{"id":"https://openalex.org/W3095348362","doi":"https://doi.org/10.1109/access.2020.3035215","title":"Event Sequence Model Application for Prioritization and Detection of Pre-Fault Waveforms on Power Distribution Lines","display_name":"Event Sequence Model Application for Prioritization and Detection of Pre-Fault Waveforms on Power Distribution Lines","publication_year":2020,"publication_date":"2020-01-01","ids":{"openalex":"https://openalex.org/W3095348362","doi":"https://doi.org/10.1109/access.2020.3035215","mag":"3095348362"},"language":"en","primary_location":{"id":"doi:10.1109/access.2020.3035215","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2020.3035215","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09246588.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09246588.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5041554662","display_name":"Sang Keun Moon","orcid":"https://orcid.org/0000-0002-3121-738X"},"institutions":[{"id":"https://openalex.org/I198972184","display_name":"Korea Electric Power Corporation (South Korea)","ror":"https://ror.org/04fperw70","country_code":"KR","type":"company","lineage":["https://openalex.org/I198972184"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Sang Keun Moon","raw_affiliation_strings":["Korea Electric Power Corporation Research Institute, Daejeon, South Korea"],"raw_orcid":"https://orcid.org/0000-0002-3121-738X","affiliations":[{"raw_affiliation_string":"Korea Electric Power Corporation Research Institute, Daejeon, South Korea","institution_ids":["https://openalex.org/I198972184"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5054934224","display_name":"Byung-Sung Lee","orcid":null},"institutions":[{"id":"https://openalex.org/I198972184","display_name":"Korea Electric Power Corporation (South Korea)","ror":"https://ror.org/04fperw70","country_code":"KR","type":"company","lineage":["https://openalex.org/I198972184"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Byung-Sung Lee","raw_affiliation_strings":["Korea Electric Power Corporation Research Institute, Daejeon, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Korea Electric Power Corporation Research Institute, Daejeon, South Korea","institution_ids":["https://openalex.org/I198972184"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5041554662"],"corresponding_institution_ids":["https://openalex.org/I198972184"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.1488,"has_fulltext":true,"cited_by_count":2,"citation_normalized_percentile":{"value":0.47144279,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"8","issue":null,"first_page":"198178","last_page":"198187"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10972","display_name":"Power Systems Fault Detection","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10972","display_name":"Power Systems Fault Detection","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11343","display_name":"Power Transformer Diagnostics and Insulation","score":0.9973000288009644,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11941","display_name":"Power System Reliability and Maintenance","score":0.9955000281333923,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/waveform","display_name":"Waveform","score":0.7741142511367798},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6519748568534851},{"id":"https://openalex.org/keywords/event","display_name":"Event (particle physics)","score":0.6365408897399902},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.52065509557724},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.48185527324676514},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.4813721776008606},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.4604613780975342},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.451568603515625},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.06661313772201538}],"concepts":[{"id":"https://openalex.org/C197424946","wikidata":"https://www.wikidata.org/wiki/Q1165717","display_name":"Waveform","level":3,"score":0.7741142511367798},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6519748568534851},{"id":"https://openalex.org/C2779662365","wikidata":"https://www.wikidata.org/wiki/Q5416694","display_name":"Event (particle physics)","level":2,"score":0.6365408897399902},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.52065509557724},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.48185527324676514},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.4813721776008606},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.4604613780975342},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.451568603515625},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.06661313772201538},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C554190296","wikidata":"https://www.wikidata.org/wiki/Q47528","display_name":"Radar","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2020.3035215","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2020.3035215","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09246588.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:99afd83f2444460480b07e4c9fdb49c2","is_oa":true,"landing_page_url":"https://doaj.org/article/99afd83f2444460480b07e4c9fdb49c2","pdf_url":null,"source":{"id":"https://openalex.org/S112646816","display_name":"SHILAP Revista de lepidopterolog\u00eda","issn_l":"0300-5267","issn":["0300-5267","2340-4078"],"is_oa":true,"is_in_doaj":true,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 8, Pp 198178-198187 (2020)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2020.3035215","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2020.3035215","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09246588.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W3095348362.pdf","grobid_xml":"https://content.openalex.org/works/W3095348362.grobid-xml"},"referenced_works_count":24,"referenced_works":["https://openalex.org/W2022261067","https://openalex.org/W2046936439","https://openalex.org/W2095736798","https://openalex.org/W2100654063","https://openalex.org/W2123334199","https://openalex.org/W2155077058","https://openalex.org/W2561992868","https://openalex.org/W2616878470","https://openalex.org/W2917190209","https://openalex.org/W2920868647","https://openalex.org/W2921594629","https://openalex.org/W2922400393","https://openalex.org/W2924320232","https://openalex.org/W2927011378","https://openalex.org/W2945351333","https://openalex.org/W2945876738","https://openalex.org/W2946861234","https://openalex.org/W2963121047","https://openalex.org/W2983686748","https://openalex.org/W3005105578","https://openalex.org/W3021388496","https://openalex.org/W3111891206","https://openalex.org/W4249046259","https://openalex.org/W6786930951"],"related_works":["https://openalex.org/W1974895211","https://openalex.org/W2176409448","https://openalex.org/W2129841057","https://openalex.org/W3040712279","https://openalex.org/W2364769705","https://openalex.org/W2056136368","https://openalex.org/W2374664672","https://openalex.org/W4367555392","https://openalex.org/W2883092465","https://openalex.org/W2114441484"],"abstract_inverted_index":{"In":[0],"this":[1],"article,":[2],"a":[3,106,117,138,143],"conceptual":[4],"approach":[5,72],"is":[6,41,103,131,147],"presented":[7],"for":[8,50,120],"pre-fault":[9],"detection":[10],"regarding":[11],"the":[12,84,89,93,98,164],"waveform":[13,35,60],"analytic":[14],"aspects":[15],"of":[16,59,177,189],"distribution":[17,125,140,190],"monitoring":[18,170],"and":[19,31,62,108,142,152,166,180],"measuring":[20],"devices.":[21],"Also":[22],"included":[23],"are":[24,55],"event":[25,63,94,178],"patterns":[26,76,179],"specifically":[27],"arranged":[28],"by":[29,83,91],"feature":[30],"classification":[32,61],"methods.":[33],"A":[34],"class":[36],"patterning":[37],"algorithm":[38],"on":[39,97,124,159,169],"time-series":[40],"applied":[42,104],"experimentally":[43],"to":[44,149],"field":[45],"waveforms":[46,54,181],"that":[47,74,112,182],"were":[48],"obtained":[49],"several":[51],"years.":[52],"The":[53,101,172],"processed":[56],"with":[57],"consideration":[58],"sequence":[64,145],"processing":[65],"because":[66],"these":[67],"detect":[68],"fault-related":[69,78],"phenomena.":[70],"This":[71,127],"demonstrates":[73],"conspicuous":[75],"in":[77,88,105,187],"sequences":[79],"can":[80,183],"be":[81,184],"discovered":[82],"data-driven":[85],"structure":[86,95],"described":[87],"paper":[90],"designing":[92],"depending":[96],"network":[99],"configuration.":[100],"application":[102],"pattern-learning":[107],"pattern-detection":[109],"process":[110],"so":[111],"integrating":[113],"both":[114],"approaches":[115],"provides":[116],"meaningful":[118],"consolidation":[119],"detecting":[121],"abnormal":[122,153],"conditions":[123],"lines.":[126],"event-based":[128],"fault":[129],"prevention":[130],"employed":[132],"using":[133],"actual":[134],"acquisition":[135],"data":[136],"from":[137],"domestic-scale":[139],"system":[141],"unique":[144],"model":[146,174],"constructed":[148],"determine":[150],"normal":[151],"conditions.":[154],"Event":[155],"index":[156],"manipulation":[157],"analysis":[158],"different":[160],"risk":[161],"levels":[162],"defines":[163],"pattern":[165],"its":[167],"impact":[168],"results.":[171],"proposed":[173],"guides":[175],"recognition":[176],"pre-emptively":[185],"detected":[186],"advance":[188],"line":[191],"failures.":[192]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}