{"id":"https://openalex.org/W2970865410","doi":"https://doi.org/10.1109/access.2019.2937838","title":"Data Simulation by Resampling\u2014A Practical Data Augmentation Algorithm for Periodical Signal Analysis-Based Fault Diagnosis","display_name":"Data Simulation by Resampling\u2014A Practical Data Augmentation Algorithm for Periodical Signal Analysis-Based Fault Diagnosis","publication_year":2019,"publication_date":"2019-01-01","ids":{"openalex":"https://openalex.org/W2970865410","doi":"https://doi.org/10.1109/access.2019.2937838","mag":"2970865410"},"language":"en","primary_location":{"id":"doi:10.1109/access.2019.2937838","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2937838","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08815712.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08815712.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5050342030","display_name":"Tianhao Hu","orcid":"https://orcid.org/0000-0003-0670-6744"},"institutions":[{"id":"https://openalex.org/I116953780","display_name":"Tongji University","ror":"https://ror.org/03rc6as71","country_code":"CN","type":"education","lineage":["https://openalex.org/I116953780"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Tianhao Hu","raw_affiliation_strings":["School of Mechanical Engineering, Tongji University, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0003-0670-6744","affiliations":[{"raw_affiliation_string":"School of Mechanical Engineering, Tongji University, Shanghai, China","institution_ids":["https://openalex.org/I116953780"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008036335","display_name":"Tang Tang","orcid":"https://orcid.org/0000-0002-6504-4296"},"institutions":[{"id":"https://openalex.org/I116953780","display_name":"Tongji University","ror":"https://ror.org/03rc6as71","country_code":"CN","type":"education","lineage":["https://openalex.org/I116953780"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Tang Tang","raw_affiliation_strings":["School of Mechanical Engineering, Tongji University, Shanghai, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Mechanical Engineering, Tongji University, Shanghai, China","institution_ids":["https://openalex.org/I116953780"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100423284","display_name":"Ming Chen","orcid":"https://orcid.org/0000-0002-7593-1411"},"institutions":[{"id":"https://openalex.org/I116953780","display_name":"Tongji University","ror":"https://ror.org/03rc6as71","country_code":"CN","type":"education","lineage":["https://openalex.org/I116953780"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ming Chen","raw_affiliation_strings":["School of Mechanical Engineering, Tongji University, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0002-7593-1411","affiliations":[{"raw_affiliation_string":"School of Mechanical Engineering, Tongji University, Shanghai, China","institution_ids":["https://openalex.org/I116953780"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5050342030"],"corresponding_institution_ids":["https://openalex.org/I116953780"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":3.0359,"has_fulltext":true,"cited_by_count":30,"citation_normalized_percentile":{"value":0.91631044,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":"7","issue":null,"first_page":"125133","last_page":"125145"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9869999885559082,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/resampling","display_name":"Resampling","score":0.8383374214172363},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7150459885597229},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.6692041754722595},{"id":"https://openalex.org/keywords/generalization","display_name":"Generalization","score":0.651381254196167},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.6416664123535156},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.51346355676651},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.4806046187877655},{"id":"https://openalex.org/keywords/data-set","display_name":"Data set","score":0.47442880272865295},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.4661473035812378},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.44390809535980225},{"id":"https://openalex.org/keywords/domain","display_name":"Domain (mathematical analysis)","score":0.43914008140563965},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.1486055850982666}],"concepts":[{"id":"https://openalex.org/C150921843","wikidata":"https://www.wikidata.org/wiki/Q1170431","display_name":"Resampling","level":2,"score":0.8383374214172363},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7150459885597229},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6692041754722595},{"id":"https://openalex.org/C177148314","wikidata":"https://www.wikidata.org/wiki/Q170084","display_name":"Generalization","level":2,"score":0.651381254196167},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.6416664123535156},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.51346355676651},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.4806046187877655},{"id":"https://openalex.org/C58489278","wikidata":"https://www.wikidata.org/wiki/Q1172284","display_name":"Data set","level":2,"score":0.47442880272865295},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.4661473035812378},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.44390809535980225},{"id":"https://openalex.org/C36503486","wikidata":"https://www.wikidata.org/wiki/Q11235244","display_name":"Domain (mathematical analysis)","level":2,"score":0.43914008140563965},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.1486055850982666},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2019.2937838","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2937838","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08815712.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:d7191c23c25446fd80fe7eae6a91cf9d","is_oa":true,"landing_page_url":"https://doaj.org/article/d7191c23c25446fd80fe7eae6a91cf9d","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 7, Pp 125133-125145 (2019)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2019.2937838","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2937838","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08815712.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure","score":0.4099999964237213}],"awards":[{"id":"https://openalex.org/G7996298390","display_name":null,"funder_award_id":"2016KJ020","funder_id":"https://openalex.org/F4320322449","funder_display_name":"Tongji University"}],"funders":[{"id":"https://openalex.org/F4320322449","display_name":"Tongji University","ror":"https://ror.org/03rc6as71"},{"id":"https://openalex.org/F4320323970","display_name":"Ministry of Industry and Information Technology of the People's Republic of China","ror":"https://ror.org/0385nmy68"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2970865410.pdf","grobid_xml":"https://content.openalex.org/works/W2970865410.grobid-xml"},"referenced_works_count":55,"referenced_works":["https://openalex.org/W1522301498","https://openalex.org/W1597576211","https://openalex.org/W1673923490","https://openalex.org/W1922655562","https://openalex.org/W1970633430","https://openalex.org/W1974543974","https://openalex.org/W2004436946","https://openalex.org/W2030323860","https://openalex.org/W2057689599","https://openalex.org/W2093598546","https://openalex.org/W2096943734","https://openalex.org/W2112796928","https://openalex.org/W2115403315","https://openalex.org/W2151239833","https://openalex.org/W2183341477","https://openalex.org/W2193413348","https://openalex.org/W2219903032","https://openalex.org/W2305225441","https://openalex.org/W2324044936","https://openalex.org/W2404692435","https://openalex.org/W2546537777","https://openalex.org/W2556013418","https://openalex.org/W2584994008","https://openalex.org/W2590288147","https://openalex.org/W2592902783","https://openalex.org/W2594265129","https://openalex.org/W2619304139","https://openalex.org/W2622350774","https://openalex.org/W2692693673","https://openalex.org/W2736470268","https://openalex.org/W2737897717","https://openalex.org/W2744790985","https://openalex.org/W2747685395","https://openalex.org/W2765284480","https://openalex.org/W2765407302","https://openalex.org/W2768753204","https://openalex.org/W2782812883","https://openalex.org/W2784141614","https://openalex.org/W2794869810","https://openalex.org/W2824874042","https://openalex.org/W2827159893","https://openalex.org/W2885608462","https://openalex.org/W3137695714","https://openalex.org/W4234674466","https://openalex.org/W4297798436","https://openalex.org/W6631190155","https://openalex.org/W6637162671","https://openalex.org/W6640090968","https://openalex.org/W6682208247","https://openalex.org/W6686164453","https://openalex.org/W6687566353","https://openalex.org/W6732696085","https://openalex.org/W6743440100","https://openalex.org/W6745136726","https://openalex.org/W6763485134"],"related_works":["https://openalex.org/W2052515325","https://openalex.org/W2050948537","https://openalex.org/W2767646790","https://openalex.org/W2352041579","https://openalex.org/W2138381686","https://openalex.org/W1998176685","https://openalex.org/W2141585124","https://openalex.org/W2032175896","https://openalex.org/W3123883311","https://openalex.org/W3216119459"],"abstract_inverted_index":{"In":[0,42,67],"recent":[1],"years,":[2],"machine":[3,112],"learning":[4,7,113,116],"and":[5,34,91,104,114,132],"deep":[6,115],"based":[8,117],"fault":[9,65],"diagnosis":[10],"methods":[11,118],"have":[12],"been":[13],"studied,":[14],"however,":[15],"most":[16],"of":[17,26,39,72,107,130,136],"them":[18],"remain":[19],"at":[20],"the":[21,61,101,105,128,134],"experimental":[22],"stage":[23],"mainly":[24],"because":[25],"two":[27,62],"obstacles,":[28],"briefly,":[29],"a)":[30],"inadequate":[31],"faulty":[32],"examples":[33,86],"b)":[35],"various":[36],"working":[37],"conditions":[38],"industrial":[40],"data.":[41],"this":[43],"literature,":[44],"a":[45,70,79,121],"practical":[46],"algorithm":[47],"named":[48],"Data":[49],"Simulation":[50],"by":[51],"Resampling":[52],"(DSR)":[53],"is":[54],"proposed":[55],"for":[56],"data":[57],"augmentation":[58,141],"to":[59,83,119],"alleviate":[60],"problems":[63],"in":[64,87],"diagnosis.":[66],"essence,":[68],"as":[69],"form":[71],"Vicinal":[73],"Risk":[74],"Minimization":[75],"(VRM),":[76],"DSR":[77,97,131],"utilizes":[78],"two-stage":[80],"resampling":[81],"operation":[82],"simulate":[84],"vicinal":[85],"both":[88,99],"time":[89],"domain":[90],"frequency":[92],"domain.":[93],"By":[94],"doing":[95],"so,":[96],"can":[98],"increase":[100],"sample":[102],"diversity":[103],"quantity":[106],"training":[108],"set,":[109],"which":[110],"regularizes":[111],"achieve":[120],"higher":[122],"generalization":[123],"performance.":[124],"Our":[125],"experiments":[126],"verify":[127],"effectiveness":[129],"show":[133],"possibility":[135],"combining":[137],"it":[138],"with":[139],"other":[140],"algorithms.":[142]},"counts_by_year":[{"year":2025,"cited_by_count":5},{"year":2024,"cited_by_count":5},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":4},{"year":2021,"cited_by_count":9},{"year":2020,"cited_by_count":5}],"updated_date":"2026-05-06T08:25:59.206177","created_date":"2025-10-10T00:00:00"}