{"id":"https://openalex.org/W2998172516","doi":"https://doi.org/10.1109/access.2019.2962131","title":"Robust Design of Detecting Contaminants in Fa\u00e7ade Cleaning Applications","display_name":"Robust Design of Detecting Contaminants in Fa\u00e7ade Cleaning Applications","publication_year":2019,"publication_date":"2019-12-25","ids":{"openalex":"https://openalex.org/W2998172516","doi":"https://doi.org/10.1109/access.2019.2962131","mag":"2998172516"},"language":"en","primary_location":{"id":"doi:10.1109/access.2019.2962131","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2962131","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/08943192.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/08943192.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101787406","display_name":"Jiseok Lee","orcid":"https://orcid.org/0000-0001-6182-9662"},"institutions":[{"id":"https://openalex.org/I4575257","display_name":"Hanyang University","ror":"https://ror.org/046865y68","country_code":"KR","type":"education","lineage":["https://openalex.org/I4575257"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Jiseok Lee","raw_affiliation_strings":["School of Mechanical Engineering, Hanyang University, Seoul, South Korea"],"affiliations":[{"raw_affiliation_string":"School of Mechanical Engineering, Hanyang University, Seoul, South Korea","institution_ids":["https://openalex.org/I4575257"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041001705","display_name":"Garam Park","orcid":"https://orcid.org/0000-0003-0930-9699"},"institutions":[{"id":"https://openalex.org/I4575257","display_name":"Hanyang University","ror":"https://ror.org/046865y68","country_code":"KR","type":"education","lineage":["https://openalex.org/I4575257"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Garam Park","raw_affiliation_strings":["School of Mechanical Engineering, Hanyang University, Seoul, South Korea"],"affiliations":[{"raw_affiliation_string":"School of Mechanical Engineering, Hanyang University, Seoul, South Korea","institution_ids":["https://openalex.org/I4575257"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5031598085","display_name":"Yecheol Moon","orcid":null},"institutions":[{"id":"https://openalex.org/I4575257","display_name":"Hanyang University","ror":"https://ror.org/046865y68","country_code":"KR","type":"education","lineage":["https://openalex.org/I4575257"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Yecheol Moon","raw_affiliation_strings":["School of Mechanical Engineering, Hanyang University, Seoul, South Korea"],"affiliations":[{"raw_affiliation_string":"School of Mechanical Engineering, Hanyang University, Seoul, South Korea","institution_ids":["https://openalex.org/I4575257"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5087726465","display_name":"Sungon Lee","orcid":"https://orcid.org/0000-0003-1313-3403"},"institutions":[{"id":"https://openalex.org/I4575257","display_name":"Hanyang University","ror":"https://ror.org/046865y68","country_code":"KR","type":"education","lineage":["https://openalex.org/I4575257"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Sungon Lee","raw_affiliation_strings":["School of Electrical Engineering, Hanyang University, Ansan, South Korea"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Hanyang University, Ansan, South Korea","institution_ids":["https://openalex.org/I4575257"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5000423233","display_name":"TaeWon Seo","orcid":"https://orcid.org/0000-0001-9447-7675"},"institutions":[{"id":"https://openalex.org/I4575257","display_name":"Hanyang University","ror":"https://ror.org/046865y68","country_code":"KR","type":"education","lineage":["https://openalex.org/I4575257"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Taewon Seo","raw_affiliation_strings":["School of Mechanical Engineering, Hanyang University, Seoul, South Korea"],"affiliations":[{"raw_affiliation_string":"School of Mechanical Engineering, Hanyang University, Seoul, South Korea","institution_ids":["https://openalex.org/I4575257"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5101787406"],"corresponding_institution_ids":["https://openalex.org/I4575257"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.4416,"has_fulltext":true,"cited_by_count":3,"citation_normalized_percentile":{"value":0.73351095,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":"8","issue":null,"first_page":"2869","last_page":"2884"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9927999973297119,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9927999973297119,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11211","display_name":"3D Surveying and Cultural Heritage","score":0.9922999739646912,"subfield":{"id":"https://openalex.org/subfields/1907","display_name":"Geology"},"field":{"id":"https://openalex.org/fields/19","display_name":"Earth and Planetary Sciences"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11164","display_name":"Remote Sensing and LiDAR Applications","score":0.9800000190734863,"subfield":{"id":"https://openalex.org/subfields/2305","display_name":"Environmental Engineering"},"field":{"id":"https://openalex.org/fields/23","display_name":"Environmental Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/brightness","display_name":"Brightness","score":0.70865398645401},{"id":"https://openalex.org/keywords/taguchi-methods","display_name":"Taguchi methods","score":0.6663780212402344},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6135267019271851},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5685433149337769},{"id":"https://openalex.org/keywords/contamination","display_name":"Contamination","score":0.5444841980934143},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.4654318690299988},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.41060349345207214},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.34780338406562805},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.14426898956298828},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.09588861465454102},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.08657893538475037}],"concepts":[{"id":"https://openalex.org/C125245961","wikidata":"https://www.wikidata.org/wiki/Q221656","display_name":"Brightness","level":2,"score":0.70865398645401},{"id":"https://openalex.org/C83469408","wikidata":"https://www.wikidata.org/wiki/Q2036525","display_name":"Taguchi methods","level":2,"score":0.6663780212402344},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6135267019271851},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5685433149337769},{"id":"https://openalex.org/C112570922","wikidata":"https://www.wikidata.org/wiki/Q60528603","display_name":"Contamination","level":2,"score":0.5444841980934143},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.4654318690299988},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.41060349345207214},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.34780338406562805},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.14426898956298828},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.09588861465454102},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.08657893538475037},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C18903297","wikidata":"https://www.wikidata.org/wiki/Q7150","display_name":"Ecology","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2019.2962131","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2962131","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/08943192.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:31be13ffce4646c98b4d9e13d2256138","is_oa":true,"landing_page_url":"https://doaj.org/article/31be13ffce4646c98b4d9e13d2256138","pdf_url":null,"source":{"id":"https://openalex.org/S112646816","display_name":"SHILAP Revista de lepidopterolog\u00eda","issn_l":"0300-5267","issn":["0300-5267","2340-4078"],"is_oa":true,"is_in_doaj":true,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 8, Pp 2869-2884 (2020)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2019.2962131","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2962131","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/08943192.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G342704958","display_name":null,"funder_award_id":"funded","funder_id":"https://openalex.org/F4320322120","funder_display_name":"National Research Foundation of Korea"},{"id":"https://openalex.org/G393802059","display_name":null,"funder_award_id":"2018M3C1B9088332","funder_id":"https://openalex.org/F4320322120","funder_display_name":"National Research Foundation of Korea"},{"id":"https://openalex.org/G5619224994","display_name":null,"funder_award_id":"2018M3C1B9088328","funder_id":"https://openalex.org/F4320322120","funder_display_name":"National Research Foundation of Korea"},{"id":"https://openalex.org/G6406549432","display_name":null,"funder_award_id":"2018M3C1B9088331","funder_id":"https://openalex.org/F4320322120","funder_display_name":"National Research Foundation of Korea"},{"id":"https://openalex.org/G6433856436","display_name":null,"funder_award_id":"NRF-2018M3C1B9088328","funder_id":"https://openalex.org/F4320322120","funder_display_name":"National Research Foundation of Korea"},{"id":"https://openalex.org/G7685055460","display_name":null,"funder_award_id":"Grant","funder_id":"https://openalex.org/F4320328359","funder_display_name":"Ministry of Science and ICT, South Korea"},{"id":"https://openalex.org/G982292920","display_name":null,"funder_award_id":"NRF-20","funder_id":"https://openalex.org/F4320322120","funder_display_name":"National Research Foundation of Korea"}],"funders":[{"id":"https://openalex.org/F4320320671","display_name":"National Research Foundation","ror":"https://ror.org/05s0g1g46"},{"id":"https://openalex.org/F4320321142","display_name":"Hanyang University","ror":"https://ror.org/046865y68"},{"id":"https://openalex.org/F4320322120","display_name":"National Research Foundation of Korea","ror":"https://ror.org/013aysd81"},{"id":"https://openalex.org/F4320328359","display_name":"Ministry of Science and ICT, South Korea","ror":"https://ror.org/01wpjm123"}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2998172516.pdf","grobid_xml":"https://content.openalex.org/works/W2998172516.grobid-xml"},"referenced_works_count":15,"referenced_works":["https://openalex.org/W1903029394","https://openalex.org/W1975030698","https://openalex.org/W1998166518","https://openalex.org/W2003232509","https://openalex.org/W2031489346","https://openalex.org/W2068808443","https://openalex.org/W2068871980","https://openalex.org/W2262607787","https://openalex.org/W2790124652","https://openalex.org/W2911524505","https://openalex.org/W2913171817","https://openalex.org/W2918218835","https://openalex.org/W2919862852","https://openalex.org/W2963037989","https://openalex.org/W2985318398"],"related_works":["https://openalex.org/W2141801573","https://openalex.org/W2042858286","https://openalex.org/W2186534316","https://openalex.org/W1899929387","https://openalex.org/W2104509673","https://openalex.org/W1660662692","https://openalex.org/W778881360","https://openalex.org/W2289064120","https://openalex.org/W2047779624","https://openalex.org/W1748556730"],"abstract_inverted_index":{"As":[0],"the":[1,27,36,117,123,130],"number":[2],"of":[3,10,31,62],"high-rise":[4],"buildings":[5],"is":[6,109,114],"increasing,":[7],"more":[8],"methods":[9],"exterior-wall":[11],"cleaning":[12,37,54],"are":[13,17,59,72,91],"being":[14],"developed.":[15],"There":[16,58],"a":[18,75,81],"few":[19],"models":[20],"based":[21],"on":[22,52,116],"artificial":[23,112],"intelligence":[24],"that":[25],"determine":[26],"type":[28],"and":[29,56,67,69,101,111],"level":[30],"contamination":[32,113],"primarily":[33],"by":[34],"moving":[35],"area.":[38],"In":[39],"this":[40],"study,":[41],"we":[42],"propose":[43],"an":[44],"system":[45],"using":[46],"YOLOv3":[47],"algorithm,":[48],"color-detection,":[49],"to":[50,74,79,98],"install":[51],"fa\u00e7ade":[53],"robot":[55],"brightness-discrimination.":[57],"three":[60,89],"types":[61],"contaminant-detection":[63],"parameters:":[64],"size,":[65],"color,":[66],"brightness,":[68],"these":[70],"parameters":[71,90],"subjected":[73],"robust":[76],"optimization":[77],"process":[78],"maintain":[80],"constant":[82],"detection":[83,124],"rate":[84],"under":[85],"different":[86],"conditions.":[87],"The":[88],"determined":[92],"via":[93],"Taguchi":[94],"method":[95],"with":[96,122],"signal":[97],"noise":[99,102],"ratio":[100],"factors.":[103],"An":[104],"environment":[105],"for":[106],"algorithm":[107,125],"testing":[108],"established,":[110],"implemented":[115],"specimen.":[118],"A":[119],"field":[120],"test":[121],"shall":[126],"be":[127],"performed":[128],"in":[129],"near":[131],"future.":[132]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2020,"cited_by_count":2}],"updated_date":"2026-04-15T08:11:43.952461","created_date":"2025-10-10T00:00:00"}