{"id":"https://openalex.org/W3008062562","doi":"https://doi.org/10.1109/access.2020.2977197","title":"Modeling and Prediction of the Reliability Analysis of an 18-Pulse Rectifier Power Supply for Aircraft Based Applications","display_name":"Modeling and Prediction of the Reliability Analysis of an 18-Pulse Rectifier Power Supply for Aircraft Based Applications","publication_year":2020,"publication_date":"2020-01-01","ids":{"openalex":"https://openalex.org/W3008062562","doi":"https://doi.org/10.1109/access.2020.2977197","mag":"3008062562"},"language":"en","primary_location":{"id":"doi:10.1109/access.2020.2977197","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2020.2977197","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09018025.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09018025.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100760659","display_name":"Yingying Zhang","orcid":"https://orcid.org/0000-0002-8050-7121"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yingying Zhang","raw_affiliation_strings":["School of Electrical Engineering and Automation, Hefei University of Technology, Hefei, China"],"raw_orcid":"https://orcid.org/0000-0002-8050-7121","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Automation, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103076223","display_name":"Jinsong Xia","orcid":"https://orcid.org/0000-0003-0920-0458"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jinsong Xia","raw_affiliation_strings":["School of Electrical Engineering and Automation, Hefei University of Technology, Hefei, China"],"raw_orcid":"https://orcid.org/0000-0003-0920-0458","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Automation, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101633248","display_name":"Xiaoli Zhang","orcid":"https://orcid.org/0000-0002-3558-2691"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaoli Zhang","raw_affiliation_strings":["School of Electrical Engineering and Automation, Hefei University of Technology, Hefei, China"],"raw_orcid":"https://orcid.org/0000-0002-3558-2691","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Automation, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100442705","display_name":"Zhiwei Chen","orcid":"https://orcid.org/0000-0002-2152-815X"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhiwei Chen","raw_affiliation_strings":["School of Electrical Engineering and Automation, Hefei University of Technology, Hefei, China"],"raw_orcid":"https://orcid.org/0000-0002-2152-815X","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Automation, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100451232","display_name":"Bing Li","orcid":"https://orcid.org/0000-0002-0083-0296"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Bing Li","raw_affiliation_strings":["School of Electrical Engineering and Automation, Hefei University of Technology, Hefei, China"],"raw_orcid":"https://orcid.org/0000-0002-0083-0296","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Automation, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064962247","display_name":"Qiwu Luo","orcid":"https://orcid.org/0000-0003-2822-5538"},"institutions":[{"id":"https://openalex.org/I139660479","display_name":"Central South University","ror":"https://ror.org/00f1zfq44","country_code":"CN","type":"education","lineage":["https://openalex.org/I139660479"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qiwu Luo","raw_affiliation_strings":["School of Automation, Central South University, Changsha, China"],"raw_orcid":"https://orcid.org/0000-0003-2822-5538","affiliations":[{"raw_affiliation_string":"School of Automation, Central South University, Changsha, China","institution_ids":["https://openalex.org/I139660479"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5020019416","display_name":"Yigang He","orcid":"https://orcid.org/0000-0002-6642-0740"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]},{"id":"https://openalex.org/I37461747","display_name":"Wuhan University","ror":"https://ror.org/033vjfk17","country_code":"CN","type":"education","lineage":["https://openalex.org/I37461747"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yigang He","raw_affiliation_strings":["School of Electrical Engineering and Automation, Hefei University of Technology, Hefei, China","School of Electrical Engineering, Wuhan University, Wuhan, China"],"raw_orcid":"https://orcid.org/0000-0002-6642-0740","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Automation, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]},{"raw_affiliation_string":"School of Electrical Engineering, Wuhan University, Wuhan, China","institution_ids":["https://openalex.org/I37461747"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":1.3878,"has_fulltext":true,"cited_by_count":17,"citation_normalized_percentile":{"value":0.8066554,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":98},"biblio":{"volume":"8","issue":null,"first_page":"47063","last_page":"47071"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10663","display_name":"Advanced Battery Technologies Research","score":0.9959999918937683,"subfield":{"id":"https://openalex.org/subfields/2203","display_name":"Automotive Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10663","display_name":"Advanced Battery Technologies Research","score":0.9959999918937683,"subfield":{"id":"https://openalex.org/subfields/2203","display_name":"Automotive Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9951000213623047,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9927999973297119,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7791129350662231},{"id":"https://openalex.org/keywords/rectifier","display_name":"Rectifier (neural networks)","score":0.7712583541870117},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6385214328765869},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5894357562065125},{"id":"https://openalex.org/keywords/block-diagram","display_name":"Block diagram","score":0.5402694344520569},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.4989469051361084},{"id":"https://openalex.org/keywords/reliability-block-diagram","display_name":"Reliability block diagram","score":0.48852360248565674},{"id":"https://openalex.org/keywords/failure-mode-and-effects-analysis","display_name":"Failure mode and effects analysis","score":0.43227308988571167},{"id":"https://openalex.org/keywords/pulse","display_name":"Pulse (music)","score":0.4126166105270386},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3861886262893677},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.29909998178482056},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.2971649169921875},{"id":"https://openalex.org/keywords/fault-tree-analysis","display_name":"Fault tree analysis","score":0.2878108322620392},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.25632303953170776},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.07034936547279358}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7791129350662231},{"id":"https://openalex.org/C50100734","wikidata":"https://www.wikidata.org/wiki/Q7303176","display_name":"Rectifier (neural networks)","level":5,"score":0.7712583541870117},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6385214328765869},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5894357562065125},{"id":"https://openalex.org/C149227320","wikidata":"https://www.wikidata.org/wiki/Q884718","display_name":"Block diagram","level":2,"score":0.5402694344520569},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4989469051361084},{"id":"https://openalex.org/C18074226","wikidata":"https://www.wikidata.org/wiki/Q7310986","display_name":"Reliability block diagram","level":3,"score":0.48852360248565674},{"id":"https://openalex.org/C66283442","wikidata":"https://www.wikidata.org/wiki/Q1389268","display_name":"Failure mode and effects analysis","level":2,"score":0.43227308988571167},{"id":"https://openalex.org/C2780167933","wikidata":"https://www.wikidata.org/wiki/Q1550652","display_name":"Pulse (music)","level":3,"score":0.4126166105270386},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3861886262893677},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.29909998178482056},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.2971649169921875},{"id":"https://openalex.org/C107094494","wikidata":"https://www.wikidata.org/wiki/Q428453","display_name":"Fault tree analysis","level":2,"score":0.2878108322620392},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.25632303953170776},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.07034936547279358},{"id":"https://openalex.org/C147168706","wikidata":"https://www.wikidata.org/wiki/Q1457734","display_name":"Recurrent neural network","level":3,"score":0.0},{"id":"https://openalex.org/C86582703","wikidata":"https://www.wikidata.org/wiki/Q7617824","display_name":"Stochastic neural network","level":4,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.0},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2020.2977197","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2020.2977197","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09018025.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:9f02424077944276b7feac6cf01d58ec","is_oa":true,"landing_page_url":"https://doaj.org/article/9f02424077944276b7feac6cf01d58ec","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 8, Pp 47063-47071 (2020)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2020.2977197","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2020.2977197","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09018025.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1396908399","display_name":"\u57fa\u4e8e\u6807\u8bc6\u4f20\u611f\u878d\u5408\u7684\u8f93\u53d8\u7535\u8bbe\u5907\u4fe1\u606f\u611f\u77e5\u4e0e\u5904\u7406\u5173\u952e\u95ee\u9898\u7814\u7a76","funder_award_id":"51637004","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G1860220586","display_name":null,"funder_award_id":"41402040301","funder_id":"https://openalex.org/F4320335787","funder_display_name":"Fundamental Research Funds for the Central Universities"},{"id":"https://openalex.org/G3817987592","display_name":null,"funder_award_id":"51637004","funder_id":"https://openalex.org/F4320335787","funder_display_name":"Fundamental Research Funds for the Central Universities"},{"id":"https://openalex.org/G4226264932","display_name":null,"funder_award_id":"2016YFF0102200","funder_id":"https://openalex.org/F4320335787","funder_display_name":"Fundamental Research Funds for the Central Universities"},{"id":"https://openalex.org/G5851346405","display_name":null,"funder_award_id":"2016YFF0102200","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G6496176865","display_name":null,"funder_award_id":"51577046","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G8144085396","display_name":null,"funder_award_id":"41402040301","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320335787","display_name":"Fundamental Research Funds for the Central Universities","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W2048328536","https://openalex.org/W2061967392","https://openalex.org/W2103992195","https://openalex.org/W2132989035","https://openalex.org/W2139052187","https://openalex.org/W2142185504","https://openalex.org/W2143925077","https://openalex.org/W2176432980","https://openalex.org/W2242657280","https://openalex.org/W2333421694","https://openalex.org/W2502142420","https://openalex.org/W2727956551","https://openalex.org/W2735222203","https://openalex.org/W2800269255","https://openalex.org/W2809742696","https://openalex.org/W2963035207","https://openalex.org/W4245784735"],"related_works":["https://openalex.org/W162387073","https://openalex.org/W2576400083","https://openalex.org/W2023383111","https://openalex.org/W172268995","https://openalex.org/W2086782250","https://openalex.org/W2161661719","https://openalex.org/W826257782","https://openalex.org/W2005279557","https://openalex.org/W2953643143","https://openalex.org/W2372604196"],"abstract_inverted_index":{"Due":[0],"to":[1,46,82,94,117,186,239,244],"its":[2,34,40,197],"advantages":[3],"of":[4,20,33,56,68,78,90,101,164,179,182,196,220,232,249],"small":[5],"size":[6],"and":[7,44,53,99,111,125,144,193,203,212,217],"light":[8],"weight,":[9],"multi-pulse":[10],"rectifier":[11,24,36,59,104,223],"has":[12,74],"a":[13],"broad":[14],"application":[15,31,55],"prospect":[16],"in":[17,28,85,128,169],"the":[18,57,66,69,79,96,102,122,129,131,162,177,187,190,204,214,221,227,230,233,246,250],"field":[19],"aviation.":[21],"The":[22,50,88,149],"18-pulse":[23,58,103,222],"is":[25,93,159,172],"more":[26],"popular":[27],"practical":[29,86],"engineering":[30,54,218,242],"because":[32],"better":[35],"characteristics":[37],"than":[38,48],"12-pulse,":[39],"simpler":[41],"structure":[42],"process":[43],"easier":[45],"realize":[47],"24-pulse.":[49],"theoretical":[51],"research":[52],"have":[60],"achieved":[61],"some":[62],"success.":[63],"However,":[64],"whether":[65],"reliability":[67,97,108,138,150,188,215,231],"system":[70],"can":[71,236],"be":[72,83,237],"satisfied":[73],"always":[75],"been":[76],"one":[77],"key":[80],"problems":[81],"solved":[84],"engineering.":[87],"aim":[89],"this":[91],"work":[92],"study":[95],"modeling":[98],"prediction":[100,139],"power":[105,224],"supply.":[106,225],"Its":[107],"block":[109],"diagram":[110],"mathematical":[112],"model":[113],"are":[114,140,152,200,207],"established.":[115],"According":[116,185],"US":[118],"Military":[119],"handbook":[120],"MIL-HDBK-217F,":[121],"most":[123,133],"authoritative":[124],"widely":[126],"used":[127,135],"world,":[130],"two":[132,156],"commonly":[134],"methods":[136],"for":[137],"parts":[141],"count":[142],"method":[143],"part":[145],"stress":[146],"analysis":[147,195],"method.":[148],"data":[151],"estimated":[153],"by":[154],"these":[155],"methods.":[157],"It":[158],"concluded":[160],"that":[161],"value":[163],"mean":[165],"time":[166],"between":[167],"failures":[168],"airborne":[170],"environment":[171],"23326":[173],"h,":[174],"which":[175],"meets":[176],"requirement":[178],"1.5":[180],"times":[181],"15000":[183],"h.":[184],"data,":[189],"failure":[191],"mode":[192],"effect":[194],"weak":[198],"links":[199],"carried":[201],"out,":[202],"improvement":[205],"measures":[206],"proposed.":[208],"This":[209],"will":[210],"promote":[211],"guide":[213],"growth":[216],"popularization":[219],"At":[226],"same":[228],"time,":[229],"actual":[234],"project":[235],"extended":[238],"other":[240],"related":[241],"applications":[243],"ensure":[245],"reliable":[247],"operation":[248],"system.":[251]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":6},{"year":2020,"cited_by_count":3}],"updated_date":"2026-05-19T21:40:30.786675","created_date":"2025-10-10T00:00:00"}