{"id":"https://openalex.org/W3036523281","doi":"https://doi.org/10.1109/access.2020.3003231","title":"Numerical Verification of Dielectric Contactor as Auxiliary Loads for Measuring the Multi-Port Network Parameter of Vertical Interconnection Array","display_name":"Numerical Verification of Dielectric Contactor as Auxiliary Loads for Measuring the Multi-Port Network Parameter of Vertical Interconnection Array","publication_year":2020,"publication_date":"2020-01-01","ids":{"openalex":"https://openalex.org/W3036523281","doi":"https://doi.org/10.1109/access.2020.3003231","mag":"3036523281"},"language":"en","primary_location":{"id":"doi:10.1109/access.2020.3003231","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2020.3003231","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09119390.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09119390.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5010480913","display_name":"Byungjin Bae","orcid":"https://orcid.org/0000-0003-1698-0026"},"institutions":[{"id":"https://openalex.org/I48566637","display_name":"Ulsan National Institute of Science and Technology","ror":"https://ror.org/017cjz748","country_code":"KR","type":"education","lineage":["https://openalex.org/I48566637"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Byungjin Bae","raw_affiliation_strings":["School of Electrical and Computer Engineering, Ulsan National Institute of Science and Technology, Ulsan, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering, Ulsan National Institute of Science and Technology, Ulsan, South Korea","institution_ids":["https://openalex.org/I48566637"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5085562709","display_name":"Jingook Kim","orcid":"https://orcid.org/0000-0001-6570-7785"},"institutions":[{"id":"https://openalex.org/I48566637","display_name":"Ulsan National Institute of Science and Technology","ror":"https://ror.org/017cjz748","country_code":"KR","type":"education","lineage":["https://openalex.org/I48566637"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jingook Kim","raw_affiliation_strings":["School of Electrical and Computer Engineering, Ulsan National Institute of Science and Technology, Ulsan, South Korea"],"raw_orcid":"https://orcid.org/0000-0001-6570-7785","affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering, Ulsan National Institute of Science and Technology, Ulsan, South Korea","institution_ids":["https://openalex.org/I48566637"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5038419298","display_name":"Ki Jin Han","orcid":"https://orcid.org/0000-0002-7190-8492"},"institutions":[{"id":"https://openalex.org/I205490536","display_name":"Dongguk University","ror":"https://ror.org/057q6n778","country_code":"KR","type":"education","lineage":["https://openalex.org/I205490536"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Ki Jin Han","raw_affiliation_strings":["Division of Electronics and Electrical Engineering, Dongguk University, Seoul, South Korea"],"raw_orcid":"https://orcid.org/0000-0002-7190-8492","affiliations":[{"raw_affiliation_string":"Division of Electronics and Electrical Engineering, Dongguk University, Seoul, South Korea","institution_ids":["https://openalex.org/I205490536"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5010480913"],"corresponding_institution_ids":["https://openalex.org/I48566637"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.208,"has_fulltext":true,"cited_by_count":3,"citation_normalized_percentile":{"value":0.50633598,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"8","issue":null,"first_page":"117997","last_page":"118004"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/contactor","display_name":"Contactor","score":0.938847541809082},{"id":"https://openalex.org/keywords/port","display_name":"Port (circuit theory)","score":0.6821127533912659},{"id":"https://openalex.org/keywords/interconnection","display_name":"Interconnection","score":0.6729616522789001},{"id":"https://openalex.org/keywords/dielectric","display_name":"Dielectric","score":0.6097867488861084},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4838763475418091},{"id":"https://openalex.org/keywords/scattering-parameters","display_name":"Scattering parameters","score":0.47624850273132324},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4454965591430664},{"id":"https://openalex.org/keywords/microwave","display_name":"Microwave","score":0.41509634256362915},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.40383777022361755},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.21207788586616516},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20708033442497253},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.15441855788230896},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.13355320692062378},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.06593337655067444}],"concepts":[{"id":"https://openalex.org/C78592999","wikidata":"https://www.wikidata.org/wiki/Q338763","display_name":"Contactor","level":3,"score":0.938847541809082},{"id":"https://openalex.org/C32802771","wikidata":"https://www.wikidata.org/wiki/Q2443617","display_name":"Port (circuit theory)","level":2,"score":0.6821127533912659},{"id":"https://openalex.org/C123745756","wikidata":"https://www.wikidata.org/wiki/Q1665949","display_name":"Interconnection","level":2,"score":0.6729616522789001},{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.6097867488861084},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4838763475418091},{"id":"https://openalex.org/C195266298","wikidata":"https://www.wikidata.org/wiki/Q2165620","display_name":"Scattering parameters","level":2,"score":0.47624850273132324},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4454965591430664},{"id":"https://openalex.org/C44838205","wikidata":"https://www.wikidata.org/wiki/Q127995","display_name":"Microwave","level":2,"score":0.41509634256362915},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.40383777022361755},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.21207788586616516},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20708033442497253},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.15441855788230896},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.13355320692062378},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.06593337655067444},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/access.2020.3003231","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2020.3003231","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09119390.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:8d8934d4693a404fbf1b23105e3b4b1d","is_oa":true,"landing_page_url":"https://doaj.org/article/8d8934d4693a404fbf1b23105e3b4b1d","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 8, Pp 117997-118004 (2020)","raw_type":"article"},{"id":"pmh:oai:scholarworks.unist.ac.kr:201301/32322","is_oa":false,"landing_page_url":"https://scholarworks.unist.ac.kr/handle/201301/32322","pdf_url":null,"source":{"id":"https://openalex.org/S4306401118","display_name":"Scholarworks@UNIST (Ulsan National Institute of Science and Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I48566637","host_organization_name":"Ulsan National Institute of Science and Technology","host_organization_lineage":["https://openalex.org/I48566637"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"ARTICLE"}],"best_oa_location":{"id":"doi:10.1109/access.2020.3003231","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2020.3003231","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09119390.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.6499999761581421,"display_name":"Affordable and clean energy"}],"awards":[{"id":"https://openalex.org/G4995453371","display_name":null,"funder_award_id":"2016M3A7B4910430","funder_id":"https://openalex.org/F4320322120","funder_display_name":"National Research Foundation of Korea"},{"id":"https://openalex.org/G8163160480","display_name":null,"funder_award_id":"NRF-2016M3A7B4910430","funder_id":"https://openalex.org/F4320322120","funder_display_name":"National Research Foundation of Korea"}],"funders":[{"id":"https://openalex.org/F4320320671","display_name":"National Research Foundation","ror":"https://ror.org/05s0g1g46"},{"id":"https://openalex.org/F4320322120","display_name":"National Research Foundation of Korea","ror":"https://ror.org/013aysd81"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W3036523281.pdf","grobid_xml":"https://content.openalex.org/works/W3036523281.grobid-xml"},"referenced_works_count":9,"referenced_works":["https://openalex.org/W2044175881","https://openalex.org/W2063391239","https://openalex.org/W2148110807","https://openalex.org/W2153729653","https://openalex.org/W2163669324","https://openalex.org/W2531313117","https://openalex.org/W2885150914","https://openalex.org/W2912818185","https://openalex.org/W2981070729"],"related_works":["https://openalex.org/W1972579791","https://openalex.org/W3017172093","https://openalex.org/W2353177263","https://openalex.org/W1995005193","https://openalex.org/W2387537324","https://openalex.org/W2393563578","https://openalex.org/W2112336123","https://openalex.org/W2385682656","https://openalex.org/W2011298219","https://openalex.org/W2355885842"],"abstract_inverted_index":{"For":[0],"the":[1,43,65,70,75,94,104,111,115,124],"accurate":[2],"and":[3,82],"reliable":[4],"multi-port":[5],"characterization":[6],"of":[7,23,123],"vertical":[8,53],"interconnection":[9],"array":[10],"structures,":[11],"this":[12],"paper":[13],"presents":[14],"an":[15,28],"indirect-contact":[16,89],"probing":[17,90,101],"method":[18,113],"to":[19],"obtain":[20],"network":[21,34,58,67],"parameters":[22,59,68],"N-port":[24,66],"device-under-tests":[25],"(DUTs)":[26],"using":[27],"M-port":[29,56],"(N":[30],">":[31],"M)":[32],"vector":[33],"analyzer":[35],"(VNA)":[36],"with":[37,87,98,114],"a":[38],"dielectric":[39,44,95,105,116],"contactor.":[40,96],"By":[41],"utilizing":[42],"contactor":[45,117],"as":[46],"auxiliary":[47],"loads":[48],"for":[49,52,80],"un-probed":[50],"ports":[51],"interconnections,":[54],"multiple":[55],"sub-array":[57,91],"can":[60],"be":[61],"correctly":[62],"synthesized":[63],"into":[64],"through":[69],"renormalization":[71],"processes.":[72],"To":[73],"verify":[74],"proposed":[76,112],"method,":[77],"four-port":[78],"DUTs":[79],"packaging":[81],"microwave":[83],"applications":[84],"were":[85],"characterized":[86],"two-port":[88,99],"simulations":[92,102],"including":[93],"Compared":[97],"direct-contact":[100],"without":[103],"contactor,":[106],"it":[107],"was":[108],"confirmed":[109],"that":[110],"provides":[118],"improved":[119],"accuracy":[120],"in":[121],"terms":[122],"feature":[125],"selective":[126],"validation":[127],"(FSV)":[128],"method.":[129]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1}],"updated_date":"2026-05-06T08:25:59.206177","created_date":"2025-10-10T00:00:00"}