{"id":"https://openalex.org/W3080420148","doi":"https://doi.org/10.1109/access.2020.3018821","title":"A Reliability Modeling Method Based on Phase-Type Distribution Aiming at Shock Model","display_name":"A Reliability Modeling Method Based on Phase-Type Distribution Aiming at Shock Model","publication_year":2020,"publication_date":"2020-01-01","ids":{"openalex":"https://openalex.org/W3080420148","doi":"https://doi.org/10.1109/access.2020.3018821","mag":"3080420148"},"language":"en","primary_location":{"id":"doi:10.1109/access.2020.3018821","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2020.3018821","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09174842.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09174842.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5057996752","display_name":"Long Wang","orcid":"https://orcid.org/0000-0002-3908-6361"},"institutions":[{"id":"https://openalex.org/I170215575","display_name":"National University of Defense Technology","ror":"https://ror.org/05d2yfz11","country_code":"CN","type":"education","lineage":["https://openalex.org/I170215575"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Long Wang","raw_affiliation_strings":["Laboratory of Science and Technology on Integrated Logistics Support, National University of Defense Technology, Changsha, China"],"raw_orcid":"https://orcid.org/0000-0002-3908-6361","affiliations":[{"raw_affiliation_string":"Laboratory of Science and Technology on Integrated Logistics Support, National University of Defense Technology, Changsha, China","institution_ids":["https://openalex.org/I170215575"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102873970","display_name":"Xu Luo","orcid":"https://orcid.org/0000-0001-6942-896X"},"institutions":[{"id":"https://openalex.org/I170215575","display_name":"National University of Defense Technology","ror":"https://ror.org/05d2yfz11","country_code":"CN","type":"education","lineage":["https://openalex.org/I170215575"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xu Luo","raw_affiliation_strings":["Laboratory of Science and Technology on Integrated Logistics Support, National University of Defense Technology, Changsha, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Laboratory of Science and Technology on Integrated Logistics Support, National University of Defense Technology, Changsha, China","institution_ids":["https://openalex.org/I170215575"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100618450","display_name":"Yue Li","orcid":"https://orcid.org/0000-0003-0376-5474"},"institutions":[{"id":"https://openalex.org/I170215575","display_name":"National University of Defense Technology","ror":"https://ror.org/05d2yfz11","country_code":"CN","type":"education","lineage":["https://openalex.org/I170215575"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yue Li","raw_affiliation_strings":["Laboratory of Science and Technology on Integrated Logistics Support, National University of Defense Technology, Changsha, China"],"raw_orcid":"https://orcid.org/0000-0003-0376-5474","affiliations":[{"raw_affiliation_string":"Laboratory of Science and Technology on Integrated Logistics Support, National University of Defense Technology, Changsha, China","institution_ids":["https://openalex.org/I170215575"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5089595840","display_name":"Jia Tang","orcid":"https://orcid.org/0009-0002-7873-8868"},"institutions":[{"id":"https://openalex.org/I4210102827","display_name":"Shanghai Customs College","ror":"https://ror.org/01agvej60","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210102827"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jia Tang","raw_affiliation_strings":["Dayaowan Customs Comprehensive Technical Service Center, Dalian, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dayaowan Customs Comprehensive Technical Service Center, Dalian, China","institution_ids":["https://openalex.org/I4210102827"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.1877,"has_fulltext":true,"cited_by_count":5,"citation_normalized_percentile":{"value":0.51456168,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"8","issue":null,"first_page":"154881","last_page":"154897"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11357","display_name":"Risk and Safety Analysis","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.994700014591217,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6789552569389343},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5652380585670471},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.48063603043556213},{"id":"https://openalex.org/keywords/type","display_name":"Type (biology)","score":0.42918288707733154},{"id":"https://openalex.org/keywords/reliability-theory","display_name":"Reliability theory","score":0.420097678899765},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.09174147248268127},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.09081628918647766},{"id":"https://openalex.org/keywords/failure-rate","display_name":"Failure rate","score":0.0782192051410675},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.0741681158542633},{"id":"https://openalex.org/keywords/thermodynamics","display_name":"Thermodynamics","score":0.07131290435791016}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6789552569389343},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5652380585670471},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.48063603043556213},{"id":"https://openalex.org/C2777299769","wikidata":"https://www.wikidata.org/wiki/Q3707858","display_name":"Type (biology)","level":2,"score":0.42918288707733154},{"id":"https://openalex.org/C201729545","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability theory","level":3,"score":0.420097678899765},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.09174147248268127},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.09081628918647766},{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.0782192051410675},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0741681158542633},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.07131290435791016},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2020.3018821","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2020.3018821","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09174842.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:37acc88e2613407e8de213348e9d55d6","is_oa":true,"landing_page_url":"https://doaj.org/article/37acc88e2613407e8de213348e9d55d6","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 8, Pp 154881-154897 (2020)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2020.3018821","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2020.3018821","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09174842.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/16","display_name":"Peace, Justice and strong institutions","score":0.6000000238418579}],"awards":[{"id":"https://openalex.org/G5386929075","display_name":null,"funder_award_id":"61903370","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W3080420148.pdf","grobid_xml":"https://content.openalex.org/works/W3080420148.grobid-xml"},"referenced_works_count":37,"referenced_works":["https://openalex.org/W34141764","https://openalex.org/W116507051","https://openalex.org/W218580582","https://openalex.org/W591839974","https://openalex.org/W798136849","https://openalex.org/W1526919895","https://openalex.org/W1570713732","https://openalex.org/W1966591077","https://openalex.org/W1984689114","https://openalex.org/W1985084297","https://openalex.org/W1986291222","https://openalex.org/W1988482885","https://openalex.org/W2009335638","https://openalex.org/W2022405959","https://openalex.org/W2026701266","https://openalex.org/W2033352153","https://openalex.org/W2038290120","https://openalex.org/W2050434690","https://openalex.org/W2059460261","https://openalex.org/W2063973166","https://openalex.org/W2124522176","https://openalex.org/W2154602821","https://openalex.org/W2293024501","https://openalex.org/W2327149449","https://openalex.org/W2378658459","https://openalex.org/W2790495508","https://openalex.org/W2791751456","https://openalex.org/W2793438866","https://openalex.org/W2803201668","https://openalex.org/W2905108140","https://openalex.org/W2947828910","https://openalex.org/W2965572490","https://openalex.org/W3016917126","https://openalex.org/W3039386396","https://openalex.org/W6631394207","https://openalex.org/W6634057643","https://openalex.org/W6983517681"],"related_works":["https://openalex.org/W2033512842","https://openalex.org/W4233600955","https://openalex.org/W4322734194","https://openalex.org/W3116237489","https://openalex.org/W4404996554","https://openalex.org/W2913665393","https://openalex.org/W2369695847","https://openalex.org/W3005535424","https://openalex.org/W2994319598","https://openalex.org/W2047067935"],"abstract_inverted_index":{"The":[0,139],"traditional":[1],"shock":[2,16,56,80,140,161],"model":[3,141,162,186],"generally":[4],"describes":[5],"the":[6,9,20,28,46,50,64,67,78,104,107,110,136,155,160,170,173,182,185],"magnitude":[7,21,65,81,105],"of":[8,31,41,49,66,106,159,172,184,193],"cumulative":[10,79],"damage":[11,51,68,108],"caused":[12],"by":[13,73,99,145],"a":[14,23,32,54,93,100,125],"random":[15],"sequence":[17],"and":[18,109,122,149,169],"compares":[19],"with":[22,116],"predetermined":[24],"threshold":[25,111],"to":[26,53,60,85,96,134],"obtain":[27],"failure":[29,94,121],"time":[30],"component.":[33],"There":[34],"are":[35],"two":[36],"limitations":[37],"in":[38,43,131,175],"this":[39,132],"kind":[40],"models":[42],"practice:":[44],"First,":[45],"statistical":[47],"characteristics":[48],"due":[52],"single":[55],"may":[57,69,82,89,112],"be":[58,71,83,90,97,114],"difficult":[59,84,91],"obtain,":[61],"which":[62],"means":[63],"not":[70,113],"described":[72,98],"an":[74],"appropriate":[75],"distribution;":[76],"Second,":[77],"measure,":[86],"or":[87],"it":[88],"for":[92],"mode":[95],"threshold,":[101],"meaning":[102],"that":[103],"compared":[115],"each":[117],"other.":[118],"Considering":[119],"both":[120,147],"censored":[123],"samples,":[124],"reliability":[126],"modeling":[127],"method":[128,158,168],"is":[129,142,163,178,187],"proposed":[130],"work":[133],"address":[135],"above":[137],"problems.":[138],"first":[143],"established":[144],"using":[146,189],"continuous":[148],"discrete":[150],"phase-type":[151],"(PH)":[152],"distributions.":[153],"Then":[154],"parameter":[156],"estimation":[157],"derived":[164],"based":[165],"on":[166],"EM":[167],"identifiability":[171],"parameters":[174],"PH":[176],"distributions":[177],"also":[179],"given.":[180],"Finally,":[181],"adaptability":[183],"analyzed":[188],"three":[190],"different":[191],"types":[192],"simulation":[194],"cases.":[195]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}