{"id":"https://openalex.org/W2971536724","doi":"https://doi.org/10.1109/access.2019.2939163","title":"Recursive-CPLS-Based Quality-Relevant and Process-Relevant Fault Monitoring With Application to the Tennessee Eastman Process","display_name":"Recursive-CPLS-Based Quality-Relevant and Process-Relevant Fault Monitoring With Application to the Tennessee Eastman Process","publication_year":2019,"publication_date":"2019-01-01","ids":{"openalex":"https://openalex.org/W2971536724","doi":"https://doi.org/10.1109/access.2019.2939163","mag":"2971536724"},"language":"en","primary_location":{"id":"doi:10.1109/access.2019.2939163","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2939163","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08824081.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08824081.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5057912398","display_name":"Changhua Hu","orcid":"https://orcid.org/0000-0002-1545-9100"},"institutions":[{"id":"https://openalex.org/I4210130660","display_name":"Xi'an High Tech University","ror":"https://ror.org/03vt7za95","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210130660"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Changhua Hu","raw_affiliation_strings":["Xi\u2019an Research Institute of High Technology, Xi\u2019an, China","Xi'an Research Institute of High Technology, Xi'an, China"],"affiliations":[{"raw_affiliation_string":"Xi\u2019an Research Institute of High Technology, Xi\u2019an, China","institution_ids":["https://openalex.org/I4210130660"]},{"raw_affiliation_string":"Xi'an Research Institute of High Technology, Xi'an, China","institution_ids":["https://openalex.org/I4210130660"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100548042","display_name":"Zhongying Xu","orcid":null},"institutions":[{"id":"https://openalex.org/I4210130660","display_name":"Xi'an High Tech University","ror":"https://ror.org/03vt7za95","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210130660"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhongying Xu","raw_affiliation_strings":["Xi\u2019an Research Institute of High Technology, Xi\u2019an, China","Xi'an Research Institute of High Technology, Xi'an, China"],"affiliations":[{"raw_affiliation_string":"Xi\u2019an Research Institute of High Technology, Xi\u2019an, China","institution_ids":["https://openalex.org/I4210130660"]},{"raw_affiliation_string":"Xi'an Research Institute of High Technology, Xi'an, China","institution_ids":["https://openalex.org/I4210130660"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033624629","display_name":"Xiangyu Kong","orcid":"https://orcid.org/0000-0003-2084-7826"},"institutions":[{"id":"https://openalex.org/I4210130660","display_name":"Xi'an High Tech University","ror":"https://ror.org/03vt7za95","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210130660"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiangyu Kong","raw_affiliation_strings":["Xi\u2019an Research Institute of High Technology, Xi\u2019an, China","Xi'an Research Institute of High Technology, Xi'an, China"],"affiliations":[{"raw_affiliation_string":"Xi\u2019an Research Institute of High Technology, Xi\u2019an, China","institution_ids":["https://openalex.org/I4210130660"]},{"raw_affiliation_string":"Xi'an Research Institute of High Technology, Xi'an, China","institution_ids":["https://openalex.org/I4210130660"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5011262638","display_name":"Jiayu Luo","orcid":"https://orcid.org/0000-0003-3453-2286"},"institutions":[{"id":"https://openalex.org/I4210130660","display_name":"Xi'an High Tech University","ror":"https://ror.org/03vt7za95","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210130660"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiayu Luo","raw_affiliation_strings":["Xi\u2019an Research Institute of High Technology, Xi\u2019an, China","Xi'an Research Institute of High Technology, Xi'an, China"],"affiliations":[{"raw_affiliation_string":"Xi\u2019an Research Institute of High Technology, Xi\u2019an, China","institution_ids":["https://openalex.org/I4210130660"]},{"raw_affiliation_string":"Xi'an Research Institute of High Technology, Xi'an, China","institution_ids":["https://openalex.org/I4210130660"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5057912398"],"corresponding_institution_ids":["https://openalex.org/I4210130660"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":2.184,"has_fulltext":true,"cited_by_count":24,"citation_normalized_percentile":{"value":0.88029099,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":95,"max":98},"biblio":{"volume":"7","issue":null,"first_page":"128746","last_page":"128757"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10640","display_name":"Spectroscopy and Chemometric Analyses","score":0.9923999905586243,"subfield":{"id":"https://openalex.org/subfields/1602","display_name":"Analytical Chemistry"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12282","display_name":"Mineral Processing and Grinding","score":0.991100013256073,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.785315215587616},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.7155672311782837},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.656238853931427},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5841078758239746},{"id":"https://openalex.org/keywords/projection","display_name":"Projection (relational algebra)","score":0.5311371684074402},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.5209837555885315},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.47650638222694397},{"id":"https://openalex.org/keywords/filter","display_name":"Filter (signal processing)","score":0.44863998889923096},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.44317254424095154},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.37283116579055786},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.35213348269462585},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.22057616710662842},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.1257670819759369}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.785315215587616},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.7155672311782837},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.656238853931427},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5841078758239746},{"id":"https://openalex.org/C57493831","wikidata":"https://www.wikidata.org/wiki/Q3134666","display_name":"Projection (relational algebra)","level":2,"score":0.5311371684074402},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.5209837555885315},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.47650638222694397},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.44863998889923096},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.44317254424095154},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.37283116579055786},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.35213348269462585},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.22057616710662842},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.1257670819759369},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2019.2939163","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2939163","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08824081.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:29e914aee93546adab9075742827e82d","is_oa":true,"landing_page_url":"https://doaj.org/article/29e914aee93546adab9075742827e82d","pdf_url":null,"source":{"id":"https://openalex.org/S112646816","display_name":"SHILAP Revista de lepidopterolog\u00eda","issn_l":"0300-5267","issn":["0300-5267","2340-4078"],"is_oa":true,"is_in_doaj":true,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 7, Pp 128746-128757 (2019)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2019.2939163","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2939163","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08824081.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","score":0.5400000214576721,"id":"https://metadata.un.org/sdg/9"}],"awards":[{"id":"https://openalex.org/G1023919524","display_name":null,"funder_award_id":", Grant","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G1231421488","display_name":null,"funder_award_id":"under","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G2087396116","display_name":null,"funder_award_id":"China","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G3317480652","display_name":null,"funder_award_id":"Science","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G391238517","display_name":null,"funder_award_id":", and","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G417141083","display_name":null,"funder_award_id":"61903375","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G5504500574","display_name":null,"funder_award_id":"61673387","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G5994120800","display_name":null,"funder_award_id":"Natural","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G7535277257","display_name":null,"funder_award_id":"61833016","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G8178734928","display_name":null,"funder_award_id":"61374120","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2971536724.pdf","grobid_xml":"https://content.openalex.org/works/W2971536724.grobid-xml"},"referenced_works_count":31,"referenced_works":["https://openalex.org/W1966863755","https://openalex.org/W1979357005","https://openalex.org/W1984672166","https://openalex.org/W2004186751","https://openalex.org/W2009933590","https://openalex.org/W2018201690","https://openalex.org/W2039839604","https://openalex.org/W2050274333","https://openalex.org/W2052184177","https://openalex.org/W2079013017","https://openalex.org/W2079577972","https://openalex.org/W2094172110","https://openalex.org/W2103711750","https://openalex.org/W2123649031","https://openalex.org/W2128921897","https://openalex.org/W2147062914","https://openalex.org/W2158958729","https://openalex.org/W2322097696","https://openalex.org/W2399774368","https://openalex.org/W2431033487","https://openalex.org/W2544577786","https://openalex.org/W2550337237","https://openalex.org/W2620633022","https://openalex.org/W2757109865","https://openalex.org/W2759373267","https://openalex.org/W2765130047","https://openalex.org/W2792372184","https://openalex.org/W2794298192","https://openalex.org/W2889017122","https://openalex.org/W2895250764","https://openalex.org/W6688540871"],"related_works":["https://openalex.org/W86946229","https://openalex.org/W3009843762","https://openalex.org/W2054360660","https://openalex.org/W1998491546","https://openalex.org/W2913439950","https://openalex.org/W3097589262","https://openalex.org/W2127402788","https://openalex.org/W2351452215","https://openalex.org/W2617963432","https://openalex.org/W2078455782"],"abstract_inverted_index":{"In":[0,24],"industrial":[1],"processes,":[2],"the":[3,6,31,41,114,123,127,133,141,151,170,175],"quality":[4],"of":[5,96,122,140,150,156],"product":[7],"is":[8,100,144,160],"crucial.":[9],"The":[10,118,138,162],"batch":[11],"partial":[12],"least":[13],"squares":[14],"(PLS)":[15],"monitoring":[16,32,42,79,98,116,176],"model":[17,33,43,69,125,129],"can":[18,61,82,104,167],"effectively":[19],"monitor":[20],"for":[21],"quality-related":[22,77,152],"faults.":[23],"process":[25,97,136],"monitoring,":[26],"to":[27,35,55,86],"overcome":[28],"time-varying":[29],"disturbances,":[30],"needs":[34],"be":[36],"updated":[37,119],"regularly.":[38],"Efficiently":[39],"updating":[40],"represents":[44],"a":[45,51,93,147],"serious":[46],"problem.":[47],"This":[48],"paper":[49],"proposes":[50],"recursive":[52],"concurrent":[53,84],"projection":[54,85],"latent":[56,87],"structures":[57,88],"(RCPLS)":[58],"algorithm,":[59],"which":[60],"both":[62],"update":[63,113],"models":[64],"more":[65],"efficiently":[66],"with":[67],"historical":[68],"parameters":[70],"and":[71,74,107,111,126,146,158,173],"new":[72],"data":[73,110],"provide":[75],"better":[76],"fault":[78,153],"results":[80,163],"than":[81],"static":[83],"(CPLS).":[89],"Based":[90],"on":[91],"RCPLS,":[92],"complete":[94],"set":[95],"technologies":[99,103],"proposed.":[101],"These":[102],"automatically":[105],"filter":[106],"store":[108],"modellable":[109],"adaptively":[112],"online":[115],"model.":[117],"computational":[120,171],"quantities":[121],"RCPLS":[124,142,157,166],"CPLS":[128,159],"are":[130],"compared":[131],"through":[132],"Tennessee":[134],"Eastman":[135],"(TEP).":[137],"effectiveness":[139],"algorithm":[143],"verified,":[145],"comprehensive":[148],"comparison":[149],"detection":[154],"capabilities":[155],"performed.":[161],"show":[164],"that":[165],"significantly":[168],"reduce":[169],"burden":[172],"increase":[174],"performance.":[177]},"counts_by_year":[{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":4},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":6}],"updated_date":"2026-03-18T14:38:29.013473","created_date":"2025-10-10T00:00:00"}