{"id":"https://openalex.org/W2996806699","doi":"https://doi.org/10.1109/access.2019.2962869","title":"3D Geometric Engineering of the Double Wedge-Like Electrodes for Filament-Type RRAM Device Performance Improvement","display_name":"3D Geometric Engineering of the Double Wedge-Like Electrodes for Filament-Type RRAM Device Performance Improvement","publication_year":2019,"publication_date":"2019-12-31","ids":{"openalex":"https://openalex.org/W2996806699","doi":"https://doi.org/10.1109/access.2019.2962869","mag":"2996806699"},"language":"en","primary_location":{"id":"doi:10.1109/access.2019.2962869","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2962869","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/08945174.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/08945174.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5008126787","display_name":"Jianxun Sun","orcid":"https://orcid.org/0000-0003-0527-1152"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]},{"id":"https://openalex.org/I4210136567","display_name":"GlobalFoundries (Singapore)","ror":"https://ror.org/03whnfd14","country_code":"SG","type":"company","lineage":["https://openalex.org/I35662394","https://openalex.org/I4210136567"]}],"countries":["SG"],"is_corresponding":true,"raw_author_name":"Jianxun Sun","raw_affiliation_strings":["GLOBALFOUNDRIES Singapore Pte Ltd., Singapore","School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore"],"affiliations":[{"raw_affiliation_string":"GLOBALFOUNDRIES Singapore Pte Ltd., Singapore","institution_ids":["https://openalex.org/I4210136567"]},{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041042989","display_name":"Yuan Bo Li","orcid":"https://orcid.org/0000-0002-0582-4290"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Yuan Bo Li","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058451401","display_name":"Yiyang Ye","orcid":"https://orcid.org/0000-0003-0215-8736"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Yiyang Ye","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Jun Zhang","orcid":"https://orcid.org/0000-0002-7472-8905"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Jun Zhang","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056369962","display_name":"Gang Yih Chong","orcid":"https://orcid.org/0000-0002-4597-6504"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Gang Yih Chong","raw_affiliation_strings":["Nanyang NanoFabrication Centre (N2FC), Nanyang Technological University, Singapore"],"affiliations":[{"raw_affiliation_string":"Nanyang NanoFabrication Centre (N2FC), Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102977688","display_name":"Juan Boon Tan","orcid":"https://orcid.org/0000-0003-2116-6459"},"institutions":[{"id":"https://openalex.org/I4210136567","display_name":"GlobalFoundries (Singapore)","ror":"https://ror.org/03whnfd14","country_code":"SG","type":"company","lineage":["https://openalex.org/I35662394","https://openalex.org/I4210136567"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Juan Boon Tan","raw_affiliation_strings":["GLOBALFOUNDRIES Singapore Pte Ltd., Singapore"],"affiliations":[{"raw_affiliation_string":"GLOBALFOUNDRIES Singapore Pte Ltd., Singapore","institution_ids":["https://openalex.org/I4210136567"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100412038","display_name":"Zhen Liu","orcid":"https://orcid.org/0000-0002-2445-9962"},"institutions":[{"id":"https://openalex.org/I139024713","display_name":"Guangdong University of Technology","ror":"https://ror.org/04azbjn80","country_code":"CN","type":"education","lineage":["https://openalex.org/I139024713"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhen Liu","raw_affiliation_strings":["School of Materials and Energy, Guangdong University of Technology, Guangzhou, China"],"affiliations":[{"raw_affiliation_string":"School of Materials and Energy, Guangdong University of Technology, Guangzhou, China","institution_ids":["https://openalex.org/I139024713"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5018298857","display_name":"T. P. Chen","orcid":"https://orcid.org/0000-0002-1098-9575"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Tupei Chen","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":8,"corresponding_author_ids":["https://openalex.org/A5008126787"],"corresponding_institution_ids":["https://openalex.org/I172675005","https://openalex.org/I4210136567"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.2421,"has_fulltext":true,"cited_by_count":3,"citation_normalized_percentile":{"value":0.57751665,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"8","issue":null,"first_page":"4924","last_page":"4934"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11128","display_name":"Transition Metal Oxide Nanomaterials","score":0.9962000250816345,"subfield":{"id":"https://openalex.org/subfields/2507","display_name":"Polymers and Plastics"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/resistive-random-access-memory","display_name":"Resistive random-access memory","score":0.9063414335250854},{"id":"https://openalex.org/keywords/electrode","display_name":"Electrode","score":0.8005537986755371},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.7354820966720581},{"id":"https://openalex.org/keywords/protein-filament","display_name":"Protein filament","score":0.7239024639129639},{"id":"https://openalex.org/keywords/resistive-touchscreen","display_name":"Resistive touchscreen","score":0.5822998881340027},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.5714515447616577},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5300084352493286},{"id":"https://openalex.org/keywords/wedge","display_name":"Wedge (geometry)","score":0.4806627035140991},{"id":"https://openalex.org/keywords/trench","display_name":"Trench","score":0.4272046685218811},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.23771139979362488},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2336568534374237},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.23039209842681885},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.2039804458618164},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.08698871731758118}],"concepts":[{"id":"https://openalex.org/C182019814","wikidata":"https://www.wikidata.org/wiki/Q1143830","display_name":"Resistive random-access memory","level":3,"score":0.9063414335250854},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.8005537986755371},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7354820966720581},{"id":"https://openalex.org/C14228908","wikidata":"https://www.wikidata.org/wiki/Q2920483","display_name":"Protein filament","level":2,"score":0.7239024639129639},{"id":"https://openalex.org/C6899612","wikidata":"https://www.wikidata.org/wiki/Q852911","display_name":"Resistive touchscreen","level":2,"score":0.5822998881340027},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.5714515447616577},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5300084352493286},{"id":"https://openalex.org/C47422493","wikidata":"https://www.wikidata.org/wiki/Q2755127","display_name":"Wedge (geometry)","level":2,"score":0.4806627035140991},{"id":"https://openalex.org/C155310634","wikidata":"https://www.wikidata.org/wiki/Q1852785","display_name":"Trench","level":3,"score":0.4272046685218811},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.23771139979362488},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2336568534374237},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.23039209842681885},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.2039804458618164},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.08698871731758118},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C147789679","wikidata":"https://www.wikidata.org/wiki/Q11372","display_name":"Physical chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/access.2019.2962869","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2962869","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/08945174.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:67d58393ff0045009077ed728ee3c167","is_oa":true,"landing_page_url":"https://doaj.org/article/67d58393ff0045009077ed728ee3c167","pdf_url":null,"source":{"id":"https://openalex.org/S112646816","display_name":"SHILAP Revista de lepidopterolog\u00eda","issn_l":"0300-5267","issn":["0300-5267","2340-4078"],"is_oa":true,"is_in_doaj":true,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 8, Pp 4924-4934 (2020)","raw_type":"article"},{"id":"pmh:oai:dr.ntu.edu.sg:10356/145876","is_oa":true,"landing_page_url":"https://hdl.handle.net/10356/145876","pdf_url":null,"source":{"id":"https://openalex.org/S4306402609","display_name":"DR-NTU (Nanyang Technological University)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I172675005","host_organization_name":"Nanyang Technological University","host_organization_lineage":["https://openalex.org/I172675005"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Journal Article"}],"best_oa_location":{"id":"doi:10.1109/access.2019.2962869","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2962869","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/08945174.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1609537680","display_name":null,"funder_award_id":"NRF-CRP","funder_id":"https://openalex.org/F4320320709","funder_display_name":"National Research Foundation Singapore"},{"id":"https://openalex.org/G2134846559","display_name":null,"funder_award_id":"NRF-CRP13-2014-02","funder_id":"https://openalex.org/F4320320709","funder_display_name":"National Research Foundation Singapore"},{"id":"https://openalex.org/G7871169798","display_name":null,"funder_award_id":"2016A05050205","funder_id":"https://openalex.org/F4320335795","funder_display_name":"Science and Technology Planning Project of Guangdong Province"},{"id":"https://openalex.org/G8852999484","display_name":null,"funder_award_id":"NRF-CRP13-2014-02","funder_id":"https://openalex.org/F4320320671","funder_display_name":"National Research Foundation"}],"funders":[{"id":"https://openalex.org/F4320320671","display_name":"National Research Foundation","ror":"https://ror.org/05s0g1g46"},{"id":"https://openalex.org/F4320320709","display_name":"National Research Foundation Singapore","ror":"https://ror.org/03cpyc314"},{"id":"https://openalex.org/F4320335795","display_name":"Science and Technology Planning Project of Guangdong Province","ror":null}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2996806699.pdf","grobid_xml":"https://content.openalex.org/works/W2996806699.grobid-xml"},"referenced_works_count":32,"referenced_works":["https://openalex.org/W1851896842","https://openalex.org/W1967670695","https://openalex.org/W1969281156","https://openalex.org/W1977765713","https://openalex.org/W2001744188","https://openalex.org/W2006819482","https://openalex.org/W2014415691","https://openalex.org/W2031750832","https://openalex.org/W2035089733","https://openalex.org/W2038172069","https://openalex.org/W2058936616","https://openalex.org/W2059522723","https://openalex.org/W2062058934","https://openalex.org/W2065110735","https://openalex.org/W2067300394","https://openalex.org/W2112181056","https://openalex.org/W2121908414","https://openalex.org/W2129719652","https://openalex.org/W2148331362","https://openalex.org/W2402238735","https://openalex.org/W2406922454","https://openalex.org/W2429362526","https://openalex.org/W2543577874","https://openalex.org/W2620030804","https://openalex.org/W2751072639","https://openalex.org/W2782685126","https://openalex.org/W2805362231","https://openalex.org/W2808379801","https://openalex.org/W2889049919","https://openalex.org/W2974811846","https://openalex.org/W2990284936","https://openalex.org/W2995291979"],"related_works":["https://openalex.org/W2019611465","https://openalex.org/W3164615570","https://openalex.org/W3157611879","https://openalex.org/W2313980841","https://openalex.org/W2054635671","https://openalex.org/W2545245183","https://openalex.org/W2557928728","https://openalex.org/W2166497341","https://openalex.org/W2086074825","https://openalex.org/W2199653281"],"abstract_inverted_index":{"The":[0,36],"resistive":[1,77],"switching":[2,78],"variability":[3],"and":[4,47,87,104,115,130],"reliability":[5,81],"degradation":[6],"are":[7,63,90],"the":[8,14,18,54,59,66,76,80,94,111,128,133],"two":[9],"major":[10],"challenges":[11],"that":[12,73],"hinder":[13],"high-volume":[15],"production":[16],"of":[17,58,132],"Resistive":[19],"Random":[20],"Access":[21],"Memory":[22],"(RRAM)":[23],"devices.":[24,136],"In":[25],"this":[26,118],"work,":[27],"a":[28,125],"3D":[29],"electrode":[30,41,48],"structure":[31],"engineering":[32],"method":[33],"is":[34],"proposed.":[35],"geometric":[37],"parameters":[38],"defined":[39],"as":[40,84,124],"angle":[42],"(EA),":[43],"electrodes":[44,57],"spacing":[45],"(ES)":[46],"trench":[49],"depth":[50],"(ETD)":[51],"associated":[52],"with":[53,96],"double":[55],"wedge-like":[56],"filament-type":[60,134],"RRAM":[61,135],"devices":[62],"studied":[64],"for":[65,93,127],"first":[67],"time.":[68],"Our":[69],"experimental":[70],"results":[71],"show":[72],"apart":[74],"from":[75],"uniformity,":[79],"performance":[82],"such":[83],"cycling":[85],"endurance":[86],"data":[88],"retention":[89],"significantly":[91],"improved":[92],"device":[95],"small":[97],"EA":[98],"(90\u00b0),":[99],"narrow":[100],"ES":[101],"(440":[102],"nm)":[103,108],"deep":[105],"ETD":[106],"(90":[107],"owing":[109],"to":[110],"electric":[112],"field":[113],"confinement":[114],"enhancement.":[116],"Thus,":[117],"new":[119],"approach":[120],"can":[121],"be":[122],"served":[123],"guideline":[126],"design":[129],"optimization":[131]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1}],"updated_date":"2026-04-10T15:06:20.359241","created_date":"2025-10-10T00:00:00"}