://openalex.org/W4244061199","https://openalex.org/W4245138339","https://openalex.org/W6633525228","https://openalex.org/W6650410788"],"related_works":["https://openalex.org/W4319221757","https://openalex.org/W2380738857","https://openalex.org/W3128072696","https://openalex.org/W2363876627","https://openalex.org/W4323669679","https://openalex.org/W2390994030","https://openalex.org/W4245138339","https://openalex.org/W2899875829","https://openalex.org/W2002484325","https://openalex.org/W2578973671"],"abstract_inverted_index":{"Train":[0],"network":[1,82],"control":[2],"management":[3],"system":[4],"(TCMS)":[5],"is":[6,69,77,100],"an":[7],"important":[8],"part":[9],"of":[10,16,39,55,66,90,93,116,124],"the":[11,17,30,35,40,47,60,72,80,88,114,120,133],"High-speed":[12,128],"rail":[13,129],"train.":[14],"Because":[15],"TCMS's":[18],"complex":[19],"and":[20,52,59,106],"redundant":[21],"structure,":[22],"long-term":[23],"operation":[24],"environment,":[25],"etc.,":[26],"breakdowns":[27],"inevitably":[28],"in":[29,132],"long-time":[31],"running.":[32],"Based":[33],"on":[34],"historical":[36],"fault":[37,62,74,103,134],"data":[38],"TCMS":[41,56,67,121],"accumulated":[42],"during":[43],"their":[44],"online":[45],"service,":[46],"working":[48],"principles,":[49],"failure":[50,68],"modes,":[51],"effects":[53],"analysis":[54],"are":[57],"researched":[58],"dynamic":[61,73],"tree":[63,75],"(DFT)":[64],"model":[65,76,87],"built.":[70],"Then,":[71],"transformed":[78],"into":[79],"Bayesian":[81],"(BN)":[83],"model,":[84],"which":[85],"can":[86],"reliability":[89,107,115],"such":[91],"types":[92],"systems.":[94],"Finally,":[95],"combining":[96],"DFT":[97],"with":[98],"BN":[99],"used":[101],"for":[102,119],"probability":[104],"estimation":[105],"assessment.":[108],"The":[109],"results":[110],"present":[111],"that":[112],"increasing":[113],"key":[117],"modules":[118],"would":[122],"be":[123],"great":[125],"help":[126],"to":[127],"train":[130],"engineers":[131],"diagnosis":[135],"field.":[136]},"counts_by_year":[{"year":2026,"cited_by_count":7},{"year":2025,"cited_by_count":12},{"year":2024,"cited_by_count":11},{"year":2023,"cited_by_count":10},{"year":2022,"cited_by_count":16},{"year":2021,"cited_by_count":1}],"updated_date":"2026-07-25T09:21:30.201066","created_date":"2025-10-10T00:00:00"}