{"id":"https://openalex.org/W3087842385","doi":"https://doi.org/10.1109/access.2020.3026382","title":"CMOS Skin Sensor for Mobile Skin Diagnosis Using an Electronic Cotton Pad","display_name":"CMOS Skin Sensor for Mobile Skin Diagnosis Using an Electronic Cotton Pad","publication_year":2020,"publication_date":"2020-01-01","ids":{"openalex":"https://openalex.org/W3087842385","doi":"https://doi.org/10.1109/access.2020.3026382","mag":"3087842385"},"language":"en","primary_location":{"id":"doi:10.1109/access.2020.3026382","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2020.3026382","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09204962.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09204962.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5064553781","display_name":"Hyunsub Norbert Rie","orcid":"https://orcid.org/0000-0003-0891-458X"},"institutions":[{"id":"https://openalex.org/I848706","display_name":"Sungkyunkwan University","ror":"https://ror.org/04q78tk20","country_code":"KR","type":"education","lineage":["https://openalex.org/I848706"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hyunsub Norbert Rie","raw_affiliation_strings":["College of Information and Communication Engineering, Sungkyunkwan University, Suwon, South Korea"],"raw_orcid":"https://orcid.org/0000-0003-0891-458X","affiliations":[{"raw_affiliation_string":"College of Information and Communication Engineering, Sungkyunkwan University, Suwon, South Korea","institution_ids":["https://openalex.org/I848706"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101738974","display_name":"Jun-Hyung Cho","orcid":"https://orcid.org/0000-0001-8913-8345"},"institutions":[{"id":"https://openalex.org/I848706","display_name":"Sungkyunkwan University","ror":"https://ror.org/04q78tk20","country_code":"KR","type":"education","lineage":["https://openalex.org/I848706"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Junhyung Cho","raw_affiliation_strings":["College of Information and Communication Engineering, Sungkyunkwan University, Suwon, South Korea"],"raw_orcid":"https://orcid.org/0000-0001-8913-8345","affiliations":[{"raw_affiliation_string":"College of Information and Communication Engineering, Sungkyunkwan University, Suwon, South Korea","institution_ids":["https://openalex.org/I848706"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5012012201","display_name":"Jungjoon Lee","orcid":null},"institutions":[{"id":"https://openalex.org/I848706","display_name":"Sungkyunkwan University","ror":"https://ror.org/04q78tk20","country_code":"KR","type":"education","lineage":["https://openalex.org/I848706"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jungjoon Lee","raw_affiliation_strings":["Sungkyunkwan University, Suwon, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Sungkyunkwan University, Suwon, South Korea","institution_ids":["https://openalex.org/I848706"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5076491781","display_name":"Srinivas Gandla","orcid":"https://orcid.org/0000-0002-4586-1483"},"institutions":[{"id":"https://openalex.org/I848706","display_name":"Sungkyunkwan University","ror":"https://ror.org/04q78tk20","country_code":"KR","type":"education","lineage":["https://openalex.org/I848706"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Srinivas Gandla","raw_affiliation_strings":["Sungkyunkwan University, Suwon, South Korea"],"raw_orcid":"https://orcid.org/0000-0002-4586-1483","affiliations":[{"raw_affiliation_string":"Sungkyunkwan University, Suwon, South Korea","institution_ids":["https://openalex.org/I848706"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100321810","display_name":"Seong\u2010Jin Kim","orcid":"https://orcid.org/0000-0002-9353-5148"},"institutions":[{"id":"https://openalex.org/I48566637","display_name":"Ulsan National Institute of Science and Technology","ror":"https://ror.org/017cjz748","country_code":"KR","type":"education","lineage":["https://openalex.org/I48566637"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Seong-Jin Kim","raw_affiliation_strings":["School of Electrical and Computer Engineering, Ulsan National Institute of Science and Technology, Ulsan, South Korea"],"raw_orcid":"https://orcid.org/0000-0002-9353-5148","affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering, Ulsan National Institute of Science and Technology, Ulsan, South Korea","institution_ids":["https://openalex.org/I48566637"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5091341639","display_name":"Jaehyuk Choi","orcid":"https://orcid.org/0000-0003-4700-1900"},"institutions":[{"id":"https://openalex.org/I848706","display_name":"Sungkyunkwan University","ror":"https://ror.org/04q78tk20","country_code":"KR","type":"education","lineage":["https://openalex.org/I848706"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jaehyuk Choi","raw_affiliation_strings":["College of Information and Communication Engineering, Sungkyunkwan University, Suwon, South Korea"],"raw_orcid":"https://orcid.org/0000-0003-4700-1900","affiliations":[{"raw_affiliation_string":"College of Information and Communication Engineering, Sungkyunkwan University, Suwon, South Korea","institution_ids":["https://openalex.org/I848706"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.0853,"has_fulltext":true,"cited_by_count":2,"citation_normalized_percentile":{"value":0.39403466,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"8","issue":null,"first_page":"178816","last_page":"178824"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10338","display_name":"Advanced Sensor and Energy Harvesting Materials","score":0.994700014591217,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10338","display_name":"Advanced Sensor and Energy Harvesting Materials","score":0.994700014591217,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10623","display_name":"Thin-Film Transistor Technologies","score":0.9904000163078308,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11472","display_name":"Analytical Chemistry and Sensors","score":0.9891999959945679,"subfield":{"id":"https://openalex.org/subfields/1502","display_name":"Bioengineering"},"field":{"id":"https://openalex.org/fields/15","display_name":"Chemical Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/photodiode","display_name":"Photodiode","score":0.7737376689910889},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.697571873664856},{"id":"https://openalex.org/keywords/image-sensor","display_name":"Image sensor","score":0.6929712295532227},{"id":"https://openalex.org/keywords/pixel","display_name":"Pixel","score":0.6387032270431519},{"id":"https://openalex.org/keywords/correlated-double-sampling","display_name":"Correlated double sampling","score":0.5832805633544922},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5264965891838074},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.5112652778625488},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.49899864196777344},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.456460177898407},{"id":"https://openalex.org/keywords/cmos-sensor","display_name":"CMOS sensor","score":0.45038747787475586},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.42867574095726013},{"id":"https://openalex.org/keywords/wireless-sensor-network","display_name":"Wireless sensor network","score":0.41220754384994507},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.38456064462661743},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2317512333393097},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.19536492228507996},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.1692052185535431},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.12381216883659363},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.09042394161224365}],"concepts":[{"id":"https://openalex.org/C751236","wikidata":"https://www.wikidata.org/wiki/Q175943","display_name":"Photodiode","level":2,"score":0.7737376689910889},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.697571873664856},{"id":"https://openalex.org/C76935873","wikidata":"https://www.wikidata.org/wiki/Q209121","display_name":"Image sensor","level":2,"score":0.6929712295532227},{"id":"https://openalex.org/C160633673","wikidata":"https://www.wikidata.org/wiki/Q355198","display_name":"Pixel","level":2,"score":0.6387032270431519},{"id":"https://openalex.org/C118277053","wikidata":"https://www.wikidata.org/wiki/Q5172837","display_name":"Correlated double sampling","level":4,"score":0.5832805633544922},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5264965891838074},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.5112652778625488},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.49899864196777344},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.456460177898407},{"id":"https://openalex.org/C155512908","wikidata":"https://www.wikidata.org/wiki/Q210745","display_name":"CMOS sensor","level":3,"score":0.45038747787475586},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.42867574095726013},{"id":"https://openalex.org/C24590314","wikidata":"https://www.wikidata.org/wiki/Q336038","display_name":"Wireless sensor network","level":2,"score":0.41220754384994507},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.38456064462661743},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2317512333393097},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.19536492228507996},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.1692052185535431},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.12381216883659363},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.09042394161224365},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.0},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.0},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/access.2020.3026382","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2020.3026382","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09204962.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:6bda819637424a1d8a8cef598f91b3f6","is_oa":true,"landing_page_url":"https://doaj.org/article/6bda819637424a1d8a8cef598f91b3f6","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 8, Pp 178816-178824 (2020)","raw_type":"article"},{"id":"pmh:oai:scholarworks.unist.ac.kr:201301/48573","is_oa":false,"landing_page_url":"https://ieeexplore.ieee.org/abstract/document/9204962","pdf_url":null,"source":{"id":"https://openalex.org/S4306401118","display_name":"Scholarworks@UNIST (Ulsan National Institute of Science and Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I48566637","host_organization_name":"Ulsan National Institute of Science and Technology","host_organization_lineage":["https://openalex.org/I48566637"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"ARTICLE"}],"best_oa_location":{"id":"doi:10.1109/access.2020.3026382","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2020.3026382","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09204962.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1809255050","display_name":null,"funder_award_id":"2020R1C1C1011813","funder_id":"https://openalex.org/F4320322120","funder_display_name":"National Research Foundation of Korea"},{"id":"https://openalex.org/G3226827548","display_name":null,"funder_award_id":"10080403","funder_id":"https://openalex.org/F4320321681","funder_display_name":"Ministry of Trade, Industry and Energy"},{"id":"https://openalex.org/G7706502842","display_name":null,"funder_award_id":"NRF-2020R1C1C1011813","funder_id":"https://openalex.org/F4320322120","funder_display_name":"National Research Foundation of Korea"}],"funders":[{"id":"https://openalex.org/F4320320671","display_name":"National Research Foundation","ror":"https://ror.org/05s0g1g46"},{"id":"https://openalex.org/F4320321681","display_name":"Ministry of Trade, Industry and Energy","ror":"https://ror.org/008nkqk13"},{"id":"https://openalex.org/F4320322120","display_name":"National Research Foundation of Korea","ror":"https://ror.org/013aysd81"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W3087842385.pdf","grobid_xml":"https://content.openalex.org/works/W3087842385.grobid-xml"},"referenced_works_count":14,"referenced_works":["https://openalex.org/W117192379","https://openalex.org/W1587851335","https://openalex.org/W1998511197","https://openalex.org/W2076642115","https://openalex.org/W2089713751","https://openalex.org/W2103797279","https://openalex.org/W2111933279","https://openalex.org/W2148384915","https://openalex.org/W2321681641","https://openalex.org/W2514640588","https://openalex.org/W3129728957","https://openalex.org/W4245379603","https://openalex.org/W6604766143","https://openalex.org/W6726137155"],"related_works":["https://openalex.org/W1979129154","https://openalex.org/W2106574814","https://openalex.org/W2125775971","https://openalex.org/W1963996011","https://openalex.org/W2331709517","https://openalex.org/W2156731538","https://openalex.org/W1990138130","https://openalex.org/W2054060211","https://openalex.org/W2108529245","https://openalex.org/W810815649"],"abstract_inverted_index":{"This":[0,18],"paper":[1],"presents":[2],"a":[3,30,69,86,92,122,131],"complementary":[4],"metal-oxide":[5],"semiconductor":[6],"(CMOS)":[7],"skin":[8,65,138,196],"sensor":[9,19,142,160,186],"for":[10,26,37,55,194],"detecting":[11,27,38,151],"hydration,":[12],"sebum,":[13],"and":[14,29,41,68,84,91,110,148,154,167],"ultraviolet":[15],"(UV)":[16],"protection.":[17],"employs":[20],"pixels":[21,47],"comprising":[22],"interdigitated":[23],"capacitors":[24],"(IDCs)":[25],"hydration":[28],"30":[31],"\u00d7":[32,45,177],"24":[33],"photodiode":[34],"(PD)":[35],"array":[36],"UV":[39,103,163],"protection":[40,104,164],"sebum.":[42],"The":[43],"4":[44],"8":[46],"with":[48,136],"IDCs":[49,83],"over":[50],"the":[51,64,79,114,119,140,159,184],"PDs":[52],"are":[53,99],"used":[54],"area":[56,67],"efficiency;":[57],"they":[58],"afford":[59],"reliable":[60],"detection":[61],"regardless":[62],"of":[63,81,108,118,146,175],"contact":[66],"high":[70],"sensitivity,":[71],"which":[72],"is":[73,128],"achieved":[74],"via":[75],"pixel":[76],"merging.":[77],"For":[78],"readout":[80,117],"both":[82],"PDs,":[85],"column-parallel":[87],"multiple-sampling":[88],"analog":[89],"front-end":[90],"9b":[93],"successive":[94],"approximation":[95],"register":[96],"analog-to-digital":[97],"converter":[98],"integrated.":[100],"To":[101],"detect":[102,162],"under":[105,165],"different":[106],"wavelengths":[107],"UVA":[109,166],"UVB,":[111],"we":[112],"implement":[113],"spatiotemporal":[115],"delta":[116],"PDs.":[120],"Furthermore,":[121],"fully":[123],"characterized,":[124],"proof-of-concept":[125],"prototype":[126],"chip":[127],"fabricated":[129],"using":[130],"110-nm":[132],"CMOS":[133],"process.":[134],"Compared":[135],"conventional":[137],"sensors,":[139],"proposed":[141,185],"exhibits":[143],"higher":[144],"sensitivities":[145],"0.25%/min":[147],"2.32%/mL":[149],"in":[150],"dehydration":[152],"rate":[153],"sebum":[155],"levels,":[156],"respectively.":[157],"Moreover,":[158],"can":[161,187],"UVB":[168],"wavelengths.":[169],"Owing":[170],"to":[171],"its":[172],"core":[173],"size":[174],"2.32":[176],"4.65":[178],"mm":[179],"<sup":[180],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[181],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</sup>":[182],",":[183],"potentially":[188],"be":[189],"integrated":[190],"into":[191],"cotton":[192],"pads":[193],"mobile":[195],"diagnosis.":[197]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1}],"updated_date":"2026-07-02T09:51:11.867554","created_date":"2025-10-10T00:00:00"}