{"id":"https://openalex.org/W3084236864","doi":"https://doi.org/10.1109/access.2020.3022292","title":"Analysis of Partial Discharges in Electrical Tree Growth Under Very Low Frequency (VLF) Excitation Through Pulse Sequence and Nonlinear Time Series Analysis","display_name":"Analysis of Partial Discharges in Electrical Tree Growth Under Very Low Frequency (VLF) Excitation Through Pulse Sequence and Nonlinear Time Series Analysis","publication_year":2020,"publication_date":"2020-01-01","ids":{"openalex":"https://openalex.org/W3084236864","doi":"https://doi.org/10.1109/access.2020.3022292","mag":"3084236864"},"language":"en","primary_location":{"id":"doi:10.1109/access.2020.3022292","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2020.3022292","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09187195.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09187195.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5028426449","display_name":"Pablo Donoso","orcid":"https://orcid.org/0000-0002-4534-5489"},"institutions":[{"id":"https://openalex.org/I75778554","display_name":"Federico Santa Mar\u00eda Technical University","ror":"https://ror.org/05510vn56","country_code":"CL","type":"education","lineage":["https://openalex.org/I75778554"]}],"countries":["CL"],"is_corresponding":false,"raw_author_name":"Pablo Donoso","raw_affiliation_strings":["Department of Electrical Engineering, Universidad T\u00e9cnica Federico Santa Mar\u00eda, Valpara\u00edso, Chile"],"raw_orcid":"https://orcid.org/0000-0002-4534-5489","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Universidad T\u00e9cnica Federico Santa Mar\u00eda, Valpara\u00edso, Chile","institution_ids":["https://openalex.org/I75778554"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5066097766","display_name":"Roger Schurch","orcid":"https://orcid.org/0000-0003-3041-2340"},"institutions":[{"id":"https://openalex.org/I75778554","display_name":"Federico Santa Mar\u00eda Technical University","ror":"https://ror.org/05510vn56","country_code":"CL","type":"education","lineage":["https://openalex.org/I75778554"]}],"countries":["CL"],"is_corresponding":false,"raw_author_name":"Roger Schurch","raw_affiliation_strings":["Department of Electrical Engineering, Universidad T\u00e9cnica Federico Santa Mar\u00eda, Valpara\u00edso, Chile"],"raw_orcid":"https://orcid.org/0000-0003-3041-2340","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Universidad T\u00e9cnica Federico Santa Mar\u00eda, Valpara\u00edso, Chile","institution_ids":["https://openalex.org/I75778554"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5053921091","display_name":"Jorge Alfredo Ardila\u2010Rey","orcid":"https://orcid.org/0000-0001-8811-2274"},"institutions":[{"id":"https://openalex.org/I75778554","display_name":"Federico Santa Mar\u00eda Technical University","ror":"https://ror.org/05510vn56","country_code":"CL","type":"education","lineage":["https://openalex.org/I75778554"]}],"countries":["CL"],"is_corresponding":false,"raw_author_name":"Jorge Ardila","raw_affiliation_strings":["Department of Electrical Engineering, Universidad T\u00e9cnica Federico Santa Mar\u00eda, Santiago, Chile"],"raw_orcid":"https://orcid.org/0000-0001-8811-2274","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Universidad T\u00e9cnica Federico Santa Mar\u00eda, Santiago, Chile","institution_ids":["https://openalex.org/I75778554"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5058994874","display_name":"Luis Orellana","orcid":"https://orcid.org/0000-0001-6751-9761"},"institutions":[{"id":"https://openalex.org/I75778554","display_name":"Federico Santa Mar\u00eda Technical University","ror":"https://ror.org/05510vn56","country_code":"CL","type":"education","lineage":["https://openalex.org/I75778554"]}],"countries":["CL"],"is_corresponding":false,"raw_author_name":"Luis Orellana","raw_affiliation_strings":["Department of Electrical Engineering, Universidad T\u00e9cnica Federico Santa Mar\u00eda, Santiago, Chile"],"raw_orcid":"https://orcid.org/0000-0001-6751-9761","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Universidad T\u00e9cnica Federico Santa Mar\u00eda, Santiago, Chile","institution_ids":["https://openalex.org/I75778554"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.8151,"has_fulltext":true,"cited_by_count":14,"citation_normalized_percentile":{"value":0.68543259,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"8","issue":null,"first_page":"163673","last_page":"163684"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11343","display_name":"Power Transformer Diagnostics and Insulation","score":0.9980999827384949,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10787","display_name":"Lightning and Electromagnetic Phenomena","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/3103","display_name":"Astronomy and Astrophysics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electrical-treeing","display_name":"Electrical treeing","score":0.8214817643165588},{"id":"https://openalex.org/keywords/partial-discharge","display_name":"Partial discharge","score":0.6736772060394287},{"id":"https://openalex.org/keywords/nonlinear-system","display_name":"Nonlinear system","score":0.5344300270080566},{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.49372562766075134},{"id":"https://openalex.org/keywords/pulsed-power","display_name":"Pulsed power","score":0.47750991582870483},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4622464179992676},{"id":"https://openalex.org/keywords/very-low-frequency","display_name":"Very low frequency","score":0.44235676527023315},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.429568886756897},{"id":"https://openalex.org/keywords/excitation","display_name":"Excitation","score":0.42731037735939026},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.38268741965293884},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.3804774880409241},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.32131651043891907},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.28890302777290344},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.2862333655357361},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.18949353694915771},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.15066048502922058}],"concepts":[{"id":"https://openalex.org/C175395656","wikidata":"https://www.wikidata.org/wiki/Q4384289","display_name":"Electrical treeing","level":4,"score":0.8214817643165588},{"id":"https://openalex.org/C130143024","wikidata":"https://www.wikidata.org/wiki/Q1929972","display_name":"Partial discharge","level":3,"score":0.6736772060394287},{"id":"https://openalex.org/C158622935","wikidata":"https://www.wikidata.org/wiki/Q660848","display_name":"Nonlinear system","level":2,"score":0.5344300270080566},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.49372562766075134},{"id":"https://openalex.org/C97039730","wikidata":"https://www.wikidata.org/wiki/Q552565","display_name":"Pulsed power","level":3,"score":0.47750991582870483},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4622464179992676},{"id":"https://openalex.org/C139358767","wikidata":"https://www.wikidata.org/wiki/Q549933","display_name":"Very low frequency","level":2,"score":0.44235676527023315},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.429568886756897},{"id":"https://openalex.org/C83581075","wikidata":"https://www.wikidata.org/wiki/Q1361503","display_name":"Excitation","level":2,"score":0.42731037735939026},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.38268741965293884},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.3804774880409241},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.32131651043891907},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.28890302777290344},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.2862333655357361},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.18949353694915771},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.15066048502922058},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2020.3022292","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2020.3022292","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09187195.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:00357e9ec58d470f86b335496f4e2405","is_oa":true,"landing_page_url":"https://doaj.org/article/00357e9ec58d470f86b335496f4e2405","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 8, Pp 163673-163684 (2020)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2020.3022292","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2020.3022292","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09187195.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G3866173595","display_name":null,"funder_award_id":"PI_L_18_19","funder_id":"https://openalex.org/F4320310976","funder_display_name":"Universidad T\u00e9cnica Federico Santa Mar\u00eda"},{"id":"https://openalex.org/G3966689545","display_name":null,"funder_award_id":"11181177","funder_id":"https://openalex.org/F4320338073","funder_display_name":"Fondo Nacional de Desarrollo Cient\u00edfico y Tecnol\u00f3gico"},{"id":"https://openalex.org/G4291817005","display_name":"ANALYSIS OF ELECTRICAL TREES AND PARTIAL DISCHARGES FROM VLF TO HARMONIC FREQUENCIES TO IMPROVE ASSET MANAGEMENT AND ELECTRICAL INSULATION DESIGNS","funder_award_id":"11181177","funder_id":"https://openalex.org/F4320331146","funder_display_name":"Agencia Nacional de Investigaci\u00f3n y Desarrollo"},{"id":"https://openalex.org/G5465356624","display_name":null,"funder_award_id":"11181177","funder_id":"https://openalex.org/F4320335542","funder_display_name":"Fondo Nacional de Desarrollo Cient\u00edfico, Tecnol\u00f3gico y de Innovaci\u00f3n Tecnol\u00f3gica"}],"funders":[{"id":"https://openalex.org/F4320310976","display_name":"Universidad T\u00e9cnica Federico Santa Mar\u00eda","ror":"https://ror.org/05510vn56"},{"id":"https://openalex.org/F4320331146","display_name":"Agencia Nacional de Investigaci\u00f3n y Desarrollo","ror":null},{"id":"https://openalex.org/F4320335542","display_name":"Fondo Nacional de Desarrollo Cient\u00edfico, Tecnol\u00f3gico y de Innovaci\u00f3n Tecnol\u00f3gica","ror":null},{"id":"https://openalex.org/F4320338073","display_name":"Fondo Nacional de Desarrollo Cient\u00edfico y Tecnol\u00f3gico","ror":"https://ror.org/02ap3w078"}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W3084236864.pdf","grobid_xml":"https://content.openalex.org/works/W3084236864.grobid-xml"},"referenced_works_count":53,"referenced_works":["https://openalex.org/W1549386224","https://openalex.org/W1963608955","https://openalex.org/W2005813168","https://openalex.org/W2008520616","https://openalex.org/W2029401646","https://openalex.org/W2031365860","https://openalex.org/W2040704490","https://openalex.org/W2044021879","https://openalex.org/W2050142243","https://openalex.org/W2055617798","https://openalex.org/W2069486183","https://openalex.org/W2078097197","https://openalex.org/W2081658954","https://openalex.org/W2103620646","https://openalex.org/W2106484083","https://openalex.org/W2116502967","https://openalex.org/W2122676029","https://openalex.org/W2128071386","https://openalex.org/W2128283293","https://openalex.org/W2134607168","https://openalex.org/W2134997324","https://openalex.org/W2138141197","https://openalex.org/W2139766622","https://openalex.org/W2142942278","https://openalex.org/W2143257327","https://openalex.org/W2147152337","https://openalex.org/W2155738431","https://openalex.org/W2160406537","https://openalex.org/W2166353047","https://openalex.org/W2323445795","https://openalex.org/W2511339896","https://openalex.org/W2513627937","https://openalex.org/W2551095394","https://openalex.org/W2607897949","https://openalex.org/W2783084715","https://openalex.org/W2784116390","https://openalex.org/W2802651627","https://openalex.org/W2894526830","https://openalex.org/W2903100116","https://openalex.org/W2907245523","https://openalex.org/W2967203835","https://openalex.org/W3026351312","https://openalex.org/W4212842665","https://openalex.org/W4232323818","https://openalex.org/W4238177721","https://openalex.org/W4239652802","https://openalex.org/W4239989644","https://openalex.org/W4243650946","https://openalex.org/W4246197340","https://openalex.org/W4251777845","https://openalex.org/W4299429830","https://openalex.org/W6606936116","https://openalex.org/W6700983859"],"related_works":["https://openalex.org/W2552921044","https://openalex.org/W2118231321","https://openalex.org/W2801209252","https://openalex.org/W2103991600","https://openalex.org/W2155409284","https://openalex.org/W2612972072","https://openalex.org/W2391132677","https://openalex.org/W2055059664","https://openalex.org/W2145380103","https://openalex.org/W3135141782"],"abstract_inverted_index":{"Electrical":[0,25],"treeing":[1],"is":[2,72,76],"the":[3,20,177,180,197,210,220,224,227,234,250],"main":[4],"degradation":[5],"mechanism":[6],"in":[7,57,134,260],"high":[8,84],"voltage":[9,69],"polymeric":[10],"insulation,":[11],"that":[12,142,175,204],"leads":[13],"to":[14,39,153,232,249],"power":[15,80],"system":[16,117,182,213],"plant":[17],"failure":[18],"and":[19,37,41,82,91,109,151],"loss":[21],"of":[22,127,172,179,187],"electricity":[23],"supply.":[24],"trees":[26,55,144],"grow":[27],"under":[28,62],"partial":[29],"discharge":[30],"(PD)":[31],"activity,":[32],"which":[33],"can":[34],"be":[35],"measured":[36],"analyzed":[38,52],"understand":[40],"characterize":[42,233],"electrical":[43,54,143,216,235],"tree":[44,217,236],"growth.":[45,218,237],"In":[46,185],"this":[47],"work,":[48],"PD":[49,97],"measurements":[50],"were":[51,100,167],"for":[53,78,96,245,253],"grown":[56,145],"epoxy":[58],"resin":[59],"needle-plane":[60],"samples":[61,160,255],"very":[63],"low":[64],"frequency":[65,259],"(VLF,":[66],"0.1":[67],"Hz)":[68],"excitation.":[70],"VLF":[71,147,246],"interesting":[73],"as":[74,123],"it":[75,201],"used":[77],"testing":[79],"cables":[81],"other":[83,221,261],"capacitance":[85],"insulation":[86],"loads.":[87],"However,":[88],"more":[89,194,207],"experience":[90],"new":[92],"methods":[93],"are":[94,132],"needed":[95],"interpretation.":[98],"PDs":[99],"studied":[101],"using":[102,223],"two":[103],"tools:":[104],"pulse":[105],"sequence":[106],"analysis":[107,113],"(PSA)":[108],"nonlinear":[110,181,211],"time":[111],"series":[112],"(NLTSA)":[114],"from":[115],"dynamic":[116,212],"theory.":[118],"PSA":[119,165,198],"was":[120,202,230],"treated":[121],"here":[122],"a":[124,241],"particular":[125],"case":[126],"NLTSA":[128,190,205,225],"since":[129],"their":[130,135],"constructions":[131],"similar":[133],"mathematical":[136],"treatment.":[137],"The":[138,238],"experimental":[139],"results":[140,239,251],"showed":[141,240],"at":[146,162,257],"had":[148],"branch-type":[149],"structure":[150],"times":[152,157],"breakdown":[154],"about":[155,209],"fifty":[156],"larger":[158],"than":[159,196],"aged":[161,256],"industrial":[163,258],"frequency.":[164],"plots":[166],"compared":[168,248],"with":[169,215],"2D":[170,191],"projections":[171,192],"state-space":[173],"trajectories":[174],"represent":[176],"dynamics":[178],"(NLTSA":[183],"approach).":[184],"terms":[186],"graphical":[188],"representation,":[189],"generated":[193],"clusters":[195],"plots,":[199],"thus,":[200],"interpreted":[203],"revealed":[206],"details":[208],"associated":[214],"On":[219],"hand,":[222],"approach,":[226],"correlation":[228],"dimension":[229],"estimated":[231],"different":[242],"evolution":[243],"obtained":[244],"excitation":[247],"reported":[252],"test":[254],"studies.":[262]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":3},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":4},{"year":2020,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}