{"id":"https://openalex.org/W2959199894","doi":"https://doi.org/10.1109/access.2019.2928896","title":"Power Integrity Coanalysis Methodology for Multi-Domain High-Speed Memory Systems","display_name":"Power Integrity Coanalysis Methodology for Multi-Domain High-Speed Memory Systems","publication_year":2019,"publication_date":"2019-01-01","ids":{"openalex":"https://openalex.org/W2959199894","doi":"https://doi.org/10.1109/access.2019.2928896","mag":"2959199894"},"language":"en","primary_location":{"id":"doi:10.1109/access.2019.2928896","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2928896","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08763973.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08763973.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100656386","display_name":"Seungwon Kim","orcid":"https://orcid.org/0000-0002-9016-8792"},"institutions":[{"id":"https://openalex.org/I48566637","display_name":"Ulsan National Institute of Science and Technology","ror":"https://ror.org/017cjz748","country_code":"KR","type":"education","lineage":["https://openalex.org/I48566637"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Seungwon Kim","raw_affiliation_strings":["Department of Electrical Engineering, Ulsan National Institute of Science and Technology, Ulsan, South Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Ulsan National Institute of Science and Technology, Ulsan, South Korea","institution_ids":["https://openalex.org/I48566637"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5038419298","display_name":"Ki Jin Han","orcid":"https://orcid.org/0000-0002-7190-8492"},"institutions":[{"id":"https://openalex.org/I205490536","display_name":"Dongguk University","ror":"https://ror.org/057q6n778","country_code":"KR","type":"education","lineage":["https://openalex.org/I205490536"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Ki Jin Han","raw_affiliation_strings":["Division of Electronics and Electrical Engineering, Dongguk University, Seoul, South Korea"],"affiliations":[{"raw_affiliation_string":"Division of Electronics and Electrical Engineering, Dongguk University, Seoul, South Korea","institution_ids":["https://openalex.org/I205490536"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100337285","display_name":"Youngmin Kim","orcid":"https://orcid.org/0000-0001-6399-1719"},"institutions":[{"id":"https://openalex.org/I94588446","display_name":"Hongik University","ror":"https://ror.org/00egdv862","country_code":"KR","type":"education","lineage":["https://openalex.org/I94588446"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Youngmin Kim","raw_affiliation_strings":["School of Electronic and Electrical Engineering, Hongik University, Seoul, South Korea"],"affiliations":[{"raw_affiliation_string":"School of Electronic and Electrical Engineering, Hongik University, Seoul, South Korea","institution_ids":["https://openalex.org/I94588446"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5102986393","display_name":"Seokhyeong Kang","orcid":null},"institutions":[{"id":"https://openalex.org/I123900574","display_name":"Pohang University of Science and Technology","ror":"https://ror.org/04xysgw12","country_code":"KR","type":"education","lineage":["https://openalex.org/I123900574"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Seokhyeong Kang","raw_affiliation_strings":["Department of Electrical Engineering, Pohang University of Science and Technology, Pohang, South Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Pohang University of Science and Technology, Pohang, South Korea","institution_ids":["https://openalex.org/I123900574"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5100656386"],"corresponding_institution_ids":["https://openalex.org/I48566637"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.121,"has_fulltext":true,"cited_by_count":2,"citation_normalized_percentile":{"value":0.45812289,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":95},"biblio":{"volume":"7","issue":null,"first_page":"95305","last_page":"95313"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11527","display_name":"3D IC and TSV technologies","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.791576623916626},{"id":"https://openalex.org/keywords/power-integrity","display_name":"Power integrity","score":0.781609296798706},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.5472558736801147},{"id":"https://openalex.org/keywords/parametric-statistics","display_name":"Parametric statistics","score":0.533937394618988},{"id":"https://openalex.org/keywords/signal-integrity","display_name":"Signal integrity","score":0.5279654264450073},{"id":"https://openalex.org/keywords/monte-carlo-method","display_name":"Monte Carlo method","score":0.5042992830276489},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4274805188179016},{"id":"https://openalex.org/keywords/electric-power-system","display_name":"Electric power system","score":0.42132556438446045},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3767171800136566},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3378966152667999},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.20874762535095215},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.11664021015167236},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.096646249294281}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.791576623916626},{"id":"https://openalex.org/C2777561913","wikidata":"https://www.wikidata.org/wiki/Q19599527","display_name":"Power integrity","level":4,"score":0.781609296798706},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.5472558736801147},{"id":"https://openalex.org/C117251300","wikidata":"https://www.wikidata.org/wiki/Q1849855","display_name":"Parametric statistics","level":2,"score":0.533937394618988},{"id":"https://openalex.org/C44938667","wikidata":"https://www.wikidata.org/wiki/Q4503810","display_name":"Signal integrity","level":3,"score":0.5279654264450073},{"id":"https://openalex.org/C19499675","wikidata":"https://www.wikidata.org/wiki/Q232207","display_name":"Monte Carlo method","level":2,"score":0.5042992830276489},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4274805188179016},{"id":"https://openalex.org/C89227174","wikidata":"https://www.wikidata.org/wiki/Q2388981","display_name":"Electric power system","level":3,"score":0.42132556438446045},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3767171800136566},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3378966152667999},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.20874762535095215},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.11664021015167236},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.096646249294281},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C123745756","wikidata":"https://www.wikidata.org/wiki/Q1665949","display_name":"Interconnection","level":2,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":4,"locations":[{"id":"doi:10.1109/access.2019.2928896","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2928896","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08763973.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:09d0908441da4713a7c0ef331448f418","is_oa":true,"landing_page_url":"https://doaj.org/article/09d0908441da4713a7c0ef331448f418","pdf_url":null,"source":{"id":"https://openalex.org/S112646816","display_name":"SHILAP Revista de lepidopterolog\u00eda","issn_l":"0300-5267","issn":["0300-5267","2340-4078"],"is_oa":true,"is_in_doaj":true,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 7, Pp 95305-95313 (2019)","raw_type":"article"},{"id":"pmh:oai:oasis.postech.ac.kr:2014.oak/103078","is_oa":false,"landing_page_url":"https://oasis.postech.ac.kr/handle/2014.oak/103078","pdf_url":null,"source":{"id":"https://openalex.org/S4306401965","display_name":"Open Access System for Information Sharing (Pohang University of Science and Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I123900574","host_organization_name":"Pohang University of Science and Technology","host_organization_lineage":["https://openalex.org/I123900574"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Article"},{"id":"pmh:oai:scholarworks.unist.ac.kr:201301/27493","is_oa":false,"landing_page_url":"https://scholarworks.unist.ac.kr/handle/201301/27493","pdf_url":null,"source":{"id":"https://openalex.org/S4306401118","display_name":"Scholarworks@UNIST (Ulsan National Institute of Science and Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I48566637","host_organization_name":"Ulsan National Institute of Science and Technology","host_organization_lineage":["https://openalex.org/I48566637"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"ARTICLE"}],"best_oa_location":{"id":"doi:10.1109/access.2019.2928896","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2928896","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08763973.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1739134435","display_name":null,"funder_award_id":"IITP-","funder_id":"https://openalex.org/F4320324891","funder_display_name":"Iran Telecommunication Research Center"},{"id":"https://openalex.org/G2720942983","display_name":null,"funder_award_id":"2016M3A7B4909943","funder_id":"https://openalex.org/F4320322120","funder_display_name":"National Research Foundation of Korea"},{"id":"https://openalex.org/G3520395564","display_name":null,"funder_award_id":"IITP-2019-2016-0-00309-002","funder_id":"https://openalex.org/F4320335489","funder_display_name":"Institute for Information and Communications Technology Promotion"},{"id":"https://openalex.org/G5870850103","display_name":null,"funder_award_id":"2017M3D1A1040828","funder_id":"https://openalex.org/F4320322120","funder_display_name":"National Research Foundation of Korea"},{"id":"https://openalex.org/G7189021111","display_name":null,"funder_award_id":"IITP-2019-2016-0-00309","funder_id":"https://openalex.org/F4320335489","funder_display_name":"Institute for Information and Communications Technology Promotion"},{"id":"https://openalex.org/G7644699911","display_name":null,"funder_award_id":"2017M3D1A1040828","funder_id":"https://openalex.org/F4320328359","funder_display_name":"Ministry of Science and ICT, South Korea"},{"id":"https://openalex.org/G7685055460","display_name":null,"funder_award_id":"Grant","funder_id":"https://openalex.org/F4320328359","funder_display_name":"Ministry of Science and ICT, South Korea"},{"id":"https://openalex.org/G949392318","display_name":null,"funder_award_id":"2017M3D1A1040828","funder_id":"https://openalex.org/F4320320671","funder_display_name":"National Research Foundation"}],"funders":[{"id":"https://openalex.org/F4320320671","display_name":"National Research Foundation","ror":"https://ror.org/05s0g1g46"},{"id":"https://openalex.org/F4320322120","display_name":"National Research Foundation of Korea","ror":"https://ror.org/013aysd81"},{"id":"https://openalex.org/F4320324891","display_name":"Iran Telecommunication Research Center","ror":"https://ror.org/01a3g2z22"},{"id":"https://openalex.org/F4320328359","display_name":"Ministry of Science and ICT, South Korea","ror":"https://ror.org/01wpjm123"},{"id":"https://openalex.org/F4320335489","display_name":"Institute for Information and Communications Technology Promotion","ror":"https://ror.org/01g0hqq23"}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2959199894.pdf","grobid_xml":"https://content.openalex.org/works/W2959199894.grobid-xml"},"referenced_works_count":27,"referenced_works":["https://openalex.org/W637695241","https://openalex.org/W1593525474","https://openalex.org/W1964059347","https://openalex.org/W2060318198","https://openalex.org/W2069901078","https://openalex.org/W2095813283","https://openalex.org/W2096844335","https://openalex.org/W2116494573","https://openalex.org/W2125117676","https://openalex.org/W2148310529","https://openalex.org/W2149155748","https://openalex.org/W2149462689","https://openalex.org/W2512825462","https://openalex.org/W2529452203","https://openalex.org/W2548446476","https://openalex.org/W2759349921","https://openalex.org/W2798567981","https://openalex.org/W2799050829","https://openalex.org/W2808513690","https://openalex.org/W4210367193","https://openalex.org/W4242172629","https://openalex.org/W4244021934","https://openalex.org/W4312562922","https://openalex.org/W6641078657","https://openalex.org/W6641835383","https://openalex.org/W6674788492","https://openalex.org/W6681789530"],"related_works":["https://openalex.org/W2965410099","https://openalex.org/W4235454973","https://openalex.org/W4386105410","https://openalex.org/W2250058922","https://openalex.org/W2148913576","https://openalex.org/W3097351224","https://openalex.org/W2533759086","https://openalex.org/W2385649681","https://openalex.org/W2164938154","https://openalex.org/W1987899475"],"abstract_inverted_index":{"With":[0],"the":[1,12,50,82,98,125,159],"increasing":[2],"demand":[3],"for":[4,25,94,112],"state-of-the-art":[5],"technologies,":[6],"such":[7,62,134],"as":[8,21,32,63,135],"wearable":[9],"devices":[10],"and":[11,138],"Internet":[13],"of":[14,49,52,88,162],"things":[15],"(IoT),":[16],"power":[17,108,114,128],"integrity":[18,109,129],"has":[19],"emerged":[20],"a":[22,41,46,72,86,107],"major":[23],"concern":[24],"high-speed,":[26],"low-power":[27,163],"interfaces":[28],"that":[29,145,155],"are":[30,92,156],"used":[31],"mobile":[33],"platforms.":[34],"By":[35],"using":[36,131],"case-specific":[37],"design":[38,60,83],"models":[39],"in":[40,58,116,127],"high-speed":[42],"memory":[43,118],"system,":[44],"only":[45,79],"limited":[47],"analysis":[48],"effects":[51],"parametric":[53,132],"variations":[54],"can":[55,76,123,149],"be":[56,77],"performed":[57],"complex":[59],"problems,":[61],"adjacent":[64],"voltage":[65],"domain":[66],"coupling":[67],"at":[68],"high":[69],"frequencies.":[70],"Moreover,":[71],"conventional":[73],"industrial":[74],"method":[75],"simulated":[78],"after":[80],"completing":[81],"layout;":[84],"therefore,":[85],"number":[87],"iterative":[89],"back-annotation":[90],"processes":[91],"required":[93],"signoff;":[95],"this":[96,103],"delays":[97],"time":[99],"to":[100],"market.":[101],"In":[102],"paper,":[104],"we":[105],"propose":[106],"coanalysis":[110],"methodology":[111,122,148],"multiple":[113],"domains":[115],"high-frequency":[117],"systems.":[119],"Our":[120,142],"proposed":[121,147],"analyze":[124],"tendencies":[126],"by":[130],"methods,":[133],"parameter":[136],"sweeping":[137],"Monte":[139],"Carlo":[140],"simulations.":[141],"experiments":[143],"prove":[144],"our":[146],"predict":[150],"similar":[151],"peak-to-peak":[152],"ripple":[153],"voltages":[154],"comparable":[157],"with":[158],"realistic":[160],"simulations":[161],"double":[164],"data":[165],"rate":[166],"four":[167],"interfaces.":[168]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2021,"cited_by_count":1}],"updated_date":"2026-04-10T15:06:20.359241","created_date":"2025-10-10T00:00:00"}