{"id":"https://openalex.org/W2977885583","doi":"https://doi.org/10.1109/access.2019.2945566","title":"A Deconvolution Approach for Degradation Modeling With Measurement Error","display_name":"A Deconvolution Approach for Degradation Modeling With Measurement Error","publication_year":2019,"publication_date":"2019-01-01","ids":{"openalex":"https://openalex.org/W2977885583","doi":"https://doi.org/10.1109/access.2019.2945566","mag":"2977885583"},"language":"en","primary_location":{"id":"doi:10.1109/access.2019.2945566","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2945566","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08859211.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08859211.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5056965099","display_name":"Luis Alberto Rodr\u00edguez\u2010Pic\u00f3n","orcid":"https://orcid.org/0000-0003-2951-2344"},"institutions":[{"id":"https://openalex.org/I114756412","display_name":"Universidad Aut\u00f3noma de Ciudad Ju\u00e1rez","ror":"https://ror.org/05fj8cf83","country_code":"MX","type":"education","lineage":["https://openalex.org/I114756412"]}],"countries":["MX"],"is_corresponding":false,"raw_author_name":"Luis Alberto Rodriguez-Picon","raw_affiliation_strings":["Department of Industrial Engineering and Manufacturing, Autonomous University of Ciudad Ju\u00e1rez, Ciudad Ju\u00e1rez, M\u00e9xico"],"raw_orcid":"https://orcid.org/0000-0003-2951-2344","affiliations":[{"raw_affiliation_string":"Department of Industrial Engineering and Manufacturing, Autonomous University of Ciudad Ju\u00e1rez, Ciudad Ju\u00e1rez, M\u00e9xico","institution_ids":["https://openalex.org/I114756412"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5074540370","display_name":"Luis Asunci\u00f3n P\u00e9rez-Dom\u00ednguez","orcid":"https://orcid.org/0000-0003-2541-4595"},"institutions":[{"id":"https://openalex.org/I114756412","display_name":"Universidad Aut\u00f3noma de Ciudad Ju\u00e1rez","ror":"https://ror.org/05fj8cf83","country_code":"MX","type":"education","lineage":["https://openalex.org/I114756412"]}],"countries":["MX"],"is_corresponding":false,"raw_author_name":"Luis Perez-Dominguez","raw_affiliation_strings":["Department of Industrial Engineering and Manufacturing, Autonomous University of Ciudad Ju\u00e1rez, Ciudad Ju\u00e1rez, M\u00e9xico"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Industrial Engineering and Manufacturing, Autonomous University of Ciudad Ju\u00e1rez, Ciudad Ju\u00e1rez, M\u00e9xico","institution_ids":["https://openalex.org/I114756412"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034521567","display_name":"Jos\u00e9 Mej\u00ad\u00eda","orcid":"https://orcid.org/0000-0002-5832-6623"},"institutions":[{"id":"https://openalex.org/I114756412","display_name":"Universidad Aut\u00f3noma de Ciudad Ju\u00e1rez","ror":"https://ror.org/05fj8cf83","country_code":"MX","type":"education","lineage":["https://openalex.org/I114756412"]}],"countries":["MX"],"is_corresponding":false,"raw_author_name":"Jose Mejia","raw_affiliation_strings":["Department of Electric Engineering and Computation, Autonomous University of Ciudad Ju\u00e1rez, Ciudad Ju\u00e1rez, M\u00e9xico"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electric Engineering and Computation, Autonomous University of Ciudad Ju\u00e1rez, Ciudad Ju\u00e1rez, M\u00e9xico","institution_ids":["https://openalex.org/I114756412"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017643773","display_name":"Iv\u00e1n Juan Carlos P\u00e9rez-Olgu\u00edn","orcid":"https://orcid.org/0000-0003-2445-0500"},"institutions":[{"id":"https://openalex.org/I114756412","display_name":"Universidad Aut\u00f3noma de Ciudad Ju\u00e1rez","ror":"https://ror.org/05fj8cf83","country_code":"MX","type":"education","lineage":["https://openalex.org/I114756412"]}],"countries":["MX"],"is_corresponding":false,"raw_author_name":"Ivan Jc Perez-Olguin","raw_affiliation_strings":["Department of Industrial Engineering and Manufacturing, Autonomous University of Ciudad Ju\u00e1rez, Ciudad Ju\u00e1rez, M\u00e9xico"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Industrial Engineering and Manufacturing, Autonomous University of Ciudad Ju\u00e1rez, Ciudad Ju\u00e1rez, M\u00e9xico","institution_ids":["https://openalex.org/I114756412"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5070465210","display_name":"Manuel Iv\u00e1n Rodr\u00edguez Borb\u00f3n","orcid":"https://orcid.org/0000-0001-8405-4599"},"institutions":[{"id":"https://openalex.org/I114756412","display_name":"Universidad Aut\u00f3noma de Ciudad Ju\u00e1rez","ror":"https://ror.org/05fj8cf83","country_code":"MX","type":"education","lineage":["https://openalex.org/I114756412"]}],"countries":["MX"],"is_corresponding":false,"raw_author_name":"Manuel I. Rodriguez-Borbon","raw_affiliation_strings":["Department of Industrial Engineering and Manufacturing, Autonomous University of Ciudad Ju\u00e1rez, Ciudad Ju\u00e1rez, M\u00e9xico"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Industrial Engineering and Manufacturing, Autonomous University of Ciudad Ju\u00e1rez, Ciudad Ju\u00e1rez, M\u00e9xico","institution_ids":["https://openalex.org/I114756412"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I114756412"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":1.3084,"has_fulltext":true,"cited_by_count":11,"citation_normalized_percentile":{"value":0.79817611,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"7","issue":null,"first_page":"143899","last_page":"143911"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10968","display_name":"Statistical Distribution Estimation and Applications","score":0.9973000288009644,"subfield":{"id":"https://openalex.org/subfields/2613","display_name":"Statistics and Probability"},"field":{"id":"https://openalex.org/fields/26","display_name":"Mathematics"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9884999990463257,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.8862761855125427},{"id":"https://openalex.org/keywords/deconvolution","display_name":"Deconvolution","score":0.7573901414871216},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7128123044967651},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6570786833763123},{"id":"https://openalex.org/keywords/observational-error","display_name":"Observational error","score":0.5961916446685791},{"id":"https://openalex.org/keywords/gaussian","display_name":"Gaussian","score":0.5041769742965698},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.48570284247398376},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.44447600841522217},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.27353063225746155},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.19262757897377014},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.12628036737442017},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.09011250734329224}],"concepts":[{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.8862761855125427},{"id":"https://openalex.org/C174576160","wikidata":"https://www.wikidata.org/wiki/Q1183700","display_name":"Deconvolution","level":2,"score":0.7573901414871216},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7128123044967651},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6570786833763123},{"id":"https://openalex.org/C19619285","wikidata":"https://www.wikidata.org/wiki/Q196372","display_name":"Observational error","level":2,"score":0.5961916446685791},{"id":"https://openalex.org/C163716315","wikidata":"https://www.wikidata.org/wiki/Q901177","display_name":"Gaussian","level":2,"score":0.5041769742965698},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.48570284247398376},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.44447600841522217},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.27353063225746155},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.19262757897377014},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.12628036737442017},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.09011250734329224},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C147597530","wikidata":"https://www.wikidata.org/wiki/Q369472","display_name":"Computational chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2019.2945566","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2945566","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08859211.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:897badf79d4048ba854ead5763898f11","is_oa":true,"landing_page_url":"https://doaj.org/article/897badf79d4048ba854ead5763898f11","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 7, Pp 143899-143911 (2019)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2019.2945566","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2945566","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08859211.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/12","score":0.5799999833106995,"display_name":"Responsible consumption and production"}],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2977885583.pdf","grobid_xml":"https://content.openalex.org/works/W2977885583.grobid-xml"},"referenced_works_count":55,"referenced_works":["https://openalex.org/W31895810","https://openalex.org/W1585926113","https://openalex.org/W1717256175","https://openalex.org/W1965404432","https://openalex.org/W1971248991","https://openalex.org/W1974635664","https://openalex.org/W1979902067","https://openalex.org/W1981460882","https://openalex.org/W1985827874","https://openalex.org/W2003910253","https://openalex.org/W2004988490","https://openalex.org/W2021683013","https://openalex.org/W2023083702","https://openalex.org/W2023344466","https://openalex.org/W2033756468","https://openalex.org/W2044382751","https://openalex.org/W2067266460","https://openalex.org/W2072999804","https://openalex.org/W2103590861","https://openalex.org/W2112935810","https://openalex.org/W2117854664","https://openalex.org/W2126432428","https://openalex.org/W2149193488","https://openalex.org/W2160583089","https://openalex.org/W2168633486","https://openalex.org/W2291320274","https://openalex.org/W2318161113","https://openalex.org/W2345145213","https://openalex.org/W2372094370","https://openalex.org/W2407117566","https://openalex.org/W2416810628","https://openalex.org/W2481932838","https://openalex.org/W2487237297","https://openalex.org/W2512412157","https://openalex.org/W2537417286","https://openalex.org/W2561529988","https://openalex.org/W2593521312","https://openalex.org/W2614102503","https://openalex.org/W2731618922","https://openalex.org/W2737468872","https://openalex.org/W2752760815","https://openalex.org/W2763830668","https://openalex.org/W2773176246","https://openalex.org/W2792099819","https://openalex.org/W2793819418","https://openalex.org/W2804855405","https://openalex.org/W2883566986","https://openalex.org/W2895739853","https://openalex.org/W2926150930","https://openalex.org/W2944956302","https://openalex.org/W3107865356","https://openalex.org/W4250977417","https://openalex.org/W4324114579","https://openalex.org/W6601315320","https://openalex.org/W6708803958"],"related_works":["https://openalex.org/W4251527294","https://openalex.org/W3090782779","https://openalex.org/W4250106855","https://openalex.org/W2037261263","https://openalex.org/W3149087629","https://openalex.org/W4231036715","https://openalex.org/W2032074591","https://openalex.org/W1986156575","https://openalex.org/W1815542355","https://openalex.org/W2152540334"],"abstract_inverted_index":{"Degradation":[0],"trajectories":[1],"over":[2],"time":[3,21,73],"provide":[4],"information":[5],"that":[6,30,98,130,180],"is":[7,34,86,125,128,134,170,191],"important":[8,36,94,200],"for":[9],"the":[10,20,22,39,49,54,65,70,78,83,89,102,106,131,138,142,147,155,164,167,174,181,195,205],"life":[11],"estimation":[12],"of":[13,19,41,67,158,166],"products":[14],"and":[15,109,141,150,198],"systems.":[16],"However,":[17],"most":[18],"degradation":[23,46,55,90,104,108,133,140,157,169],"measurements":[24,52],"are":[25,202],"disturbed":[26],"by":[27,136,172],"different":[28,76],"conditions":[29],"cause":[31],"uncertainty.":[32],"This":[33],"an":[35],"problem":[37],"in":[38,64],"area":[40],"reliability":[42,121,206],"assessment":[43],"based":[44],"on":[45],"data,":[47],"because":[48],"multiple":[50],"observed":[51,71,107,139,156],"characterize":[53],"path,":[56],"which":[57,178],"ends":[58],"defining":[59],"a":[60,116,159,185],"failure":[61,72,80],"time.":[62,81],"Thus,":[63],"presence":[66],"measurement":[68,84,111,123,143,182],"error":[69,85,124,183],"may":[74],"be":[75],"from":[77,105],"true":[79,103,132,168],"As":[82],"inherent":[87],"to":[88,95,100,119,153,193],"testing,":[91],"it":[92],"results":[93],"establish":[96],"models":[97],"allow":[99],"obtain":[101],"some":[110,199],"error.":[112,144],"In":[113],"this":[114],"article,":[115],"modeling":[117],"approach":[118],"assess":[120],"under":[122],"proposed.":[126],"It":[127],"considered":[129,146],"obtained":[135],"deconvoluting":[137],"We":[145],"inverse":[148],"Gaussian":[149,186],"Wiener":[151],"processes":[152],"describe":[154],"particular":[160],"case":[161],"study.":[162],"Then,":[163],"obtaining":[165],"performed":[171],"developing":[173],"proposed":[175,196],"deconvolution":[176],"method":[177],"considers":[179],"follows":[184],"distribution.":[187],"An":[188],"illustrative":[189],"example":[190],"presented":[192],"implement":[194],"modeling,":[197],"insights":[201],"provided":[203],"about":[204],"assessment.":[207]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}