{"id":"https://openalex.org/W2969814241","doi":"https://doi.org/10.1109/access.2019.2936471","title":"Improvement of Alternative Non-Raster Scanning Methods for High Speed Atomic Force Microscopy: A Review","display_name":"Improvement of Alternative Non-Raster Scanning Methods for High Speed Atomic Force Microscopy: A Review","publication_year":2019,"publication_date":"2019-01-01","ids":{"openalex":"https://openalex.org/W2969814241","doi":"https://doi.org/10.1109/access.2019.2936471","mag":"2969814241"},"language":"en","primary_location":{"id":"doi:10.1109/access.2019.2936471","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2936471","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08809367.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"review","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08809367.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5103026396","display_name":"Sajal K. Das","orcid":"https://orcid.org/0000-0002-0596-4816"},"institutions":[{"id":"https://openalex.org/I17477748","display_name":"Rajshahi University of Engineering and Technology","ror":"https://ror.org/049ysg747","country_code":"BD","type":"education","lineage":["https://openalex.org/I17477748"]}],"countries":["BD"],"is_corresponding":true,"raw_author_name":"Sajal K. Das","raw_affiliation_strings":["Department of Mechatronics Engineering, Rajshahi University of Engineering & Technology, Rajshahi, Bangladesh"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Mechatronics Engineering, Rajshahi University of Engineering & Technology, Rajshahi, Bangladesh","institution_ids":["https://openalex.org/I17477748"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078443680","display_name":"Faisal R. Badal","orcid":"https://orcid.org/0000-0002-7463-7675"},"institutions":[{"id":"https://openalex.org/I17477748","display_name":"Rajshahi University of Engineering and Technology","ror":"https://ror.org/049ysg747","country_code":"BD","type":"education","lineage":["https://openalex.org/I17477748"]}],"countries":["BD"],"is_corresponding":false,"raw_author_name":"Faisal R. Badal","raw_affiliation_strings":["Department of Mechatronics Engineering, Rajshahi University of Engineering & Technology, Rajshahi, Bangladesh"],"raw_orcid":"https://orcid.org/0000-0002-7463-7675","affiliations":[{"raw_affiliation_string":"Department of Mechatronics Engineering, Rajshahi University of Engineering & Technology, Rajshahi, Bangladesh","institution_ids":["https://openalex.org/I17477748"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047043024","display_name":"Md. Atikur Rahman","orcid":"https://orcid.org/0000-0002-9591-3018"},"institutions":[{"id":"https://openalex.org/I17477748","display_name":"Rajshahi University of Engineering and Technology","ror":"https://ror.org/049ysg747","country_code":"BD","type":"education","lineage":["https://openalex.org/I17477748"]}],"countries":["BD"],"is_corresponding":false,"raw_author_name":"Md. Atikur Rahman","raw_affiliation_strings":["Department of Mechatronics Engineering, Rajshahi University of Engineering & Technology, Rajshahi, Bangladesh"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Mechatronics Engineering, Rajshahi University of Engineering & Technology, Rajshahi, Bangladesh","institution_ids":["https://openalex.org/I17477748"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100774680","display_name":"Md. Atikul Islam","orcid":"https://orcid.org/0000-0002-9525-5393"},"institutions":[{"id":"https://openalex.org/I17477748","display_name":"Rajshahi University of Engineering and Technology","ror":"https://ror.org/049ysg747","country_code":"BD","type":"education","lineage":["https://openalex.org/I17477748"]}],"countries":["BD"],"is_corresponding":false,"raw_author_name":"Md. Atikul Islam","raw_affiliation_strings":["Department of Mechatronics Engineering, Rajshahi University of Engineering & Technology, Rajshahi, Bangladesh"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Mechatronics Engineering, Rajshahi University of Engineering & Technology, Rajshahi, Bangladesh","institution_ids":["https://openalex.org/I17477748"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041388320","display_name":"Subrata K. Sarker","orcid":"https://orcid.org/0000-0001-6077-8031"},"institutions":[{"id":"https://openalex.org/I17477748","display_name":"Rajshahi University of Engineering and Technology","ror":"https://ror.org/049ysg747","country_code":"BD","type":"education","lineage":["https://openalex.org/I17477748"]}],"countries":["BD"],"is_corresponding":false,"raw_author_name":"Subrata K. Sarker","raw_affiliation_strings":["Department of Mechatronics Engineering, Rajshahi University of Engineering & Technology, Rajshahi, Bangladesh"],"raw_orcid":"https://orcid.org/0000-0001-6077-8031","affiliations":[{"raw_affiliation_string":"Department of Mechatronics Engineering, Rajshahi University of Engineering & Technology, Rajshahi, Bangladesh","institution_ids":["https://openalex.org/I17477748"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5034383958","display_name":"N. Paul","orcid":"https://orcid.org/0000-0003-1273-3693"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Norottom Paul","raw_affiliation_strings":["Information and Communication Technology Division, Bangladesh Hi-Tech Park Authority (BHTPA), Dhaka, Bangladesh"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Information and Communication Technology Division, Bangladesh Hi-Tech Park Authority (BHTPA), Dhaka, Bangladesh","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5103026396"],"corresponding_institution_ids":["https://openalex.org/I17477748"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":2.4038,"has_fulltext":true,"cited_by_count":34,"citation_normalized_percentile":{"value":0.90055451,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":"7","issue":null,"first_page":"115603","last_page":"115624"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10923","display_name":"Force Microscopy Techniques and Applications","score":1.0,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10923","display_name":"Force Microscopy Techniques and Applications","score":1.0,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12466","display_name":"Near-Field Optical Microscopy","score":0.996399998664856,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/raster-scan","display_name":"Raster scan","score":0.8548270463943481},{"id":"https://openalex.org/keywords/lissajous-curve","display_name":"Lissajous curve","score":0.7792117595672607},{"id":"https://openalex.org/keywords/raster-graphics","display_name":"Raster graphics","score":0.7202203273773193},{"id":"https://openalex.org/keywords/scanning-probe-microscopy","display_name":"Scanning probe microscopy","score":0.7080332040786743},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4877384603023529},{"id":"https://openalex.org/keywords/scanning-electron-microscope","display_name":"Scanning electron microscope","score":0.43510696291923523},{"id":"https://openalex.org/keywords/scanning-capacitance-microscopy","display_name":"Scanning capacitance microscopy","score":0.4178459942340851},{"id":"https://openalex.org/keywords/atomic-force-microscopy","display_name":"Atomic force microscopy","score":0.41413113474845886},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.3698157072067261},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.356703519821167},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.330777645111084},{"id":"https://openalex.org/keywords/scanning-confocal-electron-microscopy","display_name":"Scanning confocal electron microscopy","score":0.25261086225509644},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.16917145252227783},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.13145235180854797}],"concepts":[{"id":"https://openalex.org/C145406643","wikidata":"https://www.wikidata.org/wiki/Q2641959","display_name":"Raster scan","level":2,"score":0.8548270463943481},{"id":"https://openalex.org/C207168407","wikidata":"https://www.wikidata.org/wiki/Q594135","display_name":"Lissajous curve","level":2,"score":0.7792117595672607},{"id":"https://openalex.org/C181844469","wikidata":"https://www.wikidata.org/wiki/Q182270","display_name":"Raster graphics","level":2,"score":0.7202203273773193},{"id":"https://openalex.org/C36628996","wikidata":"https://www.wikidata.org/wiki/Q907287","display_name":"Scanning probe microscopy","level":2,"score":0.7080332040786743},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4877384603023529},{"id":"https://openalex.org/C26771246","wikidata":"https://www.wikidata.org/wiki/Q321095","display_name":"Scanning electron microscope","level":2,"score":0.43510696291923523},{"id":"https://openalex.org/C99752389","wikidata":"https://www.wikidata.org/wiki/Q9337610","display_name":"Scanning capacitance microscopy","level":4,"score":0.4178459942340851},{"id":"https://openalex.org/C102951782","wikidata":"https://www.wikidata.org/wiki/Q49295","display_name":"Atomic force microscopy","level":2,"score":0.41413113474845886},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.3698157072067261},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.356703519821167},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.330777645111084},{"id":"https://openalex.org/C187921700","wikidata":"https://www.wikidata.org/wiki/Q7430074","display_name":"Scanning confocal electron microscopy","level":3,"score":0.25261086225509644},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.16917145252227783},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.13145235180854797}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2019.2936471","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2936471","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08809367.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:a7893d76ad4c43e7825225f4314d5907","is_oa":true,"landing_page_url":"https://doaj.org/article/a7893d76ad4c43e7825225f4314d5907","pdf_url":null,"source":{"id":"https://openalex.org/S112646816","display_name":"SHILAP Revista de lepidopterolog\u00eda","issn_l":"0300-5267","issn":["0300-5267","2340-4078"],"is_oa":true,"is_in_doaj":true,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 7, Pp 115603-115624 (2019)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2019.2936471","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2936471","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08809367.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2969814241.pdf","grobid_xml":"https://content.openalex.org/works/W2969814241.grobid-xml"},"referenced_works_count":113,"referenced_works":["https://openalex.org/W71206719","https://openalex.org/W78205331","https://openalex.org/W264891673","https://openalex.org/W651303278","https://openalex.org/W1446908979","https://openalex.org/W1488504584","https://openalex.org/W1498716641","https://openalex.org/W1553792387","https://openalex.org/W1558878888","https://openalex.org/W1580207629","https://openalex.org/W1596164007","https://openalex.org/W1657126748","https://openalex.org/W1831928442","https://openalex.org/W1965116607","https://openalex.org/W1967318028","https://openalex.org/W1973254339","https://openalex.org/W1978410787","https://openalex.org/W1987659326","https://openalex.org/W1988215944","https://openalex.org/W1989980569","https://openalex.org/W1990965192","https://openalex.org/W1992984362","https://openalex.org/W1997339250","https://openalex.org/W1999827068","https://openalex.org/W2002090291","https://openalex.org/W2009461444","https://openalex.org/W2013005056","https://openalex.org/W2013238181","https://openalex.org/W2016766477","https://openalex.org/W2018310779","https://openalex.org/W2018533902","https://openalex.org/W2024303936","https://openalex.org/W2024344892","https://openalex.org/W2025761145","https://openalex.org/W2026066143","https://openalex.org/W2026121782","https://openalex.org/W2027004408","https://openalex.org/W2027050895","https://openalex.org/W2030206518","https://openalex.org/W2031968854","https://openalex.org/W2036784091","https://openalex.org/W2039235813","https://openalex.org/W2040306273","https://openalex.org/W2042028590","https://openalex.org/W2044474049","https://openalex.org/W2045284683","https://openalex.org/W2046032184","https://openalex.org/W2047164308","https://openalex.org/W2047828308","https://openalex.org/W2049592940","https://openalex.org/W2050938834","https://openalex.org/W2053249052","https://openalex.org/W2054283519","https://openalex.org/W2058209887","https://openalex.org/W2065325399","https://openalex.org/W2067147925","https://openalex.org/W2070680125","https://openalex.org/W2073173456","https://openalex.org/W2074586010","https://openalex.org/W2075356231","https://openalex.org/W2079186366","https://openalex.org/W2080446719","https://openalex.org/W2080578192","https://openalex.org/W2083907292","https://openalex.org/W2083919021","https://openalex.org/W2088982749","https://openalex.org/W2093603011","https://openalex.org/W2100495894","https://openalex.org/W2104926577","https://openalex.org/W2110167104","https://openalex.org/W2113608953","https://openalex.org/W2124008016","https://openalex.org/W2126461033","https://openalex.org/W2128403295","https://openalex.org/W2135195563","https://openalex.org/W2137034164","https://openalex.org/W2144243814","https://openalex.org/W2144651557","https://openalex.org/W2147509943","https://openalex.org/W2150903279","https://openalex.org/W2153008072","https://openalex.org/W2162461129","https://openalex.org/W2162680749","https://openalex.org/W2163851945","https://openalex.org/W2164586994","https://openalex.org/W2165878769","https://openalex.org/W2168717647","https://openalex.org/W2170139439","https://openalex.org/W2171698015","https://openalex.org/W2189023219","https://openalex.org/W2326158180","https://openalex.org/W2335578274","https://openalex.org/W2370742440","https://openalex.org/W2414774309","https://openalex.org/W2484161046","https://openalex.org/W2486715671","https://openalex.org/W2496950337","https://openalex.org/W2530229664","https://openalex.org/W2564895605","https://openalex.org/W2568203515","https://openalex.org/W2577556947","https://openalex.org/W2597885517","https://openalex.org/W2735681407","https://openalex.org/W2766544995","https://openalex.org/W2890733470","https://openalex.org/W3102544148","https://openalex.org/W4214492055","https://openalex.org/W4299033981","https://openalex.org/W4300936984","https://openalex.org/W6602898486","https://openalex.org/W6629161950","https://openalex.org/W6633278042","https://openalex.org/W6960060141"],"related_works":["https://openalex.org/W1987484483","https://openalex.org/W1984055937","https://openalex.org/W4385770201","https://openalex.org/W2067147925","https://openalex.org/W1974004953","https://openalex.org/W204409194","https://openalex.org/W2093392189","https://openalex.org/W2042028590","https://openalex.org/W2377833861","https://openalex.org/W2564895605"],"abstract_inverted_index":{"The":[0,21,99,191],"invention":[1],"of":[2,16,23,31,50,59,65,86,101,109,123,146,164,182],"the":[3,13,29,47,51,87,110,121,124,144,196],"nanotechnology":[4,66],"adds":[5],"a":[6,42,57,62,162,176],"new":[7,43],"branch":[8,44,58],"to":[9,27,45,67,83,106,142,195,213],"investigate":[10],"and":[11,35,71,96,113,118,136,157,166,174,186,204],"control":[12,192],"physical":[14],"properties":[15,49],"matters":[17,73,88],"at":[18],"atomic":[19,48],"level.":[20],"aim":[22],"this":[24,211],"technology":[25],"is":[26,61,90],"image":[28,68,85,97,155],"characteristics":[30],"metals,":[32],"biological":[33],"organs,":[34],"polymers.":[36],"Scanning":[37],"probe":[38],"microscopy":[39,55],"(SPM)":[40],"opens":[41],"analysis":[46],"matters.":[52],"Atomic":[53],"force":[54],"(AFM),":[56],"SPM,":[60],"versatile":[63],"tool":[64],"both":[69],"conductive":[70],"non-conductive":[72],"with":[74],"high":[75,152,171],"resolution.":[76,158],"Commercial":[77],"AFM":[78,102,173,197],"uses":[79],"raster":[80,147,165],"scanning":[81,94,111,128,138,148,153,168,183,189,206,217],"technique":[82,218],"produce":[84],"that":[89],"responsible":[91],"for":[92,170,198,219],"low":[93,107],"speed":[95,172],"quality.":[98],"performances":[100],"are":[103,208],"hampered":[104],"due":[105],"bandwidth":[108,185],"unit":[112],"vertical":[114],"Proportional-Integral":[115],"(PI)":[116],"controller":[117],"may":[119],"damage":[120],"surface":[122],"samples.":[125],"Different":[126],"non-raster":[127,167],"techniques":[129,193],"such":[130],"as":[131],"sinusoidal,":[132,201],"rotational,":[133],"spiral,":[134,202],"cycloid,":[135,203],"lissajous":[137,205],"have":[139],"been":[140],"proposed":[141],"overcome":[143],"limitations":[145],"method":[149],"by":[150],"providing":[151],"speed,":[154,184],"quality,":[156],"This":[159],"paper":[160,212],"presents":[161],"survey":[163],"methods":[169,207],"provides":[175],"compression":[177],"between":[178],"them":[179],"in":[180,210],"term":[181],"highest":[187],"achievable":[188],"frequency.":[190],"applied":[194],"improving":[199],"raster,":[200],"studied":[209],"find":[214],"most":[215],"optimum":[216],"AFM.":[220]},"counts_by_year":[{"year":2026,"cited_by_count":3},{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":7},{"year":2023,"cited_by_count":4},{"year":2022,"cited_by_count":5},{"year":2021,"cited_by_count":6},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}