{"id":"https://openalex.org/W3098050078","doi":"https://doi.org/10.1109/access.2020.3037292","title":"An Efficient Degraded Deductive Fault Simulator for Small-Delay Defects","display_name":"An Efficient Degraded Deductive Fault Simulator for Small-Delay Defects","publication_year":2020,"publication_date":"2020-01-01","ids":{"openalex":"https://openalex.org/W3098050078","doi":"https://doi.org/10.1109/access.2020.3037292","mag":"3098050078"},"language":"en","primary_location":{"id":"doi:10.1109/access.2020.3037292","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2020.3037292","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09256321.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09256321.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102850068","display_name":"Tieqiao Liu","orcid":"https://orcid.org/0000-0001-5509-4540"},"institutions":[{"id":"https://openalex.org/I90727586","display_name":"Zhejiang University of Finance and Economics","ror":"https://ror.org/055vj5234","country_code":"CN","type":"education","lineage":["https://openalex.org/I90727586"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Tieqiao Liu","raw_affiliation_strings":["School of Information, Zhejiang University of Finance and Economics Dongfang College, Haining, China"],"raw_orcid":"https://orcid.org/0000-0001-5509-4540","affiliations":[{"raw_affiliation_string":"School of Information, Zhejiang University of Finance and Economics Dongfang College, Haining, China","institution_ids":["https://openalex.org/I90727586"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101456347","display_name":"Ting Yu","orcid":"https://orcid.org/0000-0003-4348-2671"},"institutions":[{"id":"https://openalex.org/I90727586","display_name":"Zhejiang University of Finance and Economics","ror":"https://ror.org/055vj5234","country_code":"CN","type":"education","lineage":["https://openalex.org/I90727586"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ting Yu","raw_affiliation_strings":["School of Information, Zhejiang University of Finance and Economics Dongfang College, Haining, China"],"raw_orcid":"https://orcid.org/0000-0003-4348-2671","affiliations":[{"raw_affiliation_string":"School of Information, Zhejiang University of Finance and Economics Dongfang College, Haining, China","institution_ids":["https://openalex.org/I90727586"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100400155","display_name":"Shuo Wang","orcid":"https://orcid.org/0000-0002-4098-7319"},"institutions":[{"id":"https://openalex.org/I90727586","display_name":"Zhejiang University of Finance and Economics","ror":"https://ror.org/055vj5234","country_code":"CN","type":"education","lineage":["https://openalex.org/I90727586"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shuo Wang","raw_affiliation_strings":["School of Information, Zhejiang University of Finance and Economics Dongfang College, Haining, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Information, Zhejiang University of Finance and Economics Dongfang College, Haining, China","institution_ids":["https://openalex.org/I90727586"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5037772300","display_name":"Shuo Cai","orcid":"https://orcid.org/0000-0003-4375-3187"},"institutions":[{"id":"https://openalex.org/I56934997","display_name":"Changsha University of Science and Technology","ror":"https://ror.org/03yph8055","country_code":"CN","type":"education","lineage":["https://openalex.org/I56934997"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shuo Cai","raw_affiliation_strings":["School of Computer and Communication Engineering, Changsha University of Science and Technology, Changsha, China"],"raw_orcid":"https://orcid.org/0000-0003-4375-3187","affiliations":[{"raw_affiliation_string":"School of Computer and Communication Engineering, Changsha University of Science and Technology, Changsha, China","institution_ids":["https://openalex.org/I56934997"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":2.0213,"has_fulltext":true,"cited_by_count":12,"citation_normalized_percentile":{"value":0.868126,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":97},"biblio":{"volume":"8","issue":null,"first_page":"204855","last_page":"204862"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9966999888420105,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7245993614196777},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.47638219594955444},{"id":"https://openalex.org/keywords/simulation","display_name":"Simulation","score":0.44756263494491577},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.4302918314933777},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3725428879261017},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.36990058422088623},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.3559073805809021},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.11163994669914246},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.07849130034446716}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7245993614196777},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.47638219594955444},{"id":"https://openalex.org/C44154836","wikidata":"https://www.wikidata.org/wiki/Q45045","display_name":"Simulation","level":1,"score":0.44756263494491577},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.4302918314933777},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3725428879261017},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.36990058422088623},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.3559073805809021},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.11163994669914246},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.07849130034446716},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2020.3037292","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2020.3037292","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09256321.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:ef86e160ae5343cd92a9646d221c985a","is_oa":true,"landing_page_url":"https://doaj.org/article/ef86e160ae5343cd92a9646d221c985a","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 8, Pp 204855-204862 (2020)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2020.3037292","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2020.3037292","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09256321.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G3292031857","display_name":null,"funder_award_id":"62002314","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G3465470381","display_name":null,"funder_award_id":"18A137","funder_id":"https://openalex.org/F4320333642","funder_display_name":"Scientific Research Foundation of Hunan Provincial Education Department"},{"id":"https://openalex.org/G378297106","display_name":null,"funder_award_id":"61804037","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G800251812","display_name":null,"funder_award_id":"18A137","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G8061179271","display_name":null,"funder_award_id":"2019dfy003","funder_id":"https://openalex.org/F4320322927","funder_display_name":"Zhejiang University"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320322927","display_name":"Zhejiang University","ror":"https://ror.org/00a2xv884"},{"id":"https://openalex.org/F4320333642","display_name":"Scientific Research Foundation of Hunan Provincial Education Department","ror":null}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W3098050078.pdf","grobid_xml":"https://content.openalex.org/works/W3098050078.grobid-xml"},"referenced_works_count":28,"referenced_works":["https://openalex.org/W246882494","https://openalex.org/W346138648","https://openalex.org/W1833248402","https://openalex.org/W1974885092","https://openalex.org/W1982628661","https://openalex.org/W1986228509","https://openalex.org/W1999039453","https://openalex.org/W2021218329","https://openalex.org/W2075060462","https://openalex.org/W2076000316","https://openalex.org/W2098171066","https://openalex.org/W2100821253","https://openalex.org/W2103922093","https://openalex.org/W2109986557","https://openalex.org/W2111154686","https://openalex.org/W2120349980","https://openalex.org/W2127774081","https://openalex.org/W2137756604","https://openalex.org/W2140004775","https://openalex.org/W2149424544","https://openalex.org/W2151275401","https://openalex.org/W2152042493","https://openalex.org/W2169061104","https://openalex.org/W2511040012","https://openalex.org/W2939094974","https://openalex.org/W3147331103","https://openalex.org/W4231973520","https://openalex.org/W4242961060"],"related_works":["https://openalex.org/W2534928293","https://openalex.org/W2150099345","https://openalex.org/W2160318243","https://openalex.org/W1490077415","https://openalex.org/W3004580327","https://openalex.org/W2182874356","https://openalex.org/W3034806817","https://openalex.org/W1815542355","https://openalex.org/W2152540334","https://openalex.org/W4289655666"],"abstract_inverted_index":{"An":[0],"efficient":[1],"degraded":[2,106],"deductive":[3,64,107,122],"simulator":[4,130],"for":[5,31,38,84,93],"small":[6,32],"delay":[7,33],"defects":[8],"is":[9,58,67,118],"proposed.":[10,45],"The":[11],"proposed":[12,68,129],"method":[13],"takes":[14],"into":[15],"account":[16],"the":[17,54,71,98,105,114,128,135,149,161],"conditions":[18],"of":[19,116],"re-convergence":[20],"sensitization":[21],"and":[22,27,97,113,153],"hazard-based":[23],"detection,":[24],"providing":[25],"fast":[26],"accurate":[28],"simulation":[29,36,56,65,137,151],"results":[30,125],"defects.":[34],"Separate":[35],"strategies":[37],"faults":[39,47,86,100],"with":[40,104,148,160],"different":[41],"fault":[42,49,94,136],"effects":[43,50,95],"are":[44,79,101],"For":[46,60],"on":[48,87,145,157],"re-convergent":[51,89],"fan-out":[52,88],"stems,":[53,90],"serial":[55,77,150],"technique":[57,66],"applied.":[59],"other":[61,99],"faults,":[62],"a":[63,142,154],"to":[69],"accelerate":[70,134],"simulation.":[72],"Different":[73],"from":[74],"previous":[75],"works,":[76],"simulations":[78],"carried":[80],"out":[81],"no":[82],"longer":[83],"all":[85],"but":[91],"only":[92],"re-convergences,":[96],"parallel":[102],"simulated":[103],"technique,":[108],"which":[109],"eliminates":[110],"\u201cAND\u201d":[111],"operation":[112],"propagation":[115],"fault-list":[117],"simpler":[119],"than":[120],"conventional":[121],"ones.":[123],"Experimental":[124],"demonstrate":[126],"that":[127,131],"can":[132],"further":[133],"in":[138],"efficiency.":[139],"It":[140],"achieves":[141],"28.3X":[143],"speedup":[144,156],"average":[146,158],"compared":[147,159],"method,":[152],"3.92X":[155],"critical":[162],"path":[163],"tracing":[164],"based":[165],"method.":[166]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":4},{"year":2021,"cited_by_count":4}],"updated_date":"2026-08-14T07:06:38.338062","created_date":"2025-10-10T00:00:00"}