{"id":"https://openalex.org/W2992124668","doi":"https://doi.org/10.1109/access.2019.2957202","title":"Data Super-Network Fault Prediction Model and Maintenance Strategy for Mechanical Product Based on Digital Twin","display_name":"Data Super-Network Fault Prediction Model and Maintenance Strategy for Mechanical Product Based on Digital Twin","publication_year":2019,"publication_date":"2019-01-01","ids":{"openalex":"https://openalex.org/W2992124668","doi":"https://doi.org/10.1109/access.2019.2957202","mag":"2992124668"},"language":"en","primary_location":{"id":"doi:10.1109/access.2019.2957202","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2957202","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08918447.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08918447.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100703477","display_name":"Zhifeng Liu","orcid":"https://orcid.org/0000-0002-6164-3283"},"institutions":[{"id":"https://openalex.org/I37796252","display_name":"Beijing University of Technology","ror":"https://ror.org/037b1pp87","country_code":"CN","type":"education","lineage":["https://openalex.org/I37796252"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Zhifeng Liu","raw_affiliation_strings":["Beijing Key Laboratory of Advanced Manufacturing Technology, Beijing University of Technology, Beijing, China","Institute of Advanced Manufacturing and Intelligent Technology, Beijing University of Technology, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-6164-3283","affiliations":[{"raw_affiliation_string":"Beijing Key Laboratory of Advanced Manufacturing Technology, Beijing University of Technology, Beijing, China","institution_ids":["https://openalex.org/I37796252"]},{"raw_affiliation_string":"Institute of Advanced Manufacturing and Intelligent Technology, Beijing University of Technology, Beijing, China","institution_ids":["https://openalex.org/I37796252"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100756974","display_name":"Wei Chen","orcid":"https://orcid.org/0000-0003-1394-4927"},"institutions":[{"id":"https://openalex.org/I37796252","display_name":"Beijing University of Technology","ror":"https://ror.org/037b1pp87","country_code":"CN","type":"education","lineage":["https://openalex.org/I37796252"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wei Chen","raw_affiliation_strings":["Beijing Key Laboratory of Advanced Manufacturing Technology, Beijing University of Technology, Beijing, China","Institute of Advanced Manufacturing and Intelligent Technology, Beijing University of Technology, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0003-1394-4927","affiliations":[{"raw_affiliation_string":"Beijing Key Laboratory of Advanced Manufacturing Technology, Beijing University of Technology, Beijing, China","institution_ids":["https://openalex.org/I37796252"]},{"raw_affiliation_string":"Institute of Advanced Manufacturing and Intelligent Technology, Beijing University of Technology, Beijing, China","institution_ids":["https://openalex.org/I37796252"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100716789","display_name":"Caixia Zhang","orcid":"https://orcid.org/0000-0003-1312-5171"},"institutions":[{"id":"https://openalex.org/I37796252","display_name":"Beijing University of Technology","ror":"https://ror.org/037b1pp87","country_code":"CN","type":"education","lineage":["https://openalex.org/I37796252"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Caixia Zhang","raw_affiliation_strings":["Beijing Key Laboratory of Advanced Manufacturing Technology, Beijing University of Technology, Beijing, China","Institute of Advanced Manufacturing and Intelligent Technology, Beijing University of Technology, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0003-1312-5171","affiliations":[{"raw_affiliation_string":"Beijing Key Laboratory of Advanced Manufacturing Technology, Beijing University of Technology, Beijing, China","institution_ids":["https://openalex.org/I37796252"]},{"raw_affiliation_string":"Institute of Advanced Manufacturing and Intelligent Technology, Beijing University of Technology, Beijing, China","institution_ids":["https://openalex.org/I37796252"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5073910119","display_name":"Congbin Yang","orcid":"https://orcid.org/0000-0003-1040-6840"},"institutions":[{"id":"https://openalex.org/I37796252","display_name":"Beijing University of Technology","ror":"https://ror.org/037b1pp87","country_code":"CN","type":"education","lineage":["https://openalex.org/I37796252"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Congbin Yang","raw_affiliation_strings":["Beijing Key Laboratory of Advanced Manufacturing Technology, Beijing University of Technology, Beijing, China","Institute of Advanced Manufacturing and Intelligent Technology, Beijing University of Technology, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0003-1040-6840","affiliations":[{"raw_affiliation_string":"Beijing Key Laboratory of Advanced Manufacturing Technology, Beijing University of Technology, Beijing, China","institution_ids":["https://openalex.org/I37796252"]},{"raw_affiliation_string":"Institute of Advanced Manufacturing and Intelligent Technology, Beijing University of Technology, Beijing, China","institution_ids":["https://openalex.org/I37796252"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100743712","display_name":"Hongyan Chu","orcid":"https://orcid.org/0000-0002-0120-4270"},"institutions":[{"id":"https://openalex.org/I37796252","display_name":"Beijing University of Technology","ror":"https://ror.org/037b1pp87","country_code":"CN","type":"education","lineage":["https://openalex.org/I37796252"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hongyan Chu","raw_affiliation_strings":["Beijing Key Laboratory of Advanced Manufacturing Technology, Beijing University of Technology, Beijing, China","Institute of Advanced Manufacturing and Intelligent Technology, Beijing University of Technology, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-0120-4270","affiliations":[{"raw_affiliation_string":"Beijing Key Laboratory of Advanced Manufacturing Technology, Beijing University of Technology, Beijing, China","institution_ids":["https://openalex.org/I37796252"]},{"raw_affiliation_string":"Institute of Advanced Manufacturing and Intelligent Technology, Beijing University of Technology, Beijing, China","institution_ids":["https://openalex.org/I37796252"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5100703477"],"corresponding_institution_ids":["https://openalex.org/I37796252"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":6.1852,"has_fulltext":true,"cited_by_count":66,"citation_normalized_percentile":{"value":0.96650858,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":96,"max":100},"biblio":{"volume":"7","issue":null,"first_page":"177284","last_page":"177296"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10763","display_name":"Digital Transformation in Industry","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10763","display_name":"Digital Transformation in Industry","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11159","display_name":"Manufacturing Process and Optimization","score":0.9722999930381775,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14306","display_name":"Technology Assessment and Management","score":0.9722999930381775,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.7026832699775696},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7020208239555359},{"id":"https://openalex.org/keywords/layer","display_name":"Layer (electronics)","score":0.5184171199798584},{"id":"https://openalex.org/keywords/predictive-maintenance","display_name":"Predictive maintenance","score":0.5181595087051392},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.3873632550239563},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3720880150794983},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.35636770725250244},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1565842628479004}],"concepts":[{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.7026832699775696},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7020208239555359},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.5184171199798584},{"id":"https://openalex.org/C70452415","wikidata":"https://www.wikidata.org/wiki/Q3182448","display_name":"Predictive maintenance","level":2,"score":0.5181595087051392},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.3873632550239563},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3720880150794983},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.35636770725250244},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1565842628479004},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2019.2957202","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2957202","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08918447.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:f9dc9ad7f42040e8be50da89c370d941","is_oa":true,"landing_page_url":"https://doaj.org/article/f9dc9ad7f42040e8be50da89c370d941","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 7, Pp 177284-177296 (2019)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2019.2957202","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2957202","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08918447.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9","score":0.4399999976158142}],"awards":[{"id":"https://openalex.org/G462930880","display_name":null,"funder_award_id":"2018ZX04032002","funder_id":"https://openalex.org/F4320329860","funder_display_name":"National Science and Technology Major Project"},{"id":"https://openalex.org/G5122744278","display_name":null,"funder_award_id":"Z181100003118001","funder_id":"https://openalex.org/F4320329860","funder_display_name":"National Science and Technology Major Project"}],"funders":[{"id":"https://openalex.org/F4320329860","display_name":"National Science and Technology Major Project","ror":null}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2992124668.pdf","grobid_xml":"https://content.openalex.org/works/W2992124668.grobid-xml"},"referenced_works_count":37,"referenced_works":["https://openalex.org/W88390532","https://openalex.org/W1968268217","https://openalex.org/W1992882297","https://openalex.org/W2001393256","https://openalex.org/W2026899723","https://openalex.org/W2037598904","https://openalex.org/W2079964750","https://openalex.org/W2096333790","https://openalex.org/W2108366027","https://openalex.org/W2243814931","https://openalex.org/W2267453118","https://openalex.org/W2342231262","https://openalex.org/W2518003110","https://openalex.org/W2569075773","https://openalex.org/W2581964379","https://openalex.org/W2592420394","https://openalex.org/W2597150627","https://openalex.org/W2606320129","https://openalex.org/W2625535272","https://openalex.org/W2736552576","https://openalex.org/W2737897717","https://openalex.org/W2757110387","https://openalex.org/W2783918566","https://openalex.org/W2786100634","https://openalex.org/W2794455003","https://openalex.org/W2801598009","https://openalex.org/W2804780212","https://openalex.org/W2806878106","https://openalex.org/W2884839231","https://openalex.org/W2884882006","https://openalex.org/W2888563655","https://openalex.org/W2889220424","https://openalex.org/W2889773352","https://openalex.org/W2896262734","https://openalex.org/W2956903776","https://openalex.org/W4240132846","https://openalex.org/W6690471753"],"related_works":["https://openalex.org/W2951640941","https://openalex.org/W591863984","https://openalex.org/W2795136348","https://openalex.org/W962477430","https://openalex.org/W2903360172","https://openalex.org/W2277319453","https://openalex.org/W2391563149","https://openalex.org/W23403803","https://openalex.org/W4360585628","https://openalex.org/W4252323845"],"abstract_inverted_index":{"When":[0],"mechanical":[1],"products":[2],"work":[3],"in":[4,66,70,108],"complex":[5],"environments,":[6],"it":[7],"is":[8,55,115,142,159],"imperative":[9],"to":[10,45,89],"build":[11],"an":[12,134,138],"optimal":[13],"maintenance":[14,42,113],"strategy,":[15],"based":[16],"on":[17,29],"accurate":[18],"positioning":[19],"of":[20,25,84,94,104,120,156],"fault":[21,26,39,86,129],"locations":[22],"and":[23,41,76,101,131],"prediction":[24,40,87,130,154],"conditions.":[27],"Based":[28],"digital":[30,47,67,109],"twinning":[31],"technology,":[32],"this":[33,140,157],"paper":[34],"proposes":[35],"a":[36,51,58,111,145],"\u201csuper-network-warning":[37],"features\u201d":[38],"method.":[43,147,164],"According":[44],"the":[46,71,85,92,95,99,105,118,121,125,152,162],"twin":[48],"five-dimensional":[49],"structure,":[50],"three-layer":[52],"super-network":[53],"model":[54,88,107,153],"constructed,":[56],"providing":[57],"quantitative":[59],"research":[60],"for":[61,117],"data":[62],"among":[63],"heterogeneous":[64],"subjects":[65],"twinning.":[68],"Early-warning-features":[69],"physical":[72],"layer,":[73],"virtual":[74,106],"layer":[75,78],"service":[77],"are":[79],"selected":[80],"as":[81,137],"input":[82],"parameters":[83],"accurately":[90],"predict":[91],"cause":[93],"fault.":[96,122],"Then,":[97],"using":[98],"simulation":[100],"optimization":[102],"functions":[103],"twinning,":[110],"real-time":[112],"strategy":[114],"formulated":[116],"causes":[119],"It":[123],"supplements":[124],"missing":[126],"link":[127],"between":[128],"maintenance.":[132],"Taking":[133],"aero-engine":[135],"bearing":[136],"example,":[139],"method":[141,158],"compared":[143],"with":[144],"traditional":[146,163],"The":[148],"results":[149],"show":[150],"that":[151],"error":[155],"better":[160],"than":[161]},"counts_by_year":[{"year":2025,"cited_by_count":10},{"year":2024,"cited_by_count":12},{"year":2023,"cited_by_count":16},{"year":2022,"cited_by_count":16},{"year":2021,"cited_by_count":9},{"year":2020,"cited_by_count":3}],"updated_date":"2026-05-06T08:25:59.206177","created_date":"2025-10-10T00:00:00"}