{"id":"https://openalex.org/W3080253073","doi":"https://doi.org/10.1109/access.2020.3018320","title":"A New Fault Diagnosis Classifier for Rolling Bearing United Multi-Scale Permutation Entropy Optimize VMD and Cuckoo Search SVM","display_name":"A New Fault Diagnosis Classifier for Rolling Bearing United Multi-Scale Permutation Entropy Optimize VMD and Cuckoo Search SVM","publication_year":2020,"publication_date":"2020-01-01","ids":{"openalex":"https://openalex.org/W3080253073","doi":"https://doi.org/10.1109/access.2020.3018320","mag":"3080253073"},"language":"en","primary_location":{"id":"doi:10.1109/access.2020.3018320","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2020.3018320","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09172050.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09172050.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101573042","display_name":"Zijian Guo","orcid":"https://orcid.org/0000-0002-8042-5804"},"institutions":[{"id":"https://openalex.org/I55022517","display_name":"Heilongjiang University","ror":"https://ror.org/04zyhq975","country_code":"CN","type":"education","lineage":["https://openalex.org/I55022517"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zijian Guo","raw_affiliation_strings":["HLJ Province Key Laboratory of Senior-Education for Electronic Engineering, Heilongjiang University, Harbin, China","Key Laboratory of Information Fusion Estimation and Detection, Harbin, China"],"raw_orcid":"https://orcid.org/0000-0002-8042-5804","affiliations":[{"raw_affiliation_string":"HLJ Province Key Laboratory of Senior-Education for Electronic Engineering, Heilongjiang University, Harbin, China","institution_ids":["https://openalex.org/I55022517"]},{"raw_affiliation_string":"Key Laboratory of Information Fusion Estimation and Detection, Harbin, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100616095","display_name":"Mingliang Liu","orcid":"https://orcid.org/0000-0003-1124-3561"},"institutions":[{"id":"https://openalex.org/I55022517","display_name":"Heilongjiang University","ror":"https://ror.org/04zyhq975","country_code":"CN","type":"education","lineage":["https://openalex.org/I55022517"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Mingliang Liu","raw_affiliation_strings":["HLJ Province Key Laboratory of Senior-Education for Electronic Engineering, Heilongjiang University, Harbin, China","Key Laboratory of Information Fusion Estimation and Detection, Harbin, China"],"raw_orcid":"https://orcid.org/0000-0003-1124-3561","affiliations":[{"raw_affiliation_string":"HLJ Province Key Laboratory of Senior-Education for Electronic Engineering, Heilongjiang University, Harbin, China","institution_ids":["https://openalex.org/I55022517"]},{"raw_affiliation_string":"Key Laboratory of Information Fusion Estimation and Detection, Harbin, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100658312","display_name":"Yunxia Wang","orcid":"https://orcid.org/0000-0002-1739-5403"},"institutions":[{"id":"https://openalex.org/I55022517","display_name":"Heilongjiang University","ror":"https://ror.org/04zyhq975","country_code":"CN","type":"education","lineage":["https://openalex.org/I55022517"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yunxia Wang","raw_affiliation_strings":["HLJ Province Key Laboratory of Senior-Education for Electronic Engineering, Heilongjiang University, Harbin, China","Key Laboratory of Information Fusion Estimation and Detection, Harbin, China"],"raw_orcid":"https://orcid.org/0000-0002-1739-5403","affiliations":[{"raw_affiliation_string":"HLJ Province Key Laboratory of Senior-Education for Electronic Engineering, Heilongjiang University, Harbin, China","institution_ids":["https://openalex.org/I55022517"]},{"raw_affiliation_string":"Key Laboratory of Information Fusion Estimation and Detection, Harbin, China","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5065544870","display_name":"Huabin Qin","orcid":"https://orcid.org/0000-0003-0078-6579"},"institutions":[{"id":"https://openalex.org/I55022517","display_name":"Heilongjiang University","ror":"https://ror.org/04zyhq975","country_code":"CN","type":"education","lineage":["https://openalex.org/I55022517"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Huabin Qin","raw_affiliation_strings":["HLJ Province Key Laboratory of Senior-Education for Electronic Engineering, Heilongjiang University, Harbin, China"],"raw_orcid":"https://orcid.org/0000-0003-0078-6579","affiliations":[{"raw_affiliation_string":"HLJ Province Key Laboratory of Senior-Education for Electronic Engineering, Heilongjiang University, Harbin, China","institution_ids":["https://openalex.org/I55022517"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":4.3191,"has_fulltext":true,"cited_by_count":46,"citation_normalized_percentile":{"value":0.94750704,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":95,"max":99},"biblio":{"volume":"8","issue":null,"first_page":"153610","last_page":"153629"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11062","display_name":"Gear and Bearing Dynamics Analysis","score":0.9944999814033508,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9894999861717224,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cuckoo-search","display_name":"Cuckoo search","score":0.8064426779747009},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6073673367500305},{"id":"https://openalex.org/keywords/support-vector-machine","display_name":"Support vector machine","score":0.5652284026145935},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.5559720993041992},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.4846837818622589},{"id":"https://openalex.org/keywords/hyperparameter-optimization","display_name":"Hyperparameter optimization","score":0.43656715750694275},{"id":"https://openalex.org/keywords/classifier","display_name":"Classifier (UML)","score":0.43182823061943054},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4248563051223755},{"id":"https://openalex.org/keywords/particle-swarm-optimization","display_name":"Particle swarm optimization","score":0.40553128719329834}],"concepts":[{"id":"https://openalex.org/C117241572","wikidata":"https://www.wikidata.org/wiki/Q5192379","display_name":"Cuckoo search","level":3,"score":0.8064426779747009},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6073673367500305},{"id":"https://openalex.org/C12267149","wikidata":"https://www.wikidata.org/wiki/Q282453","display_name":"Support vector machine","level":2,"score":0.5652284026145935},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.5559720993041992},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.4846837818622589},{"id":"https://openalex.org/C10485038","wikidata":"https://www.wikidata.org/wiki/Q48996162","display_name":"Hyperparameter optimization","level":3,"score":0.43656715750694275},{"id":"https://openalex.org/C95623464","wikidata":"https://www.wikidata.org/wiki/Q1096149","display_name":"Classifier (UML)","level":2,"score":0.43182823061943054},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4248563051223755},{"id":"https://openalex.org/C85617194","wikidata":"https://www.wikidata.org/wiki/Q2072794","display_name":"Particle swarm optimization","level":2,"score":0.40553128719329834}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2020.3018320","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2020.3018320","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09172050.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:cef24f293d264e7cbd0139afd4e31f3e","is_oa":true,"landing_page_url":"https://doaj.org/article/cef24f293d264e7cbd0139afd4e31f3e","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 8, Pp 153610-153629 (2020)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2020.3018320","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2020.3018320","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09172050.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G8634242516","display_name":null,"funder_award_id":"kjcx201806","funder_id":"https://openalex.org/F4320310113","funder_display_name":"Heilongjiang University"}],"funders":[{"id":"https://openalex.org/F4320310113","display_name":"Heilongjiang University","ror":"https://ror.org/04zyhq975"}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W3080253073.pdf","grobid_xml":"https://content.openalex.org/works/W3080253073.grobid-xml"},"referenced_works_count":39,"referenced_works":["https://openalex.org/W639708223","https://openalex.org/W988265378","https://openalex.org/W1510598017","https://openalex.org/W1967079903","https://openalex.org/W1973048907","https://openalex.org/W1976744965","https://openalex.org/W1982178440","https://openalex.org/W2000982976","https://openalex.org/W2007805591","https://openalex.org/W2014683958","https://openalex.org/W2045001586","https://openalex.org/W2059851411","https://openalex.org/W2067802406","https://openalex.org/W2088595202","https://openalex.org/W2093266575","https://openalex.org/W2104003464","https://openalex.org/W2120390927","https://openalex.org/W2154884142","https://openalex.org/W2160320241","https://openalex.org/W2241765014","https://openalex.org/W2318041010","https://openalex.org/W2354279982","https://openalex.org/W2364027602","https://openalex.org/W2367186125","https://openalex.org/W2509453848","https://openalex.org/W2549489119","https://openalex.org/W2549639622","https://openalex.org/W2552808051","https://openalex.org/W2591732941","https://openalex.org/W2766238033","https://openalex.org/W2774375709","https://openalex.org/W2779652379","https://openalex.org/W2788278774","https://openalex.org/W2790352849","https://openalex.org/W2791125525","https://openalex.org/W2951464652","https://openalex.org/W6729455701","https://openalex.org/W6763678577","https://openalex.org/W6876729968"],"related_works":["https://openalex.org/W1978568284","https://openalex.org/W2102833174","https://openalex.org/W2753354457","https://openalex.org/W2742451303","https://openalex.org/W2329556607","https://openalex.org/W3013665388","https://openalex.org/W2905415873","https://openalex.org/W4220814209","https://openalex.org/W2901222946","https://openalex.org/W2382436519"],"abstract_inverted_index":{"Aiming":[0],"at":[1],"the":[2,12,36,44,54,64,74,79,87,92,98,106,117,121,133,140,143,157,164,168,173,178,181,185,191,203,217],"influence":[3],"of":[4,7,14,91,101,112,123,132,142,163,177,183,190],"mixed":[5],"noise":[6],"bearing":[8],"vibration":[9],"signal":[10,55,66,127],"on":[11,23],"extraction":[13],"useful":[15],"information,":[16],"a":[17],"fault":[18,165,219],"diagnosis":[19],"optimize":[20,86],"classifier":[21,135,188],"based":[22],"multi-scale":[24],"permutation":[25],"entropy":[26],"(MPE)":[27],"and":[28,52,63,126,171,216],"cuckoo":[29,80,192],"search":[30,81,214],"algorithm":[31,49,71,82,194,206],"(CS)":[32],"is":[33,40,56,67,83,136,222],"proposed.":[34],"Firstly,":[35],"MPE":[37],"threshold":[38],"method":[39,118],"adopted":[41],"to":[42,72,85],"select":[43],"appropriate":[45],"variational":[46],"mode":[47,124],"decomposition":[48],"(VMD)":[50],"parameters,":[51],"then":[53],"reconstructed":[57,65],"by":[58,69],"adding":[59],"neutral":[60],"white":[61],"noise,":[62],"decomposed":[68],"MPE-OVMD":[70],"obtain":[73],"optimal":[75,89,174],"IMF":[76],"component.":[77],"Finally,":[78],"used":[84],"global":[88],"solution":[90],"support":[93,102],"vector":[94,103],"machine,":[95],"thereby":[96],"achieving":[97],"classification":[99,158],"model":[100,159,189],"machine":[104],"with":[105,139],"best":[107],"parameters.":[108],"The":[109,152,187],"analysis":[110],"results":[111],"motor":[113],"signals":[114],"show":[115],"that":[116,156],"can":[119,160],"eliminate":[120],"phenomena":[122],"aliasing":[125],"over-decomposition.":[128],"An":[129],"analytical":[130],"comparison":[131],"CSSVM":[134],"carried":[137],"out":[138],"performance":[141],"learners":[144],"such":[145,201],"as":[146,167,202,223,225],"recall":[147],"rate,":[148],"ROC":[149],"curve,":[150],"AUC.":[151],"contrast":[153],"experiment":[154],"shows":[155],"avoid":[161],"misrecognition":[162],"sample":[166],"normal":[169],"condition":[170],"maximum":[172],"maintenance":[175],"time":[176],"equipment":[179],"under":[180],"premise":[182],"ensuring":[184],"accuracy.":[186],"optimization":[193],"has":[195],"better":[196],"fitting":[197],"accuracy":[198],"than":[199],"others":[200],"Grid":[204],"Search":[205],"(GS),":[207],"Particle":[208],"Swarm":[209],"Optimization":[210],"(PSO),":[211],"Genetic":[212],"Algorithm":[213],"(GA),":[215],"ensemble":[218],"recognition":[220],"rate":[221],"high":[224],"90%.":[226]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":9},{"year":2024,"cited_by_count":7},{"year":2023,"cited_by_count":10},{"year":2022,"cited_by_count":11},{"year":2021,"cited_by_count":8}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}