{"id":"https://openalex.org/W3049229529","doi":"https://doi.org/10.1109/access.2020.3016314","title":"An Intelligent Fault Diagnosis for Rolling Bearing Based on Adversarial Semi-Supervised Method","display_name":"An Intelligent Fault Diagnosis for Rolling Bearing Based on Adversarial Semi-Supervised Method","publication_year":2020,"publication_date":"2020-01-01","ids":{"openalex":"https://openalex.org/W3049229529","doi":"https://doi.org/10.1109/access.2020.3016314","mag":"3049229529"},"language":"en","primary_location":{"id":"doi:10.1109/access.2020.3016314","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2020.3016314","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09166486.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09166486.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100736675","display_name":"Yongchao Zhang","orcid":"https://orcid.org/0000-0001-5892-3391"},"institutions":[{"id":"https://openalex.org/I9224756","display_name":"Northeastern University","ror":"https://ror.org/03awzbc87","country_code":"CN","type":"education","lineage":["https://openalex.org/I9224756"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Yongchao Zhang","raw_affiliation_strings":["School of Mechanical Engineering and Automation, Northeastern University, Shenyang, China"],"raw_orcid":"https://orcid.org/0000-0001-5892-3391","affiliations":[{"raw_affiliation_string":"School of Mechanical Engineering and Automation, Northeastern University, Shenyang, China","institution_ids":["https://openalex.org/I9224756"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081838860","display_name":"Zhaohui Ren","orcid":"https://orcid.org/0000-0002-1390-1348"},"institutions":[{"id":"https://openalex.org/I9224756","display_name":"Northeastern University","ror":"https://ror.org/03awzbc87","country_code":"CN","type":"education","lineage":["https://openalex.org/I9224756"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhaohui Ren","raw_affiliation_strings":["School of Mechanical Engineering and Automation, Northeastern University, Shenyang, China","Shenyang Shengna Equipment Manufacturing Technology Institute Company Ltd., Shenyang, China"],"raw_orcid":"https://orcid.org/0000-0002-1390-1348","affiliations":[{"raw_affiliation_string":"School of Mechanical Engineering and Automation, Northeastern University, Shenyang, China","institution_ids":["https://openalex.org/I9224756"]},{"raw_affiliation_string":"Shenyang Shengna Equipment Manufacturing Technology Institute Company Ltd., Shenyang, China","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5103027236","display_name":"Shihua Zhou","orcid":"https://orcid.org/0000-0002-4829-1404"},"institutions":[{"id":"https://openalex.org/I9224756","display_name":"Northeastern University","ror":"https://ror.org/03awzbc87","country_code":"CN","type":"education","lineage":["https://openalex.org/I9224756"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shihua Zhou","raw_affiliation_strings":["School of Mechanical Engineering and Automation, Northeastern University, Shenyang, China"],"raw_orcid":"https://orcid.org/0000-0002-4829-1404","affiliations":[{"raw_affiliation_string":"School of Mechanical Engineering and Automation, Northeastern University, Shenyang, China","institution_ids":["https://openalex.org/I9224756"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5100736675"],"corresponding_institution_ids":["https://openalex.org/I9224756"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":2.678,"has_fulltext":true,"cited_by_count":26,"citation_normalized_percentile":{"value":0.90077944,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"8","issue":null,"first_page":"149868","last_page":"149877"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11062","display_name":"Gear and Bearing Dynamics Analysis","score":0.9972000122070312,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10188","display_name":"Advanced machining processes and optimization","score":0.949999988079071,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.741824746131897},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.6437906622886658},{"id":"https://openalex.org/keywords/classifier","display_name":"Classifier (UML)","score":0.5956999659538269},{"id":"https://openalex.org/keywords/adversarial-system","display_name":"Adversarial system","score":0.5629389882087708},{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.5465407967567444},{"id":"https://openalex.org/keywords/cosine-similarity","display_name":"Cosine similarity","score":0.5243011713027954},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.48296278715133667},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.48034846782684326},{"id":"https://openalex.org/keywords/entropy","display_name":"Entropy (arrow of time)","score":0.4648273289203644},{"id":"https://openalex.org/keywords/deep-learning","display_name":"Deep learning","score":0.4264615476131439},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.3654000759124756}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.741824746131897},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.6437906622886658},{"id":"https://openalex.org/C95623464","wikidata":"https://www.wikidata.org/wiki/Q1096149","display_name":"Classifier (UML)","level":2,"score":0.5956999659538269},{"id":"https://openalex.org/C37736160","wikidata":"https://www.wikidata.org/wiki/Q1801315","display_name":"Adversarial system","level":2,"score":0.5629389882087708},{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.5465407967567444},{"id":"https://openalex.org/C2780762811","wikidata":"https://www.wikidata.org/wiki/Q1784941","display_name":"Cosine similarity","level":3,"score":0.5243011713027954},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.48296278715133667},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.48034846782684326},{"id":"https://openalex.org/C106301342","wikidata":"https://www.wikidata.org/wiki/Q4117933","display_name":"Entropy (arrow of time)","level":2,"score":0.4648273289203644},{"id":"https://openalex.org/C108583219","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep learning","level":2,"score":0.4264615476131439},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.3654000759124756},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2020.3016314","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2020.3016314","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09166486.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:1e97d545bdd843ff823890865b6704e3","is_oa":true,"landing_page_url":"https://doaj.org/article/1e97d545bdd843ff823890865b6704e3","pdf_url":null,"source":{"id":"https://openalex.org/S112646816","display_name":"SHILAP Revista de lepidopterolog\u00eda","issn_l":"0300-5267","issn":["0300-5267","2340-4078"],"is_oa":true,"is_in_doaj":true,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 8, Pp 149868-149877 (2020)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2020.3016314","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2020.3016314","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09166486.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"score":0.5799999833106995,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[{"id":"https://openalex.org/G3010207349","display_name":null,"funder_award_id":"2017YFB1103700","funder_id":"https://openalex.org/F4320335777","funder_display_name":"National Key Research and Development Program of China"},{"id":"https://openalex.org/G7090229298","display_name":null,"funder_award_id":"2017YFB1103700","funder_id":"https://openalex.org/F4320335787","funder_display_name":"Fundamental Research Funds for the Central Universities"},{"id":"https://openalex.org/G8106996834","display_name":null,"funder_award_id":"N180304018","funder_id":"https://openalex.org/F4320335777","funder_display_name":"National Key Research and Development Program of China"},{"id":"https://openalex.org/G8896779084","display_name":null,"funder_award_id":"N180304018","funder_id":"https://openalex.org/F4320335787","funder_display_name":"Fundamental Research Funds for the Central Universities"}],"funders":[{"id":"https://openalex.org/F4320335777","display_name":"National Key Research and Development Program of China","ror":null},{"id":"https://openalex.org/F4320335787","display_name":"Fundamental Research Funds for the Central Universities","ror":null}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W3049229529.pdf","grobid_xml":"https://content.openalex.org/works/W3049229529.grobid-xml"},"referenced_works_count":41,"referenced_works":["https://openalex.org/W1979117586","https://openalex.org/W1995430360","https://openalex.org/W2019505419","https://openalex.org/W2115954437","https://openalex.org/W2187089797","https://openalex.org/W2471080557","https://openalex.org/W2509065397","https://openalex.org/W2601450892","https://openalex.org/W2606442203","https://openalex.org/W2734669076","https://openalex.org/W2765226309","https://openalex.org/W2793039588","https://openalex.org/W2798836702","https://openalex.org/W2803884688","https://openalex.org/W2804879845","https://openalex.org/W2890793284","https://openalex.org/W2902985761","https://openalex.org/W2905281262","https://openalex.org/W2906578288","https://openalex.org/W2910881901","https://openalex.org/W2918050063","https://openalex.org/W2940589124","https://openalex.org/W2940935128","https://openalex.org/W2943467239","https://openalex.org/W2948539592","https://openalex.org/W2963741406","https://openalex.org/W2978426779","https://openalex.org/W2979334714","https://openalex.org/W2986381065","https://openalex.org/W2986996311","https://openalex.org/W2990851485","https://openalex.org/W2990922109","https://openalex.org/W2991632793","https://openalex.org/W2993552823","https://openalex.org/W2998830408","https://openalex.org/W3008241461","https://openalex.org/W3098357269","https://openalex.org/W6735236233","https://openalex.org/W6758126075","https://openalex.org/W6762913911","https://openalex.org/W6771573495"],"related_works":["https://openalex.org/W2502115930","https://openalex.org/W4246396837","https://openalex.org/W2482350142","https://openalex.org/W3176240006","https://openalex.org/W3126451824","https://openalex.org/W1561927205","https://openalex.org/W3191453585","https://openalex.org/W4297672492","https://openalex.org/W4288019534","https://openalex.org/W2360571912"],"abstract_inverted_index":{"Intelligent":[0],"fault":[1,35,72],"diagnosis":[2,36,73],"of":[3,15,21,89,107,165],"rolling":[4,70,132],"bearing":[5,71,133],"issues":[6],"have":[7],"been":[8],"well":[9],"addressed":[10],"with":[11,38,174],"the":[12,19,34,63,78,87,90,111,115,137,156,159],"rapid":[13],"growth":[14],"data":[16,80],"scale.":[17],"However,":[18],"performance":[20,161],"most":[22],"diagnostic":[23,122,160],"algorithms":[24],"heavily":[25],"depends":[26],"on":[27,62,130],"sufficient":[28],"labeled":[29,40,150,166],"samples.":[30],"How":[31],"to":[32,85,92,104,120],"ensure":[33],"accuracy":[37,123],"scarce":[39,149],"samples":[41,151,167],"is":[42,67,102,168],"always":[43],"a":[44,55,97,141],"great":[45,146],"challenge":[46],"in":[47,74,171],"real":[48],"industrial":[49],"scenarios.":[50],"To":[51],"alleviate":[52],"this":[53,75],"issue,":[54],"deep":[56],"adversarial":[57,116],"semi-supervised":[58],"(DASS)":[59],"method":[60,139],"based":[61],"prototype":[64],"learning":[65],"network":[66,91],"proposed":[68,138],"for":[69],"study.":[76],"First,":[77],"nine":[79],"augmentation":[81],"methods":[82],"are":[83,118],"investigated":[84],"improve":[86,121],"ability":[88,144],"extract":[93],"discrepant":[94],"features.":[95,109],"Second,":[96],"cosine":[98],"similarity-based":[99],"classifier":[100],"architecture":[101],"exploited":[103],"estimate":[105],"prototypes":[106],"sample":[108],"Third,":[110],"cross":[112],"entropy":[113,117],"and":[114,124,145],"introduced":[119],"reduce":[125],"intra-class":[126],"variation.":[127],"Extensive":[128],"experiments":[129],"two":[131],"datasets":[134],"verify":[135],"that":[136],"owns":[140],"remarkable":[142],"identification":[143],"robustness":[147],"under":[148,162],"as":[152],"training":[153],"date.":[154],"At":[155],"same":[157],"time,":[158],"different":[163,175],"number":[164],"extensively":[169],"evaluated":[170],"noisy":[172],"environment":[173],"signal-to-noise":[176],"ratio.":[177]},"counts_by_year":[{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":8},{"year":2022,"cited_by_count":5},{"year":2021,"cited_by_count":4},{"year":2020,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}