{"id":"https://openalex.org/W2957666543","doi":"https://doi.org/10.1109/access.2019.2929199","title":"Decomposition Method for Belief Reliability Analysis of Complex Uncertain Random Systems","display_name":"Decomposition Method for Belief Reliability Analysis of Complex Uncertain Random Systems","publication_year":2019,"publication_date":"2019-01-01","ids":{"openalex":"https://openalex.org/W2957666543","doi":"https://doi.org/10.1109/access.2019.2929199","mag":"2957666543"},"language":"en","primary_location":{"id":"doi:10.1109/access.2019.2929199","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2929199","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08764359.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08764359.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100741382","display_name":"Qingyuan Zhang","orcid":"https://orcid.org/0000-0001-8680-2095"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qingyuan Zhang","raw_affiliation_strings":["School of Reliability and Systems Engineering, Beihang University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Reliability and Systems Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102026831","display_name":"Rui Kang","orcid":"https://orcid.org/0000-0002-4488-6574"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Rui Kang","raw_affiliation_strings":["School of Reliability and Systems Engineering, Beihang University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Reliability and Systems Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5090658771","display_name":"Meilin Wen","orcid":"https://orcid.org/0000-0002-0819-2647"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Meilin Wen","raw_affiliation_strings":["School of Reliability and Systems Engineering, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-0819-2647","affiliations":[{"raw_affiliation_string":"School of Reliability and Systems Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I82880672"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.6104,"has_fulltext":true,"cited_by_count":8,"citation_normalized_percentile":{"value":0.75011899,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"7","issue":null,"first_page":"132711","last_page":"132719"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10928","display_name":"Probabilistic and Robust Engineering Design","score":0.9916999936103821,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},"topics":[{"id":"https://openalex.org/T10928","display_name":"Probabilistic and Robust Engineering Design","score":0.9916999936103821,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T12135","display_name":"Fuzzy Systems and Optimization","score":0.9907000064849854,"subfield":{"id":"https://openalex.org/subfields/2613","display_name":"Statistics and Probability"},"field":{"id":"https://openalex.org/fields/26","display_name":"Mathematics"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10050","display_name":"Multi-Criteria Decision Making","score":0.9890999794006348,"subfield":{"id":"https://openalex.org/subfields/1803","display_name":"Management Science and Operations Research"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7967315912246704},{"id":"https://openalex.org/keywords/reliability-theory","display_name":"Reliability theory","score":0.6868844628334045},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6102350354194641},{"id":"https://openalex.org/keywords/component","display_name":"Component (thermodynamics)","score":0.5805559754371643},{"id":"https://openalex.org/keywords/uncertainty-theory","display_name":"Uncertainty theory","score":0.5621729493141174},{"id":"https://openalex.org/keywords/decomposition","display_name":"Decomposition","score":0.559238076210022},{"id":"https://openalex.org/keywords/belief-structure","display_name":"Belief structure","score":0.4685652554035187},{"id":"https://openalex.org/keywords/complex-system","display_name":"Complex system","score":0.43820852041244507},{"id":"https://openalex.org/keywords/metric","display_name":"Metric (unit)","score":0.4240868091583252},{"id":"https://openalex.org/keywords/key","display_name":"Key (lock)","score":0.41754862666130066},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3853696882724762},{"id":"https://openalex.org/keywords/mathematical-optimization","display_name":"Mathematical optimization","score":0.3742286264896393},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3464069962501526},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.30647027492523193},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.22779911756515503},{"id":"https://openalex.org/keywords/failure-rate","display_name":"Failure rate","score":0.11063280701637268},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.096260666847229}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7967315912246704},{"id":"https://openalex.org/C201729545","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability theory","level":3,"score":0.6868844628334045},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6102350354194641},{"id":"https://openalex.org/C168167062","wikidata":"https://www.wikidata.org/wiki/Q1117970","display_name":"Component (thermodynamics)","level":2,"score":0.5805559754371643},{"id":"https://openalex.org/C51152595","wikidata":"https://www.wikidata.org/wiki/Q7882501","display_name":"Uncertainty theory","level":2,"score":0.5621729493141174},{"id":"https://openalex.org/C124681953","wikidata":"https://www.wikidata.org/wiki/Q339062","display_name":"Decomposition","level":2,"score":0.559238076210022},{"id":"https://openalex.org/C44973800","wikidata":"https://www.wikidata.org/wiki/Q4882755","display_name":"Belief structure","level":2,"score":0.4685652554035187},{"id":"https://openalex.org/C47822265","wikidata":"https://www.wikidata.org/wiki/Q854457","display_name":"Complex system","level":2,"score":0.43820852041244507},{"id":"https://openalex.org/C176217482","wikidata":"https://www.wikidata.org/wiki/Q860554","display_name":"Metric (unit)","level":2,"score":0.4240868091583252},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.41754862666130066},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3853696882724762},{"id":"https://openalex.org/C126255220","wikidata":"https://www.wikidata.org/wiki/Q141495","display_name":"Mathematical optimization","level":1,"score":0.3742286264896393},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3464069962501526},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.30647027492523193},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.22779911756515503},{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.11063280701637268},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.096260666847229},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C18903297","wikidata":"https://www.wikidata.org/wiki/Q7150","display_name":"Ecology","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C21547014","wikidata":"https://www.wikidata.org/wiki/Q1423657","display_name":"Operations management","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2019.2929199","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2929199","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08764359.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:3609528e88204918b484088490a00f85","is_oa":true,"landing_page_url":"https://doaj.org/article/3609528e88204918b484088490a00f85","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 7, Pp 132711-132719 (2019)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2019.2929199","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2929199","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08764359.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G3009418347","display_name":null,"funder_award_id":"61573043","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G4231989224","display_name":null,"funder_award_id":"TZ2018007","funder_id":"https://openalex.org/F4320336025","funder_display_name":"Science Challenge Project"},{"id":"https://openalex.org/G4753659803","display_name":null,"funder_award_id":"61573041","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G752714931","display_name":null,"funder_award_id":"71671009","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G8679552219","display_name":null,"funder_award_id":"61573043","funder_id":"https://openalex.org/F4320336025","funder_display_name":"Science Challenge Project"},{"id":"https://openalex.org/G8951849853","display_name":"\u4fe1\u606f\u7269\u7406\u7cfb\u7edf\uff08CPS\uff09\u7684\u6545\u969c\u884c\u4e3a\u548c\u53ef\u9760\u6027\u7814\u7a76","funder_award_id":"61871013","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320321125","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56"},{"id":"https://openalex.org/F4320336025","display_name":"Science Challenge Project","ror":null}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2957666543.pdf","grobid_xml":"https://content.openalex.org/works/W2957666543.grobid-xml"},"referenced_works_count":30,"referenced_works":["https://openalex.org/W62689516","https://openalex.org/W1768617998","https://openalex.org/W1978689898","https://openalex.org/W1993152301","https://openalex.org/W2002110427","https://openalex.org/W2044778367","https://openalex.org/W2048339139","https://openalex.org/W2051214861","https://openalex.org/W2070645909","https://openalex.org/W2074339547","https://openalex.org/W2093905688","https://openalex.org/W2095062491","https://openalex.org/W2111959010","https://openalex.org/W2151376743","https://openalex.org/W2187961073","https://openalex.org/W2274279545","https://openalex.org/W2310846724","https://openalex.org/W2346233588","https://openalex.org/W2499353980","https://openalex.org/W2515132961","https://openalex.org/W2515914268","https://openalex.org/W2754262095","https://openalex.org/W2766491475","https://openalex.org/W2789615897","https://openalex.org/W2803460043","https://openalex.org/W4240463847","https://openalex.org/W4299419703","https://openalex.org/W4299422266","https://openalex.org/W6682597882","https://openalex.org/W6686791216"],"related_works":["https://openalex.org/W2182381755","https://openalex.org/W4226013350","https://openalex.org/W2751058566","https://openalex.org/W2176632791","https://openalex.org/W4226060998","https://openalex.org/W3023126583","https://openalex.org/W2310846724","https://openalex.org/W1988715056","https://openalex.org/W2957666543","https://openalex.org/W4390678274"],"abstract_inverted_index":{"Belief":[0],"reliability":[1,6,16,19,28,43,65,107],"is":[2,21,37,46,81,99,118],"a":[3,22,40,61,122],"new":[4],"proposed":[5,82],"metric":[7],"considering":[8],"both":[9],"aleatory":[10],"and":[11,34,49,93,101,113],"epistemic":[12],"uncertainty.":[13],"In":[14,55],"belief":[15,27,42,64],"theory,":[17],"system":[18,26,63],"analysis":[20,66],"key":[23],"component.":[24],"Traditional":[25],"theory":[29],"for":[30],"systems":[31,92],"with":[32,73,103,121],"random":[33],"uncertain":[35],"components":[36],"based":[38],"on":[39],"complex":[41],"formula,":[44],"which":[45],"not":[47],"understandable":[48],"efficient":[50],"enough":[51],"in":[52],"engineering":[53],"practise.":[54],"this":[56,79,116],"paper,":[57],"we":[58],"put":[59],"forward":[60],"novel":[62],"method,":[67],"called":[68],"decomposition":[69],"method":[70,80,117],"to":[71,84],"cope":[72],"the":[74,85,88,94,97,106,111],"problem.":[75],"An":[76],"algorithm":[77,98],"of":[78,87,91,96,105,115],"according":[83],"properties":[86],"cut":[89],"sets":[90],"complexity":[95],"analyzed":[100],"compared":[102],"that":[104],"formula":[108],"method.":[109],"Finally,":[110],"effectiveness":[112],"efficiency":[114],"further":[119],"illustrated":[120],"comparative":[123],"case":[124],"study.":[125]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":3},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}