{"id":"https://openalex.org/W3089035980","doi":"https://doi.org/10.1109/access.2020.3025153","title":"A 12-Bit Column-Parallel Two-Step Single-Slope ADC With a Foreground Calibration for CMOS Image Sensors","display_name":"A 12-Bit Column-Parallel Two-Step Single-Slope ADC With a Foreground Calibration for CMOS Image Sensors","publication_year":2020,"publication_date":"2020-01-01","ids":{"openalex":"https://openalex.org/W3089035980","doi":"https://doi.org/10.1109/access.2020.3025153","mag":"3089035980"},"language":"en","primary_location":{"id":"doi:10.1109/access.2020.3025153","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2020.3025153","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09201088.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09201088.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101622962","display_name":"Qihui Zhang","orcid":"https://orcid.org/0000-0001-7015-2059"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]},{"id":"https://openalex.org/I4210124847","display_name":"National Engineering Research Center of Electromagnetic Radiation Control Materials","ror":"https://ror.org/02k4dcs46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210124847"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qihui Zhang","raw_affiliation_strings":["State Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China"],"raw_orcid":"https://orcid.org/0000-0001-7015-2059","affiliations":[{"raw_affiliation_string":"State Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I4210124847","https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100749757","display_name":"Ning Ning","orcid":"https://orcid.org/0000-0001-7893-1428"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]},{"id":"https://openalex.org/I4210124847","display_name":"National Engineering Research Center of Electromagnetic Radiation Control Materials","ror":"https://ror.org/02k4dcs46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210124847"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ning Ning","raw_affiliation_strings":["State Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China"],"raw_orcid":"https://orcid.org/0000-0001-7893-1428","affiliations":[{"raw_affiliation_string":"State Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I4210124847","https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100336850","display_name":"Jing Li","orcid":"https://orcid.org/0000-0001-9980-0224"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]},{"id":"https://openalex.org/I4210124847","display_name":"National Engineering Research Center of Electromagnetic Radiation Control Materials","ror":"https://ror.org/02k4dcs46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210124847"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jing Li","raw_affiliation_strings":["State Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China"],"raw_orcid":"https://orcid.org/0000-0001-9980-0224","affiliations":[{"raw_affiliation_string":"State Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I4210124847","https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100377679","display_name":"Qi Yu","orcid":"https://orcid.org/0000-0002-0490-0749"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]},{"id":"https://openalex.org/I4210124847","display_name":"National Engineering Research Center of Electromagnetic Radiation Control Materials","ror":"https://ror.org/02k4dcs46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210124847"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qi Yu","raw_affiliation_strings":["State Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I4210124847","https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5067510762","display_name":"Kejun Wu","orcid":null},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]},{"id":"https://openalex.org/I4210124847","display_name":"National Engineering Research Center of Electromagnetic Radiation Control Materials","ror":"https://ror.org/02k4dcs46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210124847"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Kejun Wu","raw_affiliation_strings":["State Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China"],"raw_orcid":"https://orcid.org/0000-0001-5472-0570","affiliations":[{"raw_affiliation_string":"State Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I4210124847","https://openalex.org/I150229711"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100350975","display_name":"Zhong Zhang","orcid":"https://orcid.org/0000-0003-2611-9424"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]},{"id":"https://openalex.org/I4210124847","display_name":"National Engineering Research Center of Electromagnetic Radiation Control Materials","ror":"https://ror.org/02k4dcs46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210124847"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhong Zhang","raw_affiliation_strings":["State Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China"],"raw_orcid":"https://orcid.org/0000-0003-2611-9424","affiliations":[{"raw_affiliation_string":"State Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I4210124847","https://openalex.org/I150229711"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":1.0094,"has_fulltext":true,"cited_by_count":27,"citation_normalized_percentile":{"value":0.76132508,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"8","issue":null,"first_page":"172467","last_page":"172480"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9952999949455261,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11472","display_name":"Analytical Chemistry and Sensors","score":0.9889000058174133,"subfield":{"id":"https://openalex.org/subfields/1502","display_name":"Bioengineering"},"field":{"id":"https://openalex.org/fields/15","display_name":"Chemical Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/comparator","display_name":"Comparator","score":0.8766646385192871},{"id":"https://openalex.org/keywords/differential-nonlinearity","display_name":"Differential nonlinearity","score":0.8212325572967529},{"id":"https://openalex.org/keywords/integral-nonlinearity","display_name":"Integral nonlinearity","score":0.792775571346283},{"id":"https://openalex.org/keywords/effective-number-of-bits","display_name":"Effective number of bits","score":0.7858428955078125},{"id":"https://openalex.org/keywords/least-significant-bit","display_name":"Least significant bit","score":0.7049310207366943},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6700198650360107},{"id":"https://openalex.org/keywords/offset","display_name":"Offset (computer science)","score":0.6269749999046326},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.502882182598114},{"id":"https://openalex.org/keywords/fixed-pattern-noise","display_name":"Fixed-pattern noise","score":0.49951910972595215},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.49583396315574646},{"id":"https://openalex.org/keywords/successive-approximation-adc","display_name":"Successive approximation ADC","score":0.43829137086868286},{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.43722668290138245},{"id":"https://openalex.org/keywords/image-sensor","display_name":"Image sensor","score":0.4163574278354645},{"id":"https://openalex.org/keywords/pixel","display_name":"Pixel","score":0.4137510061264038},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.31343454122543335},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.22361278533935547},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.22004061937332153},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.16083171963691711},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.15501189231872559},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1500997245311737},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.14071103930473328},{"id":"https://openalex.org/keywords/converters","display_name":"Converters","score":0.12042787671089172},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.0874243974685669},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.07747635245323181}],"concepts":[{"id":"https://openalex.org/C155745195","wikidata":"https://www.wikidata.org/wiki/Q1164179","display_name":"Comparator","level":3,"score":0.8766646385192871},{"id":"https://openalex.org/C71217194","wikidata":"https://www.wikidata.org/wiki/Q575958","display_name":"Differential nonlinearity","level":3,"score":0.8212325572967529},{"id":"https://openalex.org/C130829357","wikidata":"https://www.wikidata.org/wiki/Q1665386","display_name":"Integral nonlinearity","level":4,"score":0.792775571346283},{"id":"https://openalex.org/C16671190","wikidata":"https://www.wikidata.org/wiki/Q505579","display_name":"Effective number of bits","level":3,"score":0.7858428955078125},{"id":"https://openalex.org/C4305246","wikidata":"https://www.wikidata.org/wiki/Q3885225","display_name":"Least significant bit","level":2,"score":0.7049310207366943},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6700198650360107},{"id":"https://openalex.org/C175291020","wikidata":"https://www.wikidata.org/wiki/Q1156822","display_name":"Offset (computer science)","level":2,"score":0.6269749999046326},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.502882182598114},{"id":"https://openalex.org/C2778368474","wikidata":"https://www.wikidata.org/wiki/Q5456322","display_name":"Fixed-pattern noise","level":3,"score":0.49951910972595215},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.49583396315574646},{"id":"https://openalex.org/C60154766","wikidata":"https://www.wikidata.org/wiki/Q2650458","display_name":"Successive approximation ADC","level":4,"score":0.43829137086868286},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.43722668290138245},{"id":"https://openalex.org/C76935873","wikidata":"https://www.wikidata.org/wiki/Q209121","display_name":"Image sensor","level":2,"score":0.4163574278354645},{"id":"https://openalex.org/C160633673","wikidata":"https://www.wikidata.org/wiki/Q355198","display_name":"Pixel","level":2,"score":0.4137510061264038},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.31343454122543335},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.22361278533935547},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.22004061937332153},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.16083171963691711},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.15501189231872559},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1500997245311737},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.14071103930473328},{"id":"https://openalex.org/C2778422915","wikidata":"https://www.wikidata.org/wiki/Q10302051","display_name":"Converters","level":3,"score":0.12042787671089172},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0874243974685669},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.07747635245323181},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2020.3025153","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2020.3025153","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09201088.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:9b27528ad67e463fb1e3fa75c7481434","is_oa":true,"landing_page_url":"https://doaj.org/article/9b27528ad67e463fb1e3fa75c7481434","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 8, Pp 172467-172480 (2020)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2020.3025153","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2020.3025153","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09201088.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.8600000143051147}],"awards":[{"id":"https://openalex.org/G3520842311","display_name":null,"funder_award_id":"61774028","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G5195687926","display_name":null,"funder_award_id":"61404022","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W3089035980.pdf","grobid_xml":"https://content.openalex.org/works/W3089035980.grobid-xml"},"referenced_works_count":33,"referenced_works":["https://openalex.org/W1503479382","https://openalex.org/W1541091770","https://openalex.org/W1607639185","https://openalex.org/W1636491923","https://openalex.org/W1975545060","https://openalex.org/W1985290029","https://openalex.org/W1994123466","https://openalex.org/W1999393635","https://openalex.org/W2015041420","https://openalex.org/W2036851601","https://openalex.org/W2042081546","https://openalex.org/W2053943475","https://openalex.org/W2082334180","https://openalex.org/W2094024001","https://openalex.org/W2104086223","https://openalex.org/W2113025650","https://openalex.org/W2122425004","https://openalex.org/W2136376206","https://openalex.org/W2145158355","https://openalex.org/W2147887812","https://openalex.org/W2150423223","https://openalex.org/W2164819109","https://openalex.org/W2175009324","https://openalex.org/W2200449959","https://openalex.org/W2568520569","https://openalex.org/W2655381514","https://openalex.org/W2883878442","https://openalex.org/W2966341337","https://openalex.org/W2993883558","https://openalex.org/W2996765167","https://openalex.org/W3012438093","https://openalex.org/W3034711398","https://openalex.org/W4231501498"],"related_works":["https://openalex.org/W4290755255","https://openalex.org/W2166674979","https://openalex.org/W2536327642","https://openalex.org/W2135048255","https://openalex.org/W2804896529","https://openalex.org/W2048428008","https://openalex.org/W1907199348","https://openalex.org/W2546069210","https://openalex.org/W2021405064","https://openalex.org/W3089035980"],"abstract_inverted_index":{"This":[0],"paper":[1],"proposes":[2],"a":[3,26,71,91,115],"novel":[4],"12-bit":[5],"column-parallel":[6],"two-step":[7],"single-slope":[8],"(SS)":[9],"analog-to-digital":[10],"converter":[11],"(ADC)":[12],"for":[13],"high-speed":[14],"CMOS":[15,93],"image":[16],"sensors.":[17],"Cooperating":[18],"with":[19,121],"the":[20,36,42,45,49,54,60,65,74,77,81,95,99,107,122,155],"output":[21],"offset":[22,62],"storage":[23],"(OOS)":[24],"technique,":[25],"new":[27],"correlated":[28],"double":[29],"sampling":[30,116],"(CDS)":[31],"is":[32,51,68,130,158],"adopted":[33],"to":[34,136],"reduce":[35],"non-uniformity":[37],"in":[38,90],"column-level":[39],"ADCs.":[40],"In":[41],"proposed":[43,96],"structure,":[44],"decision":[46],"point":[47],"of":[48,53,59,103,111,118,127,146],"comparator":[50,61],"independent":[52],"input":[55,66],"signal.":[56],"The":[57,124,139],"variation":[58],"caused":[63],"by":[64],"level":[67],"eliminated.":[69],"Through":[70],"foreground":[72],"calibration,":[73],"non-idealities":[75],"from":[76,133],"ramp":[78],"generator":[79],"and":[80,88,106,154],"column":[82],"ADC":[83,97,141],"are":[84],"both":[85],"corrected.":[86],"Design":[87],"simulation":[89],"130nm":[92],"process,":[94],"achieves":[98],"differential":[100],"nonlinearity":[101,109],"(DNL)":[102],"+0.76/-0.8":[104],"LSB":[105,113],"integral":[108],"(INL)":[110],"+1.06/-0.84":[112],"at":[114],"frequency":[117],"100":[119],"KS/s":[120],"calibration.":[123],"effective":[125],"number":[126],"bits":[128,135],"(ENOB)":[129],"also":[131],"improved":[132],"4.66":[134],"11.25":[137],"bits.":[138],"single":[140],"occupies":[142],"an":[143],"active":[144],"area":[145],"7.5":[147],"\u00d7":[148],"775":[149],"\u03bcm":[150],"<sup":[151],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[152],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</sup>":[153],"power":[156],"consumption":[157],"72":[159],"\u03bcW":[160],".":[161]},"counts_by_year":[{"year":2025,"cited_by_count":7},{"year":2024,"cited_by_count":10},{"year":2023,"cited_by_count":4},{"year":2022,"cited_by_count":5},{"year":2021,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}