{"id":"https://openalex.org/W3111080369","doi":"https://doi.org/10.1109/access.2020.3041507","title":"Investigation of Relative Humidity Sensing Using Tapered No-Core Fiber Coated With Graphene Oxide Film","display_name":"Investigation of Relative Humidity Sensing Using Tapered No-Core Fiber Coated With Graphene Oxide Film","publication_year":2020,"publication_date":"2020-01-01","ids":{"openalex":"https://openalex.org/W3111080369","doi":"https://doi.org/10.1109/access.2020.3041507","mag":"3111080369"},"language":"en","primary_location":{"id":"doi:10.1109/access.2020.3041507","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2020.3041507","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09285329.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09285329.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100423331","display_name":"Hua Yang","orcid":"https://orcid.org/0000-0002-0650-5240"},"institutions":[{"id":"https://openalex.org/I3131412887","display_name":"Jiangxi University of Technology","ror":"https://ror.org/05k2j8e48","country_code":"CN","type":"education","lineage":["https://openalex.org/I3131412887"]},{"id":"https://openalex.org/I32394136","display_name":"Northumbria University","ror":"https://ror.org/049e6bc10","country_code":"GB","type":"education","lineage":["https://openalex.org/I32394136"]},{"id":"https://openalex.org/I927504317","display_name":"Nanchang Hangkong University","ror":"https://ror.org/0369pvp92","country_code":"CN","type":"education","lineage":["https://openalex.org/I927504317"]}],"countries":["CN","GB"],"is_corresponding":true,"raw_author_name":"Hua Yang","raw_affiliation_strings":["Department of Mathematics, Physics and Electrical Engineering, Northumbria University, Newcastle Upon Tyne, U.K","Jiangxi Engineering Laboratory for Optoelectronics Testing Technology, Nanchang, China","Key Laboratory of Nondestructive Testing, Ministry of Education, Nanchang Hangkong University, Nanchang, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Mathematics, Physics and Electrical Engineering, Northumbria University, Newcastle Upon Tyne, U.K","institution_ids":["https://openalex.org/I32394136"]},{"raw_affiliation_string":"Jiangxi Engineering Laboratory for Optoelectronics Testing Technology, Nanchang, China","institution_ids":["https://openalex.org/I3131412887"]},{"raw_affiliation_string":"Key Laboratory of Nondestructive Testing, Ministry of Education, Nanchang Hangkong University, Nanchang, China","institution_ids":["https://openalex.org/I927504317"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100446327","display_name":"Juan Liu","orcid":"https://orcid.org/0000-0003-0973-8557"},"institutions":[{"id":"https://openalex.org/I3131412887","display_name":"Jiangxi University of Technology","ror":"https://ror.org/05k2j8e48","country_code":"CN","type":"education","lineage":["https://openalex.org/I3131412887"]},{"id":"https://openalex.org/I927504317","display_name":"Nanchang Hangkong University","ror":"https://ror.org/0369pvp92","country_code":"CN","type":"education","lineage":["https://openalex.org/I927504317"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Juan Liu","raw_affiliation_strings":["Jiangxi Engineering Laboratory for Optoelectronics Testing Technology, Nanchang, China","Key Laboratory of Nondestructive Testing, Ministry of Education, Nanchang Hangkong University, Nanchang, China"],"raw_orcid":"https://orcid.org/0000-0003-0973-8557","affiliations":[{"raw_affiliation_string":"Jiangxi Engineering Laboratory for Optoelectronics Testing Technology, Nanchang, China","institution_ids":["https://openalex.org/I3131412887"]},{"raw_affiliation_string":"Key Laboratory of Nondestructive Testing, Ministry of Education, Nanchang Hangkong University, Nanchang, China","institution_ids":["https://openalex.org/I927504317"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100395525","display_name":"Bin Liu","orcid":"https://orcid.org/0000-0002-7971-3841"},"institutions":[{"id":"https://openalex.org/I3131412887","display_name":"Jiangxi University of Technology","ror":"https://ror.org/05k2j8e48","country_code":"CN","type":"education","lineage":["https://openalex.org/I3131412887"]},{"id":"https://openalex.org/I927504317","display_name":"Nanchang Hangkong University","ror":"https://ror.org/0369pvp92","country_code":"CN","type":"education","lineage":["https://openalex.org/I927504317"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Bin Liu","raw_affiliation_strings":["Jiangxi Engineering Laboratory for Optoelectronics Testing Technology, Nanchang, China","Key Laboratory of Nondestructive Testing, Ministry of Education, Nanchang Hangkong University, Nanchang, China"],"raw_orcid":"https://orcid.org/0000-0002-7971-3841","affiliations":[{"raw_affiliation_string":"Jiangxi Engineering Laboratory for Optoelectronics Testing Technology, Nanchang, China","institution_ids":["https://openalex.org/I3131412887"]},{"raw_affiliation_string":"Key Laboratory of Nondestructive Testing, Ministry of Education, Nanchang Hangkong University, Nanchang, China","institution_ids":["https://openalex.org/I927504317"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056885498","display_name":"Chaowei Luo","orcid":null},"institutions":[{"id":"https://openalex.org/I3131412887","display_name":"Jiangxi University of Technology","ror":"https://ror.org/05k2j8e48","country_code":"CN","type":"education","lineage":["https://openalex.org/I3131412887"]},{"id":"https://openalex.org/I927504317","display_name":"Nanchang Hangkong University","ror":"https://ror.org/0369pvp92","country_code":"CN","type":"education","lineage":["https://openalex.org/I927504317"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chaowei Luo","raw_affiliation_strings":["Jiangxi Engineering Laboratory for Optoelectronics Testing Technology, Nanchang, China","Key Laboratory of Nondestructive Testing, Ministry of Education, Nanchang Hangkong University, Nanchang, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Jiangxi Engineering Laboratory for Optoelectronics Testing Technology, Nanchang, China","institution_ids":["https://openalex.org/I3131412887"]},{"raw_affiliation_string":"Key Laboratory of Nondestructive Testing, Ministry of Education, Nanchang Hangkong University, Nanchang, China","institution_ids":["https://openalex.org/I927504317"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102201295","display_name":"Zhen Yi","orcid":null},"institutions":[{"id":"https://openalex.org/I3131412887","display_name":"Jiangxi University of Technology","ror":"https://ror.org/05k2j8e48","country_code":"CN","type":"education","lineage":["https://openalex.org/I3131412887"]},{"id":"https://openalex.org/I927504317","display_name":"Nanchang Hangkong University","ror":"https://ror.org/0369pvp92","country_code":"CN","type":"education","lineage":["https://openalex.org/I927504317"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhen Yi","raw_affiliation_strings":["Jiangxi Engineering Laboratory for Optoelectronics Testing Technology, Nanchang, China","Key Laboratory of Nondestructive Testing, Ministry of Education, Nanchang Hangkong University, Nanchang, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Jiangxi Engineering Laboratory for Optoelectronics Testing Technology, Nanchang, China","institution_ids":["https://openalex.org/I3131412887"]},{"raw_affiliation_string":"Key Laboratory of Nondestructive Testing, Ministry of Education, Nanchang Hangkong University, Nanchang, China","institution_ids":["https://openalex.org/I927504317"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5027610911","display_name":"Lichun Ma","orcid":"https://orcid.org/0000-0002-1268-5313"},"institutions":[{"id":"https://openalex.org/I3131412887","display_name":"Jiangxi University of Technology","ror":"https://ror.org/05k2j8e48","country_code":"CN","type":"education","lineage":["https://openalex.org/I3131412887"]},{"id":"https://openalex.org/I927504317","display_name":"Nanchang Hangkong University","ror":"https://ror.org/0369pvp92","country_code":"CN","type":"education","lineage":["https://openalex.org/I927504317"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lichun Ma","raw_affiliation_strings":["Jiangxi Engineering Laboratory for Optoelectronics Testing Technology, Nanchang, China","Key Laboratory of Nondestructive Testing, Ministry of Education, Nanchang Hangkong University, Nanchang, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Jiangxi Engineering Laboratory for Optoelectronics Testing Technology, Nanchang, China","institution_ids":["https://openalex.org/I3131412887"]},{"raw_affiliation_string":"Key Laboratory of Nondestructive Testing, Ministry of Education, Nanchang Hangkong University, Nanchang, China","institution_ids":["https://openalex.org/I927504317"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111686990","display_name":"Shengpeng Wan","orcid":null},"institutions":[{"id":"https://openalex.org/I3131412887","display_name":"Jiangxi University of Technology","ror":"https://ror.org/05k2j8e48","country_code":"CN","type":"education","lineage":["https://openalex.org/I3131412887"]},{"id":"https://openalex.org/I927504317","display_name":"Nanchang Hangkong University","ror":"https://ror.org/0369pvp92","country_code":"CN","type":"education","lineage":["https://openalex.org/I927504317"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Sheng-Peng Wan","raw_affiliation_strings":["Jiangxi Engineering Laboratory for Optoelectronics Testing Technology, Nanchang, China","Key Laboratory of Nondestructive Testing, Ministry of Education, Nanchang Hangkong University, Nanchang, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Jiangxi Engineering Laboratory for Optoelectronics Testing Technology, Nanchang, China","institution_ids":["https://openalex.org/I3131412887"]},{"raw_affiliation_string":"Key Laboratory of Nondestructive Testing, Ministry of Education, Nanchang Hangkong University, Nanchang, China","institution_ids":["https://openalex.org/I927504317"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057394874","display_name":"Andrew R. Pike","orcid":"https://orcid.org/0000-0002-1888-9798"},"institutions":[{"id":"https://openalex.org/I84884186","display_name":"Newcastle University","ror":"https://ror.org/01kj2bm70","country_code":"GB","type":"education","lineage":["https://openalex.org/I84884186"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Andrew R. Pike","raw_affiliation_strings":["School of Chemistry, Newcastle University, Newcastle Upon Tyne, U.K"],"raw_orcid":"https://orcid.org/0000-0002-1888-9798","affiliations":[{"raw_affiliation_string":"School of Chemistry, Newcastle University, Newcastle Upon Tyne, U.K","institution_ids":["https://openalex.org/I84884186"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5086922590","display_name":"Yongqing Fu","orcid":"https://orcid.org/0000-0001-9797-4036"},"institutions":[{"id":"https://openalex.org/I32394136","display_name":"Northumbria University","ror":"https://ror.org/049e6bc10","country_code":"GB","type":"education","lineage":["https://openalex.org/I32394136"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Yong Qing Fu","raw_affiliation_strings":["Department of Mathematics, Physics and Electrical Engineering, Northumbria University, Newcastle Upon Tyne, U.K"],"raw_orcid":"https://orcid.org/0000-0001-9797-4036","affiliations":[{"raw_affiliation_string":"Department of Mathematics, Physics and Electrical Engineering, Northumbria University, Newcastle Upon Tyne, U.K","institution_ids":["https://openalex.org/I32394136"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100755662","display_name":"Qiang Wu","orcid":"https://orcid.org/0000-0002-2901-7434"},"institutions":[{"id":"https://openalex.org/I3131412887","display_name":"Jiangxi University of Technology","ror":"https://ror.org/05k2j8e48","country_code":"CN","type":"education","lineage":["https://openalex.org/I3131412887"]},{"id":"https://openalex.org/I32394136","display_name":"Northumbria University","ror":"https://ror.org/049e6bc10","country_code":"GB","type":"education","lineage":["https://openalex.org/I32394136"]},{"id":"https://openalex.org/I927504317","display_name":"Nanchang Hangkong University","ror":"https://ror.org/0369pvp92","country_code":"CN","type":"education","lineage":["https://openalex.org/I927504317"]}],"countries":["CN","GB"],"is_corresponding":false,"raw_author_name":"Qiang Wu","raw_affiliation_strings":["Department of Mathematics, Physics and Electrical Engineering, Northumbria University, Newcastle Upon Tyne, U.K","Jiangxi Engineering Laboratory for Optoelectronics Testing Technology, Nanchang, China","Key Laboratory of Nondestructive Testing, Ministry of Education, Nanchang Hangkong University, Nanchang, China"],"raw_orcid":"https://orcid.org/0000-0002-2901-7434","affiliations":[{"raw_affiliation_string":"Department of Mathematics, Physics and Electrical Engineering, Northumbria University, Newcastle Upon Tyne, U.K","institution_ids":["https://openalex.org/I32394136"]},{"raw_affiliation_string":"Jiangxi Engineering Laboratory for Optoelectronics Testing Technology, Nanchang, China","institution_ids":["https://openalex.org/I3131412887"]},{"raw_affiliation_string":"Key Laboratory of Nondestructive Testing, Ministry of Education, Nanchang Hangkong University, Nanchang, China","institution_ids":["https://openalex.org/I927504317"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100719068","display_name":"Xingdao He","orcid":"https://orcid.org/0000-0003-4173-8178"},"institutions":[{"id":"https://openalex.org/I3131412887","display_name":"Jiangxi University of Technology","ror":"https://ror.org/05k2j8e48","country_code":"CN","type":"education","lineage":["https://openalex.org/I3131412887"]},{"id":"https://openalex.org/I927504317","display_name":"Nanchang Hangkong University","ror":"https://ror.org/0369pvp92","country_code":"CN","type":"education","lineage":["https://openalex.org/I927504317"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xingdao He","raw_affiliation_strings":["Jiangxi Engineering Laboratory for Optoelectronics Testing Technology, Nanchang, China","Key Laboratory of Nondestructive Testing, Ministry of Education, Nanchang Hangkong University, Nanchang, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Jiangxi Engineering Laboratory for Optoelectronics Testing Technology, Nanchang, China","institution_ids":["https://openalex.org/I3131412887"]},{"raw_affiliation_string":"Key Laboratory of Nondestructive Testing, Ministry of Education, Nanchang Hangkong University, Nanchang, China","institution_ids":["https://openalex.org/I927504317"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":11,"corresponding_author_ids":["https://openalex.org/A5100423331"],"corresponding_institution_ids":["https://openalex.org/I3131412887","https://openalex.org/I32394136","https://openalex.org/I927504317"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.8321,"has_fulltext":true,"cited_by_count":14,"citation_normalized_percentile":{"value":0.73648055,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":98},"biblio":{"volume":"8","issue":null,"first_page":"220755","last_page":"220761"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10205","display_name":"Advanced Fiber Optic Sensors","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10205","display_name":"Advanced Fiber Optic Sensors","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10299","display_name":"Photonic and Optical Devices","score":0.9912999868392944,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10461","display_name":"Gas Sensing Nanomaterials and Sensors","score":0.9742000102996826,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.8498765230178833},{"id":"https://openalex.org/keywords/microfiber","display_name":"Microfiber","score":0.7308950424194336},{"id":"https://openalex.org/keywords/graphene","display_name":"Graphene","score":0.6694302558898926},{"id":"https://openalex.org/keywords/core","display_name":"Core (optical fiber)","score":0.6073936820030212},{"id":"https://openalex.org/keywords/relative-humidity","display_name":"Relative humidity","score":0.5619518160820007},{"id":"https://openalex.org/keywords/optical-fiber","display_name":"Optical fiber","score":0.539901077747345},{"id":"https://openalex.org/keywords/fiber","display_name":"Fiber","score":0.5257257223129272},{"id":"https://openalex.org/keywords/fiber-optic-sensor","display_name":"Fiber optic sensor","score":0.5223727822303772},{"id":"https://openalex.org/keywords/interferometry","display_name":"Interferometry","score":0.49680760502815247},{"id":"https://openalex.org/keywords/refractive-index","display_name":"Refractive index","score":0.49662381410598755},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.46779948472976685},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.46384197473526},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.46357348561286926},{"id":"https://openalex.org/keywords/graded-index-fiber","display_name":"Graded-index fiber","score":0.4234272837638855},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.22493943572044373},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.14402002096176147},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.07648000121116638}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.8498765230178833},{"id":"https://openalex.org/C12820456","wikidata":"https://www.wikidata.org/wiki/Q920873","display_name":"Microfiber","level":2,"score":0.7308950424194336},{"id":"https://openalex.org/C30080830","wikidata":"https://www.wikidata.org/wiki/Q169917","display_name":"Graphene","level":2,"score":0.6694302558898926},{"id":"https://openalex.org/C2164484","wikidata":"https://www.wikidata.org/wiki/Q5170150","display_name":"Core (optical fiber)","level":2,"score":0.6073936820030212},{"id":"https://openalex.org/C158960510","wikidata":"https://www.wikidata.org/wiki/Q180600","display_name":"Relative humidity","level":2,"score":0.5619518160820007},{"id":"https://openalex.org/C194232370","wikidata":"https://www.wikidata.org/wiki/Q162","display_name":"Optical fiber","level":2,"score":0.539901077747345},{"id":"https://openalex.org/C519885992","wikidata":"https://www.wikidata.org/wiki/Q161","display_name":"Fiber","level":2,"score":0.5257257223129272},{"id":"https://openalex.org/C21651689","wikidata":"https://www.wikidata.org/wiki/Q1397427","display_name":"Fiber optic sensor","level":3,"score":0.5223727822303772},{"id":"https://openalex.org/C166689943","wikidata":"https://www.wikidata.org/wiki/Q850283","display_name":"Interferometry","level":2,"score":0.49680760502815247},{"id":"https://openalex.org/C42067758","wikidata":"https://www.wikidata.org/wiki/Q174102","display_name":"Refractive index","level":2,"score":0.49662381410598755},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.46779948472976685},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.46384197473526},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.46357348561286926},{"id":"https://openalex.org/C113102252","wikidata":"https://www.wikidata.org/wiki/Q5591869","display_name":"Graded-index fiber","level":4,"score":0.4234272837638855},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.22493943572044373},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.14402002096176147},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.07648000121116638},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/access.2020.3041507","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2020.3041507","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09285329.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:4bad1daf84ce4e6096d6f08bad9e8292","is_oa":true,"landing_page_url":"https://doaj.org/article/4bad1daf84ce4e6096d6f08bad9e8292","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 8, Pp 220755-220761 (2020)","raw_type":"article"},{"id":"pmh:oai:eprints.ncl.ac.uk:277600","is_oa":false,"landing_page_url":null,"pdf_url":null,"source":{"id":"https://openalex.org/S4306402485","display_name":"Newcastle University ePrints (Newcastle Univesity)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I84884186","host_organization_name":"Newcastle University","host_organization_lineage":["https://openalex.org/I84884186"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":""}],"best_oa_location":{"id":"doi:10.1109/access.2020.3041507","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2020.3041507","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09285329.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1322583595","display_name":null,"funder_award_id":"41266001","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G3424620400","display_name":null,"funder_award_id":"62065013","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G5074054487","display_name":null,"funder_award_id":"YC2020-S523","funder_id":"https://openalex.org/F4320311344","funder_display_name":"Nanchang Hangkong University"},{"id":"https://openalex.org/G7524057045","display_name":null,"funder_award_id":"61865013","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320311344","display_name":"Nanchang Hangkong University","ror":"https://ror.org/0369pvp92"},{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W3111080369.pdf","grobid_xml":"https://content.openalex.org/works/W3111080369.grobid-xml"},"referenced_works_count":32,"referenced_works":["https://openalex.org/W264598563","https://openalex.org/W281699245","https://openalex.org/W1981201940","https://openalex.org/W2013689985","https://openalex.org/W2039838782","https://openalex.org/W2041858177","https://openalex.org/W2064623781","https://openalex.org/W2066527057","https://openalex.org/W2071521037","https://openalex.org/W2107616928","https://openalex.org/W2111472104","https://openalex.org/W2151117559","https://openalex.org/W2261396163","https://openalex.org/W2343120328","https://openalex.org/W2344148467","https://openalex.org/W2501980888","https://openalex.org/W2529140492","https://openalex.org/W2554616823","https://openalex.org/W2742662564","https://openalex.org/W2766044721","https://openalex.org/W2787962427","https://openalex.org/W2800200082","https://openalex.org/W2870740918","https://openalex.org/W2906172116","https://openalex.org/W2921713938","https://openalex.org/W2944881257","https://openalex.org/W2966610697","https://openalex.org/W3011432437","https://openalex.org/W3014184782","https://openalex.org/W3031670265","https://openalex.org/W3046723577","https://openalex.org/W6693103823"],"related_works":["https://openalex.org/W1998299717","https://openalex.org/W2027990312","https://openalex.org/W2613656038","https://openalex.org/W4231299486","https://openalex.org/W2157137839","https://openalex.org/W1979655169","https://openalex.org/W1996568222","https://openalex.org/W2035036442","https://openalex.org/W1987818718","https://openalex.org/W2038705077"],"abstract_inverted_index":{"A":[0],"microfiber":[1],"interferometer":[2],"based":[3],"on":[4,61,80],"a":[5,14,26,36,66,91,113,124,168,172],"single-mode":[6,8],"tapered-no-core":[7],"(STNCS)":[9],"fiber":[10,33,64,110,163],"structure":[11,34,111],"coated":[12],"with":[13,112,142],"thin":[15],"layer":[16],"of":[17,72,102,116,127,133,145,156,187],"graphene":[18],"oxide":[19],"(GO)":[20],"was":[21,55,135],"proposed":[22,162],"and":[23,75,148,158,176],"demonstrated":[24],"as":[25],"relative":[27],"humidity":[28,165],"(RH)":[29],"sensor.":[30],"The":[31,51,70,86,137,161],"STNCS":[32,109],"has":[35,139,167],"strong":[37],"evanescent":[38],"field,":[39],"which":[40],"can":[41],"sensitively":[42],"response":[43],"to":[44,57],"changes":[45],"in":[46,121,130,184],"the":[47,59,62,76,100,108,131,185],"surrounding":[48],"refractive":[49],"index.":[50],"moisture-sensitive":[52],"material":[53],"GO":[54,73,103],"used":[56],"form":[58],"film":[60],"no-core":[63],"by":[65],"dip":[67],"impregnation":[68],"method.":[69],"effects":[71],"concentration":[74,101],"tapered":[77],"waist":[78,93,114],"diameter":[79,94,115],"RH":[81,97,122,188],"sensitivity":[82,126,170],"were":[83],"studied":[84],"experimentally.":[85],"experimental":[87],"results":[88],"showed":[89],"that":[90],"thinner":[92],"provides":[95],"higher":[96],"sensitivity.":[98],"When":[99],"solution":[104],"is":[105],"0.01":[106],"mg/mL,":[107],"2.9":[117],"\u03bcm":[118],"performs":[119],"better":[120],"sensing;":[123],"high":[125,169],"0.461":[128],"nm/%RH":[129],"range":[132,175],"40-98%":[134],"achieved.":[136],"sensor":[138,166],"good":[140,178],"stability":[141,179],"wavelength":[143],"fluctuations":[144],"\u00b10.009":[146],"nm":[147,150],"\u00b10.008":[149],"over":[151,171],"60":[152],"mins":[153],"at":[154],"RHs":[155],"50%":[157],"80%,":[159],"respectively.":[160],"optic":[164],"wide":[173],"measurement":[174],"offers":[177],"showing":[180],"promising":[181],"potential":[182],"application":[183],"field":[186],"sensing.":[189]},"counts_by_year":[{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":5}],"updated_date":"2026-05-06T08:25:59.206177","created_date":"2025-10-10T00:00:00"}