{"id":"https://openalex.org/W3108373283","doi":"https://doi.org/10.1109/access.2020.3042092","title":"A Method to Utilize Mismatch Size to Produce an Additional Stable Bit in a Tilting SRAM-Based PUF","display_name":"A Method to Utilize Mismatch Size to Produce an Additional Stable Bit in a Tilting SRAM-Based PUF","publication_year":2020,"publication_date":"2020-01-01","ids":{"openalex":"https://openalex.org/W3108373283","doi":"https://doi.org/10.1109/access.2020.3042092","mag":"3108373283"},"language":"en","primary_location":{"id":"doi:10.1109/access.2020.3042092","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2020.3042092","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09277526.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09277526.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5006858727","display_name":"Yizhak Shifman","orcid":"https://orcid.org/0000-0003-1089-1081"},"institutions":[{"id":"https://openalex.org/I13955877","display_name":"Bar-Ilan University","ror":"https://ror.org/03kgsv495","country_code":"IL","type":"education","lineage":["https://openalex.org/I13955877"]}],"countries":["IL"],"is_corresponding":true,"raw_author_name":"Yizhak Shifman","raw_affiliation_strings":["Emerging Nanoscaled Integrated Circuits and Systems Laboratory, Faculty of Engineering, Bar-Ilan University, Ramat Gan, Israel"],"affiliations":[{"raw_affiliation_string":"Emerging Nanoscaled Integrated Circuits and Systems Laboratory, Faculty of Engineering, Bar-Ilan University, Ramat Gan, Israel","institution_ids":["https://openalex.org/I13955877"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5052033346","display_name":"Avi Miller","orcid":"https://orcid.org/0000-0003-4645-3841"},"institutions":[{"id":"https://openalex.org/I13955877","display_name":"Bar-Ilan University","ror":"https://ror.org/03kgsv495","country_code":"IL","type":"education","lineage":["https://openalex.org/I13955877"]}],"countries":["IL"],"is_corresponding":false,"raw_author_name":"Avi Miller","raw_affiliation_strings":["Emerging Nanoscaled Integrated Circuits and Systems Laboratory, Faculty of Engineering, Bar-Ilan University, Ramat Gan, Israel"],"affiliations":[{"raw_affiliation_string":"Emerging Nanoscaled Integrated Circuits and Systems Laboratory, Faculty of Engineering, Bar-Ilan University, Ramat Gan, Israel","institution_ids":["https://openalex.org/I13955877"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071090334","display_name":"Osnat Keren","orcid":"https://orcid.org/0000-0002-3101-9551"},"institutions":[{"id":"https://openalex.org/I13955877","display_name":"Bar-Ilan University","ror":"https://ror.org/03kgsv495","country_code":"IL","type":"education","lineage":["https://openalex.org/I13955877"]}],"countries":["IL"],"is_corresponding":false,"raw_author_name":"Osnat Keren","raw_affiliation_strings":["Emerging Nanoscaled Integrated Circuits and Systems Laboratory, Faculty of Engineering, Bar-Ilan University, Ramat Gan, Israel"],"affiliations":[{"raw_affiliation_string":"Emerging Nanoscaled Integrated Circuits and Systems Laboratory, Faculty of Engineering, Bar-Ilan University, Ramat Gan, Israel","institution_ids":["https://openalex.org/I13955877"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057416540","display_name":"Yoav Weizman","orcid":null},"institutions":[{"id":"https://openalex.org/I13955877","display_name":"Bar-Ilan University","ror":"https://ror.org/03kgsv495","country_code":"IL","type":"education","lineage":["https://openalex.org/I13955877"]}],"countries":["IL"],"is_corresponding":false,"raw_author_name":"Yoav Weizman","raw_affiliation_strings":["Emerging Nanoscaled Integrated Circuits and Systems Laboratory, Faculty of Engineering, Bar-Ilan University, Ramat Gan, Israel"],"affiliations":[{"raw_affiliation_string":"Emerging Nanoscaled Integrated Circuits and Systems Laboratory, Faculty of Engineering, Bar-Ilan University, Ramat Gan, Israel","institution_ids":["https://openalex.org/I13955877"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5038423749","display_name":"Joseph Shor","orcid":"https://orcid.org/0000-0002-9184-8642"},"institutions":[{"id":"https://openalex.org/I13955877","display_name":"Bar-Ilan University","ror":"https://ror.org/03kgsv495","country_code":"IL","type":"education","lineage":["https://openalex.org/I13955877"]}],"countries":["IL"],"is_corresponding":false,"raw_author_name":"Joseph Shor","raw_affiliation_strings":["Emerging Nanoscaled Integrated Circuits and Systems Laboratory, Faculty of Engineering, Bar-Ilan University, Ramat Gan, Israel"],"affiliations":[{"raw_affiliation_string":"Emerging Nanoscaled Integrated Circuits and Systems Laboratory, Faculty of Engineering, Bar-Ilan University, Ramat Gan, Israel","institution_ids":["https://openalex.org/I13955877"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5006858727"],"corresponding_institution_ids":["https://openalex.org/I13955877"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.7026,"has_fulltext":true,"cited_by_count":6,"citation_normalized_percentile":{"value":0.69539903,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":"8","issue":null,"first_page":"219137","last_page":"219150"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11301","display_name":"Advanced Surface Polishing Techniques","score":0.9908000230789185,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.7152309417724609},{"id":"https://openalex.org/keywords/bit","display_name":"Bit (key)","score":0.6502581834793091},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5733688473701477},{"id":"https://openalex.org/keywords/random-access-memory","display_name":"Random access memory","score":0.5198350548744202},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.24991768598556519},{"id":"https://openalex.org/keywords/computer-network","display_name":"Computer network","score":0.11456352472305298}],"concepts":[{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.7152309417724609},{"id":"https://openalex.org/C117011727","wikidata":"https://www.wikidata.org/wiki/Q1278488","display_name":"Bit (key)","level":2,"score":0.6502581834793091},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5733688473701477},{"id":"https://openalex.org/C2994168587","wikidata":"https://www.wikidata.org/wiki/Q5295","display_name":"Random access memory","level":2,"score":0.5198350548744202},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.24991768598556519},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.11456352472305298}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2020.3042092","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2020.3042092","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09277526.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:6cc27166fb8c49bab1e4283c688db412","is_oa":true,"landing_page_url":"https://doaj.org/article/6cc27166fb8c49bab1e4283c688db412","pdf_url":null,"source":{"id":"https://openalex.org/S112646816","display_name":"SHILAP Revista de lepidopterolog\u00eda","issn_l":"0300-5267","issn":["0300-5267","2340-4078"],"is_oa":true,"is_in_doaj":true,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 8, Pp 219137-219150 (2020)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2020.3042092","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2020.3042092","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09277526.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W3108373283.pdf","grobid_xml":"https://content.openalex.org/works/W3108373283.grobid-xml"},"referenced_works_count":40,"referenced_works":["https://openalex.org/W568013734","https://openalex.org/W609951012","https://openalex.org/W1517403092","https://openalex.org/W1965555277","https://openalex.org/W1971935236","https://openalex.org/W2000171858","https://openalex.org/W2012336980","https://openalex.org/W2076841548","https://openalex.org/W2088455835","https://openalex.org/W2116374153","https://openalex.org/W2128111793","https://openalex.org/W2135064681","https://openalex.org/W2144418895","https://openalex.org/W2145858709","https://openalex.org/W2289458927","https://openalex.org/W2295460135","https://openalex.org/W2483049553","https://openalex.org/W2573406683","https://openalex.org/W2580334840","https://openalex.org/W2594214473","https://openalex.org/W2791198567","https://openalex.org/W2794177219","https://openalex.org/W2899983232","https://openalex.org/W2907642298","https://openalex.org/W2908207594","https://openalex.org/W2921567073","https://openalex.org/W2942647760","https://openalex.org/W2959902518","https://openalex.org/W2961729905","https://openalex.org/W2964420546","https://openalex.org/W2969691719","https://openalex.org/W2980392069","https://openalex.org/W2999571526","https://openalex.org/W3022434015","https://openalex.org/W3033257916","https://openalex.org/W3090578905","https://openalex.org/W3097636983","https://openalex.org/W6643323797","https://openalex.org/W6676995458","https://openalex.org/W6761571986"],"related_works":["https://openalex.org/W1909296377","https://openalex.org/W2089002058","https://openalex.org/W2626140143","https://openalex.org/W3185029353","https://openalex.org/W3116379964","https://openalex.org/W2766443086","https://openalex.org/W2793465010","https://openalex.org/W1985899440","https://openalex.org/W2915176329","https://openalex.org/W2967161359"],"abstract_inverted_index":{"A":[0,115],"new":[1],"concept":[2,154],"for":[3,75,120,181],"Physical":[4],"Unclonable":[5],"Functions":[6],"(PUFs),":[7],"the":[8,26,32,36,46,58,63,73,92,96,125,131,151,163,173,177,207,211,216,230,233,237],"Mirror":[9,14,50,126,178,208,238],"PUF,":[10,179],"is":[11,68,81,88,118],"proposed.":[12],"The":[13,49,153,204],"PUF":[15,22,51,64,127,166,209,214,235],"can":[16],"be":[17],"applied":[18,156],"to":[19,34,71,91,133,157,210],"existing":[20],"preselected":[21],"circuits":[23],"by":[24,222],"post-processing":[25],"preselection":[27,54],"test":[28],"results":[29],"and":[30,107,136,148,185,197,236],"has":[31],"potential":[33],"double":[35],"number":[37,217],"of":[38,60,95,162,172,176,194,206,218,232],"effective":[39],"bits,":[40],"with":[41,99,109,187],"no":[42],"additional":[43],"area":[44],"at":[45],"bit-cell":[47],"level.":[48],"utilizes":[52],"a":[53,76,105,113,158,188],"test,":[55],"which":[56],"measures":[57],"amount":[59],"mismatch":[61,101,111,142],"within":[62],"cell.":[65],"This":[66],"data":[67],"generally":[69],"used":[70,82],"determine":[72],"mask":[74],"conventional":[77],"PUF.":[78,97,239],"Here,":[79],"it":[80],"as":[83,104,112,146],"an":[84],"entropy":[85],"source":[86],"that":[87,140],"not":[89],"correlated":[90],"original":[93,234],"response":[94,220],"Bit-cells":[98],"low":[100],"are":[102,144],"considered":[103,145],"\u20180\u2019":[106],"cells":[108,132,175],"high":[110],"\u20181\u2019.":[114],"systematic":[116],"method":[117],"shown":[119],"identifying":[121],"unstable":[122,147,174],"bits":[123,143,221],"in":[124],"response.":[128,152],"It":[129],"classifies":[130],"\u2018low\u2019,":[134],"\u2018medium\u2019":[135],"\u2018high\u2019":[137],"mismatch,":[138],"such":[139],"medium":[141],"masked":[149],"from":[150],"was":[155,227],"65nm":[159],"Si":[160],"implementation":[161],"Capacitive":[164,212],"Tilt":[165],"(Shifman":[167],"et":[168],"al.,":[169],"2020).":[170],"All":[171],"except":[180],"0.03%,":[182],"were":[183],"identified":[184],"masked,":[186],"worst-case":[189],"corner":[190],"Bit":[191],"Error-Rate":[192],"(BER)":[193],"only":[195],"2.35E-5":[196],"0.00026%":[198],"erroneous":[199],"responses":[200,231],"across":[201],"all":[202],"corners.":[203],"application":[205],"tilt":[213],"increased":[215],"stable":[219],"66%.":[223],"No":[224],"observable":[225],"correlation":[226],"found":[228],"between":[229]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2022,"cited_by_count":3}],"updated_date":"2026-03-20T23:20:44.827607","created_date":"2025-10-10T00:00:00"}