{"id":"https://openalex.org/W2971320244","doi":"https://doi.org/10.1109/access.2019.2937545","title":"A Threshold Voltage Model for Charge Trapping Effect of AlGaN/GaN HEMTs","display_name":"A Threshold Voltage Model for Charge Trapping Effect of AlGaN/GaN HEMTs","publication_year":2019,"publication_date":"2019-01-01","ids":{"openalex":"https://openalex.org/W2971320244","doi":"https://doi.org/10.1109/access.2019.2937545","mag":"2971320244"},"language":"en","primary_location":{"id":"doi:10.1109/access.2019.2937545","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2937545","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08813016.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08813016.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5050889655","display_name":"Yonghao Jia","orcid":"https://orcid.org/0000-0003-4887-2839"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yonghao Jia","raw_affiliation_strings":["School of Electronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu, China"],"raw_orcid":"https://orcid.org/0000-0003-4887-2839","affiliations":[{"raw_affiliation_string":"School of Electronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5020076100","display_name":"Zhang Wen","orcid":"https://orcid.org/0000-0003-3381-8987"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhang Wen","raw_affiliation_strings":["School of Electronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101648368","display_name":"Yongbo Chen","orcid":"https://orcid.org/0000-0002-9985-6604"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Yongbo Chen","raw_affiliation_strings":["Chengdu Hiwafer Company Ltd., Chengdu, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Chengdu Hiwafer Company Ltd., Chengdu, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069880718","display_name":"Chengcheng Xie","orcid":"https://orcid.org/0000-0003-3160-1645"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Cheng-Cheng Xie","raw_affiliation_strings":["School of Electronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu, China"],"raw_orcid":"https://orcid.org/0000-0003-3160-1645","affiliations":[{"raw_affiliation_string":"School of Electronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100754016","display_name":"Yong\u2010Xin Guo","orcid":"https://orcid.org/0000-0001-8842-5609"},"institutions":[{"id":"https://openalex.org/I165932596","display_name":"National University of Singapore","ror":"https://ror.org/01tgyzw49","country_code":"SG","type":"education","lineage":["https://openalex.org/I165932596"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Yong-Xin Guo","raw_affiliation_strings":["Department of Electrical and Computer Engineering, National University of Singapore, Singapore"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, National University of Singapore, Singapore","institution_ids":["https://openalex.org/I165932596"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100705952","display_name":"Yuehang Xu","orcid":"https://orcid.org/0000-0003-1706-2681"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yuehang Xu","raw_affiliation_strings":["School of Electronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu, China"],"raw_orcid":"https://orcid.org/0000-0003-1706-2681","affiliations":[{"raw_affiliation_string":"School of Electronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I150229711"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.5098,"has_fulltext":true,"cited_by_count":8,"citation_normalized_percentile":{"value":0.65068653,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"7","issue":null,"first_page":"120638","last_page":"120647"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10099","display_name":"GaN-based semiconductor devices and materials","score":1.0,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10099","display_name":"GaN-based semiconductor devices and materials","score":1.0,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/threshold-voltage","display_name":"Threshold voltage","score":0.7122393846511841},{"id":"https://openalex.org/keywords/trapping","display_name":"Trapping","score":0.6705617308616638},{"id":"https://openalex.org/keywords/charge","display_name":"Charge (physics)","score":0.4773866534233093},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.4569452702999115},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.44316476583480835},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.44160762429237366},{"id":"https://openalex.org/keywords/dopant","display_name":"Dopant","score":0.43391284346580505},{"id":"https://openalex.org/keywords/charge-control","display_name":"Charge control","score":0.4242880642414093},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4023682773113251},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.3959997296333313},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3494674861431122},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3014441728591919},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.29790958762168884},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.27333205938339233},{"id":"https://openalex.org/keywords/quantum-mechanics","display_name":"Quantum mechanics","score":0.22765791416168213},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.11379587650299072},{"id":"https://openalex.org/keywords/doping","display_name":"Doping","score":0.10873782634735107},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.10366195440292358}],"concepts":[{"id":"https://openalex.org/C195370968","wikidata":"https://www.wikidata.org/wiki/Q1754002","display_name":"Threshold voltage","level":4,"score":0.7122393846511841},{"id":"https://openalex.org/C2777924906","wikidata":"https://www.wikidata.org/wiki/Q34168","display_name":"Trapping","level":2,"score":0.6705617308616638},{"id":"https://openalex.org/C188082385","wikidata":"https://www.wikidata.org/wiki/Q73792","display_name":"Charge (physics)","level":2,"score":0.4773866534233093},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4569452702999115},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.44316476583480835},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.44160762429237366},{"id":"https://openalex.org/C191952053","wikidata":"https://www.wikidata.org/wiki/Q15119237","display_name":"Dopant","level":3,"score":0.43391284346580505},{"id":"https://openalex.org/C2777681924","wikidata":"https://www.wikidata.org/wiki/Q5074262","display_name":"Charge control","level":4,"score":0.4242880642414093},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4023682773113251},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.3959997296333313},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3494674861431122},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3014441728591919},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.29790958762168884},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.27333205938339233},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.22765791416168213},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.11379587650299072},{"id":"https://openalex.org/C57863236","wikidata":"https://www.wikidata.org/wiki/Q1130571","display_name":"Doping","level":2,"score":0.10873782634735107},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.10366195440292358},{"id":"https://openalex.org/C18903297","wikidata":"https://www.wikidata.org/wiki/Q7150","display_name":"Ecology","level":1,"score":0.0},{"id":"https://openalex.org/C555008776","wikidata":"https://www.wikidata.org/wiki/Q267298","display_name":"Battery (electricity)","level":3,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/access.2019.2937545","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2937545","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08813016.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:scholarbank.nus.edu.sg:10635/212344","is_oa":true,"landing_page_url":"https://scholarbank.nus.edu.sg/handle/10635/212344","pdf_url":null,"source":{"id":"https://openalex.org/S7407052290","display_name":"National University of Singapore","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Scopus OA2019","raw_type":"Article"},{"id":"pmh:oai:doaj.org/article:4aa9b5d65b2c4b71a7733ae6d39540d1","is_oa":true,"landing_page_url":"https://doaj.org/article/4aa9b5d65b2c4b71a7733ae6d39540d1","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 7, Pp 120638-120647 (2019)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2019.2937545","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2937545","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08813016.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.9100000262260437}],"awards":[{"id":"https://openalex.org/G1697373565","display_name":null,"funder_award_id":"61474020","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G7575771938","display_name":null,"funder_award_id":"ZYGX2016J036","funder_id":"https://openalex.org/F4320335787","funder_display_name":"Fundamental Research Funds for the Central Universities"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320323553","display_name":"Universit\u00e0 di Bologna","ror":"https://ror.org/01111rn36"},{"id":"https://openalex.org/F4320329860","display_name":"National Science and Technology Major Project","ror":null},{"id":"https://openalex.org/F4320335787","display_name":"Fundamental Research Funds for the Central Universities","ror":null}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2971320244.pdf","grobid_xml":"https://content.openalex.org/works/W2971320244.grobid-xml"},"referenced_works_count":55,"referenced_works":["https://openalex.org/W1489914566","https://openalex.org/W1490515748","https://openalex.org/W1551046926","https://openalex.org/W1965817159","https://openalex.org/W1977450210","https://openalex.org/W1978400647","https://openalex.org/W1984952809","https://openalex.org/W1994912458","https://openalex.org/W1998457949","https://openalex.org/W2007493084","https://openalex.org/W2016131972","https://openalex.org/W2018477734","https://openalex.org/W2030427139","https://openalex.org/W2041714088","https://openalex.org/W2049447229","https://openalex.org/W2066898362","https://openalex.org/W2080842078","https://openalex.org/W2096515792","https://openalex.org/W2102721944","https://openalex.org/W2103281872","https://openalex.org/W2111378114","https://openalex.org/W2114918125","https://openalex.org/W2117696652","https://openalex.org/W2124985289","https://openalex.org/W2131851661","https://openalex.org/W2137778525","https://openalex.org/W2143906132","https://openalex.org/W2150237098","https://openalex.org/W2150768402","https://openalex.org/W2150781865","https://openalex.org/W2157958892","https://openalex.org/W2161910747","https://openalex.org/W2163205443","https://openalex.org/W2168503739","https://openalex.org/W2217816364","https://openalex.org/W2313144263","https://openalex.org/W2506876909","https://openalex.org/W2593945896","https://openalex.org/W2734594089","https://openalex.org/W2736133219","https://openalex.org/W2757656809","https://openalex.org/W2762134253","https://openalex.org/W2766172207","https://openalex.org/W2792683149","https://openalex.org/W2810733738","https://openalex.org/W2863325548","https://openalex.org/W2885018148","https://openalex.org/W2885193830","https://openalex.org/W2886460219","https://openalex.org/W2887275363","https://openalex.org/W2894239464","https://openalex.org/W2902008133","https://openalex.org/W2903596552","https://openalex.org/W6632971702","https://openalex.org/W6734451732"],"related_works":["https://openalex.org/W1978852572","https://openalex.org/W2072660350","https://openalex.org/W2347617792","https://openalex.org/W2245347530","https://openalex.org/W1549593594","https://openalex.org/W1993368695","https://openalex.org/W2024702299","https://openalex.org/W2355824136","https://openalex.org/W1525461432","https://openalex.org/W2011451034"],"abstract_inverted_index":{"In":[0],"this":[1,116],"paper,":[2],"a":[3,63,155],"threshold":[4,109,123,167],"voltage":[5,110,124,168],"model":[6,114,120,150,157,164,170],"for":[7,22,158],"charge":[8,43],"trapping":[9,44,64],"effect":[10,45],"of":[11,99,209],"AlGaN/GaN":[12,182],"HEMTs":[13,183],"is":[14,74,151,171],"proposed.":[15],"The":[16,135,148,161],"quiescent":[17],"bias":[18],"stresses":[19],"are":[20,46,55,137],"considered":[21],"well":[23,47],"modeling":[24],"the":[25,37,42,51,58,77,86,94,100,112,121,128,143,166],"current":[26,87],"collapse":[27,88],"critical":[28,89],"points":[29,90],"in":[30,76,102,115,207],"pulsed":[31,185],"<italic":[32,186],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[33,68,175,187],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">I-V</i>":[34,188],"curves.":[35],"Moreover,":[36],"low-frequency":[38],"dispersions":[39],"due":[40,92,126],"to":[41,84,93,127],"disposed":[48],"by":[49,57,140,173],"using":[50],"proposed":[52,75,113,149],"model,":[53,78,111],"which":[54,79],"validated":[56],"scattering":[59],"parameters":[60],"(S-parameters).":[61],"Also,":[62],"related":[65],"parameter":[66],"<inline-formula":[67,174],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">":[69,176],"<tex-math":[70,177],"notation=\"LaTeX\">$\\alpha":[71],"$":[72],"</tex-math></inline-formula>":[73,180],"can":[80,118],"be":[81],"conveniently":[82],"used":[83],"describe":[85],"offset":[91],"different":[95],"acceptor":[96],"energy":[97],"levels":[98],"dopants":[101],"GaN":[103],"buffer.":[104],"Different":[105],"from":[106],"our":[107],"previous":[108],"paper":[117],"accurately":[119],"dynamic":[122],"shift":[125,169],"fast":[129],"capture":[130],"and":[131,193,201,214],"slow":[132],"emission":[133],"processes.":[134],"verifications":[136],"carried":[138],"out":[139],"comparing":[141],"with":[142,165,184],"transient":[144],"measured":[145,200],"drain":[146],"current.":[147],"also":[152],"implemented":[153],"into":[154],"large-signal":[156,163],"further":[159],"verifications.":[160],"improved":[162],"verified":[172],"notation=\"LaTeX\">$0.25~\\mu":[178],"\\text{m}$":[179],"process":[181],",":[189],"S-parameters,":[190],"power":[191,211,215],"sweep":[192],"load-pull":[194],"measurements.":[195],"More":[196],"accurate":[197],"agreements":[198],"between":[199],"modeled":[202],"results":[203],"have":[204],"been":[205],"achieved":[206],"terms":[208],"output":[210],"(Pout),":[212],"gain,":[213],"added":[216],"efficiency":[217],"(PAE).":[218]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}