{"id":"https://openalex.org/W2971923874","doi":"https://doi.org/10.1109/access.2019.2939262","title":"Effective Defect Features Extraction for Laser Ultrasonic Signal Processing by Using Time\u2013Frequency Analysis","display_name":"Effective Defect Features Extraction for Laser Ultrasonic Signal Processing by Using Time\u2013Frequency Analysis","publication_year":2019,"publication_date":"2019-01-01","ids":{"openalex":"https://openalex.org/W2971923874","doi":"https://doi.org/10.1109/access.2019.2939262","mag":"2971923874"},"language":"en","primary_location":{"id":"doi:10.1109/access.2019.2939262","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2939262","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08822956.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08822956.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5003734998","display_name":"Zhenyu Zhu","orcid":"https://orcid.org/0000-0002-4594-8802"},"institutions":[{"id":"https://openalex.org/I4800084","display_name":"Southwest Jiaotong University","ror":"https://ror.org/00hn7w693","country_code":"CN","type":"education","lineage":["https://openalex.org/I4800084"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhenyu Zhu","raw_affiliation_strings":["School of Physical Science and Technology, Southwest Jiaotong University, Chengdu, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Physical Science and Technology, Southwest Jiaotong University, Chengdu, China","institution_ids":["https://openalex.org/I4800084"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013870657","display_name":"Hao Sui","orcid":"https://orcid.org/0000-0002-3681-9750"},"institutions":[{"id":"https://openalex.org/I4800084","display_name":"Southwest Jiaotong University","ror":"https://ror.org/00hn7w693","country_code":"CN","type":"education","lineage":["https://openalex.org/I4800084"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hao Sui","raw_affiliation_strings":["School of Physical Science and Technology, Southwest Jiaotong University, Chengdu, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Physical Science and Technology, Southwest Jiaotong University, Chengdu, China","institution_ids":["https://openalex.org/I4800084"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024343767","display_name":"Yu Lei","orcid":"https://orcid.org/0000-0001-5023-927X"},"institutions":[{"id":"https://openalex.org/I4800084","display_name":"Southwest Jiaotong University","ror":"https://ror.org/00hn7w693","country_code":"CN","type":"education","lineage":["https://openalex.org/I4800084"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lei Yu","raw_affiliation_strings":["School of Physical Science and Technology, Southwest Jiaotong University, Chengdu, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Physical Science and Technology, Southwest Jiaotong University, Chengdu, China","institution_ids":["https://openalex.org/I4800084"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083543471","display_name":"Hongna Zhu","orcid":"https://orcid.org/0000-0001-5046-5701"},"institutions":[{"id":"https://openalex.org/I4800084","display_name":"Southwest Jiaotong University","ror":"https://ror.org/00hn7w693","country_code":"CN","type":"education","lineage":["https://openalex.org/I4800084"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hongna Zhu","raw_affiliation_strings":["School of Physical Science and Technology, Southwest Jiaotong University, Chengdu, China"],"raw_orcid":"https://orcid.org/0000-0001-5046-5701","affiliations":[{"raw_affiliation_string":"School of Physical Science and Technology, Southwest Jiaotong University, Chengdu, China","institution_ids":["https://openalex.org/I4800084"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100706289","display_name":"Jinli Zhang","orcid":"https://orcid.org/0000-0001-5805-3824"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Jinli Zhang","raw_affiliation_strings":["National Key Laboratory of Science and Technology on Blind Signal Processing, Chengdu, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Key Laboratory of Science and Technology on Blind Signal Processing, Chengdu, China","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5041788515","display_name":"Jianping Peng","orcid":"https://orcid.org/0000-0003-3742-5371"},"institutions":[{"id":"https://openalex.org/I4800084","display_name":"Southwest Jiaotong University","ror":"https://ror.org/00hn7w693","country_code":"CN","type":"education","lineage":["https://openalex.org/I4800084"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jianping Peng","raw_affiliation_strings":["School of Physical Science and Technology, Southwest Jiaotong University, Chengdu, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Physical Science and Technology, Southwest Jiaotong University, Chengdu, China","institution_ids":["https://openalex.org/I4800084"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.5494,"has_fulltext":true,"cited_by_count":12,"citation_normalized_percentile":{"value":0.63172628,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"7","issue":null,"first_page":"128706","last_page":"128713"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10662","display_name":"Ultrasonics and Acoustic Wave Propagation","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10662","display_name":"Ultrasonics and Acoustic Wave Propagation","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11609","display_name":"Geophysical Methods and Applications","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/2212","display_name":"Ocean Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11698","display_name":"Underwater Acoustics Research","score":0.9968000054359436,"subfield":{"id":"https://openalex.org/subfields/1910","display_name":"Oceanography"},"field":{"id":"https://openalex.org/fields/19","display_name":"Earth and Planetary Sciences"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/ultrasonic-sensor","display_name":"Ultrasonic sensor","score":0.7180312871932983},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.6843150854110718},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.6271496415138245},{"id":"https://openalex.org/keywords/signal-processing","display_name":"Signal processing","score":0.5993323922157288},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5342969298362732},{"id":"https://openalex.org/keywords/wavelet-transform","display_name":"Wavelet transform","score":0.48246389627456665},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.4663245975971222},{"id":"https://openalex.org/keywords/wavelet","display_name":"Wavelet","score":0.43934866786003113},{"id":"https://openalex.org/keywords/signal-to-noise-ratio","display_name":"Signal-to-noise ratio (imaging)","score":0.4349466562271118},{"id":"https://openalex.org/keywords/ultrasonic-testing","display_name":"Ultrasonic testing","score":0.42515742778778076},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.41864073276519775},{"id":"https://openalex.org/keywords/time\u2013frequency-analysis","display_name":"Time\u2013frequency analysis","score":0.4156479835510254},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.21664759516716003},{"id":"https://openalex.org/keywords/digital-signal-processing","display_name":"Digital signal processing","score":0.18652880191802979},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.12443780899047852},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.09802126884460449},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.08613628149032593},{"id":"https://openalex.org/keywords/filter","display_name":"Filter (signal processing)","score":0.0858229398727417},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.0661473274230957}],"concepts":[{"id":"https://openalex.org/C81288441","wikidata":"https://www.wikidata.org/wiki/Q20736125","display_name":"Ultrasonic sensor","level":2,"score":0.7180312871932983},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.6843150854110718},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.6271496415138245},{"id":"https://openalex.org/C104267543","wikidata":"https://www.wikidata.org/wiki/Q208163","display_name":"Signal processing","level":3,"score":0.5993323922157288},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5342969298362732},{"id":"https://openalex.org/C196216189","wikidata":"https://www.wikidata.org/wiki/Q2867","display_name":"Wavelet transform","level":3,"score":0.48246389627456665},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.4663245975971222},{"id":"https://openalex.org/C47432892","wikidata":"https://www.wikidata.org/wiki/Q831390","display_name":"Wavelet","level":2,"score":0.43934866786003113},{"id":"https://openalex.org/C13944312","wikidata":"https://www.wikidata.org/wiki/Q7512748","display_name":"Signal-to-noise ratio (imaging)","level":2,"score":0.4349466562271118},{"id":"https://openalex.org/C139730468","wikidata":"https://www.wikidata.org/wiki/Q1779355","display_name":"Ultrasonic testing","level":3,"score":0.42515742778778076},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.41864073276519775},{"id":"https://openalex.org/C142433447","wikidata":"https://www.wikidata.org/wiki/Q7806653","display_name":"Time\u2013frequency analysis","level":3,"score":0.4156479835510254},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.21664759516716003},{"id":"https://openalex.org/C84462506","wikidata":"https://www.wikidata.org/wiki/Q173142","display_name":"Digital signal processing","level":2,"score":0.18652880191802979},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.12443780899047852},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.09802126884460449},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.08613628149032593},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.0858229398727417},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0661473274230957},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2019.2939262","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2939262","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08822956.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:f7bdf3cf5b014a23b8ea399bacde41e2","is_oa":true,"landing_page_url":"https://doaj.org/article/f7bdf3cf5b014a23b8ea399bacde41e2","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 7, Pp 128706-128713 (2019)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2019.2939262","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2939262","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08822956.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1544763675","display_name":null,"funder_award_id":"61771409","funder_id":"https://openalex.org/F4320335787","funder_display_name":"Fundamental Research Funds for the Central Universities"},{"id":"https://openalex.org/G5037281780","display_name":null,"funder_award_id":"2682019LK08","funder_id":"https://openalex.org/F4320335787","funder_display_name":"Fundamental Research Funds for the Central Universities"},{"id":"https://openalex.org/G6620286987","display_name":null,"funder_award_id":"2682018GF10","funder_id":"https://openalex.org/F4320335787","funder_display_name":"Fundamental Research Funds for the Central Universities"},{"id":"https://openalex.org/G7837895879","display_name":"\u8f6e\u8f68\u75b2\u52b3\u88c2\u7eb9\u7684\u6da1\u6d41\u8109\u51b2\u70ed\u54cd\u5e94\u673a\u7406\u4e0e\u91cf\u5316\u68c0\u6d4b\u7814\u7a76","funder_award_id":"61771409","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G8469320225","display_name":"\u91c7\u7528\u5149\u6ce2\u8c03\u63a7\u673a\u5236\u7684\u5149\u7ea4\u53c2\u91cf\u653e\u5927\u7684\u589e\u76ca\u548c\u566a\u58f0\u7279\u6027\u7814\u7a76","funder_award_id":"61405167","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320335787","display_name":"Fundamental Research Funds for the Central Universities","ror":null}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2971923874.pdf","grobid_xml":"https://content.openalex.org/works/W2971923874.grobid-xml"},"referenced_works_count":31,"referenced_works":["https://openalex.org/W607641688","https://openalex.org/W1975538539","https://openalex.org/W1996021349","https://openalex.org/W2026686460","https://openalex.org/W2030441466","https://openalex.org/W2049588903","https://openalex.org/W2057085895","https://openalex.org/W2079339566","https://openalex.org/W2081479833","https://openalex.org/W2087625515","https://openalex.org/W2106822551","https://openalex.org/W2294128447","https://openalex.org/W2485898808","https://openalex.org/W2515857465","https://openalex.org/W2559402343","https://openalex.org/W2621245595","https://openalex.org/W2737248315","https://openalex.org/W2753536079","https://openalex.org/W2759796772","https://openalex.org/W2766819698","https://openalex.org/W2789440825","https://openalex.org/W2803612348","https://openalex.org/W2890156323","https://openalex.org/W2903712458","https://openalex.org/W2914157696","https://openalex.org/W2922815521","https://openalex.org/W2924553256","https://openalex.org/W2924700584","https://openalex.org/W2931331224","https://openalex.org/W4252006677","https://openalex.org/W4298354537"],"related_works":["https://openalex.org/W3013429970","https://openalex.org/W2113173936","https://openalex.org/W1947057263","https://openalex.org/W2968070941","https://openalex.org/W2028898054","https://openalex.org/W2560154230","https://openalex.org/W2535713557","https://openalex.org/W2595784504","https://openalex.org/W3175525782","https://openalex.org/W2905220255"],"abstract_inverted_index":{"The":[0,26,61,123],"time-frequency":[1],"analysis":[2],"(TFA)":[3],"by":[4,64,121,144],"wavelet":[5],"transform":[6],"is":[7,24,28,70,91,104,150],"adopted":[8,29],"for":[9,125,153],"the":[10,16,21,33,42,45,54,85,101,127,137,141,154],"laser":[11,128],"ultrasonic":[12,129,155],"signal":[13,39,130,156],"processing,":[14],"and":[15,84,158],"effective":[17],"features":[18,48],"extraction":[19],"of":[20,56,109,119],"material":[22,159],"defect":[23,43,80,86,110,138],"obtained.":[25],"TFA":[27,90,124],"here":[30],"to":[31,115,135],"analyze":[32],"laser-generated":[34],"surface":[35,79],"acoustic":[36],"wave":[37,47],"(SAW)":[38],"which":[40,149],"contains":[41],"features,":[44],"echo":[46,102],"are":[49],"extracted":[50,105],"significantly,":[51],"especially":[52],"under":[53],"condition":[55],"low":[57],"signal-to-noise":[58],"rate":[59],"(SNR).":[60],"simulation":[62],"model":[63],"using":[65],"finite":[66],"element":[67],"method":[68],"(FEM)":[69],"set":[71],"up":[72],"in":[73,82,107,146],"an":[74],"aluminum":[75],"plate":[76],"with":[77,89,140],"different":[78],"depths":[81,87,111],"detail,":[83],"prediction":[88],"also":[92],"considered.":[93],"It":[94],"shows":[95],"that,":[96],"without":[97],"extra":[98],"denoising":[99],"process,":[100],"SAW":[103],"significantly":[106],"case":[108],"ranging":[112],"from":[113],"0.1mm":[114],"0.9mm":[116],"at":[117],"SNR":[118],"-3dB":[120],"TFA.":[122],"processing":[126,157],"provides":[131],"a":[132],"promising":[133],"way":[134],"get":[136],"information,":[139],"accuracy":[142],"increased":[143],"7.9dB":[145],"this":[147],"work,":[148],"extremely":[151],"meaningful":[152],"evaluation.":[160]},"counts_by_year":[{"year":2026,"cited_by_count":3},{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":3},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":2}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2019-09-12T00:00:00"}