{"id":"https://openalex.org/W3012540572","doi":"https://doi.org/10.1109/access.2020.2979755","title":"A Steel Surface Defect Recognition Algorithm Based on Improved Deep Learning Network Model Using Feature Visualization and Quality Evaluation","display_name":"A Steel Surface Defect Recognition Algorithm Based on Improved Deep Learning Network Model Using Feature Visualization and Quality Evaluation","publication_year":2020,"publication_date":"2020-01-01","ids":{"openalex":"https://openalex.org/W3012540572","doi":"https://doi.org/10.1109/access.2020.2979755","mag":"3012540572"},"language":"en","primary_location":{"id":"doi:10.1109/access.2020.2979755","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2020.2979755","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09031427.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09031427.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5055197997","display_name":"Shengqi Guan","orcid":"https://orcid.org/0000-0002-8316-1138"},"institutions":[{"id":"https://openalex.org/I27599042","display_name":"Xi'an Polytechnic University","ror":"https://ror.org/03442p831","country_code":"CN","type":"education","lineage":["https://openalex.org/I27599042"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shengqi Guan","raw_affiliation_strings":["School of Mechanical and Electrical Engineering, Xi\u2019an Polytechnic University, Xi\u2019an, China","Xi???an Key Laboratory of Modern Intelligent Textile Equipment, Xi\u2019an Polytechnic University, Xi\u2019an, China","Xi???an Key Laboratory of Modern Intelligent Textile Equipment, Xi'an Polytechnic University, Xi'an, China","School of Mechanical and Electrical Engineering, Xi'an Polytechnic University, Xi'an, China"],"raw_orcid":"https://orcid.org/0000-0002-8316-1138","affiliations":[{"raw_affiliation_string":"School of Mechanical and Electrical Engineering, Xi\u2019an Polytechnic University, Xi\u2019an, China","institution_ids":["https://openalex.org/I27599042"]},{"raw_affiliation_string":"Xi???an Key Laboratory of Modern Intelligent Textile Equipment, Xi\u2019an Polytechnic University, Xi\u2019an, China","institution_ids":["https://openalex.org/I27599042"]},{"raw_affiliation_string":"Xi???an Key Laboratory of Modern Intelligent Textile Equipment, Xi'an Polytechnic University, Xi'an, China","institution_ids":["https://openalex.org/I27599042"]},{"raw_affiliation_string":"School of Mechanical and Electrical Engineering, Xi'an Polytechnic University, Xi'an, China","institution_ids":["https://openalex.org/I27599042"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058896884","display_name":"Ming Lei","orcid":"https://orcid.org/0000-0002-5712-3285"},"institutions":[{"id":"https://openalex.org/I27599042","display_name":"Xi'an Polytechnic University","ror":"https://ror.org/03442p831","country_code":"CN","type":"education","lineage":["https://openalex.org/I27599042"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ming Lei","raw_affiliation_strings":["School of Mechanical and Electrical Engineering, Xi\u2019an Polytechnic University, Xi\u2019an, China","School of Mechanical and Electrical Engineering, Xi'an Polytechnic University, Xi'an, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Mechanical and Electrical Engineering, Xi\u2019an Polytechnic University, Xi\u2019an, China","institution_ids":["https://openalex.org/I27599042"]},{"raw_affiliation_string":"School of Mechanical and Electrical Engineering, Xi'an Polytechnic University, Xi'an, China","institution_ids":["https://openalex.org/I27599042"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5110482386","display_name":"Hao L\u00fc","orcid":"https://orcid.org/0000-0002-8065-8499"},"institutions":[{"id":"https://openalex.org/I27599042","display_name":"Xi'an Polytechnic University","ror":"https://ror.org/03442p831","country_code":"CN","type":"education","lineage":["https://openalex.org/I27599042"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hao Lu","raw_affiliation_strings":["School of Mechanical and Electrical Engineering, Xi\u2019an Polytechnic University, Xi\u2019an, China","School of Mechanical and Electrical Engineering, Xi'an Polytechnic University, Xi'an, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Mechanical and Electrical Engineering, Xi\u2019an Polytechnic University, Xi\u2019an, China","institution_ids":["https://openalex.org/I27599042"]},{"raw_affiliation_string":"School of Mechanical and Electrical Engineering, Xi'an Polytechnic University, Xi'an, China","institution_ids":["https://openalex.org/I27599042"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I27599042"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":6.4996,"has_fulltext":true,"cited_by_count":77,"citation_normalized_percentile":{"value":0.96710397,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":100},"biblio":{"volume":"8","issue":null,"first_page":"49885","last_page":"49895"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9922000169754028,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11606","display_name":"Infrastructure Maintenance and Monitoring","score":0.9836999773979187,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.7201696038246155},{"id":"https://openalex.org/keywords/visualization","display_name":"Visualization","score":0.6988629698753357},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.6664940118789673},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6589369773864746},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.5965233445167542},{"id":"https://openalex.org/keywords/surface","display_name":"Surface (topology)","score":0.5282660722732544},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.46416833996772766},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.45967912673950195},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.14012572169303894}],"concepts":[{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.7201696038246155},{"id":"https://openalex.org/C36464697","wikidata":"https://www.wikidata.org/wiki/Q451553","display_name":"Visualization","level":2,"score":0.6988629698753357},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.6664940118789673},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6589369773864746},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.5965233445167542},{"id":"https://openalex.org/C2776799497","wikidata":"https://www.wikidata.org/wiki/Q484298","display_name":"Surface (topology)","level":2,"score":0.5282660722732544},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.46416833996772766},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.45967912673950195},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.14012572169303894},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2020.2979755","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2020.2979755","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09031427.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:b46fe27c7218457ea49fab93aaf03532","is_oa":true,"landing_page_url":"https://doaj.org/article/b46fe27c7218457ea49fab93aaf03532","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 8, Pp 49885-49895 (2020)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2020.2979755","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2020.2979755","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09031427.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"display_name":"Sustainable cities and communities","id":"https://metadata.un.org/sdg/11","score":0.41999998688697815}],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W3012540572.pdf","grobid_xml":"https://content.openalex.org/works/W3012540572.grobid-xml"},"referenced_works_count":47,"referenced_works":["https://openalex.org/W1686810756","https://openalex.org/W1849277567","https://openalex.org/W1884395441","https://openalex.org/W1980301091","https://openalex.org/W1998709053","https://openalex.org/W2027247355","https://openalex.org/W2028775883","https://openalex.org/W2092072518","https://openalex.org/W2097117768","https://openalex.org/W2112796928","https://openalex.org/W2133665775","https://openalex.org/W2147800946","https://openalex.org/W2163605009","https://openalex.org/W2194775991","https://openalex.org/W2196029350","https://openalex.org/W2200374509","https://openalex.org/W2315950530","https://openalex.org/W2337601638","https://openalex.org/W2343595925","https://openalex.org/W2416529854","https://openalex.org/W2540326728","https://openalex.org/W2567201298","https://openalex.org/W2591544917","https://openalex.org/W2612445135","https://openalex.org/W2616601017","https://openalex.org/W2626543860","https://openalex.org/W2766108561","https://openalex.org/W2774759294","https://openalex.org/W2794659401","https://openalex.org/W2809944199","https://openalex.org/W2890747436","https://openalex.org/W2905416267","https://openalex.org/W2912069721","https://openalex.org/W2924161931","https://openalex.org/W2950179405","https://openalex.org/W2953868242","https://openalex.org/W2964028220","https://openalex.org/W2966341653","https://openalex.org/W2983132969","https://openalex.org/W2994615081","https://openalex.org/W4297775537","https://openalex.org/W6637373629","https://openalex.org/W6639204139","https://openalex.org/W6674914833","https://openalex.org/W6684191040","https://openalex.org/W6687567705","https://openalex.org/W6737664043"],"related_works":["https://openalex.org/W2601157893","https://openalex.org/W2131735617","https://openalex.org/W2373006798","https://openalex.org/W2056912418","https://openalex.org/W2123759770","https://openalex.org/W2033213769","https://openalex.org/W2811390910","https://openalex.org/W4312376745","https://openalex.org/W2082269393","https://openalex.org/W2043960970"],"abstract_inverted_index":{"Steel":[0],"defect":[1,36,48,86,183],"detection":[2,26,31],"is":[3,71,79,93,136,171],"used":[4,80,114,139],"to":[5,15,81,95,115,173],"detect":[6],"defects":[7,57,104],"on":[8,59],"the":[9,12,17,20,30,77,83,90,97,108,117,123,141,157,163,169],"surface":[10,47,56,85,145,182],"of":[11,19,34,127,143,166,189],"steel":[13,21,46,55,84,144,181],"and":[14,38,43,68,89,110,121,125,138,150,168,192],"improve":[16,162],"quality":[18,69,120,193],"surface.":[22],"However,":[23],"traditional":[24],"image":[25,119],"algorithms":[27],"cannot":[28],"meet":[29],"requirements":[32],"because":[33],"small":[35],"features":[37,44],"low":[39],"contrast":[40],"between":[41],"background":[42],"about":[45],"datasets.":[49],"A":[50],"novel":[51],"recognition":[52,184],"algorithm":[53],"for":[54,140,180],"based":[58],"improved":[60],"deep":[61],"learning":[62],"network":[63,135,187],"models":[64],"using":[65,185],"feature":[66,98,118,190],"visualization":[67,191],"evaluation":[70],"proposed":[72,158],"in":[73,100],"this":[74,130],"paper.":[75],"Firstly,":[76],"VGG19":[78,151],"pre-train":[82],"classification":[87,142],"task":[88],"corresponding":[91],"DVGG19":[92],"established":[94],"extract":[96],"images":[99],"different":[101],"layers":[102],"from":[103],"weight":[105],"model.":[106],"Secondly,":[107],"SSIM":[109],"decision":[111],"tree":[112],"are":[113],"evaluate":[116],"adjust":[122],"parameters":[124],"structure":[126],"VGG19.":[128],"On":[129],"basis,":[131],"a":[132],"new":[133],"VSD":[134,186],"obtained":[137],"defects.":[146],"Comparing":[147],"with":[148],"ResNet":[149],"methods,":[152],"experiment":[153],"results":[154],"show":[155],"that":[156],"method":[159],"markedly":[160],"can":[161,177],"average":[164],"accuracy":[165],"classification,":[167],"model":[170,188],"able":[172],"converge":[174],"quickly,":[175],"which":[176],"be":[178],"good":[179],"evaluation.":[194]},"counts_by_year":[{"year":2026,"cited_by_count":4},{"year":2025,"cited_by_count":11},{"year":2024,"cited_by_count":25},{"year":2023,"cited_by_count":16},{"year":2022,"cited_by_count":10},{"year":2021,"cited_by_count":10},{"year":2020,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}