{"id":"https://openalex.org/W3044955050","doi":"https://doi.org/10.1109/access.2020.3011454","title":"Fractal Anti-Counterfeit Label Comparison Using Combined Image Features and Clustering","display_name":"Fractal Anti-Counterfeit Label Comparison Using Combined Image Features and Clustering","publication_year":2020,"publication_date":"2020-01-01","ids":{"openalex":"https://openalex.org/W3044955050","doi":"https://doi.org/10.1109/access.2020.3011454","mag":"3044955050"},"language":"en","primary_location":{"id":"doi:10.1109/access.2020.3011454","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2020.3011454","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09146652.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09146652.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5066920453","display_name":"Wen Wang","orcid":"https://orcid.org/0000-0003-2950-693X"},"institutions":[{"id":"https://openalex.org/I44445938","display_name":"Shandong Jianzhu University","ror":"https://ror.org/01gbfax37","country_code":"CN","type":"education","lineage":["https://openalex.org/I44445938"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wen Wang","raw_affiliation_strings":["School of Management Engineering, Shandong Jianzhu University, Jinan, China"],"raw_orcid":"https://orcid.org/0000-0003-2950-693X","affiliations":[{"raw_affiliation_string":"School of Management Engineering, Shandong Jianzhu University, Jinan, China","institution_ids":["https://openalex.org/I44445938"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5025331714","display_name":"Guoyong Han","orcid":"https://orcid.org/0000-0002-3674-1498"},"institutions":[{"id":"https://openalex.org/I44445938","display_name":"Shandong Jianzhu University","ror":"https://ror.org/01gbfax37","country_code":"CN","type":"education","lineage":["https://openalex.org/I44445938"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Guoyong Han","raw_affiliation_strings":["School of Management Engineering, Shandong Jianzhu University, Jinan, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Management Engineering, Shandong Jianzhu University, Jinan, China","institution_ids":["https://openalex.org/I44445938"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5032290703","display_name":"Guanglei Sun","orcid":null},"institutions":[{"id":"https://openalex.org/I4210145153","display_name":"Shandong Institute for Product Quality Inspection","ror":"https://ror.org/048d2bt95","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210145153"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Guanglei Sun","raw_affiliation_strings":["Jinan Institute of Product Quality Inspection, Jinan, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Jinan Institute of Product Quality Inspection, Jinan, China","institution_ids":["https://openalex.org/I4210145153"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.0958,"has_fulltext":true,"cited_by_count":1,"citation_normalized_percentile":{"value":0.38257828,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"8","issue":null,"first_page":"134303","last_page":"134310"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12357","display_name":"Digital Media Forensic Detection","score":0.9876999855041504,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12357","display_name":"Digital Media Forensic Detection","score":0.9876999855041504,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14319","display_name":"Currency Recognition and Detection","score":0.9865999817848206,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10388","display_name":"Advanced Steganography and Watermarking Techniques","score":0.9710000157356262,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cluster-analysis","display_name":"Cluster analysis","score":0.6803887486457825},{"id":"https://openalex.org/keywords/counterfeit","display_name":"Counterfeit","score":0.6728724241256714},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6536208391189575},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.628821074962616},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.625779390335083},{"id":"https://openalex.org/keywords/fractal","display_name":"Fractal","score":0.5863401293754578},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.4509156346321106},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.4445186257362366},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2249525487422943}],"concepts":[{"id":"https://openalex.org/C73555534","wikidata":"https://www.wikidata.org/wiki/Q622825","display_name":"Cluster analysis","level":2,"score":0.6803887486457825},{"id":"https://openalex.org/C2779356469","wikidata":"https://www.wikidata.org/wiki/Q502918","display_name":"Counterfeit","level":2,"score":0.6728724241256714},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6536208391189575},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.628821074962616},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.625779390335083},{"id":"https://openalex.org/C40636538","wikidata":"https://www.wikidata.org/wiki/Q81392","display_name":"Fractal","level":2,"score":0.5863401293754578},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.4509156346321106},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.4445186257362366},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2249525487422943},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C17744445","wikidata":"https://www.wikidata.org/wiki/Q36442","display_name":"Political science","level":0,"score":0.0},{"id":"https://openalex.org/C199539241","wikidata":"https://www.wikidata.org/wiki/Q7748","display_name":"Law","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2020.3011454","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2020.3011454","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09146652.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:2e6fad22402d4a56a91d039ddb637177","is_oa":true,"landing_page_url":"https://doaj.org/article/2e6fad22402d4a56a91d039ddb637177","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 8, Pp 134303-134310 (2020)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2020.3011454","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2020.3011454","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09146652.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"score":0.699999988079071,"id":"https://metadata.un.org/sdg/8","display_name":"Decent work and economic growth"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320313896","display_name":"Department of Education of Shandong Province","ror":"https://ror.org/01ksk4k18"}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W3044955050.pdf","grobid_xml":"https://content.openalex.org/works/W3044955050.grobid-xml"},"referenced_works_count":14,"referenced_works":["https://openalex.org/W163323618","https://openalex.org/W423139985","https://openalex.org/W2293457052","https://openalex.org/W2294526658","https://openalex.org/W2339578322","https://openalex.org/W2366493900","https://openalex.org/W2366794204","https://openalex.org/W2368318897","https://openalex.org/W2520081143","https://openalex.org/W2576786845","https://openalex.org/W2602747466","https://openalex.org/W2606253365","https://openalex.org/W3009368443","https://openalex.org/W6606696556"],"related_works":["https://openalex.org/W3191226418","https://openalex.org/W2357749344","https://openalex.org/W4323356230","https://openalex.org/W2362200800","https://openalex.org/W1539823648","https://openalex.org/W4290078996","https://openalex.org/W3113783116","https://openalex.org/W4372352523","https://openalex.org/W1579156572","https://openalex.org/W4233184255"],"abstract_inverted_index":{"The":[0,57,173],"comparison":[1,49,162,186,200],"of":[2,70,105,144,148,182],"traditional":[3],"fractal":[4,52,97,183],"anti-counterfeit":[5,53,71,98,184],"labels":[6,15,54,149],"is":[7,55,84,137,205],"based":[8,117,131,194],"mainly":[9],"on":[10,118,132,167,195],"manual":[11,29],"inspection.":[12],"However,":[13],"such":[14],"have":[16],"rich":[17],"details":[18],"and":[19,67,73,77,90,111,127,159,180,198],"complex":[20],"structures,":[21],"making":[22],"the":[23,62,88,96,103,119,145,156,161,178,190,202],"entire":[24],"identification":[25,36,197],"process":[26],"labor-intensive.":[27],"Thus,":[28],"inspections":[30],"are":[31],"highly":[32],"susceptible":[33],"to":[34,86,139,207],"low":[35],"accuracy,":[37],"which":[38],"produces":[39],"unreliable":[40,199],"results.":[41],"To":[42,100],"best":[43],"address":[44],"these":[45],"disadvantages,":[46],"an":[47],"automatic":[48],"method":[50,58,204],"for":[51,102],"proposed.":[56],"can":[59,152,163],"effectively":[60,187],"extract":[61,87],"color":[63,81,89],"features,":[64,66],"texture":[65,110],"shape":[68,112],"features":[69,94,113],"labels,":[72],"perform":[74],"cluster":[75],"analysis":[76],"comparison.":[78],"First,":[79],"a":[80,107,170],"volume":[82],"histogram":[83],"used":[85],"pixel":[91],"space":[92],"information":[93],"from":[95],"labels.":[99],"compensate":[101],"deficiency":[104],"using":[106],"single":[108],"feature,":[109],"were":[114],"also":[115],"extracted":[116],"median":[120],"robust":[121],"extended":[122],"local":[123],"binary":[124],"patterns":[125],"(MRELBP)":[126],"Hu":[128],"moments.":[129],"Next,":[130],"feature":[133],"extraction,":[134],"k-means":[135],"clustering":[136,191],"performed":[138,166],"ensure":[140],"that":[141,160,177],"as":[142,150],"many":[143],"same":[146,157],"types":[147],"possible":[151],"be":[153,165],"divided":[154],"into":[155],"clusters":[158],"only":[164],"one":[168],"or":[169],"few":[171],"clusters.":[172],"experimental":[174],"results":[175],"show":[176],"speed":[179],"quality":[181],"label":[185],"improved":[188],"after":[189],"analysis.":[192],"Furthermore,":[193],"visual":[196],"results,":[201],"proposed":[203],"expected":[206],"help":[208],"consumers":[209],"quickly":[210],"identify":[211],"low-quality,":[212],"counterfeit":[213],"products.":[214]},"counts_by_year":[{"year":2023,"cited_by_count":1}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}