{"id":"https://openalex.org/W2971970558","doi":"https://doi.org/10.1109/access.2019.2939731","title":"A Direct Sinogram Correction Method to Reduce Metal-Related Beam-Hardening in Computed Tomography","display_name":"A Direct Sinogram Correction Method to Reduce Metal-Related Beam-Hardening in Computed Tomography","publication_year":2019,"publication_date":"2019-01-01","ids":{"openalex":"https://openalex.org/W2971970558","doi":"https://doi.org/10.1109/access.2019.2939731","mag":"2971970558"},"language":"en","primary_location":{"id":"doi:10.1109/access.2019.2939731","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2939731","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08825822.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08825822.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101717372","display_name":"Sung Min Lee","orcid":"https://orcid.org/0000-0003-4887-5132"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Sung Min Lee","raw_affiliation_strings":["Department of Computational Science and Engineering, Yonsei University, Seoul, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computational Science and Engineering, Yonsei University, Seoul, South Korea","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084129346","display_name":"Taigyntuya Bayaraa","orcid":"https://orcid.org/0000-0003-2550-1250"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Taigyntuya Bayaraa","raw_affiliation_strings":["Department of Computational Science and Engineering, Yonsei University, Seoul, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computational Science and Engineering, Yonsei University, Seoul, South Korea","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004243580","display_name":"Hosan Jeong","orcid":null},"institutions":[{"id":"https://openalex.org/I4210089444","display_name":"GS Caltex (South Korea)","ror":"https://ror.org/00bvkj141","country_code":"KR","type":"company","lineage":["https://openalex.org/I4210089444"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hosan Jeong","raw_affiliation_strings":["HDXWILL, Seoul, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"HDXWILL, Seoul, South Korea","institution_ids":["https://openalex.org/I4210089444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064970872","display_name":"Chang Min Hyun","orcid":"https://orcid.org/0000-0002-7072-7489"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Chang Min Hyun","raw_affiliation_strings":["Department of Computational Science and Engineering, Yonsei University, Seoul, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computational Science and Engineering, Yonsei University, Seoul, South Korea","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5034037522","display_name":"Jin Keun Seo","orcid":"https://orcid.org/0000-0002-6275-4938"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jin Keun Seo","raw_affiliation_strings":["Department of Computational Science and Engineering, Yonsei University, Seoul, South Korea","ORCiD"],"raw_orcid":"https://orcid.org/0000-0002-6275-4938","affiliations":[{"raw_affiliation_string":"Department of Computational Science and Engineering, Yonsei University, Seoul, South Korea","institution_ids":["https://openalex.org/I193775966"]},{"raw_affiliation_string":"ORCiD","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.3988,"has_fulltext":true,"cited_by_count":14,"citation_normalized_percentile":{"value":0.5996491,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"7","issue":null,"first_page":"128828","last_page":"128836"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12386","display_name":"Advanced X-ray and CT Imaging","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12386","display_name":"Advanced X-ray and CT Imaging","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10844","display_name":"Radiation Dose and Imaging","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2741","display_name":"Radiology, Nuclear Medicine and Imaging"},"field":{"id":"https://openalex.org/fields/27","display_name":"Medicine"},"domain":{"id":"https://openalex.org/domains/4","display_name":"Health Sciences"}},{"id":"https://openalex.org/T10522","display_name":"Medical Imaging Techniques and Applications","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/2741","display_name":"Radiology, Nuclear Medicine and Imaging"},"field":{"id":"https://openalex.org/fields/27","display_name":"Medicine"},"domain":{"id":"https://openalex.org/domains/4","display_name":"Health Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6083057522773743},{"id":"https://openalex.org/keywords/radon-transform","display_name":"Radon transform","score":0.5258883833885193},{"id":"https://openalex.org/keywords/artifact","display_name":"Artifact (error)","score":0.5135562419891357},{"id":"https://openalex.org/keywords/computed-tomography","display_name":"Computed tomography","score":0.4837672710418701},{"id":"https://openalex.org/keywords/segmentation","display_name":"Segmentation","score":0.47910216450691223},{"id":"https://openalex.org/keywords/hardening","display_name":"Hardening (computing)","score":0.47087180614471436},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.43058642745018005},{"id":"https://openalex.org/keywords/cone-beam-computed-tomography","display_name":"Cone beam computed tomography","score":0.43049827218055725},{"id":"https://openalex.org/keywords/beam","display_name":"Beam (structure)","score":0.4258463382720947},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.39286625385284424},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3210717439651489},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3132644295692444},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.28256475925445557},{"id":"https://openalex.org/keywords/radiology","display_name":"Radiology","score":0.22506213188171387},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2107769250869751},{"id":"https://openalex.org/keywords/medicine","display_name":"Medicine","score":0.13183936476707458}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6083057522773743},{"id":"https://openalex.org/C197231052","wikidata":"https://www.wikidata.org/wiki/Q979829","display_name":"Radon transform","level":2,"score":0.5258883833885193},{"id":"https://openalex.org/C2779010991","wikidata":"https://www.wikidata.org/wiki/Q2720909","display_name":"Artifact (error)","level":2,"score":0.5135562419891357},{"id":"https://openalex.org/C544519230","wikidata":"https://www.wikidata.org/wiki/Q32566","display_name":"Computed tomography","level":2,"score":0.4837672710418701},{"id":"https://openalex.org/C89600930","wikidata":"https://www.wikidata.org/wiki/Q1423946","display_name":"Segmentation","level":2,"score":0.47910216450691223},{"id":"https://openalex.org/C44255700","wikidata":"https://www.wikidata.org/wiki/Q978423","display_name":"Hardening (computing)","level":3,"score":0.47087180614471436},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.43058642745018005},{"id":"https://openalex.org/C2779813781","wikidata":"https://www.wikidata.org/wiki/Q1224951","display_name":"Cone beam computed tomography","level":3,"score":0.43049827218055725},{"id":"https://openalex.org/C168834538","wikidata":"https://www.wikidata.org/wiki/Q3705329","display_name":"Beam (structure)","level":2,"score":0.4258463382720947},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.39286625385284424},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3210717439651489},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3132644295692444},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.28256475925445557},{"id":"https://openalex.org/C126838900","wikidata":"https://www.wikidata.org/wiki/Q77604","display_name":"Radiology","level":1,"score":0.22506213188171387},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2107769250869751},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.13183936476707458},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2019.2939731","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2939731","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08825822.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:14ad4aec80cc40ab86dd194d6de1aa8f","is_oa":true,"landing_page_url":"https://doaj.org/article/14ad4aec80cc40ab86dd194d6de1aa8f","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 7, Pp 128828-128836 (2019)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2019.2939731","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2939731","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08825822.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G2793285950","display_name":null,"funder_award_id":"SSTF-BA1402-01","funder_id":"https://openalex.org/F4320328437","funder_display_name":"Samsung Science and Technology Foundation"},{"id":"https://openalex.org/G3083341502","display_name":null,"funder_award_id":"SSTF-BA1402-01","funder_id":"https://openalex.org/F4320332195","funder_display_name":"Samsung"}],"funders":[{"id":"https://openalex.org/F4320328437","display_name":"Samsung Science and Technology Foundation","ror":null},{"id":"https://openalex.org/F4320332195","display_name":"Samsung","ror":"https://ror.org/04w3jy968"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2971970558.pdf","grobid_xml":"https://content.openalex.org/works/W2971970558.grobid-xml"},"referenced_works_count":34,"referenced_works":["https://openalex.org/W385197366","https://openalex.org/W1659720364","https://openalex.org/W1969726300","https://openalex.org/W1972037630","https://openalex.org/W1973203270","https://openalex.org/W1998950435","https://openalex.org/W2001090382","https://openalex.org/W2018076306","https://openalex.org/W2023160828","https://openalex.org/W2040337964","https://openalex.org/W2046867713","https://openalex.org/W2051027617","https://openalex.org/W2054663128","https://openalex.org/W2055134456","https://openalex.org/W2063567835","https://openalex.org/W2079127706","https://openalex.org/W2082621661","https://openalex.org/W2085254266","https://openalex.org/W2098092211","https://openalex.org/W2099844670","https://openalex.org/W2105010462","https://openalex.org/W2115988123","https://openalex.org/W2118736432","https://openalex.org/W2119408205","https://openalex.org/W2119436875","https://openalex.org/W2133471739","https://openalex.org/W2154129661","https://openalex.org/W2154280873","https://openalex.org/W2166018620","https://openalex.org/W2278475848","https://openalex.org/W2334956335","https://openalex.org/W2520526731","https://openalex.org/W2962931988","https://openalex.org/W6677530584"],"related_works":["https://openalex.org/W52840052","https://openalex.org/W3162837891","https://openalex.org/W1687852313","https://openalex.org/W3029243869","https://openalex.org/W2502336004","https://openalex.org/W1741504538","https://openalex.org/W4308623176","https://openalex.org/W4293073787","https://openalex.org/W2768843469","https://openalex.org/W2614950993"],"abstract_inverted_index":{"This":[0,53],"paper":[1,54],"proposes":[2],"a":[3,61,113],"direct":[4,62],"sinogram":[5,41,65,72],"correction":[6,66],"method":[7,63,83,130,146],"that":[8,100,143],"does":[9],"not":[10],"require":[11],"metal":[12],"segmentation":[13],"and":[14,48,59,74,134],"prior":[15],"knowledge":[16],"to":[17,67,85,91],"reduce":[18,68],"metal-related":[19,27],"artifacts":[20],"in":[21,31,131],"polychromatic":[22],"computerized":[23],"tomography":[24],"(CT).":[25],"The":[26,81,140],"artifacts,":[28],"being":[29],"common":[30],"dental":[32,137],"conebeam":[33,138],"CT":[34,79],"images,":[35],"are":[36,121],"caused":[37],"by":[38],"beam":[39,118],"hardening-induced":[40],"inconsistency":[42],"associated":[43],"with":[44,107,111],"complicated":[45],"metal-bone-tissue":[46],"interactions":[47],"other":[49],"factors":[50,58],"including":[51],"scattering.":[52],"carefully":[55],"analyzed":[56],"artifact-causing":[57],"developed":[60],"for":[64,78],"the":[69,75,87,92,96,101,108,125,128,144],"mismatch":[70],"between":[71],"data":[73,90,116],"mathematical":[76,102],"model":[77,103],"reconstruction.":[80],"proposed":[82,129,145],"attempts":[84],"project":[86],"beam-hardening":[88,149],"affected":[89],"range":[93],"space":[94],"of":[95,115,127],"Radon":[97],"transform":[98],"so":[99],"is":[104],"more":[105],"consistent":[106],"corrected":[109],"data,":[110],"keeping":[112],"part":[114],"where":[117],"hardening":[119],"effects":[120],"small.":[122],"We":[123],"tested":[124],"performance":[126],"numerical":[132],"simulations":[133],"experiments":[135],"using":[136],"CT.":[139],"results":[141],"demonstrate":[142],"successfully":[147],"reduces":[148],"artifacts.":[150]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":4},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":2}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}