{"id":"https://openalex.org/W3014914783","doi":"https://doi.org/10.1109/access.2020.2984385","title":"Online Degradation State Assessment Methodology for Multi-Mode Failures of Insulated Gate Bipolar Transistor","display_name":"Online Degradation State Assessment Methodology for Multi-Mode Failures of Insulated Gate Bipolar Transistor","publication_year":2020,"publication_date":"2020-01-01","ids":{"openalex":"https://openalex.org/W3014914783","doi":"https://doi.org/10.1109/access.2020.2984385","mag":"3014914783"},"language":"en","primary_location":{"id":"doi:10.1109/access.2020.2984385","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2020.2984385","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09050802.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09050802.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5082427540","display_name":"Xiangxiang Liu","orcid":"https://orcid.org/0000-0001-6702-4240"},"institutions":[{"id":"https://openalex.org/I184843921","display_name":"Hebei University of Technology","ror":"https://ror.org/018hded08","country_code":"CN","type":"education","lineage":["https://openalex.org/I184843921"]},{"id":"https://openalex.org/I4210156197","display_name":"Life Cycle Engineering (United States)","ror":"https://ror.org/056hm0802","country_code":"US","type":"company","lineage":["https://openalex.org/I4210156197"]},{"id":"https://openalex.org/I66946132","display_name":"University of Maryland, College Park","ror":"https://ror.org/047s2c258","country_code":"US","type":"education","lineage":["https://openalex.org/I66946132"]}],"countries":["CN","US"],"is_corresponding":false,"raw_author_name":"Xiangxiang Liu","raw_affiliation_strings":["Center for Advanced Life Cycle Engineering (CALCE), University of Maryland, College Park, USA","State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, Tianjin, China"],"raw_orcid":"https://orcid.org/0000-0001-6702-4240","affiliations":[{"raw_affiliation_string":"Center for Advanced Life Cycle Engineering (CALCE), University of Maryland, College Park, USA","institution_ids":["https://openalex.org/I4210156197","https://openalex.org/I66946132"]},{"raw_affiliation_string":"State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, Tianjin, China","institution_ids":["https://openalex.org/I184843921"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100443360","display_name":"Lingling Li","orcid":"https://orcid.org/0000-0003-3919-8539"},"institutions":[{"id":"https://openalex.org/I184843921","display_name":"Hebei University of Technology","ror":"https://ror.org/018hded08","country_code":"CN","type":"education","lineage":["https://openalex.org/I184843921"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lingling Li","raw_affiliation_strings":["State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, Tianjin, China"],"raw_orcid":"https://orcid.org/0000-0003-3919-8539","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, Tianjin, China","institution_ids":["https://openalex.org/I184843921"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5012329195","display_name":"Diganta Das","orcid":"https://orcid.org/0000-0001-9097-2118"},"institutions":[{"id":"https://openalex.org/I4210156197","display_name":"Life Cycle Engineering (United States)","ror":"https://ror.org/056hm0802","country_code":"US","type":"company","lineage":["https://openalex.org/I4210156197"]},{"id":"https://openalex.org/I66946132","display_name":"University of Maryland, College Park","ror":"https://ror.org/047s2c258","country_code":"US","type":"education","lineage":["https://openalex.org/I66946132"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Diganta Das","raw_affiliation_strings":["Center for Advanced Life Cycle Engineering (CALCE), University of Maryland, College Park, USA"],"raw_orcid":"https://orcid.org/0000-0001-9097-2118","affiliations":[{"raw_affiliation_string":"Center for Advanced Life Cycle Engineering (CALCE), University of Maryland, College Park, USA","institution_ids":["https://openalex.org/I4210156197","https://openalex.org/I66946132"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054055646","display_name":"Ijaz Haider Naqvi","orcid":"https://orcid.org/0000-0001-8382-9217"},"institutions":[{"id":"https://openalex.org/I207789805","display_name":"Lahore University of Management Sciences","ror":"https://ror.org/05b5x4a35","country_code":"PK","type":"education","lineage":["https://openalex.org/I207789805"]},{"id":"https://openalex.org/I4210156197","display_name":"Life Cycle Engineering (United States)","ror":"https://ror.org/056hm0802","country_code":"US","type":"company","lineage":["https://openalex.org/I4210156197"]},{"id":"https://openalex.org/I66946132","display_name":"University of Maryland, College Park","ror":"https://ror.org/047s2c258","country_code":"US","type":"education","lineage":["https://openalex.org/I66946132"]}],"countries":["PK","US"],"is_corresponding":false,"raw_author_name":"Ijaz Haider Naqvi","raw_affiliation_strings":["Center for Advanced Life Cycle Engineering (CALCE), University of Maryland, College Park, USA","Department of Electrical Engineering, Lahore University of Management Sciences (LUMS), Lahore, Pakistan"],"raw_orcid":"https://orcid.org/0000-0001-8382-9217","affiliations":[{"raw_affiliation_string":"Center for Advanced Life Cycle Engineering (CALCE), University of Maryland, College Park, USA","institution_ids":["https://openalex.org/I4210156197","https://openalex.org/I66946132"]},{"raw_affiliation_string":"Department of Electrical Engineering, Lahore University of Management Sciences (LUMS), Lahore, Pakistan","institution_ids":["https://openalex.org/I207789805"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5013287421","display_name":"Michael Pecht","orcid":"https://orcid.org/0000-0003-1126-8662"},"institutions":[{"id":"https://openalex.org/I4210156197","display_name":"Life Cycle Engineering (United States)","ror":"https://ror.org/056hm0802","country_code":"US","type":"company","lineage":["https://openalex.org/I4210156197"]},{"id":"https://openalex.org/I66946132","display_name":"University of Maryland, College Park","ror":"https://ror.org/047s2c258","country_code":"US","type":"education","lineage":["https://openalex.org/I66946132"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Michael G. Pecht","raw_affiliation_strings":["Center for Advanced Life Cycle Engineering (CALCE), University of Maryland, College Park, USA"],"raw_orcid":"https://orcid.org/0000-0003-1126-8662","affiliations":[{"raw_affiliation_string":"Center for Advanced Life Cycle Engineering (CALCE), University of Maryland, College Park, USA","institution_ids":["https://openalex.org/I4210156197","https://openalex.org/I66946132"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.5203,"has_fulltext":true,"cited_by_count":9,"citation_normalized_percentile":{"value":0.6416881,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"8","issue":null,"first_page":"69471","last_page":"69481"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9939000010490417,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9908999800682068,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.8105623722076416},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.7305611968040466},{"id":"https://openalex.org/keywords/insulated-gate-bipolar-transistor","display_name":"Insulated-gate bipolar transistor","score":0.6449463367462158},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6297917366027832},{"id":"https://openalex.org/keywords/mahalanobis-distance","display_name":"Mahalanobis distance","score":0.5401893854141235},{"id":"https://openalex.org/keywords/inverter","display_name":"Inverter","score":0.5153086185455322},{"id":"https://openalex.org/keywords/bipolar-junction-transistor","display_name":"Bipolar junction transistor","score":0.5134599804878235},{"id":"https://openalex.org/keywords/failure-mode-effects-and-criticality-analysis","display_name":"Failure mode, effects, and criticality analysis","score":0.4827544093132019},{"id":"https://openalex.org/keywords/interval","display_name":"Interval (graph theory)","score":0.465618371963501},{"id":"https://openalex.org/keywords/failure-mode-and-effects-analysis","display_name":"Failure mode and effects analysis","score":0.3985186815261841},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.3891774117946625},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2502726912498474},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.2276616096496582},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.18715474009513855},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.16533148288726807},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.1446276605129242},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.07145988941192627}],"concepts":[{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.8105623722076416},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.7305611968040466},{"id":"https://openalex.org/C28285623","wikidata":"https://www.wikidata.org/wiki/Q176110","display_name":"Insulated-gate bipolar transistor","level":3,"score":0.6449463367462158},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6297917366027832},{"id":"https://openalex.org/C1921717","wikidata":"https://www.wikidata.org/wiki/Q1334846","display_name":"Mahalanobis distance","level":2,"score":0.5401893854141235},{"id":"https://openalex.org/C11190779","wikidata":"https://www.wikidata.org/wiki/Q664575","display_name":"Inverter","level":3,"score":0.5153086185455322},{"id":"https://openalex.org/C23061349","wikidata":"https://www.wikidata.org/wiki/Q188946","display_name":"Bipolar junction transistor","level":4,"score":0.5134599804878235},{"id":"https://openalex.org/C30098461","wikidata":"https://www.wikidata.org/wiki/Q909342","display_name":"Failure mode, effects, and criticality analysis","level":3,"score":0.4827544093132019},{"id":"https://openalex.org/C2778067643","wikidata":"https://www.wikidata.org/wiki/Q166507","display_name":"Interval (graph theory)","level":2,"score":0.465618371963501},{"id":"https://openalex.org/C66283442","wikidata":"https://www.wikidata.org/wiki/Q1389268","display_name":"Failure mode and effects analysis","level":2,"score":0.3985186815261841},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.3891774117946625},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2502726912498474},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.2276616096496582},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18715474009513855},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.16533148288726807},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.1446276605129242},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.07145988941192627},{"id":"https://openalex.org/C114614502","wikidata":"https://www.wikidata.org/wiki/Q76592","display_name":"Combinatorics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2020.2984385","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2020.2984385","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09050802.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:7611489f79ae43df8f892d214ed3eb62","is_oa":true,"landing_page_url":"https://doaj.org/article/7611489f79ae43df8f892d214ed3eb62","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 8, Pp 69471-69481 (2020)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2020.2984385","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2020.2984385","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09050802.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/15","score":0.4300000071525574,"display_name":"Life in Land"}],"awards":[{"id":"https://openalex.org/G3388526602","display_name":null,"funder_award_id":"19JCZDJC32100","funder_id":"https://openalex.org/F4320322163","funder_display_name":"Natural Science Foundation of Hebei Province"},{"id":"https://openalex.org/G582500632","display_name":null,"funder_award_id":"19JCZDJC32100","funder_id":"https://openalex.org/F4320323993","funder_display_name":"Natural Science Foundation of Tianjin City"},{"id":"https://openalex.org/G721871881","display_name":null,"funder_award_id":"2018202282","funder_id":"https://openalex.org/F4320322163","funder_display_name":"Natural Science Foundation of Hebei Province"}],"funders":[{"id":"https://openalex.org/F4320322163","display_name":"Natural Science Foundation of Hebei Province","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320323993","display_name":"Natural Science Foundation of Tianjin City","ror":null},{"id":"https://openalex.org/F4320326691","display_name":"Hebei University of Technology","ror":"https://ror.org/018hded08"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W3014914783.pdf","grobid_xml":"https://content.openalex.org/works/W3014914783.grobid-xml"},"referenced_works_count":26,"referenced_works":["https://openalex.org/W69778694","https://openalex.org/W99446251","https://openalex.org/W1977635687","https://openalex.org/W1994170202","https://openalex.org/W1999959919","https://openalex.org/W2002590976","https://openalex.org/W2017769200","https://openalex.org/W2024758732","https://openalex.org/W2037516832","https://openalex.org/W2085767983","https://openalex.org/W2104267750","https://openalex.org/W2144331387","https://openalex.org/W2150658043","https://openalex.org/W2157211846","https://openalex.org/W2166693371","https://openalex.org/W2195802479","https://openalex.org/W2290910129","https://openalex.org/W2538329651","https://openalex.org/W2805298066","https://openalex.org/W2888933983","https://openalex.org/W2994636143","https://openalex.org/W2999052164","https://openalex.org/W3183452638","https://openalex.org/W6602961211","https://openalex.org/W6772408854","https://openalex.org/W6798651032"],"related_works":["https://openalex.org/W2220324042","https://openalex.org/W3138570190","https://openalex.org/W2782257358","https://openalex.org/W4362495947","https://openalex.org/W2117718616","https://openalex.org/W3146179449","https://openalex.org/W2013435365","https://openalex.org/W2059800017","https://openalex.org/W2161863954","https://openalex.org/W4249192810"],"abstract_inverted_index":{"Insulated-gate":[0],"bipolar":[1],"transistors":[2],"(IGBTs)":[3],"are":[4,157],"one":[5],"of":[6,17,28,35,39,49,85,126,145,152,165,175],"the":[7,36,50,104,110,115,129,163,166,173,176],"most":[8],"vulnerable":[9],"components":[10],"that":[11,76],"account":[12],"for":[13,63,98,142],"a":[14,25,58,70,95],"significant":[15],"fraction":[16],"inverter":[18],"and":[19,45,60,91,107,121,139],"converter":[20],"failures.":[21],"This":[22,67],"paper":[23,68],"conducts":[24],"degradation":[26,37,65,73,83,118,122,146],"analysis":[27],"IGBTs":[29,40,86],"using":[30,92],"run-to-failure":[31],"measurements.":[32],"Online":[33],"assessment":[34,74,144],"state":[38,116],"can":[41],"prolong":[42],"normal":[43],"operation":[44],"enable":[46],"proactive":[47],"maintenance":[48],"system.":[51],"The":[52,132],"research":[53],"idea":[54],"is":[55],"to":[56,113,159],"find":[57],"reliable":[59],"robust":[61],"mechanism":[62],"IGBT":[64],"assessment.":[66],"developed":[69,133],"prediction":[71,89,105],"interval-based":[72],"methodology":[75],"accurately":[77],"classifies":[78],"different":[79],"health":[80],"states":[81],"or":[82],"levels":[84],"by":[87,171],"adding":[88],"bounds":[90],"them":[93],"as":[94],"critical":[96],"value":[97],"serious":[99],"damage.":[100],"It":[101,148],"first":[102],"computes":[103],"interval":[106],"then":[108],"uses":[109],"Mahalanobis":[111],"distance":[112],"classify":[114],"into":[117],"level":[119,123],"1":[120],"2,":[124],"instead":[125],"just":[127],"applying":[128],"base":[130],"algorithm.":[131],"method":[134,167,178],"outperforms":[135],"distance-based":[136],"classification":[137],"schemes":[138],"self-organizing":[140],"maps":[141],"online":[143],"levels.":[147],"only":[149],"requires":[150],"training":[151],"1000":[153],"initial":[154],"points":[155],"which":[156],"assumed":[158],"be":[160],"healthy.":[161],"Furthermore,":[162],"generalizability":[164],"has":[168],"been":[169],"shown":[170],"validating":[172],"effectiveness":[174],"proposed":[177],"on":[179],"three":[180],"other":[181],"modules.":[182]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":3},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}