{"id":"https://openalex.org/W2978937131","doi":"https://doi.org/10.1109/access.2019.2945064","title":"A Generic Template Update Framework: The Solution for Intra-Class Variations in Biometric Systems","display_name":"A Generic Template Update Framework: The Solution for Intra-Class Variations in Biometric Systems","publication_year":2019,"publication_date":"2019-01-01","ids":{"openalex":"https://openalex.org/W2978937131","doi":"https://doi.org/10.1109/access.2019.2945064","mag":"2978937131"},"language":"en","primary_location":{"id":"doi:10.1109/access.2019.2945064","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2945064","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08854794.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08854794.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100669154","display_name":"Xi Chen","orcid":"https://orcid.org/0000-0003-1205-2222"},"institutions":[{"id":"https://openalex.org/I184843921","display_name":"Hebei University of Technology","ror":"https://ror.org/018hded08","country_code":"CN","type":"education","lineage":["https://openalex.org/I184843921"]},{"id":"https://openalex.org/I4210162962","display_name":"Beijing Academy of Science and Technology","ror":"https://ror.org/05ct4fn38","country_code":"CN","type":"government","lineage":["https://openalex.org/I4210162962"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xi Chen","raw_affiliation_strings":["School of Electronic and Information Engineering, Hebei University of Technology (HEBUT), Tianjin, China","School of Electronic and Information Engineering, Hebei University of Technology (HEBUT), Tianjin 300401, China","Beijing Institute of New Technology Applications, Beijing Academy of Sciences and Technology, Beijing 100035, China"],"raw_orcid":"https://orcid.org/0000-0003-1205-2222","affiliations":[{"raw_affiliation_string":"School of Electronic and Information Engineering, Hebei University of Technology (HEBUT), Tianjin, China","institution_ids":["https://openalex.org/I184843921"]},{"raw_affiliation_string":"School of Electronic and Information Engineering, Hebei University of Technology (HEBUT), Tianjin 300401, China","institution_ids":["https://openalex.org/I184843921"]},{"raw_affiliation_string":"Beijing Institute of New Technology Applications, Beijing Academy of Sciences and Technology, Beijing 100035, China","institution_ids":["https://openalex.org/I4210162962"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100745191","display_name":"Ming Yu","orcid":"https://orcid.org/0000-0002-6142-2333"},"institutions":[{"id":"https://openalex.org/I184843921","display_name":"Hebei University of Technology","ror":"https://ror.org/018hded08","country_code":"CN","type":"education","lineage":["https://openalex.org/I184843921"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Ming Yu","raw_affiliation_strings":["School of Electronic and Information Engineering, Hebei University of Technology (HEBUT), Tianjin, China","School of Artificial Intelligence, Hebei University of Technology (HEBUT), Tianjin 300130, China","School of Electronic and Information Engineering, Hebei University of Technology (HEBUT), Tianjin 300401, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronic and Information Engineering, Hebei University of Technology (HEBUT), Tianjin, China","institution_ids":["https://openalex.org/I184843921"]},{"raw_affiliation_string":"School of Artificial Intelligence, Hebei University of Technology (HEBUT), Tianjin 300130, China","institution_ids":["https://openalex.org/I184843921"]},{"raw_affiliation_string":"School of Electronic and Information Engineering, Hebei University of Technology (HEBUT), Tianjin 300401, China","institution_ids":["https://openalex.org/I184843921"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101535060","display_name":"Yue Feng","orcid":"https://orcid.org/0000-0003-3494-3448"},"institutions":[{"id":"https://openalex.org/I4210162962","display_name":"Beijing Academy of Science and Technology","ror":"https://ror.org/05ct4fn38","country_code":"CN","type":"government","lineage":["https://openalex.org/I4210162962"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Feng Yue","raw_affiliation_strings":["Beijing Institute of New Technology Applications, Beijing Academy of Sciences and Technology, Beijing, China","Beijing Institute of New Technology Applications, Beijing Academy of Sciences and Technology, Beijing 100035, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Beijing Institute of New Technology Applications, Beijing Academy of Sciences and Technology, Beijing, China","institution_ids":["https://openalex.org/I4210162962"]},{"raw_affiliation_string":"Beijing Institute of New Technology Applications, Beijing Academy of Sciences and Technology, Beijing 100035, China","institution_ids":["https://openalex.org/I4210162962"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100781451","display_name":"Bin Li","orcid":"https://orcid.org/0000-0002-5635-2916"},"institutions":[{"id":"https://openalex.org/I4210162962","display_name":"Beijing Academy of Science and Technology","ror":"https://ror.org/05ct4fn38","country_code":"CN","type":"government","lineage":["https://openalex.org/I4210162962"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Bin Li","raw_affiliation_strings":["Beijing Institute of New Technology Applications, Beijing Academy of Sciences and Technology, Beijing, China","Beijing Institute of New Technology Applications, Beijing Academy of Sciences and Technology, Beijing 100035, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Beijing Institute of New Technology Applications, Beijing Academy of Sciences and Technology, Beijing, China","institution_ids":["https://openalex.org/I4210162962"]},{"raw_affiliation_string":"Beijing Institute of New Technology Applications, Beijing Academy of Sciences and Technology, Beijing 100035, China","institution_ids":["https://openalex.org/I4210162962"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5044290588","display_name":"Yingchun Guo","orcid":"https://orcid.org/0000-0002-3239-3086"},"institutions":[{"id":"https://openalex.org/I184843921","display_name":"Hebei University of Technology","ror":"https://ror.org/018hded08","country_code":"CN","type":"education","lineage":["https://openalex.org/I184843921"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yingchun Guo","raw_affiliation_strings":["School of Artificial Intelligence, Hebei University of Technology (HEBUT), Tianjin, China","School of Artificial Intelligence, Hebei University of Technology (HEBUT), Tianjin 300130, China"],"raw_orcid":"https://orcid.org/0000-0002-3239-3086","affiliations":[{"raw_affiliation_string":"School of Artificial Intelligence, Hebei University of Technology (HEBUT), Tianjin, China","institution_ids":["https://openalex.org/I184843921"]},{"raw_affiliation_string":"School of Artificial Intelligence, Hebei University of Technology (HEBUT), Tianjin 300130, China","institution_ids":["https://openalex.org/I184843921"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5100745191"],"corresponding_institution_ids":["https://openalex.org/I184843921"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.0,"has_fulltext":true,"cited_by_count":1,"citation_normalized_percentile":{"value":0.10698184,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":"7","issue":null,"first_page":"145082","last_page":"145094"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10828","display_name":"Biometric Identification and Security","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1711","display_name":"Signal Processing"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10828","display_name":"Biometric Identification and Security","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1711","display_name":"Signal Processing"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10057","display_name":"Face and Expression Recognition","score":0.9966999888420105,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11448","display_name":"Face recognition and analysis","score":0.9966999888420105,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/template","display_name":"Template","score":0.8639428615570068},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.8256082534790039},{"id":"https://openalex.org/keywords/biometrics","display_name":"Biometrics","score":0.8041269779205322},{"id":"https://openalex.org/keywords/outlier","display_name":"Outlier","score":0.644884467124939},{"id":"https://openalex.org/keywords/selection","display_name":"Selection (genetic algorithm)","score":0.5850064754486084},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.5305980443954468},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.5287206768989563},{"id":"https://openalex.org/keywords/class","display_name":"Class (philosophy)","score":0.514318585395813},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.50975102186203},{"id":"https://openalex.org/keywords/similarity","display_name":"Similarity (geometry)","score":0.4970393478870392},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.4914346933364868},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.34230268001556396},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.14801377058029175}],"concepts":[{"id":"https://openalex.org/C82714645","wikidata":"https://www.wikidata.org/wiki/Q438331","display_name":"Template","level":2,"score":0.8639428615570068},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.8256082534790039},{"id":"https://openalex.org/C184297639","wikidata":"https://www.wikidata.org/wiki/Q177765","display_name":"Biometrics","level":2,"score":0.8041269779205322},{"id":"https://openalex.org/C79337645","wikidata":"https://www.wikidata.org/wiki/Q779824","display_name":"Outlier","level":2,"score":0.644884467124939},{"id":"https://openalex.org/C81917197","wikidata":"https://www.wikidata.org/wiki/Q628760","display_name":"Selection (genetic algorithm)","level":2,"score":0.5850064754486084},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.5305980443954468},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.5287206768989563},{"id":"https://openalex.org/C2777212361","wikidata":"https://www.wikidata.org/wiki/Q5127848","display_name":"Class (philosophy)","level":2,"score":0.514318585395813},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.50975102186203},{"id":"https://openalex.org/C103278499","wikidata":"https://www.wikidata.org/wiki/Q254465","display_name":"Similarity (geometry)","level":3,"score":0.4970393478870392},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.4914346933364868},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.34230268001556396},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.14801377058029175},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2019.2945064","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2945064","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08854794.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:6ce91fe93b0643b6905e701541a2eefe","is_oa":true,"landing_page_url":"https://doaj.org/article/6ce91fe93b0643b6905e701541a2eefe","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 7, Pp 145082-145094 (2019)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2019.2945064","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2945064","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08854794.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G3778656631","display_name":null,"funder_award_id":"F2019202464","funder_id":"https://openalex.org/F4320322163","funder_display_name":"Natural Science Foundation of Hebei Province"},{"id":"https://openalex.org/G5552293935","display_name":null,"funder_award_id":"F2019202381","funder_id":"https://openalex.org/F4320322163","funder_display_name":"Natural Science Foundation of Hebei Province"},{"id":"https://openalex.org/G8367877","display_name":null,"funder_award_id":"201900043","funder_id":"https://openalex.org/F4320326873","funder_display_name":"National Laboratory of Pattern Recognition"},{"id":"https://openalex.org/G8452333611","display_name":null,"funder_award_id":"61806071","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G8951269585","display_name":null,"funder_award_id":"61806071","funder_id":"https://openalex.org/F4320322163","funder_display_name":"Natural Science Foundation of Hebei Province"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320322163","display_name":"Natural Science Foundation of Hebei Province","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320326873","display_name":"National Laboratory of Pattern Recognition","ror":null}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2978937131.pdf","grobid_xml":"https://content.openalex.org/works/W2978937131.grobid-xml"},"referenced_works_count":33,"referenced_works":["https://openalex.org/W1145659577","https://openalex.org/W1545334487","https://openalex.org/W1551955830","https://openalex.org/W1836087331","https://openalex.org/W1976018444","https://openalex.org/W1982801133","https://openalex.org/W1984240240","https://openalex.org/W2003828036","https://openalex.org/W2016387742","https://openalex.org/W2046523908","https://openalex.org/W2050076696","https://openalex.org/W2079728613","https://openalex.org/W2099387610","https://openalex.org/W2134020924","https://openalex.org/W2136576757","https://openalex.org/W2141461916","https://openalex.org/W2155968502","https://openalex.org/W2158754611","https://openalex.org/W2165086579","https://openalex.org/W2165216297","https://openalex.org/W2165835468","https://openalex.org/W2555074224","https://openalex.org/W2566257583","https://openalex.org/W2605024226","https://openalex.org/W2606842801","https://openalex.org/W2618005569","https://openalex.org/W2761556242","https://openalex.org/W2765526141","https://openalex.org/W2781403925","https://openalex.org/W2884114979","https://openalex.org/W4243097765","https://openalex.org/W6682828822","https://openalex.org/W6731240608"],"related_works":["https://openalex.org/W2121300814","https://openalex.org/W2076845124","https://openalex.org/W4231091074","https://openalex.org/W2183964146","https://openalex.org/W2379932303","https://openalex.org/W1886613375","https://openalex.org/W4236081792","https://openalex.org/W4250583430","https://openalex.org/W2095239294","https://openalex.org/W3147744369"],"abstract_inverted_index":{"It":[0,219],"is":[1,40,50,198],"already":[2],"a":[3,41,61,101,131,154,210],"consensus":[4],"that":[5,194],"intra-class":[6,20,65],"variations":[7,21,66],"will":[8],"decline":[9],"the":[10,23,31,48,53,122,159,172,195,206,215,222],"performance":[11,217],"of":[12,34,60,64,92,124,174,224],"biometric":[13,24,45,98,189,232],"systems.":[14],"Many":[15],"studies":[16],"have":[17,29],"explained":[18],"how":[19],"affect":[22],"systems,":[25,47],"while":[26],"few":[27],"approaches":[28],"proposed":[30,79,196],"effective":[32],"solutions":[33],"template":[35,38,82,134,161],"update.":[36],"Since":[37],"update":[39,83,135],"crucial":[42],"procedure":[43],"in":[44],"recognition":[46],"problem":[49],"challenging":[51],"because":[52,109],"newly":[54],"selected":[55,110],"templates":[56,111,149,166],"must":[57],"be":[58],"representative":[59,88,114,148],"large":[62],"amount":[63],"such":[67],"as":[68],"posture":[69],"changes":[70],"and":[71,104,147,151,167,184,204],"lighting":[72],"conditions.":[73],"To":[74,170],"this":[75,127],"end,":[76],"existing":[77,202],"techniques":[78],"to":[80,117,121,141,157,164,214,227],"perform":[81],"by":[84],"periodically":[85],"selecting":[86],"new":[87],"templates.":[89],"However,":[90],"all":[91],"them":[93],"are":[94,106,112],"designed":[95],"for":[96,144,230],"specific":[97],"traits":[99],"rather":[100],"generic":[102,133],"framework,":[103],"they":[105],"either":[107],"ineffective":[108],"less":[113],"or":[115],"prone":[116],"selection":[118,229],"errors":[119],"due":[120],"presence":[123],"outliers.":[125],"In":[126],"paper,":[128],"we":[129,177],"propose":[130,153],"novel":[132,155],"framework.":[136],"We":[137],"use":[138],"pass":[139],"tables":[140],"accumulate":[142],"information":[143],"outlier":[145],"removal":[146],"selection,":[150],"further,":[152],"criterion":[156],"select":[158],"optimal":[160],"set":[162],"according":[163,213],"current":[165],"similarity":[168],"threshold.":[169],"confirm":[171],"effectiveness":[173],"our":[175,225],"method,":[176],"carry":[178],"out":[179],"several":[180],"experiments":[181],"on":[182],"synthetic":[183],"real":[185],"datasets":[186],"from":[187],"different":[188,231],"traits.":[190,233],"The":[191],"results":[192],"show":[193],"method":[197,226],"more":[199],"robust":[200],"than":[201],"ones,":[203],"at":[205],"same":[207],"time,":[208],"achieves":[209],"higher":[211],"accuracy":[212],"specified":[216],"indicator.":[218],"also":[220],"demonstrated":[221],"superiority":[223],"random":[228]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2026-05-06T08:25:59.206177","created_date":"2025-10-10T00:00:00"}