{"id":"https://openalex.org/W3030893967","doi":"https://doi.org/10.1109/access.2020.2997807","title":"Detection of Conductive Particles in TFT-LCD Circuit Using Generative Adversarial Networks","display_name":"Detection of Conductive Particles in TFT-LCD Circuit Using Generative Adversarial Networks","publication_year":2020,"publication_date":"2020-01-01","ids":{"openalex":"https://openalex.org/W3030893967","doi":"https://doi.org/10.1109/access.2020.2997807","mag":"3030893967"},"language":"en","primary_location":{"id":"doi:10.1109/access.2020.2997807","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2020.2997807","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09099780.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09099780.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101488591","display_name":"Yuanyuan Wang","orcid":"https://orcid.org/0000-0003-0101-5194"},"institutions":[{"id":"https://openalex.org/I38877650","display_name":"Zhengzhou University","ror":"https://ror.org/04ypx8c21","country_code":"CN","type":"education","lineage":["https://openalex.org/I38877650"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Yuanyuan Wang","raw_affiliation_strings":["School of Information Engineering and Digital Medical Image Technique Research Center, Zhengzhou University, Zhengzhou, China"],"affiliations":[{"raw_affiliation_string":"School of Information Engineering and Digital Medical Image Technique Research Center, Zhengzhou University, Zhengzhou, China","institution_ids":["https://openalex.org/I38877650"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5036882508","display_name":"Ling Ma","orcid":"https://orcid.org/0000-0002-3424-3540"},"institutions":[{"id":"https://openalex.org/I38877650","display_name":"Zhengzhou University","ror":"https://ror.org/04ypx8c21","country_code":"CN","type":"education","lineage":["https://openalex.org/I38877650"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ling Ma","raw_affiliation_strings":["School of Information Engineering and Digital Medical Image Technique Research Center, Zhengzhou University, Zhengzhou, China"],"affiliations":[{"raw_affiliation_string":"School of Information Engineering and Digital Medical Image Technique Research Center, Zhengzhou University, Zhengzhou, China","institution_ids":["https://openalex.org/I38877650"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017257056","display_name":"Mingyuan Jiu","orcid":"https://orcid.org/0000-0002-4868-0709"},"institutions":[{"id":"https://openalex.org/I38877650","display_name":"Zhengzhou University","ror":"https://ror.org/04ypx8c21","country_code":"CN","type":"education","lineage":["https://openalex.org/I38877650"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Mingyuan Jiu","raw_affiliation_strings":["School of Information Engineering and Digital Medical Image Technique Research Center, Zhengzhou University, Zhengzhou, China"],"affiliations":[{"raw_affiliation_string":"School of Information Engineering and Digital Medical Image Technique Research Center, Zhengzhou University, Zhengzhou, China","institution_ids":["https://openalex.org/I38877650"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101621658","display_name":"Huiqin Jiang","orcid":"https://orcid.org/0000-0001-8520-2223"},"institutions":[{"id":"https://openalex.org/I38877650","display_name":"Zhengzhou University","ror":"https://ror.org/04ypx8c21","country_code":"CN","type":"education","lineage":["https://openalex.org/I38877650"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Huiqin Jiang","raw_affiliation_strings":["School of Information Engineering and Digital Medical Image Technique Research Center, Zhengzhou University, Zhengzhou, China"],"affiliations":[{"raw_affiliation_string":"School of Information Engineering and Digital Medical Image Technique Research Center, Zhengzhou University, Zhengzhou, China","institution_ids":["https://openalex.org/I38877650"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5101488591"],"corresponding_institution_ids":["https://openalex.org/I38877650"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":1.8069,"has_fulltext":true,"cited_by_count":11,"citation_normalized_percentile":{"value":0.87513067,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"8","issue":null,"first_page":"101338","last_page":"101350"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10036","display_name":"Advanced Neural Network Applications","score":0.9908999800682068,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14319","display_name":"Currency Recognition and Detection","score":0.9887999892234802,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6099022030830383},{"id":"https://openalex.org/keywords/adversarial-system","display_name":"Adversarial system","score":0.5876098871231079},{"id":"https://openalex.org/keywords/generative-adversarial-network","display_name":"Generative adversarial network","score":0.4960409104824066},{"id":"https://openalex.org/keywords/thin-film-transistor","display_name":"Thin-film transistor","score":0.4410717487335205},{"id":"https://openalex.org/keywords/electrical-conductor","display_name":"Electrical conductor","score":0.43835219740867615},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.32270145416259766},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.26139503717422485},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.19129785895347595},{"id":"https://openalex.org/keywords/deep-learning","display_name":"Deep learning","score":0.15400701761245728},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.14199158549308777},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.08946841955184937}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6099022030830383},{"id":"https://openalex.org/C37736160","wikidata":"https://www.wikidata.org/wiki/Q1801315","display_name":"Adversarial system","level":2,"score":0.5876098871231079},{"id":"https://openalex.org/C2988773926","wikidata":"https://www.wikidata.org/wiki/Q25104379","display_name":"Generative adversarial network","level":3,"score":0.4960409104824066},{"id":"https://openalex.org/C87359718","wikidata":"https://www.wikidata.org/wiki/Q1271916","display_name":"Thin-film transistor","level":3,"score":0.4410717487335205},{"id":"https://openalex.org/C202374169","wikidata":"https://www.wikidata.org/wiki/Q124291","display_name":"Electrical conductor","level":2,"score":0.43835219740867615},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.32270145416259766},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.26139503717422485},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.19129785895347595},{"id":"https://openalex.org/C108583219","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep learning","level":2,"score":0.15400701761245728},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.14199158549308777},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.08946841955184937},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2020.2997807","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2020.2997807","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09099780.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:57fa615cea7c4118a0ab590b92af6c6e","is_oa":true,"landing_page_url":"https://doaj.org/article/57fa615cea7c4118a0ab590b92af6c6e","pdf_url":null,"source":{"id":"https://openalex.org/S112646816","display_name":"SHILAP Revista de lepidopterolog\u00eda","issn_l":"0300-5267","issn":["0300-5267","2340-4078"],"is_oa":true,"is_in_doaj":true,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 8, Pp 101338-101350 (2020)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2020.2997807","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2020.2997807","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09099780.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"display_name":"Reduced inequalities","score":0.5199999809265137,"id":"https://metadata.un.org/sdg/10"},{"display_name":"Peace, Justice and strong institutions","score":0.41999998688697815,"id":"https://metadata.un.org/sdg/16"}],"awards":[{"id":"https://openalex.org/G1231421488","display_name":null,"funder_award_id":"under","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G2087396116","display_name":null,"funder_award_id":"China","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G2273800250","display_name":null,"funder_award_id":"NSFC-","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G2987782042","display_name":null,"funder_award_id":"U1604262","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G3317480652","display_name":null,"funder_award_id":"Science","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G37568934","display_name":null,"funder_award_id":"Grant","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G391238517","display_name":null,"funder_award_id":", and","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G4020255992","display_name":null,"funder_award_id":"Project","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G5994120800","display_name":null,"funder_award_id":"Natural","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G6615639282","display_name":null,"funder_award_id":"61806180.","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G8087166531","display_name":null,"funder_award_id":"1604262","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G8599507701","display_name":null,"funder_award_id":"61806180","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320336126","display_name":"National Natural Science Foundation of China-Henan Joint Fund","ror":null}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W3030893967.pdf","grobid_xml":"https://content.openalex.org/works/W3030893967.grobid-xml"},"referenced_works_count":45,"referenced_works":["https://openalex.org/W238965320","https://openalex.org/W1522301498","https://openalex.org/W1686810756","https://openalex.org/W1836465849","https://openalex.org/W1901129140","https://openalex.org/W1903029394","https://openalex.org/W1976434118","https://openalex.org/W1982055475","https://openalex.org/W1988455267","https://openalex.org/W2000030416","https://openalex.org/W2022072454","https://openalex.org/W2045267231","https://openalex.org/W2045943859","https://openalex.org/W2097117768","https://openalex.org/W2133059825","https://openalex.org/W2163605009","https://openalex.org/W2171447172","https://openalex.org/W2194775991","https://openalex.org/W2412782625","https://openalex.org/W2546760267","https://openalex.org/W2560023338","https://openalex.org/W2630837129","https://openalex.org/W2769961006","https://openalex.org/W2793938489","https://openalex.org/W2884561390","https://openalex.org/W2888443510","https://openalex.org/W2892806280","https://openalex.org/W2919115771","https://openalex.org/W2928133111","https://openalex.org/W2960445332","https://openalex.org/W2963136578","https://openalex.org/W2963163009","https://openalex.org/W2963881378","https://openalex.org/W2964309882","https://openalex.org/W2977511705","https://openalex.org/W4293584584","https://openalex.org/W4320013936","https://openalex.org/W6609321009","https://openalex.org/W6631190155","https://openalex.org/W6637373629","https://openalex.org/W6638667902","https://openalex.org/W6684191040","https://openalex.org/W6685444217","https://openalex.org/W6739696289","https://openalex.org/W6750227808"],"related_works":["https://openalex.org/W2502115930","https://openalex.org/W2482350142","https://openalex.org/W4246396837","https://openalex.org/W3126451824","https://openalex.org/W1561927205","https://openalex.org/W3191453585","https://openalex.org/W4297672492","https://openalex.org/W4310988119","https://openalex.org/W4285226279","https://openalex.org/W4288019534"],"abstract_inverted_index":{"The":[0,33,124,182],"inspection":[1,122],"of":[2,36,82,95,127,191,198],"conductive":[3,28,96,200],"particles":[4,25,39,47,97,201],"is":[5,40,50,98,117,130,152],"a":[6,51,79,90,106,133],"crucial":[7],"step":[8],"in":[9,30,101],"the":[10,27,31,45,60,128,145,150,179,185,189,192,196,204],"Thin":[11],"Film":[12],"Transistor":[13],"Liquid":[14],"Crystal":[15],"Display":[16],"(TFT-LCD)":[17],"circuit":[18,121],"detection":[19,73,94,109,180,197],"process":[20],"since":[21],"only":[22],"high-quality":[23],"deformed":[24],"have":[26],"effect":[29],"circuit.":[32],"main":[34],"task":[35],"detecting":[37],"conduction":[38],"to":[41,55,65,76,154,165,177,203],"locate":[42],"and":[43,67,156,169],"count":[44],"valid":[46,199],"accurately,":[48],"which":[49,85],"high":[52],"challenge":[53],"due":[54],"various":[56],"difficulties":[57],"such":[58],"as":[59],"uneven":[61],"illumination,":[62],"different":[63],"sizes":[64],"aggregation":[66],"overlap":[68],"between":[69],"particles,":[70],"etc.":[71],"Traditional":[72],"algorithms":[74],"need":[75],"manually":[77],"set":[78],"large":[80],"number":[81],"artificial":[83],"thresholds,":[84],"limits":[86],"their":[87],"adaptability.":[88],"As":[89],"result,":[91],"effective":[92],"automatic":[93],"strongly":[99],"motived":[100],"industry.":[102],"In":[103],"this":[104],"paper,":[105],"novel":[107],"particle":[108],"algorithm":[110],"based":[111,131],"on":[112,132,184],"generative":[113],"adversarial":[114],"networks":[115],"(GAN)":[116],"proposed":[118,176,193],"for":[119,142,160,195],"TFT-LCD":[120],"system.":[123],"backbone":[125],"architecture":[126],"generator":[129],"compact":[134],"end-to-end":[135],"neural":[136],"network":[137],"with":[138],"multi-scale":[139],"convolution":[140],"blocks":[141],"well":[143],"utilizing":[144],"multiscale":[146],"spatial":[147],"features.":[148],"And":[149],"discriminator":[151],"designed":[153],"detect":[155],"correct":[157],"high-order":[158],"inconsistencies":[159],"real-fake":[161],"images.":[162],"Moreover,":[163],"Coarse":[164],"Fine":[166],"training":[167],"strategy":[168,173],"Loss":[170],"functions":[171],"Coordination":[172],"are":[174],"further":[175],"improve":[178],"quality.":[181],"experiments":[183],"real":[186],"dataset":[187],"demonstrate":[188],"effectiveness":[190],"methods":[194],"compared":[202],"state-of-the-art":[205],"methods.":[206]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":4},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":1}],"updated_date":"2026-04-18T07:56:08.524223","created_date":"2025-10-10T00:00:00"}