{"id":"https://openalex.org/W3023179195","doi":"https://doi.org/10.1109/access.2020.2990759","title":"Effect of Thickness on the Space Charge Behavior and DC Breakdown Strength of Cross-Linked Polyethylene Insulation","display_name":"Effect of Thickness on the Space Charge Behavior and DC Breakdown Strength of Cross-Linked Polyethylene Insulation","publication_year":2020,"publication_date":"2020-01-01","ids":{"openalex":"https://openalex.org/W3023179195","doi":"https://doi.org/10.1109/access.2020.2990759","mag":"3023179195"},"language":"en","primary_location":{"id":"doi:10.1109/access.2020.2990759","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2020.2990759","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09079498.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09079498.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5020502288","display_name":"Zhipeng Ma","orcid":"https://orcid.org/0000-0002-3039-355X"},"institutions":[{"id":"https://openalex.org/I158842170","display_name":"Chongqing University","ror":"https://ror.org/023rhb549","country_code":"CN","type":"education","lineage":["https://openalex.org/I158842170"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Zhipeng Ma","raw_affiliation_strings":["State Key Laboratory of Power Transmission Equipment and System Security and New Technology, Chongqing University, Chongqing, China"],"raw_orcid":"https://orcid.org/0000-0002-3039-355X","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Power Transmission Equipment and System Security and New Technology, Chongqing University, Chongqing, China","institution_ids":["https://openalex.org/I158842170"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044765945","display_name":"Lijun Yang","orcid":"https://orcid.org/0000-0003-4407-3773"},"institutions":[{"id":"https://openalex.org/I158842170","display_name":"Chongqing University","ror":"https://ror.org/023rhb549","country_code":"CN","type":"education","lineage":["https://openalex.org/I158842170"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lijun Yang","raw_affiliation_strings":["State Key Laboratory of Power Transmission Equipment and System Security and New Technology, Chongqing University, Chongqing, China"],"raw_orcid":"https://orcid.org/0000-0003-4407-3773","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Power Transmission Equipment and System Security and New Technology, Chongqing University, Chongqing, China","institution_ids":["https://openalex.org/I158842170"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5009253362","display_name":"Muhammad Shoaib Bhutta","orcid":"https://orcid.org/0000-0001-5176-3129"},"institutions":[{"id":"https://openalex.org/I158842170","display_name":"Chongqing University","ror":"https://ror.org/023rhb549","country_code":"CN","type":"education","lineage":["https://openalex.org/I158842170"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Muhammad Shoaib Bhutta","raw_affiliation_strings":["State Key Laboratory of Power Transmission Equipment and System Security and New Technology, Chongqing University, Chongqing, China"],"raw_orcid":"https://orcid.org/0000-0001-5176-3129","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Power Transmission Equipment and System Security and New Technology, Chongqing University, Chongqing, China","institution_ids":["https://openalex.org/I158842170"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5062536849","display_name":"Haoran Bian","orcid":"https://orcid.org/0000-0001-8117-7075"},"institutions":[{"id":"https://openalex.org/I158842170","display_name":"Chongqing University","ror":"https://ror.org/023rhb549","country_code":"CN","type":"education","lineage":["https://openalex.org/I158842170"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Haoran Bian","raw_affiliation_strings":["State Key Laboratory of Power Transmission Equipment and System Security and New Technology, Chongqing University, Chongqing, China"],"raw_orcid":"https://orcid.org/0000-0001-8117-7075","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Power Transmission Equipment and System Security and New Technology, Chongqing University, Chongqing, China","institution_ids":["https://openalex.org/I158842170"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5001456750","display_name":"Muhammad Zeeshan Khan","orcid":"https://orcid.org/0000-0002-4106-8090"},"institutions":[{"id":"https://openalex.org/I158842170","display_name":"Chongqing University","ror":"https://ror.org/023rhb549","country_code":"CN","type":"education","lineage":["https://openalex.org/I158842170"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Muhammad Zeeshan Khan","raw_affiliation_strings":["State Key Laboratory of Power Transmission Equipment and System Security and New Technology, Chongqing University, Chongqing, China"],"raw_orcid":"https://orcid.org/0000-0002-4106-8090","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Power Transmission Equipment and System Security and New Technology, Chongqing University, Chongqing, China","institution_ids":["https://openalex.org/I158842170"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5020502288"],"corresponding_institution_ids":["https://openalex.org/I158842170"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.57,"has_fulltext":true,"cited_by_count":10,"citation_normalized_percentile":{"value":0.59801293,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":97},"biblio":{"volume":"8","issue":null,"first_page":"85552","last_page":"85566"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11343","display_name":"Power Transformer Diagnostics and Insulation","score":0.9955999851226807,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10787","display_name":"Lightning and Electromagnetic Phenomena","score":0.9915000200271606,"subfield":{"id":"https://openalex.org/subfields/3103","display_name":"Astronomy and Astrophysics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/space-charge","display_name":"Space charge","score":0.8460712432861328},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.7637124061584473},{"id":"https://openalex.org/keywords/electric-field","display_name":"Electric field","score":0.6739035844802856},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.663921594619751},{"id":"https://openalex.org/keywords/dielectric","display_name":"Dielectric","score":0.6297941207885742},{"id":"https://openalex.org/keywords/distortion","display_name":"Distortion (music)","score":0.5881309509277344},{"id":"https://openalex.org/keywords/polyethylene","display_name":"Polyethylene","score":0.5843267440795898},{"id":"https://openalex.org/keywords/field-strength","display_name":"Field strength","score":0.5560789704322815},{"id":"https://openalex.org/keywords/cross-linked-polyethylene","display_name":"Cross-linked polyethylene","score":0.5215263962745667},{"id":"https://openalex.org/keywords/dielectric-strength","display_name":"Dielectric strength","score":0.5079570412635803},{"id":"https://openalex.org/keywords/electrical-treeing","display_name":"Electrical treeing","score":0.4386945366859436},{"id":"https://openalex.org/keywords/field","display_name":"Field (mathematics)","score":0.4143914580345154},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.3846997320652008},{"id":"https://openalex.org/keywords/partial-discharge","display_name":"Partial discharge","score":0.3151068687438965},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2767319679260254},{"id":"https://openalex.org/keywords/magnetic-field","display_name":"Magnetic field","score":0.21050766110420227},{"id":"https://openalex.org/keywords/electron","display_name":"Electron","score":0.18125683069229126},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.13407137989997864},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.09051051735877991}],"concepts":[{"id":"https://openalex.org/C103132145","wikidata":"https://www.wikidata.org/wiki/Q1669228","display_name":"Space charge","level":3,"score":0.8460712432861328},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7637124061584473},{"id":"https://openalex.org/C60799052","wikidata":"https://www.wikidata.org/wiki/Q46221","display_name":"Electric field","level":2,"score":0.6739035844802856},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.663921594619751},{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.6297941207885742},{"id":"https://openalex.org/C126780896","wikidata":"https://www.wikidata.org/wiki/Q899871","display_name":"Distortion (music)","level":4,"score":0.5881309509277344},{"id":"https://openalex.org/C2779751980","wikidata":"https://www.wikidata.org/wiki/Q143429","display_name":"Polyethylene","level":2,"score":0.5843267440795898},{"id":"https://openalex.org/C187309904","wikidata":"https://www.wikidata.org/wiki/Q1365197","display_name":"Field strength","level":3,"score":0.5560789704322815},{"id":"https://openalex.org/C2777586470","wikidata":"https://www.wikidata.org/wiki/Q2666962","display_name":"Cross-linked polyethylene","level":3,"score":0.5215263962745667},{"id":"https://openalex.org/C70401718","wikidata":"https://www.wikidata.org/wiki/Q343241","display_name":"Dielectric strength","level":3,"score":0.5079570412635803},{"id":"https://openalex.org/C175395656","wikidata":"https://www.wikidata.org/wiki/Q4384289","display_name":"Electrical treeing","level":4,"score":0.4386945366859436},{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.4143914580345154},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.3846997320652008},{"id":"https://openalex.org/C130143024","wikidata":"https://www.wikidata.org/wiki/Q1929972","display_name":"Partial discharge","level":3,"score":0.3151068687438965},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2767319679260254},{"id":"https://openalex.org/C115260700","wikidata":"https://www.wikidata.org/wiki/Q11408","display_name":"Magnetic field","level":2,"score":0.21050766110420227},{"id":"https://openalex.org/C147120987","wikidata":"https://www.wikidata.org/wiki/Q2225","display_name":"Electron","level":2,"score":0.18125683069229126},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.13407137989997864},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.09051051735877991},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.0},{"id":"https://openalex.org/C202444582","wikidata":"https://www.wikidata.org/wiki/Q837863","display_name":"Pure mathematics","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2020.2990759","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2020.2990759","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09079498.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:47ed4a6144f94945bd7bfd776b4a2f7a","is_oa":true,"landing_page_url":"https://doaj.org/article/47ed4a6144f94945bd7bfd776b4a2f7a","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 8, Pp 85552-85566 (2020)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2020.2990759","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2020.2990759","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09079498.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"score":0.8799999952316284,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[{"id":"https://openalex.org/G3579240477","display_name":null,"funder_award_id":"2016YFB0900701","funder_id":"https://openalex.org/F4320335777","funder_display_name":"National Key Research and Development Program of China"}],"funders":[{"id":"https://openalex.org/F4320335777","display_name":"National Key Research and Development Program of China","ror":null}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W3023179195.pdf","grobid_xml":"https://content.openalex.org/works/W3023179195.grobid-xml"},"referenced_works_count":31,"referenced_works":["https://openalex.org/W1903489948","https://openalex.org/W1910407586","https://openalex.org/W1996419909","https://openalex.org/W2014838480","https://openalex.org/W2016139476","https://openalex.org/W2035397401","https://openalex.org/W2054176769","https://openalex.org/W2062050577","https://openalex.org/W2094358194","https://openalex.org/W2094925198","https://openalex.org/W2097255003","https://openalex.org/W2108241831","https://openalex.org/W2111889920","https://openalex.org/W2116251422","https://openalex.org/W2119304744","https://openalex.org/W2142854874","https://openalex.org/W2145529818","https://openalex.org/W2154445521","https://openalex.org/W2245554780","https://openalex.org/W2276706620","https://openalex.org/W2572536878","https://openalex.org/W2578442785","https://openalex.org/W2594203181","https://openalex.org/W2725436608","https://openalex.org/W2749651571","https://openalex.org/W2783560087","https://openalex.org/W2793571283","https://openalex.org/W2798848226","https://openalex.org/W2893311939","https://openalex.org/W2904259847","https://openalex.org/W2921924139"],"related_works":["https://openalex.org/W2118231321","https://openalex.org/W2801209252","https://openalex.org/W2103991600","https://openalex.org/W2155409284","https://openalex.org/W2612972072","https://openalex.org/W2391132677","https://openalex.org/W2055059664","https://openalex.org/W2153282355","https://openalex.org/W1768855023","https://openalex.org/W2553030235"],"abstract_inverted_index":{"In":[0],"high":[1],"voltage":[2],"direct":[3],"current":[4],"(HVDC)":[5],"cable":[6],"systems,":[7],"study":[8],"of":[9,31,38,80,107,189,204,221,260],"electric":[10,174],"field":[11,132,163,175,183,187,209,229,269],"distortion":[12,134,186,228,268],"created":[13],"by":[14],"space":[15,32,52,63],"charge":[16,33,53,64,91],"accumulation":[17,78,92],"is":[18,47,137,145,157,161,223,231,262,271],"very":[19],"important":[20,49],"for":[21,140,150,159],"examining":[22],"insulation":[23],"performance.":[24],"Therefore,":[25],"in":[26,55,241],"this":[27],"paper":[28],"the":[29,74,130,173,202,219,246,258,267,279],"influence":[30],"on":[34,172,245,282],"short-time":[35],"breakdown":[36,216,247,250,283,286],"characteristics":[37,84],"cross-linked":[39],"polyethylene":[40],"(XLPE)":[41],"are":[42],"studied.":[43],"Trap":[44],"energy":[45],"distribution":[46,70],"an":[48],"factor":[50,155],"affecting":[51],"behavior":[54],"dielectrics.":[56],"Dielectrics":[57],"with":[58,98,121,191,237,253,289],"various":[59,68],"thicknesses":[60,193,214],"exhibit":[61],"different":[62,192,212],"phenomena":[65],"due":[66],"to":[67,118,200],"trap":[69,83],"characteristics,":[71],"which":[72,110,136,156,276],"regulate":[73],"injection,":[75],"migration":[76],"and":[77,94,143,165,185,207,235,249,285],"processes":[79],"charges.":[81],"Consequently,":[82],"can":[85,111],"affect":[86,171],"many":[87],"parameters,":[88],"such":[89],"as":[90,116],"depth":[93],"injection":[95],"barrier.":[96],"XLPE":[97,120,142,190,213,222,261],"thickness":[99,122,220,259],"less":[100,224,272],"than":[101,124,148,225,233,264,273],"100":[102,125,226,265],"\u03bcm":[103],"show":[104],"lower":[105],"density":[106],"deep":[108],"traps":[109],"accumulate":[112],"homogeneous":[113],"bulk":[114],"charges":[115],"compared":[117],"thick":[119,151],"greater":[123,263],"\u03bcm.":[126],"This":[127],"phenomenon":[128,248,284],"determines":[129],"internal":[131],"strength":[133,164,184,188,251,287],"rate":[135],"20%":[138],"larger":[139],"thin":[141],"it":[144,166],"much":[146],"higher":[147,232],"that":[149],"XLPE.":[152],"The":[153],"external":[154],"considered":[158],"analysis":[160],"applied":[162,182],"shows":[167],"a":[168,242],"linear":[169],"proportional":[170],"distortion.":[176],"A":[177],"quantitative":[178],"relationship":[179],"model":[180],"between":[181],"was":[194,198],"established.":[195],"Linear":[196],"extrapolation":[197],"used":[199],"obtain":[201],"trend":[203],"applied,":[205],"distortion,":[206],"actual":[208],"strengths":[210,230,270],"at":[211],"when":[215,257],"occurred.":[217],"When":[218],"\u03bcm,":[227,266],"50kV/mm":[234],"increases":[236,252],"decreasing":[238],"thickness,":[239],"resulting":[240],"significant":[243],"effect":[244,281],"increasing":[254,290],"thickness.":[255,291],"And":[256],"50":[274],"kV/mm":[275],"also":[277],"confirms":[278],"volume":[280],"decreases":[288]},"counts_by_year":[{"year":2025,"cited_by_count":3},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":3}],"updated_date":"2026-05-06T08:25:59.206177","created_date":"2025-10-10T00:00:00"}