{"id":"https://openalex.org/W3013270508","doi":"https://doi.org/10.1109/access.2020.2982489","title":"Toward Characterization of a Rectangular Groove on a Metallic Surface by Multi-Angle Light Scattering","display_name":"Toward Characterization of a Rectangular Groove on a Metallic Surface by Multi-Angle Light Scattering","publication_year":2020,"publication_date":"2020-01-01","ids":{"openalex":"https://openalex.org/W3013270508","doi":"https://doi.org/10.1109/access.2020.2982489","mag":"3013270508"},"language":"en","primary_location":{"id":"doi:10.1109/access.2020.2982489","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2020.2982489","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09046038.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09046038.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5073515995","display_name":"Zhaolou Cao","orcid":null},"institutions":[{"id":"https://openalex.org/I200845125","display_name":"Nanjing University of Information Science and Technology","ror":"https://ror.org/02y0rxk19","country_code":"CN","type":"education","lineage":["https://openalex.org/I200845125"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhaolou Cao","raw_affiliation_strings":["Jiangsu Key Laboratory for Optoelectronic Detection of Atmosphere and Ocean, Nanjing University of Information Science and Technology, Nanjing, China","School of Physics and Optoelectronic Engineering, Nanjing University of Information Science and Technology, Nanjing, China"],"raw_orcid":"https://orcid.org/0000-0002-5574-327X","affiliations":[{"raw_affiliation_string":"Jiangsu Key Laboratory for Optoelectronic Detection of Atmosphere and Ocean, Nanjing University of Information Science and Technology, Nanjing, China","institution_ids":["https://openalex.org/I200845125"]},{"raw_affiliation_string":"School of Physics and Optoelectronic Engineering, Nanjing University of Information Science and Technology, Nanjing, China","institution_ids":["https://openalex.org/I200845125"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034061698","display_name":"Fenping Cui","orcid":"https://orcid.org/0000-0002-7937-8094"},"institutions":[{"id":"https://openalex.org/I200845125","display_name":"Nanjing University of Information Science and Technology","ror":"https://ror.org/02y0rxk19","country_code":"CN","type":"education","lineage":["https://openalex.org/I200845125"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Fenping Cui","raw_affiliation_strings":["Jiangsu Key Laboratory for Optoelectronic Detection of Atmosphere and Ocean, Nanjing University of Information Science and Technology, Nanjing, China","School of Physics and Optoelectronic Engineering, Nanjing University of Information Science and Technology, Nanjing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Jiangsu Key Laboratory for Optoelectronic Detection of Atmosphere and Ocean, Nanjing University of Information Science and Technology, Nanjing, China","institution_ids":["https://openalex.org/I200845125"]},{"raw_affiliation_string":"School of Physics and Optoelectronic Engineering, Nanjing University of Information Science and Technology, Nanjing, China","institution_ids":["https://openalex.org/I200845125"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043399984","display_name":"Fenglin Xian","orcid":"https://orcid.org/0000-0003-2377-4802"},"institutions":[{"id":"https://openalex.org/I200845125","display_name":"Nanjing University of Information Science and Technology","ror":"https://ror.org/02y0rxk19","country_code":"CN","type":"education","lineage":["https://openalex.org/I200845125"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Fenglin Xian","raw_affiliation_strings":["Jiangsu Key Laboratory for Optoelectronic Detection of Atmosphere and Ocean, Nanjing University of Information Science and Technology, Nanjing, China","School of Physics and Optoelectronic Engineering, Nanjing University of Information Science and Technology, Nanjing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Jiangsu Key Laboratory for Optoelectronic Detection of Atmosphere and Ocean, Nanjing University of Information Science and Technology, Nanjing, China","institution_ids":["https://openalex.org/I200845125"]},{"raw_affiliation_string":"School of Physics and Optoelectronic Engineering, Nanjing University of Information Science and Technology, Nanjing, China","institution_ids":["https://openalex.org/I200845125"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014548608","display_name":"Shixin Pei","orcid":"https://orcid.org/0000-0001-7325-3162"},"institutions":[{"id":"https://openalex.org/I200845125","display_name":"Nanjing University of Information Science and Technology","ror":"https://ror.org/02y0rxk19","country_code":"CN","type":"education","lineage":["https://openalex.org/I200845125"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shixin Pei","raw_affiliation_strings":["Jiangsu Key Laboratory for Optoelectronic Detection of Atmosphere and Ocean, Nanjing University of Information Science and Technology, Nanjing, China","School of Physics and Optoelectronic Engineering, Nanjing University of Information Science and Technology, Nanjing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Jiangsu Key Laboratory for Optoelectronic Detection of Atmosphere and Ocean, Nanjing University of Information Science and Technology, Nanjing, China","institution_ids":["https://openalex.org/I200845125"]},{"raw_affiliation_string":"School of Physics and Optoelectronic Engineering, Nanjing University of Information Science and Technology, Nanjing, China","institution_ids":["https://openalex.org/I200845125"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108622605","display_name":"Jinhua Li","orcid":null},"institutions":[{"id":"https://openalex.org/I200845125","display_name":"Nanjing University of Information Science and Technology","ror":"https://ror.org/02y0rxk19","country_code":"CN","type":"education","lineage":["https://openalex.org/I200845125"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jinhua Li","raw_affiliation_strings":["Jiangsu Key Laboratory for Optoelectronic Detection of Atmosphere and Ocean, Nanjing University of Information Science and Technology, Nanjing, China","School of Physics and Optoelectronic Engineering, Nanjing University of Information Science and Technology, Nanjing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Jiangsu Key Laboratory for Optoelectronic Detection of Atmosphere and Ocean, Nanjing University of Information Science and Technology, Nanjing, China","institution_ids":["https://openalex.org/I200845125"]},{"raw_affiliation_string":"School of Physics and Optoelectronic Engineering, Nanjing University of Information Science and Technology, Nanjing, China","institution_ids":["https://openalex.org/I200845125"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100780503","display_name":"Huichun Ye","orcid":"https://orcid.org/0000-0001-7836-497X"},"institutions":[{"id":"https://openalex.org/I126520041","display_name":"University of Science and Technology of China","ror":"https://ror.org/04c4dkn09","country_code":"CN","type":"education","lineage":["https://openalex.org/I126520041","https://openalex.org/I19820366"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Huichun Ye","raw_affiliation_strings":["Department of Precision Machinery and Precision Instruments, University of Science and Technology of China, Hefei, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Precision Machinery and Precision Instruments, University of Science and Technology of China, Hefei, China","institution_ids":["https://openalex.org/I126520041"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.1917,"has_fulltext":true,"cited_by_count":4,"citation_normalized_percentile":{"value":0.46584762,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":95},"biblio":{"volume":"8","issue":null,"first_page":"60210","last_page":"60217"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11723","display_name":"Optical Coatings and Gratings","score":0.9922000169754028,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/groove","display_name":"Groove (engineering)","score":0.7630093097686768},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.727840006351471},{"id":"https://openalex.org/keywords/scattering","display_name":"Scattering","score":0.6785227060317993},{"id":"https://openalex.org/keywords/light-scattering","display_name":"Light scattering","score":0.5922951698303223},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5259892344474792},{"id":"https://openalex.org/keywords/rectangle","display_name":"Rectangle","score":0.5249716639518738},{"id":"https://openalex.org/keywords/surface","display_name":"Surface (topology)","score":0.4265424907207489},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3469696640968323},{"id":"https://openalex.org/keywords/geometry","display_name":"Geometry","score":0.3207475543022156},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.1341058611869812}],"concepts":[{"id":"https://openalex.org/C2779472054","wikidata":"https://www.wikidata.org/wiki/Q2377973","display_name":"Groove (engineering)","level":2,"score":0.7630093097686768},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.727840006351471},{"id":"https://openalex.org/C191486275","wikidata":"https://www.wikidata.org/wiki/Q210028","display_name":"Scattering","level":2,"score":0.6785227060317993},{"id":"https://openalex.org/C120456961","wikidata":"https://www.wikidata.org/wiki/Q210028","display_name":"Light scattering","level":3,"score":0.5922951698303223},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5259892344474792},{"id":"https://openalex.org/C2781302577","wikidata":"https://www.wikidata.org/wiki/Q209","display_name":"Rectangle","level":2,"score":0.5249716639518738},{"id":"https://openalex.org/C2776799497","wikidata":"https://www.wikidata.org/wiki/Q484298","display_name":"Surface (topology)","level":2,"score":0.4265424907207489},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3469696640968323},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.3207475543022156},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.1341058611869812},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2020.2982489","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2020.2982489","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09046038.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:8e842abda40e41adb7cf9a3ab4aafb41","is_oa":true,"landing_page_url":"https://doaj.org/article/8e842abda40e41adb7cf9a3ab4aafb41","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 8, Pp 60210-60217 (2020)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2020.2982489","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2020.2982489","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09046038.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1801949204","display_name":null,"funder_award_id":"BK20180784","funder_id":"https://openalex.org/F4320322769","funder_display_name":"Natural Science Foundation of Jiangsu Province"},{"id":"https://openalex.org/G1941123174","display_name":null,"funder_award_id":"BK20150929","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G2861572318","display_name":null,"funder_award_id":"61605081","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G3133533746","display_name":null,"funder_award_id":"BK20180799","funder_id":"https://openalex.org/F4320322769","funder_display_name":"Natural Science Foundation of Jiangsu Province"},{"id":"https://openalex.org/G5996652100","display_name":null,"funder_award_id":"11605090","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G6027271829","display_name":null,"funder_award_id":"BK20150929","funder_id":"https://openalex.org/F4320322769","funder_display_name":"Natural Science Foundation of Jiangsu Province"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320322769","display_name":"Natural Science Foundation of Jiangsu Province","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W3013270508.pdf","grobid_xml":"https://content.openalex.org/works/W3013270508.grobid-xml"},"referenced_works_count":36,"referenced_works":["https://openalex.org/W1964260818","https://openalex.org/W1973913788","https://openalex.org/W1980014880","https://openalex.org/W1983585672","https://openalex.org/W1984588057","https://openalex.org/W1990133973","https://openalex.org/W1995208784","https://openalex.org/W2019582097","https://openalex.org/W2029717392","https://openalex.org/W2030868950","https://openalex.org/W2034042110","https://openalex.org/W2080952789","https://openalex.org/W2081611005","https://openalex.org/W2086753614","https://openalex.org/W2089410874","https://openalex.org/W2091524695","https://openalex.org/W2094597186","https://openalex.org/W2101920731","https://openalex.org/W2117454459","https://openalex.org/W2137258327","https://openalex.org/W2142875284","https://openalex.org/W2149250691","https://openalex.org/W2161250595","https://openalex.org/W2406266332","https://openalex.org/W2625369664","https://openalex.org/W2733951009","https://openalex.org/W2745735382","https://openalex.org/W2895726332","https://openalex.org/W2895993652","https://openalex.org/W2923385825","https://openalex.org/W2936448899","https://openalex.org/W2954062561","https://openalex.org/W2955493592","https://openalex.org/W3005843537","https://openalex.org/W4256590866","https://openalex.org/W6739511494"],"related_works":["https://openalex.org/W2158852896","https://openalex.org/W2086374469","https://openalex.org/W2275064127","https://openalex.org/W2059047098","https://openalex.org/W1981068248","https://openalex.org/W3176935228","https://openalex.org/W2071747263","https://openalex.org/W2393154816","https://openalex.org/W2155574163","https://openalex.org/W2064382467"],"abstract_inverted_index":{"Fast":[0],"quantitative":[1],"characterization":[2],"of":[3,22,32,36,48,71,147],"a":[4,14,27,37,61,88,159],"rectangular":[5,38],"groove":[6,59,98,121,139],"with":[7,83,153],"sizes":[8],"from":[9,44,64,110],"sub-micrometers":[10],"to":[11,95,119,162],"micrometers":[12],"on":[13,57,60,101,166],"surface":[15,63],"has":[16],"been":[17],"demanding":[18],"in":[19,127],"quality":[20],"control":[21],"optical":[23],"elements.":[24],"We":[25],"report":[26],"numerical":[28],"procedure":[29],"for":[30,141],"retrieval":[31],"the":[33,45,49,58,80,84,97,102,120,128,138,145],"geometrical":[34],"parameters":[35,99,140],"groove,":[39],"including":[40],"width":[41],"and":[42,105],"depth,":[43],"angular":[46],"distribution":[47,114],"scattered":[50],"light":[51,73,113,148],"generated":[52],"by":[53,77],"launching":[54],"plane":[55],"waves":[56],"metallic":[62,167],"different":[65],"propagation":[66],"directions.":[67],"The":[68],"far-field":[69],"intensity":[70],"scattering":[72,112,149],"is":[74,93,116],"first":[75],"obtained":[76],"numerically":[78],"solving":[79],"electromagnetic":[81],"problem":[82],"modal":[85],"theory.":[86],"Then,":[87],"two-stage":[89],"inverse":[90],"modeling":[91],"approach":[92],"developed":[94],"retrieve":[96],"based":[100],"lookup":[103],"table":[104],"repulsive":[106],"particle":[107],"swarm":[108],"optimization":[109],"multi-angle":[111],"that":[115,132],"highly":[117],"sensitive":[118],"parameters.":[122],"Noise":[123],"influences":[124],"are":[125],"considered":[126],"simulation.":[129],"Results":[130],"suggest":[131],"our":[133],"method":[134],"can":[135,150],"precisely":[136],"obtain":[137],"noisy":[142],"signals.":[143],"As":[144],"measurement":[146],"be":[151,158],"conducted":[152],"high":[154],"efficiency,":[155],"it":[156],"should":[157],"powerful":[160],"tool":[161],"characterize":[163],"rectangle":[164],"grooves":[165],"surfaces.":[168]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}