{"id":"https://openalex.org/W2993800541","doi":"https://doi.org/10.1109/access.2019.2955091","title":"An Analytical Gate Delay Model in Near/Subthreshold Domain Considering Process Variation","display_name":"An Analytical Gate Delay Model in Near/Subthreshold Domain Considering Process Variation","publication_year":2019,"publication_date":"2019-01-01","ids":{"openalex":"https://openalex.org/W2993800541","doi":"https://doi.org/10.1109/access.2019.2955091","mag":"2993800541"},"language":"en","primary_location":{"id":"doi:10.1109/access.2019.2955091","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2955091","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08910544.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08910544.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5046599843","display_name":"Peng Cao","orcid":"https://orcid.org/0000-0003-2039-9031"},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Peng Cao","raw_affiliation_strings":["National ASIC System Engineering Research Center, Southeast University, Nanjing, China"],"affiliations":[{"raw_affiliation_string":"National ASIC System Engineering Research Center, Southeast University, Nanjing, China","institution_ids":["https://openalex.org/I76569877"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079695261","display_name":"Zhiyuan Liu","orcid":"https://orcid.org/0000-0003-0775-9100"},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhiyuan Liu","raw_affiliation_strings":["National ASIC System Engineering Research Center, Southeast University, Nanjing, China"],"affiliations":[{"raw_affiliation_string":"National ASIC System Engineering Research Center, Southeast University, Nanjing, China","institution_ids":["https://openalex.org/I76569877"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5089487764","display_name":"Jingjing Guo","orcid":"https://orcid.org/0000-0002-1031-9416"},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jingjing Guo","raw_affiliation_strings":["National ASIC System Engineering Research Center, Southeast University, Nanjing, China"],"affiliations":[{"raw_affiliation_string":"National ASIC System Engineering Research Center, Southeast University, Nanjing, China","institution_ids":["https://openalex.org/I76569877"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5034476875","display_name":"Jiangping Wu","orcid":"https://orcid.org/0000-0001-9126-5490"},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiangping Wu","raw_affiliation_strings":["National ASIC System Engineering Research Center, Southeast University, Nanjing, China"],"affiliations":[{"raw_affiliation_string":"National ASIC System Engineering Research Center, Southeast University, Nanjing, China","institution_ids":["https://openalex.org/I76569877"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5046599843"],"corresponding_institution_ids":["https://openalex.org/I76569877"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":1.0892,"has_fulltext":true,"cited_by_count":15,"citation_normalized_percentile":{"value":0.78819573,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":98},"biblio":{"volume":"7","issue":null,"first_page":"171515","last_page":"171524"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/subthreshold-conduction","display_name":"Subthreshold conduction","score":0.6669290661811829},{"id":"https://openalex.org/keywords/process-corners","display_name":"Process corners","score":0.5582804083824158},{"id":"https://openalex.org/keywords/process-variation","display_name":"Process variation","score":0.5475510358810425},{"id":"https://openalex.org/keywords/monte-carlo-method","display_name":"Monte Carlo method","score":0.4858812689781189},{"id":"https://openalex.org/keywords/skew","display_name":"Skew","score":0.4636799693107605},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4443318843841553},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.4426132142543793},{"id":"https://openalex.org/keywords/probability-density-function","display_name":"Probability density function","score":0.4166049361228943},{"id":"https://openalex.org/keywords/scaling","display_name":"Scaling","score":0.4160591959953308},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.41489237546920776},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.3771960139274597},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.28227055072784424},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.2514220178127289},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.21757850050926208},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.19459757208824158},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.16545730829238892},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.10459277033805847},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.0974450409412384}],"concepts":[{"id":"https://openalex.org/C156465305","wikidata":"https://www.wikidata.org/wiki/Q1658601","display_name":"Subthreshold conduction","level":4,"score":0.6669290661811829},{"id":"https://openalex.org/C192615534","wikidata":"https://www.wikidata.org/wiki/Q7247268","display_name":"Process corners","level":3,"score":0.5582804083824158},{"id":"https://openalex.org/C93389723","wikidata":"https://www.wikidata.org/wiki/Q7247313","display_name":"Process variation","level":3,"score":0.5475510358810425},{"id":"https://openalex.org/C19499675","wikidata":"https://www.wikidata.org/wiki/Q232207","display_name":"Monte Carlo method","level":2,"score":0.4858812689781189},{"id":"https://openalex.org/C43711488","wikidata":"https://www.wikidata.org/wiki/Q7534783","display_name":"Skew","level":2,"score":0.4636799693107605},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4443318843841553},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.4426132142543793},{"id":"https://openalex.org/C197055811","wikidata":"https://www.wikidata.org/wiki/Q207522","display_name":"Probability density function","level":2,"score":0.4166049361228943},{"id":"https://openalex.org/C99844830","wikidata":"https://www.wikidata.org/wiki/Q102441924","display_name":"Scaling","level":2,"score":0.4160591959953308},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.41489237546920776},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.3771960139274597},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.28227055072784424},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.2514220178127289},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.21757850050926208},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.19459757208824158},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.16545730829238892},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.10459277033805847},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.0974450409412384},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2019.2955091","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2955091","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08910544.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:547a18a5c8244697944914ffb94ee7de","is_oa":true,"landing_page_url":"https://doaj.org/article/547a18a5c8244697944914ffb94ee7de","pdf_url":null,"source":{"id":"https://openalex.org/S112646816","display_name":"SHILAP Revista de lepidopterolog\u00eda","issn_l":"0300-5267","issn":["0300-5267","2340-4078"],"is_oa":true,"is_in_doaj":true,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 7, Pp 171515-171524 (2019)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2019.2955091","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2955091","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08910544.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"score":0.800000011920929,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[{"id":"https://openalex.org/G1013060038","display_name":null,"funder_award_id":"2017ZX01030101","funder_id":"https://openalex.org/F4320329860","funder_display_name":"National Science and Technology Major Project"},{"id":"https://openalex.org/G3672178875","display_name":null,"funder_award_id":"2018YFB2202702","funder_id":"https://openalex.org/F4320335777","funder_display_name":"National Key Research and Development Program of China"}],"funders":[{"id":"https://openalex.org/F4320329860","display_name":"National Science and Technology Major Project","ror":null},{"id":"https://openalex.org/F4320335777","display_name":"National Key Research and Development Program of China","ror":null}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2993800541.pdf","grobid_xml":"https://content.openalex.org/works/W2993800541.grobid-xml"},"referenced_works_count":20,"referenced_works":["https://openalex.org/W1997782294","https://openalex.org/W1998525920","https://openalex.org/W1999520218","https://openalex.org/W2030257954","https://openalex.org/W2044350388","https://openalex.org/W2070623495","https://openalex.org/W2095816496","https://openalex.org/W2113735631","https://openalex.org/W2130038216","https://openalex.org/W2134909205","https://openalex.org/W2140823559","https://openalex.org/W2141236461","https://openalex.org/W2168159483","https://openalex.org/W2176629069","https://openalex.org/W2342528869","https://openalex.org/W2559429877","https://openalex.org/W2593061314","https://openalex.org/W4239145761","https://openalex.org/W4252820003","https://openalex.org/W6650124168"],"related_works":["https://openalex.org/W4239145761","https://openalex.org/W2111372718","https://openalex.org/W2525077515","https://openalex.org/W2118152793","https://openalex.org/W2141625582","https://openalex.org/W2034182926","https://openalex.org/W2615230521","https://openalex.org/W4388000032","https://openalex.org/W2564437568","https://openalex.org/W2107916809"],"abstract_inverted_index":{"Voltage":[0],"scaling":[1,17],"technique":[2],"is":[3,51,65,134],"widely":[4],"employed":[5],"in":[6,83,93,150,160],"state-of-the-art":[7],"low":[8],"power":[9,13],"circuits":[10],"with":[11,54,88,124,137,153],"excellent":[12],"reduction.":[14],"However,":[15],"voltage":[16],"to":[18,72,175],"sub-threshold":[19],"(STV)":[20],"and":[21,28,45,107,157,163],"near-threshold":[22],"(NTV)":[23],"domain":[24],"introduces":[25],"performance":[26],"degradation":[27],"high":[29],"process":[30,55],"variation":[31,56,82],"sensitivity.":[32],"Accurate":[33],"modeling":[34,145],"of":[35,101,146],"the":[36,40,46,75,99,102,105,121,131],"statistical":[37],"characteristics":[38],"especially":[39],"probability":[41],"distribution":[42,48,71,95],"function":[43,49],"(PDF)":[44],"cumulative":[47],"(CDF)":[50],"urgently":[52],"required":[53],"consideration.":[57],"In":[58],"this":[59],"paper,":[60],"a":[61,89],"novel":[62],"analytical":[63],"model":[64,133],"derived":[66],"based":[67],"on":[68],"log-skew-normal":[69],"(LSN)":[70],"precisely":[73],"evaluate":[74],"gate":[76],"delay":[77,94,109,144,161,165],"variation.":[78],"The":[79],"multi-variate":[80],"threshold":[81],"stacked":[84],"gates":[85,149],"are":[86],"modeled":[87],"linear":[90],"approximation":[91],"method":[92,123],"derivation.":[96],"By":[97],"applying":[98],"CDF":[100],"proposed":[103,132],"model,":[104],"maximum":[106,168],"minimum":[108],"indicated":[110],"by":[111],"\u00b13\u03c3":[112,164],"percentile":[113],"point":[114],"can":[115],"be":[116],"calculated":[117],"essentially":[118],"different":[119],"from":[120],"common":[122],"much":[125],"higher":[126],"accuracy.":[127],"Experimental":[128],"results":[129,141],"show":[130],"highly":[135],"fitted":[136],"Monte":[138],"Carlo":[139],"(MC)":[140],"for":[142],"stochastic":[143],"generic":[147],"logic":[148],"near/subthreshold":[151],"regime":[152],"less":[154],"than":[155],"8%":[156],"6%":[158],"error":[159],"variability":[162],"prediction,":[166],"showing":[167],"accuracy":[169],"improvement":[170],"about":[171],"40":[172],"times":[173],"compared":[174],"preproposal":[176],"models.":[177]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":5},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":2}],"updated_date":"2026-04-10T15:06:20.359241","created_date":"2025-10-10T00:00:00"}