{"id":"https://openalex.org/W2966391331","doi":"https://doi.org/10.1109/access.2019.2931194","title":"Vison-Based 3D Shape Measurement System for Transparent Microdefect Characterization","display_name":"Vison-Based 3D Shape Measurement System for Transparent Microdefect Characterization","publication_year":2019,"publication_date":"2019-01-01","ids":{"openalex":"https://openalex.org/W2966391331","doi":"https://doi.org/10.1109/access.2019.2931194","mag":"2966391331"},"language":"en","primary_location":{"id":"doi:10.1109/access.2019.2931194","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2931194","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08777162.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08777162.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5037876015","display_name":"Yuanlong Deng","orcid":"https://orcid.org/0000-0001-6162-2127"},"institutions":[{"id":"https://openalex.org/I180726961","display_name":"Shenzhen University","ror":"https://ror.org/01vy4gh70","country_code":"CN","type":"education","lineage":["https://openalex.org/I180726961"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Yuanlong Deng","raw_affiliation_strings":["Laboratory of Machine Vision and Inspection, College of Mechatronics and Control Engineering, Shenzhen University, Shenzhen, China"],"affiliations":[{"raw_affiliation_string":"Laboratory of Machine Vision and Inspection, College of Mechatronics and Control Engineering, Shenzhen University, Shenzhen, China","institution_ids":["https://openalex.org/I180726961"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072676828","display_name":"Xizhou Pan","orcid":null},"institutions":[{"id":"https://openalex.org/I180726961","display_name":"Shenzhen University","ror":"https://ror.org/01vy4gh70","country_code":"CN","type":"education","lineage":["https://openalex.org/I180726961"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xizhou Pan","raw_affiliation_strings":["Laboratory of Machine Vision and Inspection, College of Mechatronics and Control Engineering, Shenzhen University, Shenzhen, China"],"affiliations":[{"raw_affiliation_string":"Laboratory of Machine Vision and Inspection, College of Mechatronics and Control Engineering, Shenzhen University, Shenzhen, China","institution_ids":["https://openalex.org/I180726961"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5051526485","display_name":"Xingzheng Wang","orcid":"https://orcid.org/0000-0002-5433-3631"},"institutions":[{"id":"https://openalex.org/I180726961","display_name":"Shenzhen University","ror":"https://ror.org/01vy4gh70","country_code":"CN","type":"education","lineage":["https://openalex.org/I180726961"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xingzheng Wang","raw_affiliation_strings":["Laboratory of Machine Vision and Inspection, College of Mechatronics and Control Engineering, Shenzhen University, Shenzhen, China"],"affiliations":[{"raw_affiliation_string":"Laboratory of Machine Vision and Inspection, College of Mechatronics and Control Engineering, Shenzhen University, Shenzhen, China","institution_ids":["https://openalex.org/I180726961"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5088944559","display_name":"Xiaopin Zhong","orcid":"https://orcid.org/0000-0002-8761-9396"},"institutions":[{"id":"https://openalex.org/I180726961","display_name":"Shenzhen University","ror":"https://ror.org/01vy4gh70","country_code":"CN","type":"education","lineage":["https://openalex.org/I180726961"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaopin Zhong","raw_affiliation_strings":["Laboratory of Machine Vision and Inspection, College of Mechatronics and Control Engineering, Shenzhen University, Shenzhen, China"],"affiliations":[{"raw_affiliation_string":"Laboratory of Machine Vision and Inspection, College of Mechatronics and Control Engineering, Shenzhen University, Shenzhen, China","institution_ids":["https://openalex.org/I180726961"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5037876015"],"corresponding_institution_ids":["https://openalex.org/I180726961"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":1.7632,"has_fulltext":true,"cited_by_count":14,"citation_normalized_percentile":{"value":0.87433173,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"7","issue":null,"first_page":"105721","last_page":"105733"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13114","display_name":"Image Processing Techniques and Applications","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/polarizer","display_name":"Polarizer","score":0.6708574295043945},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.6610507369041443},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.6550968885421753},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.594481348991394},{"id":"https://openalex.org/keywords/machine-vision","display_name":"Machine vision","score":0.5284414291381836},{"id":"https://openalex.org/keywords/image-processing","display_name":"Image processing","score":0.4823112487792969},{"id":"https://openalex.org/keywords/characterization","display_name":"Characterization (materials science)","score":0.43816834688186646},{"id":"https://openalex.org/keywords/grayscale","display_name":"Grayscale","score":0.4353967308998108},{"id":"https://openalex.org/keywords/confocal-microscopy","display_name":"Confocal microscopy","score":0.43134158849716187},{"id":"https://openalex.org/keywords/visual-inspection","display_name":"Visual inspection","score":0.4262567460536957},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3585125207901001},{"id":"https://openalex.org/keywords/pixel","display_name":"Pixel","score":0.2956063151359558},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.2919100522994995},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.16264238953590393},{"id":"https://openalex.org/keywords/birefringence","display_name":"Birefringence","score":0.09164583683013916}],"concepts":[{"id":"https://openalex.org/C121524040","wikidata":"https://www.wikidata.org/wiki/Q11942175","display_name":"Polarizer","level":3,"score":0.6708574295043945},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.6610507369041443},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.6550968885421753},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.594481348991394},{"id":"https://openalex.org/C5339829","wikidata":"https://www.wikidata.org/wiki/Q1425977","display_name":"Machine vision","level":2,"score":0.5284414291381836},{"id":"https://openalex.org/C9417928","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Image processing","level":3,"score":0.4823112487792969},{"id":"https://openalex.org/C2780841128","wikidata":"https://www.wikidata.org/wiki/Q5073781","display_name":"Characterization (materials science)","level":2,"score":0.43816834688186646},{"id":"https://openalex.org/C78201319","wikidata":"https://www.wikidata.org/wiki/Q685727","display_name":"Grayscale","level":3,"score":0.4353967308998108},{"id":"https://openalex.org/C2779178360","wikidata":"https://www.wikidata.org/wiki/Q902045","display_name":"Confocal microscopy","level":2,"score":0.43134158849716187},{"id":"https://openalex.org/C168820333","wikidata":"https://www.wikidata.org/wiki/Q448889","display_name":"Visual inspection","level":2,"score":0.4262567460536957},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3585125207901001},{"id":"https://openalex.org/C160633673","wikidata":"https://www.wikidata.org/wiki/Q355198","display_name":"Pixel","level":2,"score":0.2956063151359558},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.2919100522994995},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.16264238953590393},{"id":"https://openalex.org/C125743686","wikidata":"https://www.wikidata.org/wiki/Q108779","display_name":"Birefringence","level":2,"score":0.09164583683013916},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2019.2931194","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2931194","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08777162.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:2dae6af65ab943d88471365028f759a2","is_oa":true,"landing_page_url":"https://doaj.org/article/2dae6af65ab943d88471365028f759a2","pdf_url":null,"source":{"id":"https://openalex.org/S112646816","display_name":"SHILAP Revista de lepidopterolog\u00eda","issn_l":"0300-5267","issn":["0300-5267","2340-4078"],"is_oa":true,"is_in_doaj":true,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 7, Pp 105721-105733 (2019)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2019.2931194","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2931194","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08777162.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"score":0.6200000047683716,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[{"id":"https://openalex.org/G1231421488","display_name":null,"funder_award_id":"under","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G1591468659","display_name":null,"funder_award_id":"JCYJ20180306174120445","funder_id":"https://openalex.org/F4320335803","funder_display_name":"Shenzhen Fundamental Research and Discipline Layout project"},{"id":"https://openalex.org/G2087396116","display_name":null,"funder_award_id":"China","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G2290736354","display_name":null,"funder_award_id":"61741204","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G2806925563","display_name":null,"funder_award_id":"201904","funder_id":"https://openalex.org/F4320325571","funder_display_name":"Shenzhen University"},{"id":"https://openalex.org/G2981938667","display_name":null,"funder_award_id":"Shenzhen","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G3162017210","display_name":null,"funder_award_id":"201803","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G3317480652","display_name":null,"funder_award_id":"Science","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G3757194791","display_name":null,"funder_award_id":"JCYJ20","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G391238517","display_name":null,"funder_award_id":", and","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G4009049029","display_name":null,"funder_award_id":"Startup","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G4148739412","display_name":null,"funder_award_id":"201603","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G5128791319","display_name":null,"funder_award_id":"2019041","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G5270737256","display_name":null,"funder_award_id":"20445","funder_id":"https://openalex.org/F4320306076","funder_display_name":"National Science Foundation"},{"id":"https://openalex.org/G5315606550","display_name":null,"funder_award_id":"JCYJ20160331185006518","funder_id":"https://openalex.org/F4320335803","funder_display_name":"Shenzhen Fundamental Research and Discipline Layout project"},{"id":"https://openalex.org/G6502399670","display_name":null,"funder_award_id":"2019041","funder_id":"https://openalex.org/F4320325571","funder_display_name":"Shenzhen University"},{"id":"https://openalex.org/G6974197156","display_name":null,"funder_award_id":"61571306","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G7611972004","display_name":null,"funder_award_id":"2016033","funder_id":"https://openalex.org/F4320325571","funder_display_name":"Shenzhen University"},{"id":"https://openalex.org/G847170067","display_name":null,"funder_award_id":"2016033","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G848032724","display_name":null,"funder_award_id":"Science","funder_id":"https://openalex.org/F4320306076","funder_display_name":"National Science Foundation"}],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"},{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320325571","display_name":"Shenzhen University","ror":"https://ror.org/01vy4gh70"},{"id":"https://openalex.org/F4320335803","display_name":"Shenzhen Fundamental Research and Discipline Layout project","ror":null}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2966391331.pdf","grobid_xml":"https://content.openalex.org/works/W2966391331.grobid-xml"},"referenced_works_count":47,"referenced_works":["https://openalex.org/W1540806761","https://openalex.org/W1969276716","https://openalex.org/W1970393985","https://openalex.org/W1971306954","https://openalex.org/W1975629748","https://openalex.org/W1978222653","https://openalex.org/W1986587559","https://openalex.org/W1991582788","https://openalex.org/W2006719722","https://openalex.org/W2033053524","https://openalex.org/W2041464047","https://openalex.org/W2044041635","https://openalex.org/W2058777816","https://openalex.org/W2067531249","https://openalex.org/W2067956279","https://openalex.org/W2080964655","https://openalex.org/W2091018836","https://openalex.org/W2091250708","https://openalex.org/W2092243497","https://openalex.org/W2100275119","https://openalex.org/W2111376641","https://openalex.org/W2120694107","https://openalex.org/W2142288599","https://openalex.org/W2163417295","https://openalex.org/W2171646521","https://openalex.org/W2257660580","https://openalex.org/W2270330859","https://openalex.org/W2399138319","https://openalex.org/W2536297875","https://openalex.org/W2549337046","https://openalex.org/W2564237490","https://openalex.org/W2618942512","https://openalex.org/W2692693673","https://openalex.org/W2761796288","https://openalex.org/W2770469989","https://openalex.org/W2770718388","https://openalex.org/W2791138779","https://openalex.org/W2791731233","https://openalex.org/W2793945328","https://openalex.org/W2794119880","https://openalex.org/W2806710557","https://openalex.org/W2885002578","https://openalex.org/W2885636529","https://openalex.org/W2909096226","https://openalex.org/W2926743806","https://openalex.org/W2942672693","https://openalex.org/W2953121811"],"related_works":["https://openalex.org/W2154191047","https://openalex.org/W2388067771","https://openalex.org/W2978928176","https://openalex.org/W2389497123","https://openalex.org/W1969556251","https://openalex.org/W1987385378","https://openalex.org/W2794901953","https://openalex.org/W2762725308","https://openalex.org/W2132335896","https://openalex.org/W3214663095"],"abstract_inverted_index":{"The":[0,126,243],"main":[1],"task":[2],"of":[3,32,39,62,74,128,145,154,205,292],"vision-based":[4,116],"industrial":[5,50],"defect":[6,23,41,166,191],"inspection":[7,42,61,101],"is":[8,21,54,69,140,169,182,207],"to":[9,17,25,88,112,151],"implement":[10],"efficient":[11,263],"non-contact":[12],"visual":[13],"quality":[14],"control,":[15],"i.e.,":[16,188],"detect":[18],"if":[19],"there":[20],"a":[22,34,114,148,159,176,253,258],"and":[24,36,106,173,193,221,227,236,261,280],"achieve":[26,252],"an":[27,75],"accurate":[28],"3D":[29,117,143,196,203],"shape":[30,118,197],"measurement":[31,79,119,204,255],"such":[33,103],"defect,":[35],"this":[37,90,109,129,211,270],"kind":[38],"vision":[40],"system":[43,120,237,250,273],"has":[44,132,274],"been":[45,133,219,240,275,285],"widely":[46],"applied":[47],"in":[48,59,96,257,277],"various":[49],"application.":[51],"However,":[52],"it":[53],"still":[55],"not":[56],"the":[57,60,66,70,97,142,152,155,185,248,266,290,293],"case":[58],"transparent":[63,123],"microdefect":[64,124,146,156,160,206,216],"on":[65],"polarizer":[67,122,215],"(which":[68],"most":[71],"important":[72,229],"part":[73],"LCD":[76],"screen).":[77],"Optical":[78],"devices":[80],"(such":[81],"as":[82,104],"confocal":[83,99,200,267],"microscopy)":[84],"are":[85],"often":[86],"utilized":[87],"fulfil":[89],"task.":[91],"To":[92],"solve":[93],"problems":[94],"lied":[95],"current":[98],"microscopy":[100],"system,":[102,130,162,226],"expensive":[105],"non-real-time":[107],"processing,":[108],"research":[110],"aims":[111],"develop":[113],"novel":[115],"for":[121],"characterization.":[125],"innovation":[127],"which":[131,163,287],"verified":[134],"by":[135,184,199,210,223],"our":[136,224],"optical":[137],"model":[138],"simulation,":[139],"that":[141,247],"sizes":[144],"have":[147,218,239,284],"monotonically":[149],"relation":[150],"grayscale":[153],"image.":[157],"Hence,":[158],"imaging":[161,272],"could":[164,251],"acquire":[165],"image":[167],"accurately,":[168],"first":[170],"well":[171],"designed":[172],"implemented.":[174],"Then,":[175],"support":[177],"vector":[178],"regression":[179],"(SVR)":[180],"algorithm":[181],"derived":[183],"trained":[186],"data,":[187],"100":[189],"acquired":[190],"images":[192],"its":[194],"corresponding":[195],"value":[198],"microscopy.":[201,268],"Characterized":[202],"thereby":[208],"obtained":[209],"SVR":[212],"algorithm.":[213],"30":[214],"samples":[217,283],"imaged":[220],"measured":[222],"proposed":[225,249,294],"several":[228],"performance":[230],"indicators,":[231],"including":[232],"processing":[233],"speed,":[234],"accuracy":[235],"reproducibility,":[238],"elaborately":[241],"tested.":[242],"experimental":[244],"results":[245],"show":[246],"high-accuracy":[254],"but":[256],"much":[259],"faster":[260],"more":[262],"way":[264],"than":[265],"Besides,":[269],"developed":[271],"evaluated":[276],"real":[278],"applications,":[279],"over":[281],"300":[282],"detected,":[286],"also":[288],"validate":[289],"effectiveness":[291],"system.":[295]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":5}],"updated_date":"2026-03-18T14:38:29.013473","created_date":"2025-10-10T00:00:00"}