{"id":"https://openalex.org/W2990922109","doi":"https://doi.org/10.1109/access.2019.2954091","title":"Rolling Bearing Initial Fault Detection Using Long Short-Term Memory Recurrent Network","display_name":"Rolling Bearing Initial Fault Detection Using Long Short-Term Memory Recurrent Network","publication_year":2019,"publication_date":"2019-01-01","ids":{"openalex":"https://openalex.org/W2990922109","doi":"https://doi.org/10.1109/access.2019.2954091","mag":"2990922109"},"language":"en","primary_location":{"id":"doi:10.1109/access.2019.2954091","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2954091","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08905994.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08905994.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5108835582","display_name":"Huaitao Shi","orcid":null},"institutions":[{"id":"https://openalex.org/I83714178","display_name":"Shenyang Jianzhu University","ror":"https://ror.org/01zr73v18","country_code":"CN","type":"education","lineage":["https://openalex.org/I83714178"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Huaitao Shi","raw_affiliation_strings":["School of Mechanical Engineering, Shenyang Jianzhu University, Shenyang, China"],"raw_orcid":"https://orcid.org/0000-0003-1654-2798","affiliations":[{"raw_affiliation_string":"School of Mechanical Engineering, Shenyang Jianzhu University, Shenyang, China","institution_ids":["https://openalex.org/I83714178"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101422550","display_name":"Lei Guo","orcid":"https://orcid.org/0000-0002-8134-0474"},"institutions":[{"id":"https://openalex.org/I83714178","display_name":"Shenyang Jianzhu University","ror":"https://ror.org/01zr73v18","country_code":"CN","type":"education","lineage":["https://openalex.org/I83714178"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lei Guo","raw_affiliation_strings":["School of Mechanical Engineering, Shenyang Jianzhu University, Shenyang, China"],"raw_orcid":"https://orcid.org/0000-0002-8134-0474","affiliations":[{"raw_affiliation_string":"School of Mechanical Engineering, Shenyang Jianzhu University, Shenyang, China","institution_ids":["https://openalex.org/I83714178"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043646485","display_name":"Shuai Tan","orcid":"https://orcid.org/0000-0001-9626-7831"},"institutions":[{"id":"https://openalex.org/I143593769","display_name":"East China University of Science and Technology","ror":"https://ror.org/01vyrm377","country_code":"CN","type":"education","lineage":["https://openalex.org/I143593769"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shuai Tan","raw_affiliation_strings":["Key Laboratory of Advanced Control and Optimization for Chemical Processes, Ministry of Education, East China University of Science and Technology, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0001-9626-7831","affiliations":[{"raw_affiliation_string":"Key Laboratory of Advanced Control and Optimization for Chemical Processes, Ministry of Education, East China University of Science and Technology, Shanghai, China","institution_ids":["https://openalex.org/I143593769"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5068289723","display_name":"Xiaotian Bai","orcid":"https://orcid.org/0000-0003-4542-183X"},"institutions":[{"id":"https://openalex.org/I83714178","display_name":"Shenyang Jianzhu University","ror":"https://ror.org/01zr73v18","country_code":"CN","type":"education","lineage":["https://openalex.org/I83714178"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaotian Bai","raw_affiliation_strings":["School of Mechanical Engineering, Shenyang Jianzhu University, Shenyang, China"],"raw_orcid":"https://orcid.org/0000-0003-4542-183X","affiliations":[{"raw_affiliation_string":"School of Mechanical Engineering, Shenyang Jianzhu University, Shenyang, China","institution_ids":["https://openalex.org/I83714178"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5108835582"],"corresponding_institution_ids":["https://openalex.org/I83714178"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":7.9272,"has_fulltext":true,"cited_by_count":77,"citation_normalized_percentile":{"value":0.9791792,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":98,"max":100},"biblio":{"volume":"7","issue":null,"first_page":"171559","last_page":"171569"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9947999715805054,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13891","display_name":"Engineering Diagnostics and Reliability","score":0.9817000031471252,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.7390723824501038},{"id":"https://openalex.org/keywords/bearing","display_name":"Bearing (navigation)","score":0.7018879055976868},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6610705852508545},{"id":"https://openalex.org/keywords/condition-monitoring","display_name":"Condition monitoring","score":0.580768883228302},{"id":"https://openalex.org/keywords/vibration","display_name":"Vibration","score":0.5557401776313782},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5154984593391418},{"id":"https://openalex.org/keywords/sliding-window-protocol","display_name":"Sliding window protocol","score":0.5028557181358337},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.4365687966346741},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.43290793895721436},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.4255702495574951},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.39715567231178284},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2338867485523224},{"id":"https://openalex.org/keywords/window","display_name":"Window (computing)","score":0.1577639877796173},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.08830142021179199}],"concepts":[{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.7390723824501038},{"id":"https://openalex.org/C199978012","wikidata":"https://www.wikidata.org/wiki/Q1273815","display_name":"Bearing (navigation)","level":2,"score":0.7018879055976868},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6610705852508545},{"id":"https://openalex.org/C2775846686","wikidata":"https://www.wikidata.org/wiki/Q643012","display_name":"Condition monitoring","level":2,"score":0.580768883228302},{"id":"https://openalex.org/C198394728","wikidata":"https://www.wikidata.org/wiki/Q3695508","display_name":"Vibration","level":2,"score":0.5557401776313782},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5154984593391418},{"id":"https://openalex.org/C102392041","wikidata":"https://www.wikidata.org/wiki/Q592860","display_name":"Sliding window protocol","level":3,"score":0.5028557181358337},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.4365687966346741},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.43290793895721436},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.4255702495574951},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.39715567231178284},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2338867485523224},{"id":"https://openalex.org/C2778751112","wikidata":"https://www.wikidata.org/wiki/Q835016","display_name":"Window (computing)","level":2,"score":0.1577639877796173},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.08830142021179199},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2019.2954091","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2954091","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08905994.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:45246fbd6bb2464597477e38162fd56d","is_oa":true,"landing_page_url":"https://doaj.org/article/45246fbd6bb2464597477e38162fd56d","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 7, Pp 171559-171569 (2019)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2019.2954091","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2954091","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08905994.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1555332463","display_name":null,"funder_award_id":"2019-ZD-0654","funder_id":"https://openalex.org/F4320323086","funder_display_name":"Natural Science Foundation of Liaoning Province"},{"id":"https://openalex.org/G3319870409","display_name":null,"funder_award_id":"2017YFC0703903","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G5146047154","display_name":null,"funder_award_id":"51705341","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G5818242913","display_name":null,"funder_award_id":"2019-ZD-0654","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G6562944809","display_name":null,"funder_award_id":"51905357","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320323086","display_name":"Natural Science Foundation of Liaoning Province","ror":null}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2990922109.pdf","grobid_xml":"https://content.openalex.org/works/W2990922109.grobid-xml"},"referenced_works_count":22,"referenced_works":["https://openalex.org/W1967116388","https://openalex.org/W2019505419","https://openalex.org/W2047539961","https://openalex.org/W2063922127","https://openalex.org/W2126584714","https://openalex.org/W2158958729","https://openalex.org/W2765691677","https://openalex.org/W2766878080","https://openalex.org/W2791036512","https://openalex.org/W2794455003","https://openalex.org/W2810993408","https://openalex.org/W2899369559","https://openalex.org/W2899879087","https://openalex.org/W2904278575","https://openalex.org/W2920168274","https://openalex.org/W2945648831","https://openalex.org/W2945785843","https://openalex.org/W2953069607","https://openalex.org/W2954127871","https://openalex.org/W2959349511","https://openalex.org/W2969777389","https://openalex.org/W2974562533"],"related_works":["https://openalex.org/W2575656761","https://openalex.org/W2065631063","https://openalex.org/W2378667342","https://openalex.org/W2335478004","https://openalex.org/W2594567802","https://openalex.org/W2363739414","https://openalex.org/W4323520306","https://openalex.org/W1996858460","https://openalex.org/W2142557486","https://openalex.org/W4387386938"],"abstract_inverted_index":{"The":[0,129,167,215],"complete":[1],"failure":[2],"of":[3,61,77,81,137,144,184,204,229],"the":[4,12,17,27,62,78,82,88,92,96,102,106,110,115,135,141,159,176,185,202,205,220,226,230,236],"rolling":[5,63,79,186,231],"bearing":[6,187,232],"is":[7,21,30,85,161,188],"a":[8,35,172],"deterioration":[9,237],"process":[10],"from":[11,87],"initial":[13,37,126,168,227],"minor":[14],"fault":[15,29,38,169],"to":[16,124,139,200],"serious":[18,28],"fault,":[19],"it":[20],"meaningless":[22],"for":[23,246],"guiding":[24],"maintenance":[25,247],"when":[26],"alarmed.":[31],"This":[32],"work":[33],"presents":[34],"novel":[36],"diagnosis":[39],"framework":[40],"based":[41],"on":[42],"sliding":[43,70],"window":[44,71],"stacked":[45],"denoising":[46],"auto-encoder":[47],"(SDAE)":[48],"and":[49,114,158,180,192,208,233,242],"long":[50],"short-term":[51],"memory":[52],"(LSTM)":[53],"model.":[54],"In":[55],"this":[56],"approach,":[57],"multiple":[58,74],"vibration":[59,75],"value":[60,76],"bearings":[64,80],"are":[65,122],"entered":[66],"into":[67],"SDAE":[68,94,138],"by":[69,91,119],"processing.":[72],"Then,":[73],"next":[83,111],"period":[84,98,112],"predicted":[86],"signal":[89],"reconstructed":[90],"trained":[93,120],"in":[95,175],"previous":[97],"using":[99,163],"LSTM.":[100],"For":[101],"given":[103],"input":[104],"data,":[105,145],"reconstruction":[107],"errors":[108],"between":[109,155],"data":[113,117,156],"output":[116],"generated":[118],"LSTM":[121,150],"used":[123],"detect":[125,225],"anomalous":[127],"conditions.":[128],"proposed":[130,206,221],"method":[131,207,222],"not":[132],"only":[133,164],"utilizes":[134],"ability":[136],"learn":[140],"inherent":[142],"distribution":[143],"but":[146],"also":[147],"ensures":[148],"that":[149,219],"can":[151,223],"extract":[152],"timing":[153],"relationships":[154],"cycles,":[157],"model":[160],"built":[162],"normal":[165],"data.":[166],"detection":[170],"as":[171],"key":[173],"difficulty":[174],"operating":[177],"condition":[178],"monitoring":[179],"performance":[181],"degradation":[182],"assessment":[183],"effectively":[189,224],"solved.":[190],"Experimental":[191],"classic":[193],"rotating":[194],"machinery":[195],"datasets":[196],"have":[197,243],"been":[198],"employed":[199],"testify":[201],"effectiveness":[203],"its":[209],"preponderance":[210],"over":[211],"some":[212],"state-of-the-art":[213],"methods.":[214],"experiment":[216],"results":[217],"indicate":[218],"anomalies":[228],"accurately":[234],"describe":[235],"trend":[238],"with":[239],"strong":[240],"robustness,":[241],"high":[244],"significance":[245],"guiding.":[248]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":6},{"year":2024,"cited_by_count":12},{"year":2023,"cited_by_count":10},{"year":2022,"cited_by_count":15},{"year":2021,"cited_by_count":16},{"year":2020,"cited_by_count":16}],"updated_date":"2026-05-06T08:25:59.206177","created_date":"2025-10-10T00:00:00"}