{"id":"https://openalex.org/W3044509263","doi":"https://doi.org/10.1109/access.2020.3011689","title":"Electrical Equipment Identification Method With Synthetic Data Using Edge-Oriented Generative Adversarial Network","display_name":"Electrical Equipment Identification Method With Synthetic Data Using Edge-Oriented Generative Adversarial Network","publication_year":2020,"publication_date":"2020-01-01","ids":{"openalex":"https://openalex.org/W3044509263","doi":"https://doi.org/10.1109/access.2020.3011689","mag":"3044509263"},"language":"en","primary_location":{"id":"doi:10.1109/access.2020.3011689","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2020.3011689","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09146829.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09146829.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5001091807","display_name":"Zhewen Niu","orcid":"https://orcid.org/0000-0002-4859-1511"},"institutions":[{"id":"https://openalex.org/I90610280","display_name":"South China University of Technology","ror":"https://ror.org/0530pts50","country_code":"CN","type":"education","lineage":["https://openalex.org/I90610280"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Zhewen Niu","raw_affiliation_strings":["School of Electric Power Engineering, South China University of Technology, Guangzhou, China"],"raw_orcid":"https://orcid.org/0000-0002-4859-1511","affiliations":[{"raw_affiliation_string":"School of Electric Power Engineering, South China University of Technology, Guangzhou, China","institution_ids":["https://openalex.org/I90610280"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024453737","display_name":"Marek Reformat","orcid":"https://orcid.org/0000-0003-4783-0717"},"institutions":[{"id":"https://openalex.org/I154425047","display_name":"University of Alberta","ror":"https://ror.org/0160cpw27","country_code":"CA","type":"education","lineage":["https://openalex.org/I154425047"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Marek Z. Reformat","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Alberta, Edmonton, Canada"],"raw_orcid":"https://orcid.org/0000-0003-4783-0717","affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Alberta, Edmonton, Canada","institution_ids":["https://openalex.org/I154425047"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5016974124","display_name":"Wenhu Tang","orcid":"https://orcid.org/0009-0005-5786-4568"},"institutions":[{"id":"https://openalex.org/I90610280","display_name":"South China University of Technology","ror":"https://ror.org/0530pts50","country_code":"CN","type":"education","lineage":["https://openalex.org/I90610280"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wenhu Tang","raw_affiliation_strings":["School of Electric Power Engineering, South China University of Technology, Guangzhou, China"],"raw_orcid":"https://orcid.org/0000-0003-1823-2355","affiliations":[{"raw_affiliation_string":"School of Electric Power Engineering, South China University of Technology, Guangzhou, China","institution_ids":["https://openalex.org/I90610280"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5043924969","display_name":"Baining Zhao","orcid":"https://orcid.org/0000-0002-9653-3316"},"institutions":[{"id":"https://openalex.org/I90610280","display_name":"South China University of Technology","ror":"https://ror.org/0530pts50","country_code":"CN","type":"education","lineage":["https://openalex.org/I90610280"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Baining Zhao","raw_affiliation_strings":["School of Electric Power Engineering, South China University of Technology, Guangzhou, China"],"raw_orcid":"https://orcid.org/0000-0002-9653-3316","affiliations":[{"raw_affiliation_string":"School of Electric Power Engineering, South China University of Technology, Guangzhou, China","institution_ids":["https://openalex.org/I90610280"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5001091807"],"corresponding_institution_ids":["https://openalex.org/I90610280"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":1.0837,"has_fulltext":true,"cited_by_count":11,"citation_normalized_percentile":{"value":0.81962126,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":"8","issue":null,"first_page":"136487","last_page":"136497"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9944999814033508,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9944999814033508,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14319","display_name":"Currency Recognition and Detection","score":0.9833999872207642,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10036","display_name":"Advanced Neural Network Applications","score":0.9666000008583069,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7831373810768127},{"id":"https://openalex.org/keywords/identification","display_name":"Identification (biology)","score":0.6754964590072632},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.6504221558570862},{"id":"https://openalex.org/keywords/thermography","display_name":"Thermography","score":0.6141079068183899},{"id":"https://openalex.org/keywords/electrical-equipment","display_name":"Electrical equipment","score":0.5770513415336609},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5430088043212891},{"id":"https://openalex.org/keywords/enhanced-data-rates-for-gsm-evolution","display_name":"Enhanced Data Rates for GSM Evolution","score":0.5307586193084717},{"id":"https://openalex.org/keywords/data-acquisition","display_name":"Data acquisition","score":0.46624961495399475},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.39951372146606445},{"id":"https://openalex.org/keywords/infrared","display_name":"Infrared","score":0.3823486268520355},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.33641088008880615},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.12736690044403076},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.0875503420829773}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7831373810768127},{"id":"https://openalex.org/C116834253","wikidata":"https://www.wikidata.org/wiki/Q2039217","display_name":"Identification (biology)","level":2,"score":0.6754964590072632},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.6504221558570862},{"id":"https://openalex.org/C2779222261","wikidata":"https://www.wikidata.org/wiki/Q624587","display_name":"Thermography","level":3,"score":0.6141079068183899},{"id":"https://openalex.org/C162175671","wikidata":"https://www.wikidata.org/wiki/Q3749263","display_name":"Electrical equipment","level":2,"score":0.5770513415336609},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5430088043212891},{"id":"https://openalex.org/C162307627","wikidata":"https://www.wikidata.org/wiki/Q204833","display_name":"Enhanced Data Rates for GSM Evolution","level":2,"score":0.5307586193084717},{"id":"https://openalex.org/C163985040","wikidata":"https://www.wikidata.org/wiki/Q1172399","display_name":"Data acquisition","level":2,"score":0.46624961495399475},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.39951372146606445},{"id":"https://openalex.org/C158355884","wikidata":"https://www.wikidata.org/wiki/Q11388","display_name":"Infrared","level":2,"score":0.3823486268520355},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.33641088008880615},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.12736690044403076},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0875503420829773},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C59822182","wikidata":"https://www.wikidata.org/wiki/Q441","display_name":"Botany","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2020.3011689","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2020.3011689","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09146829.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:288dd169aaa745328950de456f90512c","is_oa":true,"landing_page_url":"https://doaj.org/article/288dd169aaa745328950de456f90512c","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 8, Pp 136487-136497 (2020)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2020.3011689","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2020.3011689","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09146829.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9","score":0.5899999737739563}],"awards":[{"id":"https://openalex.org/G2870013046","display_name":null,"funder_award_id":"2018YFE0208400","funder_id":"https://openalex.org/F4320335777","funder_display_name":"National Key Research and Development Program of China"},{"id":"https://openalex.org/G5592073706","display_name":null,"funder_award_id":"51977082","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G7895759816","display_name":null,"funder_award_id":"201906150017","funder_id":"https://openalex.org/F4320322725","funder_display_name":"China Scholarship Council"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320322725","display_name":"China Scholarship Council","ror":"https://ror.org/04atp4p48"},{"id":"https://openalex.org/F4320335777","display_name":"National Key Research and Development Program of China","ror":null}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W3044509263.pdf","grobid_xml":"https://content.openalex.org/works/W3044509263.grobid-xml"},"referenced_works_count":40,"referenced_works":["https://openalex.org/W32988189","https://openalex.org/W1409440556","https://openalex.org/W1580276905","https://openalex.org/W1686810756","https://openalex.org/W2088886701","https://openalex.org/W2099471712","https://openalex.org/W2157726448","https://openalex.org/W2161381512","https://openalex.org/W2173520492","https://openalex.org/W2182269792","https://openalex.org/W2194775991","https://openalex.org/W2243417253","https://openalex.org/W2533924129","https://openalex.org/W2550512190","https://openalex.org/W2738423991","https://openalex.org/W2760234283","https://openalex.org/W2767019926","https://openalex.org/W2773366453","https://openalex.org/W2794869810","https://openalex.org/W2883554987","https://openalex.org/W2904851779","https://openalex.org/W2908062660","https://openalex.org/W2910881901","https://openalex.org/W2940589124","https://openalex.org/W2945228284","https://openalex.org/W2945285557","https://openalex.org/W2952193749","https://openalex.org/W2962879692","https://openalex.org/W2963073614","https://openalex.org/W2963108767","https://openalex.org/W2963684088","https://openalex.org/W3046421354","https://openalex.org/W4295521014","https://openalex.org/W4320013936","https://openalex.org/W6637373629","https://openalex.org/W6685352114","https://openalex.org/W6735913928","https://openalex.org/W6746373118","https://openalex.org/W6765850568","https://openalex.org/W6988021498"],"related_works":["https://openalex.org/W2224543647","https://openalex.org/W35959284","https://openalex.org/W2286188758","https://openalex.org/W2141980482","https://openalex.org/W2900544575","https://openalex.org/W4391030883","https://openalex.org/W2513461979","https://openalex.org/W4255358997","https://openalex.org/W2946143309","https://openalex.org/W4310007303"],"abstract_inverted_index":{"The":[0,112,139],"fourth":[1],"industrial":[2],"revolution":[3],"-":[4,7],"Industry":[5],"4.0":[6],"puts":[8],"emphasis":[9],"on":[10,109],"the":[11,17,32,37,103,173,188,191,199],"application":[12],"of":[13,19,23,36,44,72,83,105,115,123,163,175,190,201],"intelligent":[14,42],"technologies":[15,40],"in":[16,56,64,68,198],"area":[18],"monitoring":[20],"and":[21,28,54,66,91,203],"identification":[22,104,158,197],"electrical":[24,59,106,164],"equipment.":[25],"High":[26],"precision":[27],"non-contact":[29],"qualities":[30],"make":[31],"infrared":[33,84,110,126,146,178],"thermography":[34],"one":[35],"most":[38],"suitable":[39],"for":[41,102,155,195],"inspection":[43],"high-voltage":[45],"apparatus.":[46],"Yet,":[47],"due":[48,86],"to":[49,79,87,143,171,186],"imperfect":[50],"data":[51,154],"acquisition":[52],"methods":[53],"difficulties":[55],"collecting":[57],"data,":[58],"equipment":[60,107,165,196],"images":[61,85,147],"are":[62,166,183],"limited":[63,202],"quantities":[65],"imbalanced":[67,204],"representing":[69],"different":[70],"types":[71],"devices.":[73],"Additionally,":[74],"it":[75],"is":[76,100,119,137,141],"not":[77],"easy":[78],"extract":[80],"representative":[81],"features":[82,162],"their":[88],"low-intensity":[89],"contrast":[90],"uneven":[92],"distribution.":[93],"In":[94],"this":[95,116,129],"paper,":[96],"a":[97,120],"data-driven":[98,157],"framework":[99,194],"proposed":[101,117,192],"based":[108],"images.":[111,127,179],"main":[113],"technique":[114],"system":[118],"novel":[121],"process":[122,174],"generating":[124,176],"synthetic":[125],"For":[128],"purpose,":[130],"an":[131],"Edge-Oriented":[132],"Generative":[133],"Adversarial":[134],"Network":[135],"(EOGAN)":[136],"developed.":[138],"EOGAN":[140],"designed":[142],"create":[144],"realistic":[145,177],"that":[148],"can":[149],"be":[150],"used":[151],"as":[152,168],"augmented":[153],"developing":[156],"methods.":[159],"Extracted":[160],"edge":[161],"utilized":[167],"prior":[169],"information":[170],"guide":[172],"Finally,":[180],"comparative":[181],"experiments":[182],"carried":[184],"out":[185],"show":[187],"effectiveness":[189],"EOGAN-based":[193],"presence":[200],"image":[205],"datasets.":[206]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":2}],"updated_date":"2026-05-06T08:25:59.206177","created_date":"2025-10-10T00:00:00"}