{"id":"https://openalex.org/W3007882885","doi":"https://doi.org/10.1109/access.2020.2977138","title":"A Contribution to Everlasting Electrical Insulation for DC Voltage: PD-Phobic Materials","display_name":"A Contribution to Everlasting Electrical Insulation for DC Voltage: PD-Phobic Materials","publication_year":2020,"publication_date":"2020-01-01","ids":{"openalex":"https://openalex.org/W3007882885","doi":"https://doi.org/10.1109/access.2020.2977138","mag":"3007882885"},"language":"en","primary_location":{"id":"doi:10.1109/access.2020.2977138","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2020.2977138","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09018011.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09018011.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5027146086","display_name":"Gian Carlo Montanari","orcid":"https://orcid.org/0000-0003-2025-8693"},"institutions":[{"id":"https://openalex.org/I103163165","display_name":"Florida State University","ror":"https://ror.org/05g3dte14","country_code":"US","type":"education","lineage":["https://openalex.org/I103163165"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Gian Carlo Montanari","raw_affiliation_strings":["Center for Advanced Power Systems (CAPS), Florida State University, Tallahassee, USA"],"raw_orcid":"https://orcid.org/0000-0003-2025-8693","affiliations":[{"raw_affiliation_string":"Center for Advanced Power Systems (CAPS), Florida State University, Tallahassee, USA","institution_ids":["https://openalex.org/I103163165"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5087670165","display_name":"Paolo Seri","orcid":"https://orcid.org/0000-0002-8409-0853"},"institutions":[{"id":"https://openalex.org/I9360294","display_name":"University of Bologna","ror":"https://ror.org/01111rn36","country_code":"IT","type":"education","lineage":["https://openalex.org/I9360294"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Paolo Seri","raw_affiliation_strings":["Department of Electrical, Electronics and Information Engineering (DEI), University of Bologna, Bologna, Italy"],"raw_orcid":"https://orcid.org/0000-0002-8409-0853","affiliations":[{"raw_affiliation_string":"Department of Electrical, Electronics and Information Engineering (DEI), University of Bologna, Bologna, Italy","institution_ids":["https://openalex.org/I9360294"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5067041549","display_name":"Hadi Naderiallaf","orcid":"https://orcid.org/0000-0002-8241-4631"},"institutions":[{"id":"https://openalex.org/I9360294","display_name":"University of Bologna","ror":"https://ror.org/01111rn36","country_code":"IT","type":"education","lineage":["https://openalex.org/I9360294"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Hadi Naderiallaf","raw_affiliation_strings":["Department of Electrical, Electronics and Information Engineering (DEI), University of Bologna, Bologna, Italy"],"raw_orcid":"https://orcid.org/0000-0002-8241-4631","affiliations":[{"raw_affiliation_string":"Department of Electrical, Electronics and Information Engineering (DEI), University of Bologna, Bologna, Italy","institution_ids":["https://openalex.org/I9360294"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.8757,"has_fulltext":true,"cited_by_count":17,"citation_normalized_percentile":{"value":0.6806933,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"8","issue":null,"first_page":"41882","last_page":"41888"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11343","display_name":"Power Transformer Diagnostics and Insulation","score":0.9929999709129333,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10787","display_name":"Lightning and Electromagnetic Phenomena","score":0.9923999905586243,"subfield":{"id":"https://openalex.org/subfields/3103","display_name":"Astronomy and Astrophysics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/partial-discharge","display_name":"Partial discharge","score":0.8322433233261108},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7005742192268372},{"id":"https://openalex.org/keywords/electrical-treeing","display_name":"Electrical treeing","score":0.6082693934440613},{"id":"https://openalex.org/keywords/insulation-system","display_name":"Insulation system","score":0.5769526362419128},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.542194128036499},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.49448180198669434},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.48027682304382324},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4678899347782135},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.46131372451782227},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.41712239384651184},{"id":"https://openalex.org/keywords/engineering-physics","display_name":"Engineering physics","score":0.3772735595703125},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.29187989234924316},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.23855367302894592},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.10999724268913269},{"id":"https://openalex.org/keywords/thermodynamics","display_name":"Thermodynamics","score":0.07178813219070435}],"concepts":[{"id":"https://openalex.org/C130143024","wikidata":"https://www.wikidata.org/wiki/Q1929972","display_name":"Partial discharge","level":3,"score":0.8322433233261108},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7005742192268372},{"id":"https://openalex.org/C175395656","wikidata":"https://www.wikidata.org/wiki/Q4384289","display_name":"Electrical treeing","level":4,"score":0.6082693934440613},{"id":"https://openalex.org/C2776152135","wikidata":"https://www.wikidata.org/wiki/Q467898","display_name":"Insulation system","level":2,"score":0.5769526362419128},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.542194128036499},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.49448180198669434},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.48027682304382324},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4678899347782135},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.46131372451782227},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.41712239384651184},{"id":"https://openalex.org/C61696701","wikidata":"https://www.wikidata.org/wiki/Q770766","display_name":"Engineering physics","level":1,"score":0.3772735595703125},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.29187989234924316},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23855367302894592},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.10999724268913269},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.07178813219070435},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":4,"locations":[{"id":"doi:10.1109/access.2020.2977138","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2020.2977138","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09018011.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:cris.unibo.it:11585/774717","is_oa":true,"landing_page_url":"http://hdl.handle.net/11585/774717","pdf_url":null,"source":{"id":"https://openalex.org/S4306402579","display_name":"Archivio istituzionale della ricerca (Alma Mater Studiorum Universit\u00e0 di Bologna)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I4210117483","host_organization_name":"Istituto di Ematologia di Bologna","host_organization_lineage":["https://openalex.org/I4210117483"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/article"},{"id":"pmh:oai:doaj.org/article:d0b06488dbd948aabc46ef4c85241fd3","is_oa":true,"landing_page_url":"https://doaj.org/article/d0b06488dbd948aabc46ef4c85241fd3","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 8, Pp 41882-41888 (2020)","raw_type":"article"},{"id":"pmh:oai:nottingham-repository.worktribe.com:7511670","is_oa":true,"landing_page_url":"https://nottingham-repository.worktribe.com/output/7511670","pdf_url":null,"source":{"id":"https://openalex.org/S4306402483","display_name":"Repository@Nottingham (University of Nottingham)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I142263535","host_organization_name":"University of Nottingham","host_organization_lineage":["https://openalex.org/I142263535"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Journal Article"}],"best_oa_location":{"id":"doi:10.1109/access.2020.2977138","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2020.2977138","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09018011.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W3007882885.pdf","grobid_xml":"https://content.openalex.org/works/W3007882885.grobid-xml"},"referenced_works_count":25,"referenced_works":["https://openalex.org/W560530827","https://openalex.org/W1495189451","https://openalex.org/W1988184970","https://openalex.org/W2002609719","https://openalex.org/W2016456587","https://openalex.org/W2055132913","https://openalex.org/W2121685735","https://openalex.org/W2123759570","https://openalex.org/W2136320133","https://openalex.org/W2143257327","https://openalex.org/W2160217224","https://openalex.org/W2513723723","https://openalex.org/W2729445730","https://openalex.org/W2967279472","https://openalex.org/W2992873798","https://openalex.org/W3005627651","https://openalex.org/W3007739277","https://openalex.org/W3013758958","https://openalex.org/W3013980681","https://openalex.org/W3119299979","https://openalex.org/W3134875744","https://openalex.org/W4212842665","https://openalex.org/W4233921518","https://openalex.org/W4248620758","https://openalex.org/W6775875948"],"related_works":["https://openalex.org/W2118231321","https://openalex.org/W2801209252","https://openalex.org/W2155409284","https://openalex.org/W2612972072","https://openalex.org/W2391132677","https://openalex.org/W2055059664","https://openalex.org/W3133140065","https://openalex.org/W2167441838","https://openalex.org/W4383748077","https://openalex.org/W2154770248"],"abstract_inverted_index":{"This":[0,93],"paper":[1],"focuses":[2],"on":[3],"the":[4,19,27,83],"design":[5,73,100],"of":[6,21,29,108,113],"insulating":[7],"materials":[8,49],"candidate":[9],"from":[10,82],"DC-supply":[11],"applications,":[12],"proposing":[13],"viable":[14],"solutions":[15],"that":[16,86],"may":[17,95],"increase":[18],"defect-tolerance":[20],"an":[22],"insulation":[23,40,52,74,89,102],"system":[24],"and":[25,71,91,106],"avoid":[26,60],"presence":[28],"highly":[30],"energetic":[31],"phenomena,":[32],"specifically":[33],"partial":[34,61,79],"discharges,":[35],"which":[36,76],"can":[37,53,87],"cause":[38],"premature":[39],"breakdown.":[41],"It":[42],"is":[43],"shown":[44],"that,":[45],"in":[46,64,68],"principle,":[47],"polymeric":[48],"for":[50],"DC":[51,101],"be":[54],"structured,":[55],"possibly":[56],"through":[57],"nanotechnology,":[58],"to":[59,99],"discharge":[62,80],"inception":[63],"steady":[65],"state":[66],"even":[67],"UHVDC":[69],"cables":[70],"high-field":[72],"systems,":[75],"would":[77],"exclude":[78],"degradation":[81],"aging":[84],"factors":[85],"affect":[88],"reliability":[90,107],"life.":[92],"approach":[94],"provide":[96],"basic":[97],"tools":[98],"having":[103],"electro-thermal":[104],"life":[105],"virtually":[109],"unlimited":[110],"extent,":[111],"thus":[112],"so-called":[114],"PD-phobic":[115],"materials.":[116]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":7},{"year":2020,"cited_by_count":2}],"updated_date":"2026-07-15T18:14:33.161393","created_date":"2025-10-10T00:00:00"}