{"id":"https://openalex.org/W2997279400","doi":"https://doi.org/10.1109/access.2019.2963633","title":"Sequence Image Registration for Large Depth of Microscopic Focus Stacking","display_name":"Sequence Image Registration for Large Depth of Microscopic Focus Stacking","publication_year":2020,"publication_date":"2020-01-01","ids":{"openalex":"https://openalex.org/W2997279400","doi":"https://doi.org/10.1109/access.2019.2963633","mag":"2997279400"},"language":"en","primary_location":{"id":"doi:10.1109/access.2019.2963633","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2963633","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/08949367.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/08949367.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5070730557","display_name":"Ang Wu","orcid":"https://orcid.org/0000-0003-2797-0050"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]},{"id":"https://openalex.org/I4750791","display_name":"Henan Agricultural University","ror":"https://ror.org/04eq83d71","country_code":"CN","type":"education","lineage":["https://openalex.org/I4750791"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ang Wu","raw_affiliation_strings":["College of Mechanical and Electrical Engineering, Henan Agricultural University, Zhengzhou, China","School of Instrument Science and Opto-Electronics Engineering, Hefei University of Technology, Hefei, China"],"raw_orcid":"https://orcid.org/0000-0003-2797-0050","affiliations":[{"raw_affiliation_string":"College of Mechanical and Electrical Engineering, Henan Agricultural University, Zhengzhou, China","institution_ids":["https://openalex.org/I4750791"]},{"raw_affiliation_string":"School of Instrument Science and Opto-Electronics Engineering, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056308077","display_name":"Yan-qiong Shi","orcid":"https://orcid.org/0000-0002-1345-9561"},"institutions":[{"id":"https://openalex.org/I118987531","display_name":"Anhui Jianzhu University","ror":"https://ror.org/0108wjw08","country_code":"CN","type":"education","lineage":["https://openalex.org/I118987531"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yanqiong Shi","raw_affiliation_strings":["School of Mechanical and Electrical Engineering, Anhui Jianzhu University, Hefei, China"],"raw_orcid":"https://orcid.org/0000-0002-1345-9561","affiliations":[{"raw_affiliation_string":"School of Mechanical and Electrical Engineering, Anhui Jianzhu University, Hefei, China","institution_ids":["https://openalex.org/I118987531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072805393","display_name":"Rongsheng Lu","orcid":"https://orcid.org/0000-0002-9794-9428"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Rongsheng Lu","raw_affiliation_strings":["School of Instrument Science and Opto-Electronics Engineering, Hefei University of Technology, Hefei, China"],"raw_orcid":"https://orcid.org/0000-0002-9794-9428","affiliations":[{"raw_affiliation_string":"School of Instrument Science and Opto-Electronics Engineering, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100353030","display_name":"Zilong Zhang","orcid":"https://orcid.org/0000-0002-5579-7171"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zilong Zhang","raw_affiliation_strings":["School of Instrument Science and Opto-Electronics Engineering, Hefei University of Technology, Hefei, China"],"raw_orcid":"https://orcid.org/0000-0002-5579-7171","affiliations":[{"raw_affiliation_string":"School of Instrument Science and Opto-Electronics Engineering, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.7563,"has_fulltext":true,"cited_by_count":7,"citation_normalized_percentile":{"value":0.77770451,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"8","issue":null,"first_page":"6533","last_page":"6542"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T13114","display_name":"Image Processing Techniques and Applications","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T13114","display_name":"Image Processing Techniques and Applications","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12549","display_name":"Image and Object Detection Techniques","score":0.995199978351593,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10531","display_name":"Advanced Vision and Imaging","score":0.9937999844551086,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.829505443572998},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.7853101491928101},{"id":"https://openalex.org/keywords/ransac","display_name":"RANSAC","score":0.7833465933799744},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6711993217468262},{"id":"https://openalex.org/keywords/image-registration","display_name":"Image registration","score":0.6226691007614136},{"id":"https://openalex.org/keywords/scale-invariant-feature-transform","display_name":"Scale-invariant feature transform","score":0.5859935879707336},{"id":"https://openalex.org/keywords/focus","display_name":"Focus (optics)","score":0.546870231628418},{"id":"https://openalex.org/keywords/image-stitching","display_name":"Image stitching","score":0.4485812485218048},{"id":"https://openalex.org/keywords/feature-detection","display_name":"Feature detection (computer vision)","score":0.43873894214630127},{"id":"https://openalex.org/keywords/image-fusion","display_name":"Image fusion","score":0.42003822326660156},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.4075074791908264},{"id":"https://openalex.org/keywords/image-processing","display_name":"Image processing","score":0.3343096673488617},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.32786521315574646},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.26217275857925415},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.10816836357116699}],"concepts":[{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.829505443572998},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.7853101491928101},{"id":"https://openalex.org/C114744707","wikidata":"https://www.wikidata.org/wiki/Q218533","display_name":"RANSAC","level":3,"score":0.7833465933799744},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6711993217468262},{"id":"https://openalex.org/C166704113","wikidata":"https://www.wikidata.org/wiki/Q861092","display_name":"Image registration","level":3,"score":0.6226691007614136},{"id":"https://openalex.org/C61265191","wikidata":"https://www.wikidata.org/wiki/Q767770","display_name":"Scale-invariant feature transform","level":3,"score":0.5859935879707336},{"id":"https://openalex.org/C192209626","wikidata":"https://www.wikidata.org/wiki/Q190909","display_name":"Focus (optics)","level":2,"score":0.546870231628418},{"id":"https://openalex.org/C29081049","wikidata":"https://www.wikidata.org/wiki/Q1364242","display_name":"Image stitching","level":2,"score":0.4485812485218048},{"id":"https://openalex.org/C126422989","wikidata":"https://www.wikidata.org/wiki/Q93586","display_name":"Feature detection (computer vision)","level":4,"score":0.43873894214630127},{"id":"https://openalex.org/C69744172","wikidata":"https://www.wikidata.org/wiki/Q860822","display_name":"Image fusion","level":3,"score":0.42003822326660156},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.4075074791908264},{"id":"https://openalex.org/C9417928","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Image processing","level":3,"score":0.3343096673488617},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.32786521315574646},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.26217275857925415},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.10816836357116699},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2019.2963633","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2963633","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/08949367.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:a737f208464847b3be984d9e13cb1b63","is_oa":true,"landing_page_url":"https://doaj.org/article/a737f208464847b3be984d9e13cb1b63","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 8, Pp 6533-6542 (2020)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2019.2963633","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2963633","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/08949367.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1227073750","display_name":null,"funder_award_id":"51875164","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G3892749058","display_name":null,"funder_award_id":"2013YQ220749","funder_id":"https://openalex.org/F4320335765","funder_display_name":"National Key Scientific Instrument and Equipment Development Projects of China"},{"id":"https://openalex.org/G4757854724","display_name":null,"funder_award_id":"2018YFB2003801","funder_id":"https://openalex.org/F4320335777","funder_display_name":"National Key Research and Development Program of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320335765","display_name":"National Key Scientific Instrument and Equipment Development Projects of China","ror":null},{"id":"https://openalex.org/F4320335777","display_name":"National Key Research and Development Program of China","ror":null}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2997279400.pdf","grobid_xml":"https://content.openalex.org/works/W2997279400.grobid-xml"},"referenced_works_count":35,"referenced_works":["https://openalex.org/W53747639","https://openalex.org/W1491719799","https://openalex.org/W1532362218","https://openalex.org/W1973723602","https://openalex.org/W2023656964","https://openalex.org/W2042243448","https://openalex.org/W2047741152","https://openalex.org/W2052094314","https://openalex.org/W2053478924","https://openalex.org/W2074891869","https://openalex.org/W2103504761","https://openalex.org/W2108729336","https://openalex.org/W2117228865","https://openalex.org/W2119605622","https://openalex.org/W2124386111","https://openalex.org/W2129116707","https://openalex.org/W2141584146","https://openalex.org/W2151103935","https://openalex.org/W2167999499","https://openalex.org/W2186984857","https://openalex.org/W2336882407","https://openalex.org/W2398216241","https://openalex.org/W2763911690","https://openalex.org/W2782796222","https://openalex.org/W2792029318","https://openalex.org/W2800452261","https://openalex.org/W2806710557","https://openalex.org/W2885743548","https://openalex.org/W2910972669","https://openalex.org/W2921554929","https://openalex.org/W2937505787","https://openalex.org/W4243493583","https://openalex.org/W6629564929","https://openalex.org/W6631707545","https://openalex.org/W6676449312"],"related_works":["https://openalex.org/W1565457536","https://openalex.org/W2353412837","https://openalex.org/W2888311149","https://openalex.org/W4387822693","https://openalex.org/W2912782527","https://openalex.org/W2002904063","https://openalex.org/W2184781617","https://openalex.org/W2559085038","https://openalex.org/W2724122122","https://openalex.org/W2076160147"],"abstract_inverted_index":{"The":[0,174,187],"large":[1,182],"depth":[2,19,35,183],"of":[3,20,22,33,41,60,72,119,145,152,184,219],"images":[4],"for":[5,180],"microscopic":[6],"measurement":[7],"can":[8],"be":[9,83],"achieved":[10,112],"by":[11,28,51,85,113,208],"using":[12],"focus":[13,223],"stacking":[14],"techniques":[15],"with":[16],"a":[17,96,220],"small":[18,135],"field":[21],"objective":[23,43],"lens.":[24],"It":[25,110,139],"is":[26,108,111,166,178,195,206],"implemented":[27],"fusing":[29,89],"the":[30,38,42,47,52,58,61,78,90,102,116,120,128,134,142,149,158,160,171,181,192,199,214],"image":[31,62,79,86,91,121,129,153,185],"sequences":[32,122],"short":[34],"images.":[36],"However,":[37],"non-linear":[39],"movement":[40],"imaging":[44,218],"system":[45],"or":[46],"measured":[48],"object":[49],"caused":[50],"moving":[53],"stage":[54],"straightness":[55],"error":[56],"brings":[57],"misalignment":[59],"sequences,":[63],"such":[64],"as":[65,75,77],"transversal":[66],"translation,":[67],"rotation,":[68],"and":[69,148,155,216],"tilting.":[70],"All":[71],"these":[73],"interferences,":[74],"well":[76],"brightness":[80],"variation":[81],"must":[82],"corrected":[84],"registration":[87,98,204],"before":[88],"sequences.":[92],"In":[93,157],"this":[94],"paper,":[95],"fast-automatic":[97],"method":[99,177,194,212],"based":[100],"on":[101],"scale":[103],"invariant":[104],"feature":[105,146],"transform":[106],"(SIFT)":[107],"proposed.":[109],"firstly":[114],"segmenting":[115],"focal":[117,137],"regions":[118],"through":[123],"fast":[124],"edge":[125],"detection.":[126],"Then":[127],"features":[130],"are":[131],"extracted":[132],"within":[133],"segmented":[136],"areas.":[138],"greatly":[140],"reduces":[141],"computational":[143],"cost":[144],"extraction":[147],"following":[150],"steps":[151],"correction,":[154],"alignment.":[156],"process,":[159],"random":[161],"sampling":[162],"consistency":[163],"(RANSAC)":[164],"algorithm":[165],"also":[167],"used":[168],"to":[169],"remove":[170],"mistake":[172],"features.":[173],"Laplacian":[175],"pyramid":[176],"adopted":[179],"fusion.":[186],"experimental":[188],"results":[189],"show":[190],"that":[191],"proposed":[193],"more":[196],"efficient":[197],"than":[198],"traditional":[200],"SIFT":[201],"algorithm.":[202],"Its":[203],"efficiency":[205],"improved":[207],"about":[209],"60%.":[210],"This":[211],"facilitates":[213],"high-precision":[215],"real-time":[217],"monocular":[221],"three-dimensional":[222],"stacking.":[224]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}