{"id":"https://openalex.org/W3049448292","doi":"https://doi.org/10.1109/access.2020.3016686","title":"Reliability Analysis and Design of MMC Based on Mission Profile for the Components Degradation","display_name":"Reliability Analysis and Design of MMC Based on Mission Profile for the Components Degradation","publication_year":2020,"publication_date":"2020-01-01","ids":{"openalex":"https://openalex.org/W3049448292","doi":"https://doi.org/10.1109/access.2020.3016686","mag":"3049448292"},"language":"en","primary_location":{"id":"doi:10.1109/access.2020.3016686","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2020.3016686","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09167207.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09167207.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5112613588","display_name":"Gaotai Lv","orcid":null},"institutions":[{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Gaotai Lv","raw_affiliation_strings":["School of Electrical Engineering, Xi\u2019an Jiaotong University, Xi\u2019an, China","School of Electrical Engineering, Xi'an Jiaotong University, Xi'an, China"],"raw_orcid":"https://orcid.org/0000-0002-6949-7874","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Xi\u2019an Jiaotong University, Xi\u2019an, China","institution_ids":["https://openalex.org/I87445476"]},{"raw_affiliation_string":"School of Electrical Engineering, Xi'an Jiaotong University, Xi'an, China","institution_ids":["https://openalex.org/I87445476"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101566929","display_name":"Wanjun Lei","orcid":null},"institutions":[{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wanjun Lei","raw_affiliation_strings":["School of Electrical Engineering, Xi\u2019an Jiaotong University, Xi\u2019an, China","School of Electrical Engineering, Xi'an Jiaotong University, Xi'an, China"],"raw_orcid":"https://orcid.org/0000-0002-6759-7169","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Xi\u2019an Jiaotong University, Xi\u2019an, China","institution_ids":["https://openalex.org/I87445476"]},{"raw_affiliation_string":"School of Electrical Engineering, Xi'an Jiaotong University, Xi'an, China","institution_ids":["https://openalex.org/I87445476"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100377137","display_name":"Meng Wang","orcid":"https://orcid.org/0000-0002-2293-1709"},"institutions":[{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Meng Wang","raw_affiliation_strings":["School of Electrical Engineering, Xi\u2019an Jiaotong University, Xi\u2019an, China","School of Electrical Engineering, Xi'an Jiaotong University, Xi'an, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Xi\u2019an Jiaotong University, Xi\u2019an, China","institution_ids":["https://openalex.org/I87445476"]},{"raw_affiliation_string":"School of Electrical Engineering, Xi'an Jiaotong University, Xi'an, China","institution_ids":["https://openalex.org/I87445476"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017719005","display_name":"Chunlin Lv","orcid":"https://orcid.org/0000-0002-9395-0819"},"institutions":[{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chunlin Lv","raw_affiliation_strings":["School of Electrical Engineering, Xi\u2019an Jiaotong University, Xi\u2019an, China","School of Electrical Engineering, Xi'an Jiaotong University, Xi'an, China"],"raw_orcid":"https://orcid.org/0000-0002-9395-0819","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Xi\u2019an Jiaotong University, Xi\u2019an, China","institution_ids":["https://openalex.org/I87445476"]},{"raw_affiliation_string":"School of Electrical Engineering, Xi'an Jiaotong University, Xi'an, China","institution_ids":["https://openalex.org/I87445476"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5103242301","display_name":"Jiaqi Zhao","orcid":"https://orcid.org/0000-0002-5886-8924"},"institutions":[{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiaqi Zhao","raw_affiliation_strings":["School of Electrical Engineering, Xi\u2019an Jiaotong University, Xi\u2019an, China","School of Electrical Engineering, Xi'an Jiaotong University, Xi'an, China"],"raw_orcid":"https://orcid.org/0000-0002-5886-8924","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Xi\u2019an Jiaotong University, Xi\u2019an, China","institution_ids":["https://openalex.org/I87445476"]},{"raw_affiliation_string":"School of Electrical Engineering, Xi'an Jiaotong University, Xi'an, China","institution_ids":["https://openalex.org/I87445476"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I87445476"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":1.0094,"has_fulltext":true,"cited_by_count":16,"citation_normalized_percentile":{"value":0.75957083,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"8","issue":null,"first_page":"149940","last_page":"149951"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11102","display_name":"HVDC Systems and Fault Protection","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11102","display_name":"HVDC Systems and Fault Protection","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9958999752998352,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14502","display_name":"High-Voltage Power Transmission Systems","score":0.9825000166893005,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/insulated-gate-bipolar-transistor","display_name":"Insulated-gate bipolar transistor","score":0.75605309009552},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6443822383880615},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.626401424407959},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6060501933097839},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.5368244051933289},{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.5033876299858093},{"id":"https://openalex.org/keywords/mean-time-between-failures","display_name":"Mean time between failures","score":0.49726441502571106},{"id":"https://openalex.org/keywords/junction-temperature","display_name":"Junction temperature","score":0.48400232195854187},{"id":"https://openalex.org/keywords/modular-design","display_name":"Modular design","score":0.4656935930252075},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.44575807452201843},{"id":"https://openalex.org/keywords/monte-carlo-method","display_name":"Monte Carlo method","score":0.4420603811740875},{"id":"https://openalex.org/keywords/exponential-distribution","display_name":"Exponential distribution","score":0.42221683263778687},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.41991716623306274},{"id":"https://openalex.org/keywords/failure-rate","display_name":"Failure rate","score":0.3896411061286926},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.3858925402164459},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.22277376055717468},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17605027556419373},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.11047253012657166}],"concepts":[{"id":"https://openalex.org/C28285623","wikidata":"https://www.wikidata.org/wiki/Q176110","display_name":"Insulated-gate bipolar transistor","level":3,"score":0.75605309009552},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6443822383880615},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.626401424407959},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6060501933097839},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.5368244051933289},{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.5033876299858093},{"id":"https://openalex.org/C44154001","wikidata":"https://www.wikidata.org/wiki/Q754940","display_name":"Mean time between failures","level":3,"score":0.49726441502571106},{"id":"https://openalex.org/C167781694","wikidata":"https://www.wikidata.org/wiki/Q6311800","display_name":"Junction temperature","level":3,"score":0.48400232195854187},{"id":"https://openalex.org/C101468663","wikidata":"https://www.wikidata.org/wiki/Q1620158","display_name":"Modular design","level":2,"score":0.4656935930252075},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.44575807452201843},{"id":"https://openalex.org/C19499675","wikidata":"https://www.wikidata.org/wiki/Q232207","display_name":"Monte Carlo method","level":2,"score":0.4420603811740875},{"id":"https://openalex.org/C55350006","wikidata":"https://www.wikidata.org/wiki/Q237193","display_name":"Exponential distribution","level":2,"score":0.42221683263778687},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.41991716623306274},{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.3896411061286926},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.3858925402164459},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.22277376055717468},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17605027556419373},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.11047253012657166},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2020.3016686","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2020.3016686","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09167207.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:f72cfe1146f541f0a0bcd9886eca1e9c","is_oa":true,"landing_page_url":"https://doaj.org/article/f72cfe1146f541f0a0bcd9886eca1e9c","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 8, Pp 149940-149951 (2020)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2020.3016686","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2020.3016686","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09167207.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G2832945796","display_name":null,"funder_award_id":"2018YFB0905800","funder_id":"https://openalex.org/F4320321540","funder_display_name":"Ministry of Science and Technology of the People's Republic of China"}],"funders":[{"id":"https://openalex.org/F4320321540","display_name":"Ministry of Science and Technology of the People's Republic of China","ror":"https://ror.org/027s68j25"}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W3049448292.pdf","grobid_xml":"https://content.openalex.org/works/W3049448292.grobid-xml"},"referenced_works_count":24,"referenced_works":["https://openalex.org/W1915388693","https://openalex.org/W1964350159","https://openalex.org/W1985864140","https://openalex.org/W2003589956","https://openalex.org/W2024878069","https://openalex.org/W2071760299","https://openalex.org/W2108776657","https://openalex.org/W2167033325","https://openalex.org/W2197739317","https://openalex.org/W2230698191","https://openalex.org/W2324950157","https://openalex.org/W2366385641","https://openalex.org/W2469918546","https://openalex.org/W2585999567","https://openalex.org/W2728506505","https://openalex.org/W2784130885","https://openalex.org/W2789111672","https://openalex.org/W2791908960","https://openalex.org/W2972334001","https://openalex.org/W3134875744","https://openalex.org/W3149230469","https://openalex.org/W4239062334","https://openalex.org/W6651057683","https://openalex.org/W6767456326"],"related_works":["https://openalex.org/W2941586664","https://openalex.org/W2026438159","https://openalex.org/W2952153532","https://openalex.org/W2894661039","https://openalex.org/W2973352049","https://openalex.org/W2587344013","https://openalex.org/W2995312372","https://openalex.org/W2762233094","https://openalex.org/W2782720998","https://openalex.org/W1034752577"],"abstract_inverted_index":{"In":[0,151],"the":[1,13,35,41,48,59,75,80,93,129,137,156,165,173,185,189,191],"field":[2],"of":[3,16,37,44,50,61,83,87,95,153,167,188],"high":[4],"voltage":[5],"level":[6,64,108],"applications,":[7],"modular":[8],"multi-level":[9],"converter":[10],"(MMC)":[11],"has":[12,53],"definite":[14],"advantages":[15],"low":[17],"power":[18,133],"loss":[19,134],"and":[20,22,112,120,132,141,172],"modularity":[21],"there":[23],"have":[24],"been":[25,55],"many":[26],"studies":[27],"on":[28,34,116,178],"its":[29],"reliability.":[30,65],"Some":[31],"researches":[32],"focus":[33],"degradation":[36,49],"physical":[38,51,100],"characteristics":[39,52,101],"in":[40,58,135,169],"lifetime":[42,125],"prediction":[43],"key":[45],"devices,":[46],"but":[47],"not":[54],"directly":[56],"used":[57,162],"research":[60],"MMC":[62,109,117],"system":[63,107],"The":[66],"traditional":[67],"exponential":[68,179],"distribution":[69,82,180],"failure":[70],"rate":[71],"is":[72,161,181,195],"constant":[73],"while":[74],"Monte":[76],"Carlo":[77],"method":[78,114,160,176],"assumes":[79],"random":[81],"multiple":[84],"devices.":[85],"Neither":[86],"these":[88],"two":[89],"methods":[90],"can":[91],"describe":[92],"reliability":[94,110,174],"a":[96,106],"single":[97],"device":[98,154],"with":[99],"degradation.":[102,126],"This":[103],"article":[104],"presents":[105],"analysis":[111,175],"design":[113,187],"based":[115,177],"mission":[118,139],"profile":[119,140],"insulated-gate":[121],"bipolar":[122],"transistor":[123],"(IGBT)":[124],"According":[127],"to":[128,163],"IGBT":[130,168],"current":[131],"MMC,":[136],"annual":[138],"junction":[142],"temperature":[143],"result":[144],"are":[145],"analyzed":[146],"by":[147],"rainflow":[148],"counting":[149],"algorithm.":[150],"terms":[152],"degradation,":[155],"thermal":[157],"network":[158],"updating":[159],"calculate":[164],"life":[166],"different":[170],"time,":[171],"improved.":[182],"To":[183],"optimize":[184],"redundancy":[186],"system,":[190],"multi-objective":[192],"function":[193],"optimization":[194],"processed.":[196]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":4},{"year":2022,"cited_by_count":5},{"year":2021,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}