{"id":"https://openalex.org/W3008406023","doi":"https://doi.org/10.1109/access.2020.2974554","title":"Comparative Study of 2SiC&amp;4Si Hybrid Configuration Schemes in ANPC Inverter","display_name":"Comparative Study of 2SiC&amp;4Si Hybrid Configuration Schemes in ANPC Inverter","publication_year":2020,"publication_date":"2020-01-01","ids":{"openalex":"https://openalex.org/W3008406023","doi":"https://doi.org/10.1109/access.2020.2974554","mag":"3008406023"},"language":"en","primary_location":{"id":"doi:10.1109/access.2020.2974554","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2020.2974554","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09000840.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09000840.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5047824410","display_name":"Zhijian Feng","orcid":"https://orcid.org/0000-0002-1099-6572"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Zhijian Feng","raw_affiliation_strings":["School of Electrical Engineering and Automation, Hefei University of Technology, Hefei, China"],"raw_orcid":"https://orcid.org/0000-0002-1099-6572","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Automation, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100399159","display_name":"Xing Zhang","orcid":"https://orcid.org/0000-0003-3589-7463"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xing Zhang","raw_affiliation_strings":["School of Electrical Engineering and Automation, Hefei University of Technology, Hefei, China"],"raw_orcid":"https://orcid.org/0000-0003-3589-7463","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Automation, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078232511","display_name":"Shaolin Yu","orcid":"https://orcid.org/0000-0002-7314-9952"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shaolin Yu","raw_affiliation_strings":["School of Electrical Engineering and Automation, Hefei University of Technology, Hefei, China"],"raw_orcid":"https://orcid.org/0000-0002-7314-9952","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Automation, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5042298929","display_name":"Jiacai Zhuang","orcid":"https://orcid.org/0000-0003-4353-7951"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Jiacai Zhuang","raw_affiliation_strings":["Sungrow Power Supply Company, Ltd., Hefei, China"],"raw_orcid":"https://orcid.org/0000-0003-4353-7951","affiliations":[{"raw_affiliation_string":"Sungrow Power Supply Company, Ltd., Hefei, China","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5047824410"],"corresponding_institution_ids":["https://openalex.org/I16365422"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":1.6643,"has_fulltext":true,"cited_by_count":28,"citation_normalized_percentile":{"value":0.83789662,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"8","issue":null,"first_page":"33934","last_page":"33943"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10228","display_name":"Multilevel Inverters and Converters","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9882000088691711,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/network-topology","display_name":"Network topology","score":0.7733808755874634},{"id":"https://openalex.org/keywords/silicon-carbide","display_name":"Silicon carbide","score":0.7410927414894104},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.652118980884552},{"id":"https://openalex.org/keywords/inverter","display_name":"Inverter","score":0.5932043194770813},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5451459288597107},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4584360718727112},{"id":"https://openalex.org/keywords/silicon","display_name":"Silicon","score":0.44144678115844727},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.43688151240348816},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.43094608187675476},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.41914820671081543},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2983160614967346},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.24461349844932556},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17184558510780334},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.09658271074295044},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.09159490466117859},{"id":"https://openalex.org/keywords/computer-network","display_name":"Computer network","score":0.07894182205200195}],"concepts":[{"id":"https://openalex.org/C199845137","wikidata":"https://www.wikidata.org/wiki/Q145490","display_name":"Network topology","level":2,"score":0.7733808755874634},{"id":"https://openalex.org/C2780722187","wikidata":"https://www.wikidata.org/wiki/Q412356","display_name":"Silicon carbide","level":2,"score":0.7410927414894104},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.652118980884552},{"id":"https://openalex.org/C11190779","wikidata":"https://www.wikidata.org/wiki/Q664575","display_name":"Inverter","level":3,"score":0.5932043194770813},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5451459288597107},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4584360718727112},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.44144678115844727},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.43688151240348816},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.43094608187675476},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.41914820671081543},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2983160614967346},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.24461349844932556},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17184558510780334},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.09658271074295044},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.09159490466117859},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.07894182205200195},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2020.2974554","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2020.2974554","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09000840.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:fa5884415a974611ad6a64b6e8d9cea0","is_oa":true,"landing_page_url":"https://doaj.org/article/fa5884415a974611ad6a64b6e8d9cea0","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 8, Pp 33934-33943 (2020)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2020.2974554","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2020.2974554","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09000840.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.4099999964237213,"display_name":"Affordable and clean energy"}],"awards":[{"id":"https://openalex.org/G5750126922","display_name":null,"funder_award_id":"51677049","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G5820907800","display_name":null,"funder_award_id":"U1766207","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W3008406023.pdf","grobid_xml":"https://content.openalex.org/works/W3008406023.grobid-xml"},"referenced_works_count":12,"referenced_works":["https://openalex.org/W1551591264","https://openalex.org/W1908134563","https://openalex.org/W2148848280","https://openalex.org/W2471458452","https://openalex.org/W2586797985","https://openalex.org/W2778968697","https://openalex.org/W2903676902","https://openalex.org/W2905275287","https://openalex.org/W2906695031","https://openalex.org/W2907531368","https://openalex.org/W6632800817","https://openalex.org/W6682138035"],"related_works":["https://openalex.org/W2086397253","https://openalex.org/W2367891013","https://openalex.org/W2007108787","https://openalex.org/W2133122801","https://openalex.org/W2084837496","https://openalex.org/W2103570580","https://openalex.org/W2373210218","https://openalex.org/W3147659851","https://openalex.org/W600422426","https://openalex.org/W3119861251"],"abstract_inverted_index":{"Compared":[0],"with":[1,47],"traditional":[2],"silicon":[3,7],"(Si)":[4],"power":[5],"devices,":[6],"carbide":[8],"(SiC)":[9],"devices":[10,28,46,49,76,80,106],"have":[11],"attracted":[12],"extensive":[13],"attention":[14],"due":[15],"to":[16,57,94,115],"their":[17],"excellent":[18],"characteristics.":[19],"In":[20,92,137],"recent":[21],"years,":[22],"the":[23,34,44,68,99,124,140,147,153],"manufacturing":[24],"process":[25],"of":[26,43,73,98,104,146,152],"SiC":[27,48,75,105,120],"has":[29],"become":[30],"more":[31],"mature,":[32],"but":[33],"cost":[35],"is":[36,53],"still":[37],"high.":[38],"Therefore,":[39],"replacing":[40],"only":[41],"some":[42],"Si":[45,79],"in":[50,82,107],"a":[51,54],"topology":[52],"better":[55],"choice":[56],"achieve":[58],"higher":[59],"system":[60],"efficiency":[61,148],"while":[62],"considering":[63],"costs.":[64],"This":[65],"paper":[66],"studies":[67],"hybrid":[69,87,108,126,132,155],"configuration":[70,133],"schemes":[71,134,156],"consisting":[72],"two":[74],"and":[77,143,149],"four":[78],"(2SiC&4Si)":[81],"ANPC":[83,127],"three-level":[84],"inverter.":[85],"Two":[86],"2SiC&4Si":[88,125],"topologies":[89],"are":[90,113,135,157],"proposed.":[91],"order":[93],"make":[95],"full":[96],"use":[97],"low":[100],"switching":[101,117],"loss":[102,150],"characteristics":[103],"topologies,":[109,128],"specific":[110],"modulation":[111],"strategies":[112],"applied":[114],"concentrate":[116],"losses":[118],"on":[119,123],"devices.":[121],"Based":[122],"three":[129,154],"efficient":[130],"SiC&Si":[131],"derived.":[136],"this":[138],"paper,":[139],"theoretical":[141],"comparison":[142],"experimental":[144],"verification":[145],"distribution":[151],"carried":[158],"out.":[159]},"counts_by_year":[{"year":2025,"cited_by_count":5},{"year":2024,"cited_by_count":7},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":6},{"year":2021,"cited_by_count":6},{"year":2020,"cited_by_count":1}],"updated_date":"2026-05-06T08:25:59.206177","created_date":"2020-03-06T00:00:00"}
